Engineering Papers⌕ Search

SEARCH · Engineering Papers

Results for “electronic materials”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.

At least 559 records · Page 31
All sourcesNASA NTRSDOE OSTI
NASA NTRS1984

Edge Stabilized Ribbon (ESR); Stress, Dislocation Density and Electronic Performance

The edge stabilized ribbon (ESR) silicon ribbon was grown in widths of 1, 2.2 and 4.0 inches at speeds ranging from .6 to 7 in/min, which result in ribbon thicknesses of 5 to 400 microns. One of the primary problems remaining in ESR growth is that of thermally induced mechanical stresses. This problem is manifested as ribbon with a high degree of residual stress or as ribbon with buckled ribbon. Thermal stresses result in a high dislocation density in the grown material, resulting in compromised electronic performance. Improvements in ribbon flatness were accomplished by modification of the ribbon cooling profile. Ribbon flatness and other experimental observations of ESR ribbon are discussed. Laser scanner measurements show a good correlation between diffusion length and dislocation density which indicates that the high dislocation densities are the primary cause of the poor current performance of ESR materials. Dislocation densities were reduced and improved electronic performance resulted. Laser scanner data on new and old material are presented.

Sachs, E. M.↗
NASA NTRS2002

Heterogeneous Distribution of Carbonaceous Material in Murchison Matrix: In Situ Observations Using Energy Filtered Transmission Electron Microscopy

Energy filtered TEM (Transmission Electron Microscopy) has been used to study the location of carbonaceous material in situ in Murchison matrix. Carbon occurs frequently as narrow rims around sulfide grains, but is rare in regions of matrix that are dominated by phyllosilicates. Additional information is contained in the original extended abstract.

Brearley, Adrian J.↗
NASA NTRS1996

Using BEEM To Probe Strains In Semiconductors

Ballistic-electron-emission microscopy (BEEM) useful in determining strains in semiconductors under some conditions. More specifically, BEEM is variant of scanning tunneling microscopy and sensitive to electronic structure of probed material. In present approach, BEEM used to obtain data on those aspects of variations in electronic structures related to variations in strains. Then by use of mathematical modeling of relationships between electronic structures and strains, variations in strains deduced from BEEM data.

Bell, L. Douglas↗
NASA NTRS2003

Attachment of Single-wall Carbon Nanotubes (SWNTs) on Platinum Surfaces by Self-Assembling Techniques

Single-wall carbon nanotubes (SWNTs) are very interesting materials because of their morphology, electronic and mechanical properties. Its morphology (high length-to-diameter ratio) and electronic properties suggest potential application of SWNTs as anode material for lithium ion secondary batteries. The introduction of SWNTs on these types of sources systems will improve their performance, efficiency, and capacity to store energy. A purification method has been applied for the removal of iron and amorphous carbon from the nanotubes. Unpurified and purified SWNTs were characterized by transmission electron microscopy (TEM), and thermogravimetric analysis (TGA). In order to attach carbon nanotubes on platinum electrode surfaces, a self-assembled monolayer (SAM) of 4-aminothiophenol (4-ATP) was deposited over the electrodes. The amino-terminated SAM obtained was characterized by cyclic voltammetry, X-ray photoelectron spectroscopy (XPS), and Fourier-transforms infrared (FTIR) spectroscopy. Carbon nanotubes were deposited over the amino-terminated SAM by an amide bond formed between SAM amino groups and carboxylic acid groups at the open ends of the carbon nanotubes.This deposition was characterized using Raman spectroscopy and Scanning Electron microscopy (SEM).

Rosario-Castro, Belinda I.↗
NASA NTRS1983

Electronic detection of ultra-heavy nuclei by pyroelectric materials

A recent prediction by the authors that pyroelectric materials may be capable of detecting ultra-heavy nuclei has been confirmed. Charge pulse signals from pyroelectric crystals of lithium tantalate exposed to Au ions and a pulsed beam of Ni-58 ions, and from pyroelectric films of polyvinylidene fluoride exposed to a pulsed beam of Ni-58 ions, have been measured using pulse electronics with time constants in the microsecond range. These studies show that pyroelectric materials, in general, are capable of detecting incident nuclei having very high mass and charge. In particular, pyroelectric polymers, such as polyvinylidene fluoride, are readily available as inexpensive flexible films. This new class of charged particle detector could eventually find applications in large-area experiments for detection and trajectory determination of low-energy, ultra-heavy nuclei.

Simpson, J. A.↗
NASA NTRS1984

Effect of reabsorbed recombination radiation on the saturation current of direct gap p-n junctions

The application of the radiative transfer theory for semiconductors to p-n homojunctions subject to low level injection conditions is discussed. By virtue of the interaction of the radiation field with free carriers across the depletion layer, the saturation current density in Shockley's expression for the diode current is reduced at high doping levels. The reduction, due to self-induced photon generation, is noticeable for n-type material owing to the small electron effective mass in direct band-gap III-V compounds. The effect is insignificant in p-type material. At an equilibrium electron concentration of 2 x 10 to the 18th/cu cm in GaAs, a reduction of the saturation current density by 15 percent is predicted. It is concluded that realistic GaAs p-n junctions possess a finite thickness.

Von Roos, O.↗
NASA NTRS2010

High internal free volume compositions for low-k dielectric and other applications

The present invention provides materials, devices, and methods involving new heterocyclic, shape-persistent monomeric units with internal free volume. In some cases, materials the present invention may comprise monomers, oligomers, or polymers that incorporate a heterocyclic, shape-persistent iptycene. The present invention may provide materials having low dielectric constants and improved stability at high operating temperatures due to the electron-poor character of materials. In addition, compositions of the invention may be easily synthesized and readily modified to suit a particular application.

Swager, Timothy M.↗
NASA NTRS1972

Stardust.

Rocket experiments were conducted to collect particles from noctilucent clouds at Kiruna, Sweden. The Pandora II inflight shadowing technique considered by Hallgren and Hemenway (1971) was used in the experiments. This technique makes it possible to study the collected particles as a function of time and altitude intervals. The particles observed consisted of an irregular electron-opaque core surrounded by a rounded, low density material. X-ray and electron opacity data suggest that the abundances of the heavy elements, such as Hf and Ta, in the particles are comparable to those of the light elements, such as Al and Si.

Hemenway, C. L.↗
NASA NTRS1978

Hot forming of silicon sheet, silicon sheet growth development for the large area silicon sheet task of the low cost silicon solar array project

The hot workability of polycrystalline silicon was studied. Uniaxail stress-strain curves are given for strain rates in the range of .0001 to .1/sec and temperatures from 1100 to 1380 C. At the highest strain rates at 1380 C axial strains in excess of 20% were easily obtainable without cracking. After deformations of 36%, recrystallization was completed within 0.1 hr at 1380 C. When the recrystallization was complete, there was still a small volume fraction of unrecyrstallized material which appeared very stable and may degrade the electronic properties of the bulk materials. Texture measurements showed that the as-produced vapor deposited polycrystalline rods have a 110 fiber texture with the 110 direction parallel to the growth direction and no preferred orientation about this axis. Upon axial compression perpendicular to the growth direction, the former 110 fiber axis changed to 111 and the compression axis became 110 . Recrystallization changed the texture to 110 along the former fiber axis and to 100 along the compression axis.

Graham, C. D., Jr.↗
NASA NTRS1999

NASA Tech Briefs, April 1999

Topics include: special coverage sections on automotive technology, and CAM and sections on electronic components and systems, software, materials, machinery/automation, physical sciences, and a special section of Electronic Tech Briefs and Motion Control Tech Briefs.

Source record↗
NASA NTRS1990

Environments stressful to optical materials in low earth orbit

Spacecraft in low earth orbit experience a variety of environments which are potentially damaging to materials and to optical systems including electronic controls and components. The low earth orbit (typically 400 km) has a significantly different set of environments than higher orbits. The environments vary not only with altitude but also with inclination. This paper deals with the environment that the Space Station Freedom will experience and with some of the effects on the materials and electronic components that will comprise the optical systems on the station. Specific optical systems are not addressed but the information presented is general and does apply to optical systems.

Musikant, S.↗
NASA NTRS1985

Angular particle impingement studies of thermoplastic materials at normal incidence

Scanning electron microscope studies were conducted to characterize the erosion resistance of polymethyl methacrylate (PMMA), polycarbonate (PC), polytetrafluorethylene (PTFE), and ultra-high-molecular-weight polyethylene (UHMWPE). Erosion was caused by a jet of angular microparticles of crushed glass at normal incidence. Material built up above the original surface on all of the materials. As erosion progressed, this buildup disappeared. UHMWPE was the most resistant material and PMMA the least. The most favorable properties for high erosion resistance were high values of ultimate elongation, maximum service temperature, and strain energy and a low value of the modulus of elasticity. Erosion-rate-versus-time curves of PC and PTFE exhibited incubation, acceleration, and steady-state periods. PMMA also exhibited a deceleration period, and an incubation period with deposition was observed for UHMWPE.

Rao, P. V.↗