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At least 649 records · Page 36

The structure of PX{sub 3} (X = Cl, Br, I) molecular liquids from X-ray diffraction, molecular dynamics simulations, and reverse Monte Carlo modeling

Synchrotron X-ray diffraction measurements have been conducted on liquid phosphorus trichloride, tribromide, and triiodide. Molecular Dynamics simulations for these molecular liquids were performed with a dual purpose: (1) to establish whether existing intermolecular potential functions can provide a picture that is consistent with diffraction data and (2) to generate reliable starting configurations for subsequent Reverse Monte Carlo modelling. Structural models (i.e., sets of coordinates of thousands of atoms) that were fully consistent with experimental diffraction information, within errors, have been prepared by means of the Reverse Monte Carlo method. Comparison with reference systems, generated by hard sphere-like Monte Carlo simulations, was also carried out to demonstrate the extent to which simple space filling effects determine the structure of the liquids (and thus, also estimating the information content of measured data). Total scattering structure factors, partial radial distribution functions and orientational correlations as a function of distances between the molecular centres have been calculated from the models. In general, more or less antiparallel arrangements of the primary molecular axes that are found to be the most favourable orientation of two neighbouring molecules. In liquid PBr{sub 3} electrostatic interactions seem to play a more important role in determining intermolecular correlations than in the other two liquids; molecular arrangements in both PCl{sub 3} and PI{sub 3} are largely driven by steric effects.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗

Quantum diffraction effects on the atomic polarization collision in partially ionized dense plasmas

The influence of quantum diffraction on the electron-atom polarization collision process is investigated in partially ionized dense plasmas. The pseudopotential model and eikonal method are employed to obtain the eikonal phase shift and eikonal cross section as functions of the impact parameter, collision energy, Debye length, electron de Broglie wavelength, and atomic polarizability. The results show that the eikonal phase shift for the electron-hydrogen atom polarization collision decreases with an increase of the electron de Broglie wavelength. It is important to note that the influence of quantum diffraction produces the repulsive part in the electron-atom polarization interaction. It is also found that the quantum diffraction effect enhances the differential eikonal cross section. Additionally, the total eikonal cross section decreases with increasing electron de Broglie wavelength. The variations of the eikonal cross section due to the influence of finite size of the de Broglie wavelength and Debye radius are also discussed.

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗

Prediction of Debye-Scherrer diffraction patterns in arbitrarily strained samples

The prediction of Debye-Scherrer diffraction patterns from strained samples is typically conducted in the small strain limit. Although valid for small deviations from the hydrostat (such as the conditions of finite strength typically observed in diamond anvil cells) this assertion is likely to fail for the large strain anisotropies (often of order 10% in normal strain) found in uniaxially loaded dynamic compression experiments. In this paper, we derive a general form for the (θ{sub B},ϕ) dependence of the diffraction for an arbitrarily deformed polycrystalline sample in any geometry, and of any crystal symmetry. We show that this formula is consistent with ray traced diffraction for highly strained computationally generated polycrystals, and that the formula shows deviations from the widely used small strain solutions previously reported.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗

Misfit strain of oxygen precipitates in Czochralski silicon studied with energy-dispersive X-ray diffraction

Annealed Czochralski Silicon wafers containing SiO{sub x} precipitates have been studied by high energy X-ray diffraction in a defocused Laue setup using a laboratory tungsten tube. The energy dispersive evaluation of the diffracted Bragg intensity of the 220 reflection within the framework of the statistical dynamical theory yields the static Debye-Waller factor E of the crystal, which gives access to the strain induced by the SiO{sub x} precipitates. The results are correlated with precipitate densities and sizes determined from transmission electron microscopy measurements of equivalent wafers. This allows for the determination of the constrained linear misfit ε between precipitate and crystal lattice. For samples with octahedral precipitates the values ranging from ε = 0.39 (+0.28/−0.12) to ε = 0.48 (+0.34/−0.16) indicate that self-interstitials emitted into the matrix during precipitate growth contribute to the lattice strain. In this case, the expected value calculated from literature values is ε = 0.26 ± 0.05. Further, the precise evaluation of Pendellösung oscillations in the diffracted Bragg intensity of as-grown wafers reveals a thermal Debye-Waller parameter for the 220 reflection B{sup 220}(293 K) of 0.5582 ± 0.0039 Å{sup 2} for a structure factor based on spherically symmetric scattering contributions.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗

High precision two-dimensional strain mapping in semiconductor devices using nanobeam electron diffraction in the transmission electron microscope

A classical method used to characterize the strain in modern semiconductor devices is nanobeam diffraction (NBD) in the transmission electron microscope. One challenge for this method lies in the fact that the smaller the beam becomes, the more difficult it becomes to analyze the resulting diffraction spot pattern. We show that a carefully designed fitting algorithm enables us to reduce the sampling area for the diffraction patterns on the camera chip dramatically (∼1/16) compared to traditional settings without significant loss of precision. The resulting lower magnification of the spot pattern permits the presence of an annular dark field detector, which in turn makes the recording of images for drift correction during NBD acquisition possible. Thus, the reduced sampling size allows acquisition of drift corrected NBD 2D strain maps of up to 3000 pixels while maintaining a precision of better than 0.07%. As an example, we show NBD strain maps of a modern field effect transistor (FET) device. A special filtering feature used in the analysis makes it is possible to measure strain in silicon devices even in the presence of other crystalline materials covering the probed area, which is important for the characterization of the next generation of devices (Fin-FETs).

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗

Role of photonic angular momentum states in nonreciprocal diffraction from magneto-optical cylinder arrays

Optical eigenstates in a concentrically symmetric resonator are photonic angular momentum states (PAMSs) with quantized optical orbital angular momentums (OAMs). Nonreciprocal optical phenomena can be obtained if we lift the degeneracy of PAMSs. In this article, we provide a comprehensive study of nonreciprocal optical diffraction of various orders from a magneto-optical cylinder array. We show that nonreciprocal diffraction can be obtained only for these nonzero orders. Role of PAMSs, the excitation of which is sensitive to the directions of incidence, applied magnetic field, and arrangement of the cylinders, are studied. Some interesting phenomena such as a dispersionless quasi-omnidirectional nonreciprocal diffraction and spikes associated with high-OAM PAMSs are present and discussed.

36 MATERIALS SCIENCE↗

High quality single shot ultrafast MeV electron diffraction from a photocathode radio-frequency gun

A compact ultrafast electron diffractometer, consisting of an s-band 1.6 cell photocathode radio-frequency gun, a multi-function changeable sample chamber, and a sensitive relativistic electron detector, was built at Shanghai Jiao Tong University. High-quality single-shot transmission electron diffraction patterns have been recorded by scattering 2.5 MeV electrons off single crystalline gold and polycrystalline aluminum samples. The high quality diffraction pattern indicates an excellent spatial resolution, with the ratio of the diffraction ring radius over the ring rms width beyond 10. The electron pulse width is estimated to be about 300 fs. The high temporal and spatial resolution may open new opportunities in various areas of sciences.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗

Electron diffraction study of the sillenites Bi{sub 12}SiO{sub 20}, Bi{sub 25}FeO{sub 39} and Bi{sub 25}InO{sub 39}: Evidence of short-range ordering of oxygen-vacancies in the trivalent sillenites

We present an electron diffraction study of three sillenites, Bi{sub 12}SiO{sub 20}, Bi{sub 25}FeO{sub 39}, and Bi{sub 25}InO{sub 39} synthesized using the solid-state method. We explore a hypothesis, inspired by optical studies in the literature, that suggests that trivalent sillenites have additional disorder not present in the tetravalent compounds. Electron diffraction patterns of Bi{sub 25}FeO{sub 39} and Bi{sub 25}InO{sub 39} show streaks that confirm deviations from the ideal sillenite structure. Multi-slice simulations of electron-diffraction patterns are presented for different perturbations to the sillenite structure - partial substitution of the M site by Bi{sup 3+}, random and ordered oxygen-vacancies, and a frozen-phonon model. Although comparison of experimental data to simulations cannot be conclusive, we consider the streaks as evidence of short-range ordered oxygen-vacancies.

36 MATERIALS SCIENCE↗

Time-resolved x-ray diffraction techniques for bulk polycrystalline materials under dynamic loading

We have developed two techniques for time-resolved x-ray diffraction from bulk polycrystalline materials during dynamic loading. In the first technique, we synchronize a fast detector with loading of samples at strain rates of ∼10{sup 3}–10{sup 4} s{sup −1} in a compression Kolsky bar (split Hopkinson pressure bar) apparatus to obtain in situ diffraction patterns with exposures as short as 70 ns. This approach employs moderate x-ray energies (10–20 keV) and is well suited to weakly absorbing materials such as magnesium alloys. The second technique is useful for more strongly absorbing materials, and uses high-energy x-rays (86 keV) and a fast shutter synchronized with the Kolsky bar to produce short (∼40 μs) pulses timed with the arrival of the strain pulse at the specimen, recording the diffraction pattern on a large-format amorphous silicon detector. For both techniques we present sample data demonstrating the ability of these techniques to characterize elastic strains and polycrystalline texture as a function of time during high-rate deformation.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗

Design and demonstration of broadband thin planar diffractive acoustic lenses

We present here two diffractive acoustic lenses with subwavelength thickness, planar profile, and broad operation bandwidth. Tapered labyrinthine unit cells with their inherently broadband effective material properties are exploited in our design. Both the measured and the simulated results are showcased to demonstrate the lensing effect over more than 40% of the central frequency. The focusing of a propagating Gaussian modulated sinusoidal pulse is also demonstrated. This work paves the way for designing diffractive acoustic lenses and more generalized phase engineering diffractive elements with labyrinthine acoustic metamaterials.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗

Multiferroic CuCrO₂ under high pressure: In situ X-ray diffraction and Raman spectroscopic studies

The compression behavior of delafossite compound CuCrO₂ has been investigated by in situ x-ray diffraction (XRD) and Raman spectroscopic measurements up to 23.2 and 34 GPa, respectively. X-ray diffraction data show the stability of ambient rhombohedral structure up to ~23 GPa. Material shows large anisotropy in axial compression with c-axis compressibility, κ{sub c} = 1.26 × 10⁻³(1) GPa⁻¹ and a-axis compressibility, κ{sub a} = 8.90 × 10⁻³(6) GPa⁻¹. Our XRD data show an irreversible broadening of diffraction peaks. Pressure volume data when fitted to 3rd order Birch-Murnaghan equation of state give the value of bulk modulus, B₀ = 156.7(2.8) GPa with its pressure derivative, B₀{sup ’} as 5.3(0.5). All the observed vibrational modes in Raman measurements show hardening with pressure. Appearance of a new mode at ~24 GPa indicates the structural phase transition in the compound. Our XRD and Raman results indicate that CuCrO{sub 2} may be transforming to an ordered rocksalt type structure under compression.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗

Optical loss due to diffraction by concentrator Fresnel lenses

Fresnel lenses are widely used in concentrating photovoltaic (CPV) systems as a primary optical element. They focus sunlight on small solar cells or on the entrance apertures of secondary optical elements. A Fresnel lens consists of several prism rings and diffraction by these prism rings is unavoidable. Some of the light that would reach a designated target area according to geometric optics will miss it due to diffraction. This diffraction loss may be of relevant magnitude for CPV applications. The results of published analytical calculations are evaluated, discussed, and compared to computer simulations and measurements.

14 SOLAR ENERGY↗

Strain mapping at the nanoscale using precession electron diffraction in transmission electron microscope with off axis camera

Precession electron diffraction is an efficient technique to measure strain in nanostructures by precessing the electron beam, while maintaining a few nanometre probe size. Here, we show that an advanced diffraction pattern treatment allows reproducible and precise strain measurements to be obtained using a default 512 × 512 DigiSTAR off-axis camera both in advanced or non-corrected transmission electron microscopes. This treatment consists in both projective geometry correction of diffraction pattern distortions and strain Delaunay triangulation based analysis. Precision in the strain measurement is improved and reached 2.7 × 10{sup −4} with a probe size approaching 4.2 nm in diameter. This method is applied to the study of the strain state in InGaAs quantum-well (QW) devices elaborated on Si substrate. Results show that the GaAs/Si mismatch does not induce in-plane strain fluctuations in the InGaAs QW region.

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗

Monitoring non-pseudomorphic epitaxial growth of spinel/perovskite oxide heterostructures by reflection high-energy electron diffraction

Pulsed laser deposition of spinel γ-Al{sub 2}O{sub 3} thin films on bulk perovskite SrTiO{sub 3} is monitored by high-pressure reflection high-energy electron diffraction (RHEED). The heteroepitaxial combination of two materials with different crystal structures is found to be inherently accompanied by a strong intensity modulation of bulk diffraction patterns from inelastically scattered electrons, which impedes the observation of RHEED intensity oscillations. Avoiding such electron surface-wave resonance enhancement by de-tuning the RHEED geometry allows for the separate observation of the surface-diffracted specular RHEED signal and thus the real-time monitoring of sub-unit cell two-dimensional layer-by-layer growth. Since these challenges are essentially rooted in the difference between film and substrate crystal structure, our findings are of relevance for the growth of any heterostructure combining oxides with different crystal symmetry and may thus facilitate the search for novel oxide heterointerfaces.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗

Determination of the geometric corrugation of graphene on SiC(0001) by grazing incidence fast atom diffraction

We present a grazing incidence fast atom diffraction (GIFAD) study of monolayer graphene on 6H-SiC(0001). This system shows a Moiré-like 13 × 13 superlattice above the reconstructed carbon buffer layer. The averaging property of GIFAD results in electronic and geometric corrugations that are well decoupled; the graphene honeycomb corrugation is only observed with the incident beam parallel to the zigzag direction while the geometric corrugation arising from the superlattice is revealed along the armchair direction. Full-quantum calculations of the diffraction patterns show the very high GIFAD sensitivity to the amplitude of the surface corrugation. The best agreement between the calculated and measured diffraction intensities yields a corrugation height of 0.27 ± 0.03 Å.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗

Test of factorization in diffractive deep inelastic scattering and photoproduction at HERA

The QCD factorization theorem in diffraction is tested by comparing diffractive jet production data to QCD predictions based on fits to inclusive diffractive cross section data. H1 measured dijet production with a leading proton detected in the Very Forward Proton Spectrometer (VFPS), both in deep-inelastic scattering and in photoproduction. The DIS measurements are complemented by measurements of dijet production with an associated rapidity gap and in a data sample selected with a leading proton in the Forward Proton Spectrometer (FPS)

72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS↗

Eshelby twist and correlation effects in diffraction from nanocrystals

Molecular dynamics simulations were used to model the Eshelby dislocation inside Pd and Ir nanowires and to predict the powder diffraction pattern using the Debye scattering equation. We find that the ideal dislocation solution by Eshelby is in good agreement with the observed twist angle and deviatoric strain, even though it ignores both the splitting of the Eshelby dislocation into two partials and surface stress. Surface stress plays a significant role only for nanorods with small aspect ratio (∼1:1). We also find that Wilson's prediction on the diffraction peak broadening for the Eshelby dislocation is overestimated because it ignores the fact that the Eshelby twist relaxes the deviatoric strain. Moreover, the twist loosens the correlation along the nanorod, causing additional line profile broadening, which is read by diffraction as a decrease of coherent domain size when the total twist angle is bigger than 1.5°. Overall, our findings suggest a novel way to predict and analyze the dislocations as well as the resulting strain fields in the twisted nanocrystalline rods.

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗

Optically confined polarized resonance Raman studies in identifying crystalline orientation of sub-diffraction limited AlGaN nanostructure

An optical characterization tool of Raman spectroscopy with extremely weak scattering cross section tool is not popular to analyze scattered signal from a single nanostructure in the sub-diffraction regime. In this regard, plasmonic assisted characterization tools are only relevant in spectroscopic studies of nanoscale object in the sub-diffraction limit. We have reported polarized resonance Raman spectroscopic (RRS) studies with strong electron-phonon coupling to understand the crystalline orientation of a single AlGaN nanowire of diameter ∼100 nm. AlGaN nanowire is grown by chemical vapor deposition technique using the catalyst assisted vapor-liquid-solid process. The results are compared with the high resolution transmission electron microscopic analysis. As a matter of fact, optical confinement effect due to the dielectric contrast of nanowire with respect to that of surrounding media assisted with electron-phonon coupling of RRS is useful for the spectroscopic analysis in the sub-diffraction limit of 325 nm (λ/2N.A.) using an excitation wavelength (λ) of 325 nm and near ultraviolet 40× far field objective with a numerical aperture (N.A.) value of 0.50.

77 NANOSCIENCE AND NANOTECHNOLOGY↗