Metal-oxide semiconductor stability studies - Capacitance-voltage measurements Final report
Electrophysical instabilities of metal oxide semiconductors determined by capacitance-voltage curve analysis
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Electrophysical instabilities of metal oxide semiconductors determined by capacitance-voltage curve analysis
Simultaneous fabrication of enhancement mode metal oxide semiconductor transistors in epitaxial material
Electron-phonon interaction in III to V semiconductors and temperature dependence of attenuation in quartz and tourmaline
Semiconductor injection laser for continuous operation at room temperature in visible wavelength range
Semiconductor radiation damage from high-energy electron and proton radiation
Absorption spectra of boron thin films and studies of structure of semiconductor thin films
Preparation of silicon wafer surface before photoresist application to improve resist adhesion - High resolution photoengraving for semiconductor devices
Radiation effect on recombination luminescence and tunneling in semiconductors
Manufacture of lithium-drifted silicon surface- barrier semiconductor counters
Transducer techniques for generating acoustic waves evaluated in study of electron-phonon interactions in semiconductors
Photoengraving process for semiconductor devices
Atomic scattering contribution to pulse height defect and energy dispersion of heavy ions in semiconductor detectors
Equivalent circuit evaluation of theoretical potential and limitations of millimeter wave semiconductor diode detectors, mixers and frequency multipliers
Schroedinger equation in semiconductor with N atoms containing dislocation, vacancy or other defect, noting phase shift and local charge neutrality
Electrostatic field gradient effect in semiconductors with diffused impurities investigated, using basic diffusion theory
Dangling bonds and dislocations in semiconductors, noting existence of core charge dependent localized state in gap caused by local decrease in atom density
Preparation of lithium-drifted semiconductor nuclear particle detectors
High reliability screening of semiconductor and integrated circuit devices