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NASA NTRS2003

Preparation of Regular Specimens for Atom Probes

A method of preparation of specimens of non-electropolishable materials for analysis by atom probes is being developed as a superior alternative to a prior method. In comparison with the prior method, the present method involves less processing time. Also, whereas the prior method yields irregularly shaped and sized specimens, the present developmental method offers the potential to prepare specimens of regular shape and size. The prior method is called the method of sharp shards because it involves crushing the material of interest and selecting microscopic sharp shards of the material for use as specimens. Each selected shard is oriented with its sharp tip facing away from the tip of a stainless-steel pin and is glued to the tip of the pin by use of silver epoxy. Then the shard is milled by use of a focused ion beam (FIB) to make the shard very thin (relative to its length) and to make its tip sharp enough for atom-probe analysis. The method of sharp shards is extremely time-consuming because the selection of shards must be performed with the help of a microscope, the shards must be positioned on the pins by use of micromanipulators, and the irregularity of size and shape necessitates many hours of FIB milling to sharpen each shard. In the present method, a flat slab of the material of interest (e.g., a polished sample of rock or a coated semiconductor wafer) is mounted in the sample holder of a dicing saw of the type conventionally used to cut individual integrated circuits out of the wafers on which they are fabricated in batches. A saw blade appropriate to the material of interest is selected. The depth of cut and the distance between successive parallel cuts is made such that what is left after the cuts is a series of thin, parallel ridges on a solid base. Then the workpiece is rotated 90 and the pattern of cuts is repeated, leaving behind a square array of square posts on the solid base. The posts can be made regular, long, and thin, as required for samples for atom-probe analysis. Because of their small volume and regularity, the amount of FIB-milling time can be much less than that of the method of sharp shards. Individual posts can be broken off for mounting in a manner similar to that of the method of sharp shards. Alternatively, the posts can be left intact on the base and the base can be cut to a small square (e.g., 3 by 3 mm) suitable for mounting in an atom probe of a type capable of accepting multiple-tip specimens. The advantage of multiple-tip specimens is the possibility of analyzing many tips without the time-consuming interchange of specimens.

Kuhlman, Kim↗

NASA NTRS1995

Ames Research Center Mars/Pathfinder Heat Shield Design Verification ARC-JET Test

Design verification tests were performed on samples representing the aerobrake of the Mars/Pathfinder vehicle. The test specimens consisted of the SLA-561V ablator bonded to the honeycomb structure. The primary objective was to evaluate the ablation materials performance and to measure temperatures within the ablator, at the structural bondline and at the back sheet of the honeycomb structure. Other objectives were to evaluate the effect of ablative repair plug material treatment and voids in the heat shield. A total of 29 models were provided for testing in the Ames 60MW arc-jet facility. Of these, 23 models were flat-faced and six remaining models were curved edge ones, intended to simulate the conditions on the curved rim of the forebody where the maximum shear occurred. Eight sets of test conditions were used. The stagnation point heating rates varied from 47 to 240 W/cm2 and the stagnation pressures from 0.15 to 0.27 atm. (The maximum flight values are 132 W/cm2 and 0.25 atm) The majority of these runs were made at a nominal stagnation pressure of 0.25 atm. Two higher pressure runs were made to check the current (denser) ablation material for spallation, or other forms of thermal stress failure. Over 60% of the flatfaced models yielded good thermocouple data and all produced useful surface recession information. Of the five curved-edge models that were tested, only one gave good data; the remaining ones experienced model-holder failure. The test results can be summarized by noting that no failure of the ablative material was observed on any model. Also, the bondline temperature design limit of 250 C was never reached within an equivalent flight time despite a stagnation point heat load that exceeded the maximum flight value by up to 130%. At heating rates of over 200W/cm2 and stagnation pressures of 0.25 atm, or greater, the average surface recessions exceeded 0.5 cm on some models. The surface roughness increased dramatically at pressures above 0.25 atm and was four times greater at 0.27 atm than at 0.25 atm. Procured repair plug material performed much better than room-temperature cured plugs, as observed in the previous tests. Voids in the ablator did not increase local temperatures and gaps did not grow during testing.

Tran, Huy K.↗