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All sourcesNASA NTRSDOE OSTI
NASA NTRSDate not supplied

Evaluation of Automotive Grade Resistors for Space Flight

Over the past decade, electronic, electrical, and electromechanical (EEE) parts for space applications have undergone significant changes, largely driven by CubeSat and commercial space developers pushing the boundaries on the utilization of commercial parts in space. Global product shortages and shipping delays are still impacting space flight project deadlines. Many projects have turned to automotive grade resistors as an alternate to their MIL-SPEC counterparts to fulfill requirements. In addition, automotive grade resistors may offer designers a wider range of parts to consider. A recent NASA study recommended the use of high-volume manufactured commercial components for space applications provided these components show evidence of stringent fabrication controls and thorough reliability monitoring practices [1]. Automotive grade components have stringent qualification requirements per the Automotive Electronic Council (AEC). However, the end user usually does not have insight into the practices the manufacturer may use to reduce/eliminate infant mortality nor for compliance to all datasheet specifications. Screening, Life and Accelerated Life testing on a set of standard automotive-grade chip resistors is proposed to evaluate the reliability of these components. Requirements from both the AEC-Q (Automotive Electronic Council Qualification) and EEE-INST-002 (Instructions for EEE Parts Selection, Screening, Qualification, and Derating) for resistors is compared and discussed. The resistors have been tested by using a modified methodology from EEE-INST-002 to evaluate their reliability for space flight projects. The findings of this study indicate that the underlying degradation mechanisms at rated temperature and power are best represented by power law models with a fitted exponent between 0 and 1. A linear model is more conservative which compensates for potential model uncertainty given the wide range of design and materials used in automotive resistors, while still providing useful long-term resistance drift estimates. No electrical anomalies or failures were observed throughout the 1,000-hour Life Tests other than small in tolerance resistance drift aging. Degradation models were utilized to quantify and extrapolate the long-term resistance drift under operating conditions for the components. The models demonstrated that some automotive-grade resistors are likely to operate 10 years at nominal usage conditions while others might fail earlier.

Zainab Abdullahi↗
NASA NTRSDate not supplied

Evaluation of Automotive Grade Resistors for Space Flight

Over the past decade, electronic, electrical, and electromechanical (EEE) parts for space applications have undergone significant changes, largely driven by CubeSat and commercial space developers pushing the boundaries on the utilization of commercial parts in space. Global product shortages and shipping delays are still impacting space flight project deadlines. Many projects have turned to automotive grade resistors as an alternate to their MILSPEC counterparts to fulfill requirements. In addition, automotive grade resistors may offer designers a wider range of parts to consider. A recent NASA study recommended the use of high-volume manufactured commercial components for space applications provided these components show evidence of stringent fabrication controls and thorough reliability monitoring practices. Automotive grade components have stringent qualification requirements per the Automotive Electronic Council (AEC). However, the end user usually does not have insight into the practices the manufacturer may use to reduce/eliminate infant mortality nor for compliance to all datasheet specifications. Screening, Life and Accelerated Life testing on a set of standard automotive-grade chip resistors is proposed to evaluate the reliability of these components. Requirements from both the AEC-Q (Automotive Electronic Council Qualification) and EEE-INST-002 (Instructions for EEE Parts Selection, Screening, Qualification, and Derating) for resistors is compared and discussed. The resistors have been tested by using a modified methodology from EEEINST-002 to evaluate their reliability for space flight projects. The findings of this study indicate that the underlying degradation mechanisms at rated temperature and power are best represented by power law models with a fitted exponent between 0 and 1. A linear model is more conservative which compensates for potential model uncertainty given the wide range of design and materials used in automotive resistors, while still providing useful long-term resistance drift estimates. No electrical anomalies or failures were observed throughout the 1000-hour Life Tests other than small in tolerance resistance drift aging. Degradation models were utilized to quantify and extrapolate the long-term resistance drift under operating conditions for the components. The models demonstrated that some automotive-grade resistors are likely to operate 10 years at nominal usage conditions while others might fail earlier.

Zainab Abdullahi↗
NASA NTRS2011

Pulsed Laser System to Simulate Effects of Cosmic Rays in Semiconductor Devices

Spaceflight system electronic devices must survive a wide range of radiation environments with various particle types including energetic protons, electrons, gamma rays, x-rays, and heavy ions. High-energy charged particles such as heavy ions can pass straight through a semiconductor material and interact with a charge-sensitive region, generating a significant amount of charge (electron-hole pairs) along their tracks. These excess charges can damage the device, and the response can range from temporary perturbations to permanent changes in the state or performance. These phenomena are called single event effects (SEE). Before application in flight systems, electronic parts need to be qualified and tested for performance and radiation sensitivity. Typically, their susceptibility to SEE is tested by exposure to an ion beam from a particle accelerator. At such facilities, the device under test (DUT) is irradiated with large beams so there is no fine resolution to investigate particular regions of sensitivity on the parts. While it is the most reliable approach for radiation qualification, these evaluations are time consuming and costly. There is always a need for new cost-efficient strategies to complement accelerator testing: pulsed lasers provide such a solution. Pulsed laser light can be utilized to simulate heavy ion effects with the advantage of being able to localize the sensitive region of an integrated circuit. Generally, a focused laser beam of approximately picosecond pulse duration is used to generate carrier density in the semiconductor device. During irradiation, the laser pulse is absorbed by the electronic medium with a wavelength selected accordingly by the user, and the laser energy can ionize and simulate SEE as would occur in space. With a tightly focused near infrared (NIR) laser beam, the beam waist of about a micrometer can be achieved, and additional scanning techniques are able to yield submicron resolution. This feature allows mapping of all of the sensitive regions of the studied device with fine resolution, unlike heavy ion experiments. The problematic regions can be precisely identified, and it provides a considerable amount of information about the circuit. In addition, the system allows flexibility for testing the device in different configurations in situ.

Aveline, David C.↗
NASA NTRS1986

Accelerating Corrosion in Solar-Cell Tests

In simple electrochemical cell, two silicon solar cells serve as anode and cathode, respectively. Electrolytic medium and voltage between them accelerate corrosion and migration interactions between cell metal contacts and plastic encapsulant. Degradation of metal contacts becomes evident in few hours. Although developed specifically for cells with Ti/Pd/Ag contacts, technique readily adapted to other metal combinations.

Shalaby, H. M.↗
NASA NTRS2001

Improving the Total Impulse Capability of the NSTAR Ion Thruster With Thick-Accelerator-Grid Ion Optics

The results of performance tests with thick-accelerator-grid (TAG) ion optics are presented. TAG ion optics utilize a 50 percent thicker accelerator grid to double ion optics' service life. NSTAR ion optics were also tested to provide a baseline performance for comparison. Impingement-limited total voltages for the TAG ion optics were only 0 to 15 V higher than those of the NSTAR ion optics. Electron backstreaming limits for the TAG ion optics were 3 to 9 V higher than those for the NSTAR optics due to the increased accelerator grid thickness for the TAG ion optics. Screen grid ion transparencies for the TAG ion optics were only about 2 percent lower than those for the NSTAR optics, reflecting the lower physical screen grid open area fraction of the TAG ion optics. Accelerator currents for the TAG ion optics were 19 to 43 percent greater than those for the NSTAR ion optics due, in part, to a sudden increase in accelerator current during TAG ion optics' performance tests for unknown reasons and to the lower-than-nominal accelerator aperture diameters. Beam divergence half-angles that enclosed 95 percent of the total beam current and beam divergence thrust correction factors for the TAG ion optics were within 2 degrees and 1 percent, respectively, of those for the NSTAR ion optics.

Soulas, George C.↗
NASA NTRS1972

An analysis of the relaxation of laminar boundary layer on a flat plate after passage of an interface with application to expansion-tube flows

The relaxation of the accelerating-gas boundary layer to the test-gas boundary layer over a flat plate in an expansion tube is analyzed. Several combinations of test gas and acceleration gas are considered. The problem is treated in two conically similar limits: (1) when the time lag between the arrival of the shock and the interface at the leading edge of the plate is very large, and (2) when this lag is negligible. The time-dependent laminar-boundary-layer equations of a binary mixture of perfect gases are taken as the flow-governing equations. This coupled set of differential equations, written in terms of the Lam-Crocco variables, has been solved by a line-relaxation finite-difference techniques. The results presented include the Stanton number and the local skin-friction coefficient as functions of shock Mach number and the nondimensional distance-time variable. The results indicate that more than 95 percent of the test-gas boundary layer exists over a length, measured from the leading edge of the plate, equal to about three-tenths of the distance traversed by the interface in the free stream.

Gupta, R. N.↗
NASA NTRS2005

Force Limited Vibration Testing

This slide presentation reviews the concept and applications of Force Limited Vibration Testing. The goal of vibration testing of aerospace hardware is to identify problems that would result in flight failures. The commonly used aerospace vibration tests uses artificially high shaker forces and responses at the resonance frequencies of the test item. It has become common to limit the acceleration responses in the test to those predicted for the flight. This requires an analysis of the acceleration response, and requires placing accelerometers on the test item. With the advent of piezoelectric gages it has become possible to improve vibration testing. The basic equations have are reviewed. Force limits are analogous and complementary to the acceleration specifications used in conventional vibration testing. Just as the acceleration specification is the frequency spectrum envelope of the in-flight acceleration at the interface between the test item and flight mounting structure, the force limit is the envelope of the in-flight force at the interface . In force limited vibration tests, both the acceleration and force specifications are needed, and the force specification is generally based on and proportional to the acceleration specification. Therefore, force limiting does not compensate for errors in the development of the acceleration specification, e.g., too much conservatism or the lack thereof. These errors will carry over into the force specification. Since in-flight vibratory force data are scarce, force limits are often derived from coupled system analyses and impedance information obtained from measurements or finite element models (FEM). Fortunately, data on the interface forces between systems and components are now available from system acoustic and vibration tests of development test models and from a few flight experiments. Semi-empirical methods of predicting force limits are currently being developed on the basis of the limited flight and system test data. A simple two degree of freedom system is shown and the governing equations for basic force limiting results for this system are reviewed. The design and results of the shuttle vibration forces (SVF) experiments are reviewed. The Advanced Composition Explorer (ACE) also was used to validate force limiting. Test instrumentation and supporting equipment are reviewed including piezo-electric force transducers, signal processing and conditioning systems, test fixtures, and vibration controller systems. Several examples of force limited vibration testing are presented with some results.

random vibration testing↗
NASA NTRS1992

Perturbation of a normal shock - A test case for unsteady Euler codes

Shock tracking capabilities of modern nonoscillatory schemes for solving the Euler equations are studied by comparing their solutions to solutions obtained using the method of characteristics on two test problems. Both test problems involve accelerating and decelerating shock motions. The schemes tested include first order upwind, second order SONIC-A, third order ENO, and third order TONIC-A. Results show that the second and higher order schemes give nearly identical shock trajectories that are closer to the characteristic solution than the first order upwind scheme. All schemes approach the characteristic solution upon mesh refinement.

Suresh, Ambady↗
NASA NTRS1976

System tests with electric thruster beam and accelerator directly powered from laboratory solar arrays

Laboratory high voltage solar arrays were operated directly connected to power the beam and accelerator loads of an 8-centimeter ion thruster. The beam array comprised conventional 2 by 2 centimeter solar cells; the accelerator array comprised multiple junction edge-illuminated solar cells. Conventional laboratory power supplies powered the thruster's other loads. Tests were made to evaluate thruster performance and to investigate possible electrical interactions between the solar arrays and the thruster. Thruster performance was the same as with conventional laboratory beam and accelerator power supplies. Most of the thruster beam short circuits that occurred during solar array operation were cleared spontaneously without automatic or manual intervention. No spontaneous clearing occurred during conventional power supply operation.

Stover, J. B.↗
NASA NTRS2020

Comparing Cumulative Flight Thermal Fatigue to Ground Test Results for Memory Components on the Mars Curiosity Rover

This paper explores the methods used to examine Mars Curiosity Rover’s flight temperature data to the Package Qualification and Verification (PQV) accelerated thermal cycle life test data in response to flight anomalies. The redundant Rover Compute Element (RCE-A, B) has experienced an inability to mount the flash memory several times. The leading cause of these anomalies is likely the loss of electrical connectivity, which is theorized to be due to cracks on the memory component solder joints by thermal cycle fatigue. To investigate this theory, the number of thermal cycles accumulated in flight was compared to PQV accelerated thermal cycle life test data. The goal of this study was to inform mission operations of the risk associated with thermal cycling damage on the RCE. However, since the RCE-B does not have continuous temperature data from the Platinum Resistance Thermometer (PRT) closest to the flash memory, a model was made to correlate continuous data from two other nearby sensors on the RCE-B to the noncontiguous sensor. Using the Rainflow Counting Algorithm, the reconstituted data was converted into the number of equivalent thermal cycles. The Coffin-Manson Equation was used to compare flight thermal cycles to the PQV test. The accelerated life test showed cracking on the memory component solder joints after 500 cycles of 80°C temperature excursions. This study found that the RCE-A and RCE-B have undergone an equivalent of 144 and 430 cycles of 80°C temperature excursions during flight, respectively.

Berger, Lindsey N↗
NASA NTRS1992

Ion engine endurance testing at high background pressures

Ion engine endurance testing at vacuum chamber pressures in the low 10 exp -3 Pa range is enabled through the use of a three-grid accelerator system with the decelerator grid biased 50 to 100 volts negative of neutralizer cathode potential. The negative decelerator grid serves to collect the facility induced charge exchange ion current which normally results in rapid erosion of the accelerator grid during testing at elevated vacuum chamber pressures. This screen, accelerator, negative decelerator (SAND) grid configuration enables an order of magnitude reduction in vacuum chamber pumping speeds relative to that required for endurance testing of ion engines with conventional two-grid accelerator systems. A 900-hr test of a 30-cm diameter engine at 6.5 kW and a tank pressure of 3.7 x 10 exp -3 Pa was performed to test the feasibility of the three-grid SAND accelerator system technology. Grid erosion rates from this test are compared to those from a 200-hr test performed with the same discharge chamber, in the same test facility, and at the same background pressure with a conventional two grid accelerator system. The SAND optics resulted in greater than a factor of 100 reduction in accelerator grid erosion rate relative to the two-grid system.

Brophy, John R.↗
NASA NTRS2021

Comparing Cumulative Flight Thermal Fatigue to Ground Test Results for Memory Components on the Mars Curiosity Rover

This paper explores the methods used to examine Mars Curiosity Rover’s flight temperature data in relation to the Package Qualification and Verification (PQV) accelerated thermal cycle life test data in response to flight anomalies. The redundant Rover Compute Element (RCE-A, B) has experienced an inability to mount the flash memory several times. The leading cause of these anomalies is likely the loss of electrical connectivity, which is theorized to be due to cracks on the memory component solder joints by thermal cycle fatigue. To investigate this theory, the number of thermal cycles accumulated in flight was compared to PQV accelerated thermal cycle life test data. The goal of this study was to inform mission operations of the risk associated with thermal cycling damage on the RCE. However, since the RCE-B does not have continuous temperature data from the Platinum Resistance Thermometer (PRT) closest to the flash memory, a model was made to correlate continuous data from two other nearby sensors on the RCE-B to the noncontiguous sensor. Using the Rainflow Counting Algorithm, the reconstituted data was converted into the number of equivalent thermal cycles. The Coffin-Manson Equation was used to compare flight thermal cycles to the PQV test. The accelerated life test showed cracking on the memory component solder joints after 500 cycles of 80°C temperature excursions. This study found that the RCE-A and RCE-B have undergone an equivalent of 144 and 430 cycles of 80°C temperature excursions during flight, respectively.

Bell, Charles↗
NASA NTRS2012

Prognostics Approach for Power MOSFET Under Thermal-Stress

The prognostic technique for a power MOSFET presented in this paper is based on accelerated aging of MOSFET IRF520Npbf in a TO-220 package. The methodology utilizes thermal and power cycling to accelerate the life of the devices. The major failure mechanism for the stress conditions is dieattachment degradation, typical for discrete devices with leadfree solder die attachment. It has been determined that dieattach degradation results in an increase in ON-state resistance due to its dependence on junction temperature. Increasing resistance, thus, can be used as a precursor of failure for the die-attach failure mechanism under thermal stress. A feature based on normalized ON-resistance is computed from in-situ measurements of the electro-thermal response. An Extended Kalman filter is used as a model-based prognostics techniques based on the Bayesian tracking framework. The proposed prognostics technique reports on preliminary work that serves as a case study on the prediction of remaining life of power MOSFETs and builds upon the work presented in [1]. The algorithm considered in this study had been used as prognostics algorithm in different applications and is regarded as suitable candidate for component level prognostics. This work attempts to further the validation of such algorithm by presenting it with real degradation data including measurements from real sensors, which include all the complications (noise, bias, etc.) that are regularly not captured on simulated degradation data. The algorithm is developed and tested on the accelerated aging test timescale. In real world operation, the timescale of the degradation process and therefore the RUL predictions will be considerable larger. It is hypothesized that even though the timescale will be larger, it remains constant through the degradation process and the algorithm and model would still apply under the slower degradation process. By using accelerated aging data with actual device measurements and real sensors (no simulated behavior), we are attempting to assess how such algorithm behaves under realistic conditions.

Power MOSFET PHM↗
NASA NTRS2012

Performance and Environmental Test Results of the High Voltage Hall Accelerator Engineering Development Unit

NASA Science Mission Directorate's In-Space Propulsion Technology Program is sponsoring the development of a 3.5 kW-class engineering development unit Hall thruster for implementation in NASA science and exploration missions. NASA Glenn and Aerojet are developing a high fidelity high voltage Hall accelerator that can achieve specific impulse magnitudes greater than 2,700 seconds and xenon throughput capability in excess of 300 kilograms. Performance, plume mappings, thermal characterization, and vibration tests of the high voltage Hall accelerator engineering development unit have been performed. Performance test results indicated that at 3.9 kW the thruster achieved a total thrust efficiency and specific impulse of 58%, and 2,700 sec, respectively. Thermal characterization tests indicated that the thruster component temperatures were within the prescribed material maximum operating temperature limits during full power thruster operation. Finally, thruster vibration tests indicated that the thruster survived the 3-axes qualification full-level random vibration test series. Pre and post-vibration test performance mappings indicated almost identical thruster performance. Finally, an update on the development progress of a power processing unit and a xenon feed system is provided.

Kamhawi, Hani↗
NASA NTRS1977

Baseline tests of the power-train electric delivery van

Vehicle maximum speed, range at constant speed, range over stop-and-go driving schedules, maximum acceleration, gradeability, gradeability limit, road energy consumption, road power, indicated energy consumption, braking capability, battery charger efficiency, and battery characteristics were determined for a modified utility van powered by sixteen 6-volt batteries connected in series. A chopper controller actuated by a foot accelerator pedal changes the voltage applied to the 22-kilowatt (30-hp) series-wound drive motor. In addition to the conventional hydraulic braking system, the vehicle has hydraulic regenerative braking. Cycle tests and acceleration tests were conducted with and without hydraulic regeneration.

Lumannick, S.↗
NASA NTRS2014

Time-Dependent Behavior of High-Strength Kevlar and Vectran Webbing

High-strength Kevlar and Vectran webbings are currently being used by both NASA and industry as the primary load-bearing structure in inflatable space habitation modules. The time-dependent behavior of high-strength webbing architectures is a vital area of research that is providing critical material data to guide a more robust design process for this class of structures. This paper details the results of a series of time-dependent tests on 1-inch wide webbing including an initial set of comparative tests between specimens that underwent realtime and accelerated creep at 65 and 70% of their ultimate tensile strength. Variability in the ultimate tensile strength of the webbings is investigated and compared with variability in the creep life response. Additional testing studied the effects of load and displacement rate, specimen length and the time-dependent effects of preconditioning the webbings. The creep test facilities, instrumentation and test procedures are also detailed. The accelerated creep tests display consistently longer times to failure than their real-time counterparts; however, several factors were identified that may contribute to the observed disparity. Test setup and instrumentation, grip type, loading scheme, thermal environment and accelerated test postprocessing along with material variability are among these factors. Their effects are discussed and future work is detailed for the exploration and elimination of some of these factors in order to achieve a higher fidelity comparison.

Jones, Thomas C.↗
NASA NTRS1992

Development of a residual acceleration data reduction and dissemination plan

A major obstacle in evaluating the residual acceleration environment in an orbiting space laboratory is the amount of data collected during a given mission: gigabytes of data will be available as SAMS units begin to fly regularly. Investigators taking advantage of the reduced gravity conditions of space should not be overwhelmed by the accelerometer data which describe these conditions. We are therefore developing a data reduction and analysis plan that will allow principal investigators of low-g experiments to create experiment-specific residual acceleration data bases for post-flight analysis. The basic aspects of the plan can also be used to characterize the acceleration environment of earth orbiting laboratories. Our development of the reduction plan is based on the following program of research: the identification of experiment sensitivities by order of magnitude estimates and numerical modelling; evaluation of various signal processing techniques appropriate for the reduction, supplementation, and dissemination of residual acceleration data; and testing and implementation of the plan on existing acceleration data bases. The orientation of the residual acceleration vector with respect to some set of coordinate axes is important for experiments with known directional sensitivity. Orientation information can be obtained from the evaluation of direction cosines. Fourier analysis is commonly used to transform time history data into the frequency domain. Common spectral representations are the amplitude spectrum which gives the average of the components of the time series at each frequency and the power spectral density which indicates the power or energy present in the series per unit frequency interval. The data reduction and analysis scheme developed involves a two tiered structure to: (1) identify experiment characteristics and mission events that can be used to limit the amount of accelerator data an investigator should be interested in; and (2) process the data in a way that will be meaningful to the experiment objectives. A general outline of the plan is given.

Rogers, Melissa J. B.↗
NASA NTRS2014

Free-Flight Experiments in LISA Pathfinder

The LISA Pathfinder mission will demonstrate the technology of drag-free test masses for use as inertial references in future space-based gravitational wave detectors. To accomplish this, the Pathfinder spacecraft will perform drag-free flight about a test mass while measuring the acceleration of this primary test mass relative to a second reference test mass. Because the reference test mass is contained within the same spacecraft, it is necessary to apply forces on it to maintain its position and attitude relative to the spacecraft. These forces are a potential source of acceleration noise in the LISA Pathfinder system that are not present in the full LISA configuration. While LISA Pathfinder has been designed to meet it's primary mission requirements in the presence of this noise, recent estimates suggest that the on-orbit performance may be limited by this 'suspension noise'. The drift-mode or free-flight experiments provide an opportunity to mitigate this noise source and further characterize the underlying disturbances that are of interest to the designers of LISA-like instruments. This article provides a high-level overview of these experiments and the methods under development to analyze the resulting data.

The technique of drag-free↗