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At least 613 records · Page 34

Nearly hyperuniform, nonhyperuniform, and antihyperuniform density fluctuations in two-dimensional transition metal dichalcogenides with defects

Hyperuniform many-body systems in d-dimensional Euclidean space R d are characterized by completely suppressed (normalized) infinite-wavelength density fluctuations, and appear to be endowed with novel exotic physical properties. Recently, hyperuniform systems of disordered varieties have been observed in the context of various atomic-scale two-dimensional (2D) materials. Here, we analyze the effects of localized defects on the density fluctuations across length scales and on the hyperuniformity property of experimental samples of two-dimensional transition metal dichalcogenides. In particular, we extract atomic coordinates from time series annular dark field-scanning transmission electron microscopy (ADF-STEM) imaging data of 2D tungsten chalcogenides with the 2H structure (Te-doped 2H-WSe 2 ) showing continuous development and evolution of electron-beam induced defects, and construct the corresponding chemical-bonding informed coordination networks between the atoms. We then compute a variety of pair statistics and bond-orientational statistics to characterize the samples. At low defect concentrations, the corresponding materials are nearly hyperuniform, characterized by significantly suppressed scattering at the zero wave-number limit (omitting forward/ballistic scattering). As more defects are introduced, the (approximate) hyperuniformity of the materials is gradually destroyed, and the system becomes non-hyperuniform even when the material still contains a significant amount of crystalline regions. At high defect concentrations, the structures become antihyperuniform with diverging (normalized) large-scale density fluctuations, mimicking those typically observed at the thermal critical points associated with phase transitions. Overall, the defected materials possess varying degrees of orientation order, and there is apparently no intermediate hexatic phase emerging. To understand the observed nearly hyperuniform density fluctuations in the slightly defected materials, we construct a minimalist structural model and demonstrate that the experimental samples can be essentially viewed as perturbed honeycomb crystals with small correlated displacements and double chalcogen vacancies. Moreover, the small correlated displacements alone can significantly degrade hyperuniformity of the perfect honeycomb structure. Therefore, even a small amount of vacancies, when coupled with correlated displacements, can completely destroy hyperuniformity of the system.

77 NANOSCIENCE AND NANOTECHNOLOGY↗

Ab initio phonon point defect scattering and thermal transport in graphene

Here, we study the scattering of phonons from point defects and their effect on lattice thermal conductivity κ using a parameter-free ab initio Green's function methodology. Specifically, we focus on the scattering of phonons by boron (B), nitrogen (N), and phosphorus substitutions as well as single- and double-carbon vacancies in graphene. We show that changes of the atomic structure and harmonic interatomic force constants locally near defects govern the strength and frequency trends of the scattering of out-of-plane acoustic (ZA) phonons, the dominant heat carriers in graphene. ZA scattering rates due to N substitutions are nearly an order of magnitude smaller than those for B defects despite having similar mass perturbations. Furthermore, ZA phonon scattering rates from N defects decrease with increasing frequency in the lower-frequency spectrum in stark contrast to expected trends from simple models. ZA phonon-vacancy scattering rates are found to have a significantly softer frequency dependence (~ω 0 ) in graphene than typically employed in phenomenological models. The rigorous Green's function calculations demonstrate that typical mass-defect models do not adequately describe ZA phonon-defect scattering rates. Our ab initio calculations capture well the trend of κ vs vacancy density from experiments, though not the magnitudes. In conclusion, this work elucidates important insights into phonon-defect scattering and thermal transport in graphene, and demonstrates the applicability of first-principles methods toward describing these properties in imperfect materials.

36 MATERIALS SCIENCE↗

Fundamental Resolution of Difficulties in the Theory of Charged Point Defects in Semiconductors

A defect’s formation energy is a key theoretical quantity that allows the calculation of equilibrium defect concentrations in solids and aids in the identification of defects that control the properties of materials and device performance, efficiency, and reliability. The theory of formation energies is rigorous only for neutral defects, yet the Coulomb potentials of charged defects require additional ad hoc numerical procedures. In this report, we invoke statistical mechanics to derive a revised theory of charged-defect formation energies, which eliminates the need for ad hoc numerical procedures. Calculations become straightforward and transparent. We introduce calculations demonstrating the significance of the revised theory for defect formation energies and thermodynamic transition levels.

36 MATERIALS SCIENCE↗

Fundamental Principles for Calculating Charged Defect Ionization Energies in Ultrathin Two-Dimensional Materials

Defects in two-dimensional (2D) materials are becoming prominent candidates for quantum emitters and scalable optoelectronic applications. However, several physical properties that characterize their behavior, such as charged defect ionization energies, are difficult to simulate with conventional first-principles methods, mainly because of the weak and anisotropic dielectric screening caused by the reduced dimensionality. We establish fundamental principles for accurate and efficient calculations of charged defect ionization energies and electronic structure in ultrathin 2D materials. We propose to use the vacuum level as the reference for defect charge transition levels (CTLs) because it gives robust results insensitive to the level of theory, unlike commonly used band-edge positions. Furthermore, we determine the fraction of Fock exchange in hybrid functionals for accurate band gaps and band-edge positions of 2D materials by enforcing the generalized Koopmans’ condition of localized defect states. We found that the obtained fractions of Fock exchange vary significantly from 0.2 for bulk hexagonal boron nitride (h-BN) to 0.4 for monolayer h-BN, whose band gaps are also in good agreement with experimental results and calculated GW results. The combination of these methods allows for the reliable and efficient prediction of defect ionization energies (the difference between CTLs and band-edge positions). We motivate and generalize these findings with several examples including different defects in monolayer to few-layer h-BN, monolayer MoS 2 , and graphane. Lastly, we show that increasing the number of layers of h-BN systematically lowers defectionization energies, mainly through CTLs shifting towards vacuum, with conduction band minima kept almost unchanged.

36 MATERIALS SCIENCE↗

Defect energetics of cubic hafnia from quantum Monte Carlo simulations

Cubic hafnia (HfO 2 ) is of great interest for a number of applications in electronics because of its high dielectric constant. However, common defects in such applications degrade the properties of hafina. We have investigated the electronic properties of oxygen vacancies and nitrogen substitution in cubic HfO 2 using first-principles calculations based on density functional theory (DFT) and many-body diffusion Monte Carlo (DMC) methods. We investigate five different charge defect states of oxygen vacancies, as well as substitutional N defects which can lead to local magnetic moments. Both DMC and DFT calculations shows that an oxygen vacancy induces strong lattice relaxations around the defect. Finally, we compare defect formation energies, charge and spin densities obtained from DMC with results obtained using DFT. While the obtained formation energies from DMC are 0.6–1.5 eV larger than those from GGA+ U , the agreement for the most important defects, neutral and positively charged oxygen vacancies, and nitrogen substitutional defect, under oxygen-poor conditions are in reasonably good agreement. Lastly, our work confirms that nitrogen can act to passivate cubic hafnia for applications in electronics.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗

Point defects in CdTe and CdSeTe alloy: a first principles investigation with DFT+U

CdTe and its alloy CdSeTe are widely used in optoelectronic devices, such as radiation detectors and solar cells, due to their superior electrical properties. However, the formation of defects and defect complexes in these materials can significantly affect their performance. As a result, understanding the defect formation and recombination processes in CdTe and CdSeTe alloy is of great importance. In recent years, density functional theory (DFT) calculations have emerged as a powerful tool for investigating the properties of defects in semiconductors. In this paper, we use DFT+U calculations to comprehensively study the properties of intrinsic defects as well as extrinsic defects induced by commonly used dopants, such as Cu and group V elements, in CdTe and CdSeTe alloy. This work provides insights into the effects of these defects on the electrical and optical properties of the material.

14 SOLAR ENERGY↗

Defect-induced displacement of topological surface state in quantum magnet MnBi2Te4

The topological magnet MnBi2⁢Te4 (MBT), with gapped topological surface state, is an attractive platform for realizing quantum anomalous Hall and axion insulator states. However, the experimentally observed surface state gaps fail to meet theoretical predictions, although the exact mechanism behind the gap suppression has been debated. Recent theoretical studies suggest that intrinsic antisite defects push the topological surface state away from the MBT surface, closing its gap and making it less accessible to scanning probe experiments. Here, we report on the local effect of defects on the MBT surface states and demonstrate that high defect concentrations lead to a displacement of the surface states well into the MBT crystal, validating the theorized mechanism. The local and global influence of antisite defects on the topological surface states are studied with samples of varying defect densities by combining scanning tunneling microscopy, angle-resolved photoemission spectroscopy, and density functional theory. Our findings identify a combination of increased defect density and reduced defect spacing as the primary factors underlying the displacement of the surface states and suppression of surface gap, guiding further development of topological quantum materials.

Lupke, Felix [Carnegie Mellon University (CMU)]↗

Analytical (S)TEM Studies of Defects Associated with PID in Stressed Si PV Modules

We report the results of analytical transmission electron microscopy studies of defects associated with potentialinduced degradation (PID) of a laboratory stressed multicrystalline silicon mini-module. Shunt defects were first identified using dark lock in thermography (DLIT) and scanning electron microscopy (SEM) electron beam induced current (EBIC) imaging. Transmission electron microscopy (TEM) crosssection samples were then prepared of selected shunt defects using conventional focused ion beam (FIB) lift out techniques and examined by TEM and scanning transmission electron microscopy (STEM). The defects were identified as {111} planar defects and compositional mapping of the defects revealed elevated levels of both Na, expected from previous work, and also surprisingly O at some of the defect cores.

14 SOLAR ENERGY↗

Tellurium Secondary-Phase Defects in CdZnTe and their Association With the 1.1-eV Deep Trap

Defects located at the EC - 1.1 (eV) level, which are electro-optically active deep traps, generally have been overlooked since their presence cannot be detected except for those in highly resistive CdTe compounds. The origin of this trap is still debated on whether it is from Te vacancies or from dislocations induced by secondary phase defects in Te. We have grown high-resistivity Te-rich CZT ingots to clarify the origin of the 1.1 eV defects and to analyze the defect levels in the CZT samples by current deep level transient spectroscopy (I-DLTS)and photoluminescence (PL). From the analysis, defect levels such as shallow acceptor/donor, A-centers, Cd vacancies and Te antisite appeared to be in both high and low concentrations of Te inclusions, but the level of 1.1-eV defects exhibited dependence on the density of Te inclusion in the CZT samples. We also evaluated the effect of the 1.1-eV deep-level defects on the detector's performance in point view of carrier trapping and de-trapping.

36 MATERIALS SCIENCE↗

Two-step annealing to remove Te secondary-phase defects in CdZnTe while preserving the high electrical resistivity

We report the presence of Te secondary-phase defects (i.e., Te inclusions and Te precipitates) is a major factor limiting the performance of CdZnTe (CZT) X- and gamma-ray radiation detectors. We find that Te secondary-phase defects in CZT crystals can be removed through post-growth, two-step annealing without creating new trapping centers (i.e., prismatic punching defects). Two-step annealing (with the first in a Cd pressure and the second one in a Te pressure) was demonstrated to be effective in removing the Te secondary-phase defects, while preserving the electrical resistivity of the CZT detector. The first step involves annealing of semi-insulating CZT under a Cd overpressure at 700/600 °C (CZT/Cd) for 24 hours, which completely eliminated the Te-rich secondary-phase defects (Te inclusions). However, it resulted in a lower resistivity of the samples (down to 2 × 10 4-6 Ω·cm). A subsequent annealing step involves processing CZT under a Te ambient condition at 540/380 °C (CZT/Te) for 120 hours, which restored the crystal’s resistivity to 6.4 × 10 10 Ω·cm without creating new Te secondary-phase defects. However, Te inclusions reappeared in the case of unnecessarily long Te ambient annealing. Finally, pulse height spectra taken with the two-step annealed CZT detectors showed improved detector performance due to a reduced concentration and size of Te secondary-phase defects.

36 MATERIALS SCIENCE↗

Probabilistic distributions of pinhole defects in atomic layer deposited films on polymeric substrates

Pinhole defects in atomic layer deposition (ALD) coatings were measured in an area of 30 cm{sup 2} in an ALD reactor, and these defects were represented by a probabilistic cluster model instead of a single defect density value with number of defects over area. With the probabilistic cluster model, the pinhole defects were simulated over a manufacturing scale surface area of ∼1 m{sup 2}. Large-area pinhole defect simulations were used to develop an improved and enhanced design method for ALD-based devices. A flexible thermal ground plane (FTGP) device requiring ALD hermetic coatings was used as an example. Using a single defect density value, it was determined that for an application with operation temperatures higher than 60 °C, the FTGP device would not be possible. The new probabilistic cluster model shows that up to 40.3% of the FTGP would be acceptable. With this new approach the manufacturing yield of ALD-enabled or other thin film based devices with different design configurations can be determined. It is important to guide process optimization and control and design for manufacturability.

42 ENGINEERING↗

Defects in SiC for Quantum Computing

Many novel materials are being actively considered for quantum information science and for realizing high-performance qubit operation at room temperature. It is known that deep defects in wide-band gap semiconductors can have spin states and long coherence times suitable for qubit operation. We theoretically investigate from ab-initio density functional theory (DFT) that the defect states in the hexagonal silicon carbide (4H-SiC) are potential qubit materials. The DFT supercell calculations were performed with the local-orbital and pseudopotential methods including hybrid exchange-correlation functionals. Di-vacancies in SiC supercells yielded defect levels in the gap consisting of closely spaced doublet just above the valence band edge, and higher levels in the band gap. The divacancy with a spin state of 1 is charge neutral. Furthermore, the divacancy is characterized by C-dangling bonds and a Si-dangling bonds. Jahn-teller distortions and formation energies as a function of the Fermi level and single photon interactions with these defect levels will be discussed. In contrast, the anti-site defects where C, Si are interchanged have high formation energies of 5.4 eV and have just a single shallow defect level close to the valence band edge, with no spin. We will compare results including the defect levels from both the electronic structure approaches.

36 MATERIALS SCIENCE↗

Finding the perfect imperfection: Accelerated, computationally driven discovery and design of quantum defects

Optically addressable spin defects have emerged as the leading platforms for quantum sensing and communication in solid-state systems. While traditional efforts have concentrated on a focused set of well-studied defects, recent advances in high-throughput computational methods have shown promise for large-scale exploration of defects across diverse semiconductor hosts. By cataloging key properties of quantum defects in computational databases, high-throughput screening techniques can systematically suggest and design novel candidates. In this article, we highlight recent advances in data-driven quantum defect design aimed at addressing critical materials science challenges such as host materials selection, defect stability, and desirable electronic and optical properties. Here, we emphasize the importance of electronic-structure-guided searches across various materials and illustrate how high-throughput computations contribute to our understanding of design principles for quantum defects. Additionally, we outline ongoing challenges and emerging opportunities in this rapidly developing field.

Xiong, Yihuang [Dartmouth College, Hanover, NH (Un↗

Evaluation of Advanced Signal Processing Techniques to Improve Detection and Identification of Embedded Defects

By the end of 1996, 109 Nuclear Power Plants were operating in the United States, producing 22% of the Nation’s electricity [1]. At present, more than two thirds of these power plants are more than 40 years old. The purpose of the U.S. Department of Energy Office of Nuclear Energy’s Light Water Reactor Sustainability (LWRS) Program is to develop technologies and other solutions that can improve the reliability, sustain the safety, and extend the operating lifetimes of nuclear power plants (NPPs) beyond 60 years [2]. The most important safety structures in an NPP are constructed of concrete. The structures generally do not allow for destructive evaluation and access is limited to one side of the concrete element. Therefore, there is a need for techniques and technologies that can assess the internal health of complex, reinforced concrete structures nondestructively. Previously, we documented the challenges associated with Non-Destructive Evaluation (NDE) of thick, reinforced concrete sections and prioritized conceptual designs of specimens that could be fabricated to represent NPP concrete structures [3]. Consequently, a 7 feet tall, by 7 feet wide, by 3 feet and 4-inch-thick concrete specimen was constructed with 2.257-inch-and 1-inch-diameter rebar every 6 to 12 inches. In addition, defects were embedded the specimen to assess the performance of existing and future NDE techniques. The defects were designed to give a mix of realistic and controlled defects for assessment of the necessary measures needed to overcome the challenges with more heavily reinforced concrete structures. Information on the embedded defects is documented in [4]. We also documented the superiority of Frequency Banded Decomposition (FBD) Synthetic Aperture Focusing Technique (SAFT) over conventional SAFT when probing defects under deep concrete cover. Improvements include seeing an intensity corresponding to a defect that is either not visible at all in regular, full frequency content SAFT, or an improvement in contrast over conventional SAFT reconstructed images. This report documents our efforts in four fronts: 1) Comparative study between traditional SAFT and FBD SAFT for concrete specimen with and without Alkali-Silica Reaction (ASR) damage, 2) improvement of our Model-Based Iterative Reconstruction (MBIR) for thick reinforced concrete [5], 3) development of a universal framework for sharing, reconstruction, and visualization of ultrasound NDE datasets, and 4) application of machine learning techniques for automated detection of ASR inside concrete. Our comparative study between FBD and traditional SAFT reconstruction images shows a clear difference between images of ASR and non-ASR specimens. In particular, the left first harmonic shows an increased contrast and sensitivity to ASR damage. For MBIR, we show the superiority of model-based techniques over delay and sum techniques such as SAFT. Improvements include elimination of artifacts caused by direct arrival signals, and increased contrast and Signal to Noise Ratio. For the universal framework, we document a format for data storage based on the HDF5 file format, and also propose a modular Graphic User Interface (GUI) for easy customization of data conversion, reconstruction, and visualization routines. Finally, two techniques for ASR automated detection are presented. The first technique is based on an analysis of the frequency content using Hilbert Transform Indicator (HTI) and the second technique employees Artificial Neural Network (ANN) techniques for training and classification of ultrasound data as ASR or non-ASR damaged classes. The ANN technique shows great potential with classification accuracy above 95%. These approaches are extensible to the detection of additional reinforced, thick concrete defects and damage.

11 NUCLEAR FUEL CYCLE AND FUEL MATERIALS↗

Compact Models for Defect Diffusivity in Semiconductor Alloys.

Predicting transient effects caused by short - pulse neutron irradiation of electronic devices is an important part of Sandia's mission. For example , predicting the diffusion of radiation - induced point defects is needed with in Sandia's Qualification Alternative to the Sandia Pulsed Reactor (QASPR) pro gram since defect diffusion mediates transient gain recovery in QASPR electronic devices. Recently, the semiconductors used to fabricate radiation - hard electronic devices have begun to shift from silicon to III - V compounds such as GaAs, InAs , GaP and InP . An advantage of this shift is that it allows engineers to optimize the radiation hardness of electronic devices by using alloy s such as InGaAs and InGaP . However, the computer codes currently being used to simulate transient radiation effects in QASP R devices will need to be modified since they presume that defect properties (charge states, energy levels, and diffusivities) in these alloys do not change with time. This is not realistic since the energy and properties of a defect depend on the types of atoms near it and , therefore, on its location in the alloy. In particular, radiation - induced defects are created at nearly random locations in an alloy and the distribution of their local environments - and thus their energies and properties - evolves with time as the defects diffuse through the alloy . To incorporate these consequential effects into computer codes used to simulate transient radiation effects, we have developed procedures to accurately compute the time dependence of defect energies and properties and then formulate them within compact models that can be employed in these computer codes. In this document, we demonstrate these procedures for the case of the highly mobile P interstitial (I P ) in an InGaP alloy. Further dissemination only as authorized to U.S. Government agencies and their contractors; other requests shall be approved by the originating facility or higher DOE programmatic authority.

36 MATERIALS SCIENCE↗

LDRD Report : Analysis of Defect Clustering in Semiconductors using Kinetic Monte Carlo Methods

The transient degradation of semiconductor device performance under irradiation has long been an issue of concern. Neutron irradiation can instigate the formation of quasi-stable defect structures, thereby introducing new energy levels into the bandgap that alter carrier lifetimes and give rise to such phenomena as gain degradation in bipolar junction transistors. Typically, the initial defect formation phase is followed by a recovery phase in which defect-defect or defect-dopant interactions modify the characteristics of the damaged structure. A kinetic Monte Carlo (KMC) code has been developed to model both thermal and carrier injection annealing of initial defect structures in semiconductor materials. Following the development of a set of verification tests, the code is employed to investigate annealing in electron-irradiated, p-type silicon as well as the recovery of base current in silicon transistors bombarded with neutrons at the Los Alamos LANSCE "Blue Room" facility. The results reveal that KMC calculations agree well with experiment once adjustments are made to significant defect parameters within the appropriate uncertainty bounds.

36 MATERIALS SCIENCE↗

Confirmatory Defect Analyses of AGR-5/6/7 Fuel

The Advanced Gas Reactor (AGR) Fuel Development and Qualification Program has executed a series of experiments to test and qualify tristructural isotropic (TRISO) particle fuels for use in high-temperature gas-cooled reactors. The most recent irradiation experiments, AGR-5/6/7, are testing fuel that was fabricated in near production-scale equipment. There are three important defect fractions that must be characterized, using a deconsolidation-leach-burn-leach (DLBL) method, to better predict and understand fuel performance during irradiation. These are the dispersed uranium fraction (DUF), exposed kernel fraction (EKF), and silicon carbide defect fraction (SDF). The DLBL characterization data from analyses of the four compact batches, fabricated and characterized by the BWX Technologies Nuclear Operations Group (BWXT-NOG), showed unexpectedly higher values for all three defect fractions relative to the parent TRISO particle defect fractions. The DUF and SDF should not have changed significantly during compact fabrication and the apparent increase in the EKF, a metric for particle damage, was higher than anticipated for the compacts with 40% volumetric packing fraction (PF). Analytical results showed no net increase in the EKF for the 25% PF compacts. Compacts from one compact batch of each packing fraction were sent to Oak Ridge National Laboratory (ORNL), along with uncompacted tristructural isotropic (TRISO) particles, overcoated to a thickness targeting a 40% PF, for confirmatory analyses of the defect fractions and determination of the source(s) of damage. The ORNL results did not confirm the BWXT-NOG results for either the DUF or the SDF; the ORNL results showed no significant change in these defect fractions relative to the parent TRISO particle lot. The ORNL results did, however, confirm that a large increase in the exposed kernel fraction was found in the 40% PF compacts and that the 25% PF compacts sustained little if any damage. Data suggest that a large majority of the mechanical damage to the TRISO particles occurred in the overcoater when targeting the 40% PF. The analytical laboratories at both BWXT-NOG and ORNL had inconsistent outcomes on analyses of individual batches. Although the ORNL data is more consistent with the parent TRISO lot and expectations, the data set is too limited in size to justifiably reject suspect data from either laboratory at this time. It is recommended that an additional analysis be done to provide sufficient data for estimating the true defect fractions for interpreting the radionuclide release data during the AGR-5/6/7 irradiation experiments.

11 NUCLEAR FUEL CYCLE AND FUEL MATERIALS↗

Defect Kinetics and Control for Module Reliability

Potential induced degradation is currently one of the most important module degradation mechanisms. It has been suggested that stacking faults decorated with sodium from the module glass are responsible for this effect and authors have also shown the reversibility of this effect upon reverse biasing of the module. The importance of sodium in the failure mechanism is clear, however, little is known regarding the factors that control its diffusion into the wafer, making it nearly impossible to predict the performance of a given module and engineer it to be better. Sodium migration from module glass into silicon cells and the resulting module degradation is a clear example of how defect kinetics can determine overall module performance and long-term reliability. To the detriment of the industry and its bankability, no quantitative models yet exist to predict defect-assisted module degradation, limiting the progress in improving reliability. In particular, the understanding of defect behavior under high electric fields, under stresses imparted by encapsulation or temperature, and under real operating conditions over long periods of time is a crucial gap in the current state-of-the-art. In this work we developed a Defect-Device-Degradation model to predict defect behavior and its impact on device performance over the module operational lifetime using experimentally-determined defect parameterizations. The validated model will provide a platform for manufacturing process optimization across input materials and architectures to avoid deleterious defects upstream and enable enhanced module robustness.

36 MATERIALS SCIENCE↗