Trap and recombination centers study in sprayed Cu₂ZnSnS₄ thin films
In this work, a study of trap and recombination center properties in polycrystalline Cu₂ZnSnS₄ thin films is carried out in order to understand the poor performance in Cu₂ZnSnS₄ thin film solar cells. Thermally stimulated current has been studied in Cu₂ZnSnS₄ deposited by pneumatic spray pyrolysis method using various heating rates, in order to gain information about trap centers and/or deep levels present within the band-gap of this material. A set of temperature-dependent current curves revealed three levels with activation energy of 126±10, 476±25, and 1100±100 meV. The possible nature of the three levels found is presented, in which the first one is likely to be related to Cu{sub Zn} antisites, while second and third to Sn vacancies and Sn{sub Cu} antisites, respectively. The values of frequency factor, capture cross section, and trap concentration have been determined for each center.