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At least 559 records · Page 31

Hamiltonian simulation in Zeno subspaces

Here, we investigate the quantum Zeno effect as a framework for designing and analyzing quantum algorithms for Hamiltonian simulation. We show that frequent projective measurements of an ancilla qubit register can be used to simulate quantum dynamics on a target qubit register with a circuit complexity similar to randomized approaches. The classical sampling overhead in the latter approaches is traded for ancilla qubit overhead in Zeno-based approaches. A second-order Zeno sequence is developed to improve scaling and implementations through unitary kicks are discussed. We derive rigorous error bounds that allow for identifying the associated circuit complexities for the first- and second-order Zeno sequences. We show that the circuits over the combined register can be identified as a subroutine commonly used in post-Trotter Hamiltonian simulation methods. We build on this observation to reveal connections between different Hamiltonian simulation algorithms.

Hamiltonian simulation↗

Behavioral model simulation studies of an image compressor

The high initial cost of prototype Very Large Scaled Integrated (VLSI) parts requires that sufficient verifications be made to eliminate design errors before actually producing the prototypes. Logic simulation is the means by which the VLSI engineer can ensure that the design will function properly. The computer time required for logic simulation can be reduced through the use of behavioral models. Behavioral models, however, require time to write and verify and they do not always produce a dramatic speed up in logic simulation time. This paper presents a study of behavioral modeling aimed at discovering which circuit types benefit most from the use of behavioral models for logic simulation.

Madani, Navid↗

Noise equivalent circuit of a semiconductor laser diode

A small-signal model of a semiconductor laser is extended to include the effects of intrinsic noise by adding current and voltage noise sources. The current noise source represents the shot noise of carrier recombination, while the voltage noise source represents the random process of simulated emission. The usefulness of the noise equivalent circuit is demonstrated by calculating the modulation and noise characteristics of a current-driven diode as a function of bias current and frequency.

Harder, C.↗

NASA F-106B lightning tests

Lightning simulation ground tests conducted on the NASA F-106B research aircraft to elicit natural strikes are summarized. The purpose of the test program was to measure the response of the aircraft's electromagnetic sensors and interior wire circuits to a controlled ground test environment that simulates the electromagnetic effects of a lightning strike. Both direct attachment and radiated field tests were conducted. In most cases, the aircraft's engine was running and test data were gathered simultaneously from NASA and MCAIR sensors on both the aircraft's own instrumentation system and the remote MCAIR computer-controlled data acquisition system. During the direct attachment tests, the input inductance, output condition (hard-wired or spark gap), and the output location were varied to provide a wide variety of test conditons. The radiated tests to the isolated aircraft were conducted to excite and measure the natural resonances of the F-106B aircraft.

Heady, B. D.↗

LuGo: An enhanced quantum phase estimation implementation

Quantum Phase Estimation (QPE) is a cardinal algorithm in quantum computing that plays a crucial role in various applications, including cryptography, molecular simulation, and solving systems of linear equations. However, the standard implementation of QPE faces challenges related to time complexity and circuit depth, which limit its practicality for large-scale computations. We introduce LuGo, a novel framework designed to enhance the performance of QPE by reducing circuit duplication, as well as using parallelization techniques to achieve faster generation of the QPE circuit and gate reduction. We validate the effectiveness of our framework by generating quantum linear solver circuits, which require both QPE and inverse QPE, to solve linear systems of equations. LuGo achieves significant improvements in both computational efficiency and hardware requirements without compromising on accuracy. Compared to a standard QPE implementation, LuGo reduces time consumption to generate a circuit that solves a 2 6 × 2 6 system matrix by a factor of 50.68 and over 31× reduction of quantum gates and circuit depth, with no fidelity loss on an ideal quantum simulator. Furthermore, we demonstrated the versatility and scalability of LuGo enabled HHL algorithm by simulating a canonical Hele-Shaw fluid problem using a quantum simulator. With these advantages, LuGo paves the way for more efficient implementations of QPE, enabling broader applications across several quantum computing domains.

Quantum algorithm↗

Early results of the ATS-6 solar cell flight experiment

This paper presents preliminary ATS-6 solar-cell flight-experiment data through the first 247 days in synchronous orbit. The experiment is transmitting data on forty 2 x 2-cm solar cells representing 16 solar-cell configurations. The experiment is designed to study the effect of this orbit on select solar cells and cover-glass parameters such as solar-cell thickness and base resistivity, cover-glass thickness variation, new cover processes, and materials such as 7940 and 7070 integral covers as well as the FEP covers, the COMSAT 'violet' cell, and backside irradiation effects. The in-space solar-cell data indicate short-circuit currents are running higher by 1% to 8% than in measurements made with solar simulations; maximum power varied between -1% and +6%. Degradation of short-circuit current due to ultraviolet effects was determined to be about 2% after 50 days in orbit. All cells performed well through 247 days in orbit except the FEP-covered cells, which appear to have increased their rate of degradation during the eclipse season.

Goldhammer, L. J.↗

DC Modeling of 4H-SiC nJFET Gate Length Reduction at 500°C

The development of robust, high-performance integrated circuits (ICs) will enable numerous potential NASA missions of current interest, including long-duration robotic missions exploring the 460°C surface of Venus. Currently, NASA is looking towards SiC-based devices to provide such a solution. However, the current NASA silicon carbide (SiC) JFET device with a channel length of 6 μm (recently fabricated Gen. 11 ICs) limits mission-relevant circuit capabilities. In this study, we combined experiments with simulations to explore two straightforward fabrication strategies (shallow n− and deep n+) to reduce the SiC JFET channel length while maintaining turn-off behavior needed to realize 500 °C circuit operation. First, the material properties for 4H-SiC were implemented in COMSOL and the Poisson equation was solved for twelve 2D device designs. Then, based on the insights gained from the distribution of the electron concentration, electrostatic potential, and electric field for twelve designs (with three fabrication strategies), simulation for a 1 μm gate length nJFET with the turn-off performance comparable to the state-of-the-art.

4H-SiC nJFET↗

DC Modeling of 4H-SiC nJFET Gate Length Reduction at 500°C

The development of robust, high-performance integrated circuits (ICs) will enable numerous potential NASA missions of current interest, including long-duration robotic missions exploring the 460°C surface of Venus. Currently, NASA is looking towards SiC-based devices to provide such a solution. However, the current NASA silicon carbide (SiC) JFET device with a channel length of 6 μm (recently fabricated Gen. 11 ICs) limits mission-relevant circuit capabilities. In this study, we combined experiments with simulations to explore two straightforward fabrication strategies (shallow n− and deep n+) to reduce the SiC JFET channel length while maintaining turn-off behavior needed to realize 500 °C circuit operation. First, the material properties for 4H-SiC were implemented in COMSOL and the Poisson equation was solved for twelve 2D device designs. Then, based on the insights gained from the distribution of the electron concentration, electrostatic potential, and electric field for twelve designs (with three fabrication strategies), simulation for a 1 μm gate length nJFET with the turn-off performance comparable to the state-of-the-art.

4H-SiC nJFET↗

EOS-AM1 Nickel Hydrogen Cell Interim Life Test Report

This paper reports the interim results of the Earth Observing System AM-1 project (EOS-AM-1) nickel hydrogen cell life test being conducted under contract to National Aeronautics and Space Administration (NASA) Goddard Space Flight Center (GSFC) at the Lockheed Martin Missiles and Space (LMMS) facility in East Windsor, NJ; and at COMSAT Labs., Clarksburg, MD. The purpose of the tests is to verify that the EOS-AM-l cell design can meet five years of real-time Low Earth Orbit (LEO) cycling. The tests include both real-time LEO and accelerated stress tests. At LMMS, the first real-time LEO simulated 99 minute orbital cycle started on February 7, 1994 and the test has been running continuously since that time, with 13000 LEO cycles completed as of September 2, 1996. Each cycle consists of a 64 minute charge (VT at 1.507 volts per cell, 1.06 C/D ratio, followed by 0.6 ampere trickle charge) and a 35 minute constant power discharge at 177 watts (22.5% DOD). At COMSAT, the accelerated stress test consists of 90 minute orbital cycles at 60% DOD with a 30 minute discharge at 60 amperes and a 60 minute charge at 40 ampercs (VT at 1.54 volts per cell to 1.09 C/D ratio, followed by 0.6 ampere trickle charge). The real-time LEO life test battery consists of seven, 50AH (nameplate rating) Eagle-Picher, Inc. (EPI) Mantech cells manufactured into three, 3-cell pack assemblies (there are two place holder cells that are not part of the life test electrical circuit). The test pack is configured to simulate the conductive thermal design of the spacecraft battely, including: conductive aluminum sleeves, 3-cell pack aluminum baseplate, and honeycomb panel all mounted to a liquid (-5 C) cold plate. The entire assembly is located in a thermal chamber operating at +3 C. The accelerated stress test unit consists of five cells mounted in machined aluminum test sleeves and is operating at +10 C. The real-time LEO life test battery has met all performance requirements through the first 13,000 cycles, including: end of charge and discharge cell voltages and voltage gradients; end of chalge and discharge cell pressures; within cell and between cell temperature gradients; discharge capacity; current and power levels; and all chalge parameters. The accelerated stress test battely has completed over 5900 cycles as of 9/11/96. This paper reports both battery performances as a function of cycle life, with individual cell performance comparisons repolted for selected cycles in both tests.

Bennett, C. W.↗

EOS--AM1 Nickel Hydrogen Cell Interim Life Test Report

This paper reports the interim results of the Earth Observing System AM-1 project (EOS-AM-1) nickel hydrogen cell life test being conducted under contract to National Aeronautics and Space Administration (NASA) Goddard Space Flight Center (GSFC) at the Lockheed Martin Missiles and Space (LMMS) facility in East Windsor, NJ; and at COMSAT Labs., Clarksburg, MD. The purpose of the tests is to verify that the EOS-AM-1 cell design can meet five years of real-time Low Earth Orbit (LEO) cycling. The tests include both real-time LEO and accelerated stress tests. At LMMS, the first real-time LEO simulated 99 minute orbital cycle started on February 7, 1994 and the test has been running continuously since that time, with 18202 LEO cycles completed as of September 1, 1997. Each cycle consists of a 64 minute charge (VT at 1.507 volts per cell. 1.06 C/D ratio, followed by 0.6 ampere trickle charge) and a 35 minute constant power discharge at 177 watts (22.5% DOD). At COMSAT, the accelerated stress test consists of 90 minute orbital cycles at 60% DOD with a 30 minute discharge at 60 amperes and a 60 minute charge at 40 amperes (VT at 1.54 volts per cell to 1.09 C/D ratio, followed by 0.6 ampere trickle charge). The real-time LEO life test battery consists of seven, 50AH (nameplate rating) Eagle-Picher, Inc. (EPI) Mantech cells manufactured into three. 3-cell pack assemblies (there are two place holder cells that are not part of the life test electrical circuit). The test pack is configured to simulate the conductive thermal design of the spacecraft battery, including: conductive aluminum sleeves, 3-cell pack aluminum baseplate, and honeycomb panel all mounted to a liquid (-5 C) cold plate. The entire assembly is located in a thermal chamber operatina at +30 C. The accelerated stress test unit consists of five cells mounted in machined aluminum test sleeves and is operating at +10 C. The real-time LEO life test battery has met all performance requirements throuch the first 18,202 cycles, including: end of chargee and discharge cell voltages and voltace -radients; end of charge and discharge cell pressures; within cell and between cell temperature gradients; discharge capacity; current and power levels; and all charge parameters. The accelerated stress test battery has completed 11,998 cycles when the test was terminated. The stress test unit met all test parameters. This paper reports battery performances as a function of cycle life for both the real time LEO and the accelerated life test regimes.

Bennett, C. W.↗

EOS-AM1 Nickel Hydrogen Cell

This paper reports the interim results of the Earth Observing System AM-1 project (EOS-AM-1) nickel hydrogen cell life test being conducted under contract to National Aeronautics and Space Administration (NASA) Goddard Space Flight Center (GSFC) at the Lockheed Martin Missile and Space (LMMS) facility in East Windsor, NJ; and at COMSAT Labs., Clarksburg, MD. The purpose of die tests is to verify that the EOS-AM-1 cell design can meet five years of real-time Low Earth Orbit (LEO) cycling. The tests include both real-time LEO and accelerated stress tests. At LMMS, the first real-time LEO simulated 99 minute orbital cycle started on February 7, 1994 and the test has been running continuously since that time, with 18,202 LEO cycles completed as of September 1, 1997. Each cycle consists of a 64 minute charge (VT at 1.507 volts per cell, 1.06 C/D ratio, followed by 0.6 ampere trickle charge) and a 35 minute constant power discharge at 177 watts (22.5% DOD). At COMSAT, the accelerated stress test consists of 90 minute orbital cycles at 60% DOD with a 30 minute discharge at 60 amperes and a 60 minute charge at 40 amperes (VT at 1.54 volts per cell to 1.09 C/D ratio, followed by 0.6 ampere trickle charge). The real-time LEO life test battery consists of seven, 50AH (nameplate rating) Eagle-Picher, Inc. (EPI) Mantech cells manufactured into three, 3-cell pack assemblies (there are two place holder cells that are not part of the life test electrical circuit). The test pack is configured to simulate the conductive thermal design of the spacecraft battery, including: conductive aluminum sleeves, 3-cell pack aluminum baseplate, and honeycomb panel all mounted to a liquid (-5 C) cold plate. The entire assembly is located in a thermal chamber operating at +30 C. The accelerated stress test unit consists of five cells mounted in machined aluminum test sleeves and is operating at +10 C. The real-time LEO life test battery has met all performance requirements through the first 18,202 cycles, including: end of charge mid discharge cell voltages and voltage gradients; end of charge and discharge cell pressures; within cell and between cell temperature gradients; discharge capacity; current and power levels; and all charge parameters. The accelerated stress test battery has completed 11,998 cycles when the test was terminated. The stress test unit met all test parameters. This paper reports battery perfortnances as a funcfion of cycle life for both the real-time LEO and the accelerated life test regimes.

Bennett, Charles W.↗

EOS-AM1 Nickel Hydrogen Cell Interim Life Test Report

This paper reports the interim results Earth Observing System AM-1 project (EOS-AM-1) nickel hydrogen cell life test being conducted under contract to National Aeronautics and Space Administration (NASA) Goddard Space Flight Center (GSFC) at the Lockheed Martin Missiles and Space (LMMS) facility in East Windsor, NJ; and at COMSAT Labs., Clarksburg, MD. The purpose of the tests is to verify that the EOS-AM-1 cell design can meet five years of real-time Low Earth Orbit (LEO) cycling. The tests include both real-time LEO and accelerated stress tests. At LMMS, the first real-time LEO simulated 99 minute orbital cycle started on February 7, 1994 and the test has been running continuously since that time, with 18202 LEO cycles completed as of September 1, 1997. Each cycle consists of a 64-minute charge (VT at 1,507 volts per cell, 1.06 C/D ratio, followed by 0.6 ampere trickle charge) and a 35 minute constant power discharge at 177 watts (22.5 percent DOD). At COMSAT, the accelerated stress test consists of 90 minute orbital cycles at 60 percent DOD with a 30 minute discharge at 60 amperes and a 60 minute charge at 40 amperes (VT at 1.54 volts per cell to 1.90 C/D ratio, followed by 0.6 ampere trickle charge). The real-time LEO life test battery consists of seven, 50AH (nameplate rating) Eagle-Picher, Inc. (EPI) Mantech cells manufactured into three, 3-cell pack assemblies (there are two place holder cells that are not part of the life test electrical circuit). The test pack is configured to simulate the conductive thermal design of the spacecraft battery, including: conductive aluminum sleeves, 3-cell pack aluminum baseplate, and honeycomb panel all mounted to a liquid (minus 5 deg) cold plate. The entire assembly is located in a thermal chamber operating at plus 3 deg. The accelerated stress test unit consists of five cells mounted in machined aluminum test sleeves and is operating at plus 10 deg. The real-time LEO life test battery has met all performance requirements through the first 18,202 cycles, including: end of charge and discharge cell voltages and voltage gradients; end of charge and discharge cells pressures; within cell and between cell temperature gradients dischare capacity; current and power levels; and all charge parameters. The accelerated stress test battery has completed 11998 cycles when the test was terminated. The stress test unit met all test parameters. This paper reports battery performances as a function of cycle life for both the real-time LEO and the accelerated life test regimes.

Bennett, Charles W.↗

Comparison of quantum advantage experiments using random circuit sampling

Random circuit sampling, the task of sampling bit strings from a random unitary operator, has been implemented to demonstrate quantum advantage on the Sycamore quantum processor with 53 qubits and on the Zuchongzhi quantum processor with 56 and 61 qubits. Recently, it was claimed that classical computers using tensor network simulation could catch on to current noisy quantum processors for random circuit sampling. While the linear cross-entropy benchmark fidelity was used to certify all these claims, it may not capture statistical properties of outputs in detail. Here, we compare the bit strings sampled from classical computers using tensor network simulation by Pan et al. [F. Pan, K. Chen, and P. Zhang, Phys. Rev. Lett. 129, 090502 (2022)] and by Kalachev et al. [G. Kalachev, P. Panteleev, P. Zhou, and M.-H. Yung, arXiv:2112.15083] with the bit strings from the Sycamore quantum processor. It is shown that all of Kalachev et al.'s samples passed the NIST random number tests. The heat maps of bit strings show that Pan et al.'s and Kalachev et al.'s samples are quite different from the Sycamore or Zuchongzhi samples. The analysis with the Marchenko-Pastur distribution and the Wasssertein distances demonstrates that Kalachev et al.'s samples are statistically closer to the Sycamore samples than Pan et al.'s while the three datasets have similar values for the linear cross-entropy fidelity. In conclusion, our finding implies that further study is needed to certify or beat the claims of quantum advantage using random circuit sampling.

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗

Variational quantum state preparation for quantum-enhanced metrology in noisy systems

Here, we investigate optimized quantum state preparation for quantum metrology applications in noisy environments. Using the QFI-OPT package, we simulate a low-depth variational quantum circuit (VQC) composed of a sequence of global rotations and entangling operations applied to a chain of qubits that are subject to dephasing noise. The parameters controlling the VQC are numerically optimized to maximize the quantum Fisher information, which characterizes the ultimate metrological sensitivity of a quantum state with respect to a global rotation. We find that, regardless of the details of the entangling operation implemented in the VQC, the optimal quantum states can be broadly classified into a trio of qualitative regimes, i.e., catlike, squeezed like, and product states, associated with different dephasing rates. Our findings are relevant for designing optimal state-preparation strategies for next-generation quantum sensors exploiting entanglement, such as time and frequency standards and magnetometers, aimed at achieving state-of-the-art performance in the presence of noise and decoherence.

quantum Fisher information↗

Multi-Split Variable Refrigerant Flow (VRF) System Building Energy Simulations Using Performance Maps

Multi-split variable refrigerant flow (VRF) systems are highly energy-efficient HVAC (heating, ventilation and air conditioning) technologies that connect a single outdoor unit to multiple independent indoor terminal units using a common refrigerant circuit and a variable-speed compressor. Building energy simulations that incorporate VRF systems help model their unique operational characteristics and predict energy consumption in specific building designs. Traditionally, EnergyPlus models these systems by employing multiple sets of performance curves to characterize both individual terminal units and the outdoor unit. However, producing these curves is labor intensive and error prone, and they often do not capture all the key input and output variables. This paper introduces a novel approach that uses multi-dimensional performance maps to model VRF systems in building environments for space cooling. In this approach, performance maps are developed at the component level—separately for the outdoor unit and for each indoor terminal. The new modeling method is validated within EnergyPlus via a Python plug-in that contains a simple solver loop to coordinate the component-level, indoor, and outdoor unit maps. Furthermore, because performance maps can span more variables than traditional performance curves, they offer the opportunity to implement advanced controls, such as enhanced dehumidification and compressor modulation. A VRF air conditioner’s hardware system was modeled using the DOE/ORNL Heat Pump Design Model, which was automated to produce extensive performance maps for both the indoor and outdoor units.

Shen, Bo [ORNL] (ORCID:0000000336600393)↗

Variational quantum eigensolver with reduced circuit complexity

Abstract The variational quantum eigensolver (VQE) is one of the most promising algorithms to find eigenstates of a given Hamiltonian on noisy intermediate-scale quantum devices (NISQ). The practical realization is limited by the complexity of quantum circuits. Here we present an approach to reduce quantum circuit complexity in VQE for electronic structure calculations. Our ClusterVQE algorithm splits the initial qubit space into clusters which are further distributed on individual (shallower) quantum circuits. The clusters are obtained based on mutual information reflecting maximal entanglement between qubits, whereas inter-cluster correlation is taken into account via a new “dressed” Hamiltonian. ClusterVQE therefore allows exact simulation of the problem by using fewer qubits and shallower circuit depth at the cost of additional classical resources, making it a potential leader for quantum chemistry simulations on NISQ devices. Proof-of-principle demonstrations are presented for several molecular systems based on quantum simulators as well as IBM quantum devices.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗

Modeling from Local to Subsystem Level Effects in Analog and Digital Circuits Due to Space Induced Single Event Transients

Single Event Transients in analog and digital electronics from space generated high energetic nuclear particles can disrupt either temporarily and sometimes permanently the functionality and performance of electronics in space vehicles. This work first provides some insights into the modeling of SET in electronic circuits that can be used in SPICE-like simulators. The work is then directed to present methodologies, one of which was developed by this author, for the assessment of SET at different levels of integration in electronics, from the circuit level to the subsystem level.

State Transistion Model.↗

Architecture for Quantum Time-dependent Circuits (ArQTIC) v1.0

ArQTiC is a domain-specific full-stack software package built for the dynamic simulations of materials on quantum computers. Its main contributions include providing a software library for high-level programming of such simulations on quantum computers, and providing post-processing capabilities that allow users to more efficiently analyze results from the quantum computer. Paired with the power to optimize and execute quantum circuits, ArQTiC opens the field of dynamic materials simulations on quantum computers to a broader community of scientists from a wider range of domain sciences, paving the way for accelerated progress towards physical quantum supremacy.

Bassman, Lindsay↗