Engineering Papers⌕ Search

SEARCH · Engineering Papers

Results for “THICKNESS”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.

At least 613 records · Page 34

Influence of the SiO{sub 2} interlayer thickness on the density and polarity of charges in Si/SiO{sub 2}/Al{sub 2}O{sub 3} stacks as studied by optical second-harmonic generation

By accurately tuning the SiO{sub 2} interlayer thickness the density and polarity of charges in Si/SiO{sub 2}/Al{sub 2}O{sub 3} stacks can be controlled. We report on the number density, polarity, and physical location of charges present in the stacks as studied by optical second-harmonic generation (SHG). Depending on the SiO{sub 2} interlayer thickness (1–150 nm) the effective charge density in the Si/SiO{sub 2}/Al{sub 2}O{sub 3} stacks ranges from 10{sup 13} to 10{sup 11} cm{sup −2} for both n- and p-type silicon. The polarity of the charges switches from negative to positive around a SiO{sub 2} interlayer thickness of 5–10 nm at which point the effective charge density in the stacks is negligible. This switch in polarity is apparent from spectroscopic, time-dependent, and azimuthal SHG measurements. The observed trends in charge density and polarity can be explained by tunneling of electrons into defect states at the SiO{sub 2}/Al{sub 2}O{sub 3} interface as well as the presence of fixed and bulk charges at the Si/SiO{sub 2} interface and in the SiO{sub 2}, respectively. This charge mechanism appears to hold generally for Si/SiO{sub 2}/Al{sub 2}O{sub 3} stacks as similar results were observed for SiO{sub 2} films prepared by various techniques.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗

Thickness and ordering temperature of surface NiO/Ni systems

We estimate the thickness and ordering temperature of an antiferromagnetic and passivation surface oxide through exchange bias coupling. The surface NiO, which is generated through the exposure of a Ni/Cu(001) surface to oxygen, is taken as a model system on which to perform the estimation. Since no exchange bias is found in the surface NiO/Ni/Cu(001), we have built a sandwich structure of NiO/n ML Ni/10 ML Co/Cu(001) to measure the n dependence of exchange bias. With n ⩽ 2, a large exchange bias field is found above 300 K, which could be due to the direct contact between the oxides and the Co layer. With 3 ⩽ n ⩽ 6, a smaller exchange bias field is found with a blocking temperature of 190 K. This implies that the thickness of NiO is, at most, 3 ML. Discovering the thickness and ordering temperature of the surface NiO provides us to explore the potential applications by using surface NiO.

36 MATERIALS SCIENCE↗

A study on the evolution of dielectric function of ZnO thin films with decreasing film thickness

Dielectric function, band gap, and exciton binding energies of ultrathin ZnO films as a function of film thickness have been obtained with spectroscopic ellipsometry. As the film thickness decreases, both real (ε{sub 1}) and imaginary (ε{sub 2}) parts of the dielectric function decrease significantly, and ε{sub 2} shows a blue shift. The film thickness dependence of the dielectric function is shown related to the changes in the interband absorption, discrete-exciton absorption, and continuum-exciton absorption, which can be attributed to the quantum confinement effect on both the band gap and exciton binding energies.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗

The effect of mix on capsule yields as a function of shell thickness and gas fill

An investigation of direct drive capsules with different shell thicknesses and gas fills was conducted to examine the amount of shock induced (Richtmyer-Meshkov) mix versus Rayleigh-Taylor mix from deceleration of the implosion. The RAGE (Eulerian) code with a turbulent mix model was used to model these capsules for neutron yields along with time-dependent mix amounts. The amount of Richtmyer-Meshkov induced mix from the shock breaking out of the shell is about 0.1 μg (0.15 μm of shell material), while the Rayleigh-Taylor mix is of order 1 μg and determines the mixed simulation yield. The simulations were able to calculate a yield over mix (YOM) ratio (experiment/mix simulation) between 0.5 and 1.0 for capsules with shell thicknesses ranging from 7.5 to 20 μm and with gas fills between 3.8 and 20 atm of D{sub 2} or DT. The simulated burn averaged T{sub ion} values typically lie with 0.5 keV of the data, which is within the measurement error. For capsules with shell thicknesses >25 μm, the YOM values drop to 0.10 ± 0.05, suggesting that some unmodeled effect needs to be accounted for in the thickest capsules.

70 PLASMA PHYSICS AND FUSION TECHNOLOGY↗

The influence of the AlN barrier thickness on the polarization Coulomb field scattering in AlN/GaN heterostructure field-effect transistors

The electron mobility scattering mechanisms in AlN/GaN heterostuctures with 3 nm and 6 nm AlN barrier thicknesses were investigated by temperature-dependent Hall measurements. The effect of interface roughness (IFR) scattering on the electron mobility was found to be enhanced by increasing AlN barrier thickness. Moreover, using the measured capacitance-voltage and current-voltage characteristics of the fabricated heterostructure field-effect transistors (HFETs) with different Schottky areas on the two heterostuctures, the variations of electron mobility with different gate biases were investigated. Due to enhanced IFR scattering, the influence of polarization Coulomb field (PCF) scattering on electron mobility was found to decrease with increasing AlN barrier layer thickness. However, the PCF scattering remained an important scattering mechanism in the AlN/GaN HFETs.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗

Evaluation of thickness and strain of thin planar layers of InAs on GaAs(001) using spectroscopic ellipsometry

We develop a technique for accurately measuring thickness of planar InAs films grown on (001) GaAs by spectroscopic ellipsometry, using bulk optical constants. We observe that the critical point structure for the E{sub 1} and E{sub 1} + Δ{sub 1} transitions extracted from the measured dielectric properties varies with strain in the layer. Transmission electron microscopy confirms the extracted thickness and measures the residual strain based on the dislocation spacing in the film. At small thickness, the E{sub 1} critical point is seen to markedly deviate from the dependence predicted by deformation potential theory and appears to be consistent with additional quantum confinement effects.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗

Realistic reflectance spectrum of thin films covering a transparent optically thick substrate

A spectrophotometric strategy is presented and discussed for calculating realistically the reflectance spectrum of an absorbing film deposited over a thick transparent or semi-transparent substrate. The developed route exploits simple mathematics, has wide range of applicability (high-to-weak absorption regions and thick-to-ultrathin films), rules out numerical and curve-fitting procedures as well as model-functions, inherently accounts for the non-measurable contribution of the film-substrate interface as well as substrate backside, and describes the film reflectance spectrum as determined by the experimental situation (deposition approach and parameters). The reliability of the method is tested on films of a well-known material (indium tin oxide) by deliberately changing film thickness and structural quality through doping. Results are found consistent with usual information yielded by reflectance, its inherent relationship with scattering processes and contributions to the measured total reflectance.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗

Tuning the thickness of electrochemically grafted layers in large area molecular junctions

We have investigated the thickness, the surface roughness, and the transport properties of oligo(1-(2-bisthienyl)benzene) (BTB) thin films grafted on evaporated Au electrodes, thanks to a diazonium-based electro-reduction process. The thickness of the organic film is tuned by varying the number of electrochemical cycles during the growth process. Atomic force microscopy measurements reveal the evolution of the thickness in the range of 2–27 nm. Its variation displays a linear dependence with the number of cycles followed by a saturation attributed to the insulating behavior of the organic films. Both ultrathin (2 nm) and thin (12 and 27 nm) large area BTB-based junctions have then been fabricated using standard CMOS processes and finally electrically characterized. The electronic responses are fully consistent with a tunneling barrier in case of ultrathin BTB film whereas a pronounced rectifying behavior is reported for thicker molecular films.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗

Engineering 180° ferroelectric domains in epitaxial PbTiO{sub 3} thin films by varying the thickness of the underlying (La,Sr)MnO{sub 3} layer

Epitaxial ferroelectric thin films of PbTiO{sub 3} (PTO) grown on top of nominally La{sub 0.7}Sr{sub 0.3}MnO{sub 3} (LSMO) submicron hillocks on Nb-doped SrTiO{sub 3} (100) substrate were investigated by means of scanning transmission electron microscopy. 180° ferroelectric domains were observed in the c-axis oriented PTO films. The formation and configuration of ferroelectric domains and domain walls were found to exhibit strong correlation with the thickness of the underlying LSMO hillocks. The domain walls start at the locations of the hillocks where the LSMO layer has a thickness of about 3 nm. Our results demonstrate that controlling the thickness variation (shape) of the LSMO hillocks can manipulate the position and density of the ferroelectric domain walls, which are considered to be the active elements for future nanoelectronics.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗

Thickness controlled sol-gel silica films for plasmonic bio-sensing devices

Plasmonics has recently received considerable interest due to its potentiality in many fields as well as in nanobio-technology applications. In this regard, various strategies are required for modifying the surfaces of plasmonic nanostructures and to control their optical properties in view of interesting application such as bio-sensing, We report a simple method for depositing silica layers of controlled thickness on planar plasmonic structures. Tetraethoxysilane (TEOS) was used as silica precursor. The control of the silica layer thickness was obtained by optimizing the sol-gel method and dip-coating technique, in particular by properly tuning different parameters such as pH, solvent concentration, and withdrawal speed. The resulting films were characterized via atomic force microscopy (AFM), Fourier-transform (FT) spectroscopy, and spectroscopic ellipsometry (SE). Furthermore, by performing the analysis of surface plasmon resonances before and after the coating of the nanostructures, it was observed that the position of the resonance structures could be properly shifted by finely controlling the silica layer thickness. The effect of silica coating was assessed also in view of sensing applications, due to important advantages, such as surface protection of the plasmonic structure.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗

High-power low-droop violet semipolar (303{sup ¯}1{sup ¯}) InGaN/GaN light-emitting diodes with thick active layer design

Devices grown on nonpolar and semipolar planes of GaN offer key performance advantages over devices grown on the conventional c-plane, including reduced polarization fields. This allows for a wider design space on semipolar planes for light emitting diodes (LEDs) to address the problem of efficiency droop at high current densities. LED structures with very thick (10–100 nm) InGaN single-quantum-well/double heterostructure active regions were grown using conventional metal organic chemical vapor deposition on semipolar (303{sup ¯}1{sup ¯}) free-standing GaN substrates and processed and packaged using conventional techniques. Simulated band diagrams showed reduced polarization fields on the (303{sup ¯}1{sup ¯}) plane. The calculated critical thickness for misfit dislocation formation is higher on the (303{sup ¯}1{sup ¯}) plane than on other semipolar planes, such as (202{sup ¯}1{sup ¯}), allowing for thicker active regions than our previous work to further reduce droop. The higher critical thickness was confirmed with defect characterization via cathodoluminescence. A trend is demonstrated in lower efficiency droop for devices with thicker active regions. Thermal droop characteristics of these devices are also presented. These observed results were utilized to demonstrate over 1 W of output power at a current density of 1 kA/cm{sup 2} from a single 0.1 mm{sup 2} LED device.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗

Weakly nonlinear Rayleigh-Taylor instability of a finite-thickness fluid layer

A weakly nonlinear (WN) model has been developed for the Rayleigh-Taylor instability of a finite-thickness incompressible fluid layer (slab). We derive the coupling evolution equations for perturbations on the (upper) “linearly stable” and (lower) “linearly unstable” interfaces of the slab. Expressions of temporal evolutions of the amplitudes of the perturbation first three harmonics on the upper and lower interfaces are obtained. The classical feedthrough (interface coupling) solution obtained by Taylor [Proc. R. Soc. London A 201, 192 (1950)] is readily recovered by the first-order results. Our third-order model can depict the WN perturbation growth and the saturation of linear (exponential) growth of the perturbation fundamental mode on both interfaces. The dependence of the WN perturbation growth and the slab distortion on the normalized layer thickness (kd) is analytically investigated via the third-order solutions. Comparison is made with Jacobs-Catton's formula [J. W. Jacobs and I. Catton, J. Fluid Mech. 187, 329 (1988)] of the position of the “linearly unstable” interface. Using a reduced formula, the saturation amplitude of linear growth of the perturbation fundamental mode is studied. It is found that the finite-thickness effects play a dominant role in the WN evolution of the slab, especially when kd < 1. Thus, it should be included in applications where the interface coupling effects are important, such as inertial confinement fusion implosions and supernova explosions.

70 PLASMA PHYSICS AND FUSION TECHNOLOGY↗

Cathode fall thickness of abnormal glow discharges between parallel-plane electrodes in different radii at low pressure

In order to investigate the influence of electrode radius on the characteristics of cathode fall thickness, experiments of low-pressure (20 Pa ≤ p ≤ 30 Pa) abnormal glow discharge were carried out between parallel-plane electrodes in different radii keeping gap distance unchanged. Axial distributions of light intensity were obtained from the discharge images captured using a Charge Coupled Device camera. The assumption that the position of the negative glow peak coincides with the edge of cathode fall layer was verified based on a two-dimensional model, and the cathode fall thicknesses, d{sub c}, were calculated from the axial distributions of light intensity. It was observed that the position of peak emission shifts closer to the cathode as current or pressure grows. The dependence of cathode fall thickness on the gas pressure and normalized current J/p{sup 2} was presented, and it was found that for discharges between electrodes in large radius the curves of pd{sub c} against J/p{sup 2} were superimposed on each other, however, this phenomenon will not hold for discharges between the smaller electrodes. The reason for this phenomenon is that the transverse diffusions of charged particles are not the same in two gaps between electrodes with different radii.

70 PLASMA PHYSICS AND FUSION TECHNOLOGY↗

Correlation between Pd metal thickness and thermally stable perpendicular magnetic anisotropy features in [Co/Pd]{sub n} multilayers at annealing temperatures up to 500 °C

We examine highly stable perpendicular magnetic anisotropy (PMA) features of [Co/Pd]{sub 10} multilayers (MLs) versus Pd thickness at various ex-situ annealing temperatures. Thermally stable PMA characteristics were observed up to 500 °C, confirming the suitability of these systems for industrial applications at this temperature. Experimental observations suggest that the choice of equivalent Co and Pd layer thicknesses in a ML configuration ensures thermally stable PMA features, even at higher annealing temperatures. X-ray diffraction patterns and cross-sectional transmission electron microscopy images were obtained to determine thickness, post-annealing PMA behavior, and to explore the structural features that govern these findings.

36 MATERIALS SCIENCE↗

Metal thickness dependence on spin wave propagation in magnonic crystal using yttrium iron garnet

Magnonic crystals (MCs) are key components for spin wave manipulation. MCs realized with periodically metallized surfaces have an advantage in ease of the fabrication, but the effect of the metal thickness has not been studied well. In this work, the metal thickness dependence on the transmission spectra of localized mode spin waves was investigated. The metal thickness over half of the skin depth was necessary to prevent strong attenuation of spin waves.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗

LaAlO{sub 3} thickness window for electronically controlled magnetism at LaAlO{sub 3}/SrTiO{sub 3} heterointerfaces

Complex-oxide heterostructures exhibit rich physical behavior such as emergent conductivity, superconductivity, and magnetism that are intriguing for scientific reasons as well as for potential technological applications. It was recently discovered that in-plane magnetism at the LaAlO{sub 3}/SrTiO{sub 3} (LAO/STO) interface can be electronically controlled at room temperature. Here, we employ magnetic force microscopy to investigate electronically controlled ferromagnetism at the LAO/STO interface with LAO thickness t varied from 4 unit cell (u.c.) to 40 u.c. Magnetic signatures are observed only within a thickness window 8 u.c. ≤ t ≤ 25 u.c. Within this window, the device capacitance corresponds well to the expected geometric value, while for thicknesses outside this window, the capacitance is strongly suppressed. The ability to modulate electronic and magnetic properties of LAO/STO devices depends on the ability to control carrier density, which is in turn constrained by intrinsic tunneling mechanisms.

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗

Dynamic atomic layer epitaxy of InN on/in +c-GaN matrix: Effect of “In+N” coverage and capping timing by GaN layer on effective InN thickness

The growth front in the self-organizing and self-limiting epitaxy of ∼1 monolayer (ML)-thick InN wells on/in +c-GaN matrix by molecular beam epitaxy (MBE) has been studied in detail, with special attention given to the behavior and role of the N atoms. The growth temperatures of interest are above 600 °C, far higher than the typical upper critical temperature of 500 °C in MBE. It was confirmed that 2 ML-thick InN wells can be frozen/inserted in GaN matrix at 620 °C, but it was found that N atoms at the growth front tend to selectively re-evaporate more quickly than In atoms at temperatures higher than 650 °C. As a result, the effective thickness of inserted InN wells in the GaN matrix at 660–670 °C were basically 1 ML or sub-ML, even though they were capped by a GaN barrier at the time of 2 ML “In+N” coverage. Furthermore, it was found that the N atoms located below In atoms in the dynamic atomic layer epitaxy growth front had remarkably weaker bonding to the +c-GaN surface.

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗

The effect of oxide shell thickness on the structural, electronic, and optical properties of Si-SiO{sub 2} core-shell nano-crystals: A (time dependent)density functional theory study

Due to their tunable properties, silicon nano-crystals (NC) are currently being investigated. Quantum confinement can generally be employed for size-dependent band-gap tuning at dimensions smaller than the Bohr radius (∼5 nm for silicon). At the nano-meter scale, however, increased surface-to-volume ratio makes the surface effects dominant. Specifically, in Si-SiO{sub 2} core-shell semiconductor NCs the interfacial transition layer causes peculiar electronic and optical properties, because of the co-existence of intermediate oxidation states of silicon (Si{sup n+}, n = 0–4). Due to the presence of the many factors involved, a comprehensive understanding of the optical properties of these NCs has not yet been achieved. In this work, Si-SiO{sub 2} NCs with a diameter of 1.1 nm and covered by amorphous oxide shells with thicknesses between 2.5 and 4.75 Å are comprehensively studied, employing density functional theory calculations. It is shown that with increased oxide shell thickness, the low-energy part of the optical transition spectrum of the NC is red shifted and attenuated. Moreover, the absorption coefficient is increased in the high-energy part of the spectrum which corresponds to SiO{sub 2} transitions. Structural examinations indicate a larger compressive stress on the central silicon cluster with a thicker oxide shell. Examination of the local density of states reveals the migration of frontier molecular orbitals from the oxide shell into the silicon core with the increase of silica shell thickness. The optical and electrical properties are explained through the analysis of the density of states and the spatial distribution of silicon sub-oxide species.

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗