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All sourcesNASA NTRSDOE OSTI
NASA NTRS2012

Charging of Individual Micron-Size Interstellar/Planetary Dust Grains by Secondary Electron Emissions

Dust grains in various astrophysical environments are generally charged electrostatically by photoelectric emissions with UV/X-ray radiation, as well as by electron/ion impact. Knowledge of physical and optical properties of individual dust grains is required for understanding of the physical and dynamical processes in space environments and the role of dust in formation of stellar and planetary systems. In this paper, we discuss experimental results on dust charging by electron impact, where low energy electrons are scattered or stick to the dust grains, thereby charging the dust grains negatively, and at sufficiently high energies the incident electrons penetrate the grain leading to excitation and emission of electrons referred to as secondary electron emission (SEE). Currently, very limited experimental data are available for charging of individual micron-size dust grains, particularly by low energy electron impact. Available theoretical models based on the Sternglass equation (Sternglass, 1954) are applicable for neutral, planar, and bulk surfaces only. However, charging properties of individual micron-size dust grains are expected to be different from the values measured on bulk materials. Our recent experimental results on individual, positively charged, micron-size lunar dust grains levitated in an electrodynamic balance facility (at NASA-MSFC) indicate that the SEE by electron impact is a complex process. The electron impact may lead to charging or discharging of dust grains depending upon the grain size, surface potential, electron energy, electron flux, grain composition, and configuration (e.g. Abbas et al, 2010). Here we discuss the complex nature of SEE charging properties of individual micron-size lunar dust grains and silica microspheres.

Tankosic, D.↗
NASA NTRS2013

Experimental Investigation of Charging Properties of Interstellar Type Silica Dust Grains by Secondary Electron Emissions

The dust charging by electron impact is an important dust charging processes in astrophysical and planetary environments. Incident low energy electrons are reflected or stick to the grains charging the dust grains negatively. At sufficiently high energies electrons penetrate the grains, leading to excitation and emission of electrons referred to as secondary electron emission (SEE). Available classical theoretical models for calculations of SEE yields are generally applicable for neutral, planar, or bulk surfaces. These models, however, are not valid for calculations of the electron impact charging properties of electrostatically charged micron/submicron-size dust grains in astrophysical environments. Rigorous quantum mechanical models are not yet available, and the SEE yields have to be determined experimentally for development of more accurate models for charging of individual dust grains. At the present time, very limited experimental data are available for charging of individual micron-size dust grains, particularly for low energy electron impact. The experimental results on individual, positively charged, micron-size lunar dust grains levitated carried out by us in a unique facility at NASA-MSFC, based on an electrodynamic balance, indicate that the SEE by electron impact is a complex process. The electron impact may lead to charging or discharging of dust grains depending upon the grain size, surface potential, electron energy, electron flux, grain composition, and configuration (Abbas et al, 2010, 2012). In this paper, we discuss SEE charging properties of individual micron-size silica microspheres that are believed to be analogs of a class of interstellar dust grains. The measurements indicate charging of the 0.2m silica particles when exposed to 25 eV electron beams and discharging when exposed to higher energy electron beams. Relatively large size silica particles (5.2-6.82m) generally discharge to lower equilibrium potentials at both electron energies. These measurements conducted on silica microspheres are qualitatively similar in nature to our previous SEE measurements on lunar Apollo missions dust samples.

Tankosic, D.↗
NASA NTRS1987

Secondary electron generation, emission and transport: Effects on spacecraft charging and NASCAP models

Secondary electrons control a spacecraft's response to a plasma environment. To accurately simulate spacecraft charging, the NASA Charging Analyzer Program (NASCAP) has mathematical models of the generation, emission and transport of secondary electrons. The importance of each of the processes and the physical basis for each of the NASCAP models are discussed. Calculations are presented which show that the NASCAP formulations are in good agreement with both laboratory and space experiments.

Katz, Ira↗
NASA NTRS1974

Secondary electron background produced by heavy nuclei in a multiwire proportional counter hodoscope

The secondary electron background produced by heavy nuclei in a multiwire proportional counter hodoscope is calculated using both a simplified and a more complete Monte Carlo model. These results are compared with experimental data from a small multiwire proportional counter hodoscope operated in a 530 MeV/nucleon accelerator beam of nitrogen nuclei. Estimates of the secondary electron background produced by heavy relativistic nuclei are presented along with the detailed results from calculations of energy deposition in the hodoscope counter cells.

Morgan, S. H., Jr.↗
NASA NTRS1986

Calculation of secondary electron trajectories in multistage depressed collectors for microwave amplifiers

Computational procedures are reported for treating power losses due to secondary electrons in multistage depressed collectors (MDC) for traveling wave tubes (TWT) and other O-type electron tubes. The MDC is modeled with an advanced, multidimensional computer program. Representative beams of secondary electrons are then injected at the points of impact of the primary beams. Separate programs are used to calculate representative beams of high-energy primary electron beams and of low-energy true secondaries. The recomputation of the MDC model including the true secondary beam allows determination of the secondary emission losses, and, if necessary, redesign of the MDC to improve performance. Recomputation of the MDC model including the primary beams is used to check on possible backstreaming from the MDC to the RF interaction structure of the tube. A comparison with experimentally measured values of TWT and MDC efficiencies is made.

Force, Dale A.↗
NASA NTRS1998

Fine Structure in the Secondary Electron Emission Peak for Diamond Crystal with (100) Negative Electron Affinity Surface

A fine structure was discovered in the low-energy peak of the secondary electron emission spectra of the diamond surface with negative electron affinity. We studied this structure for the (100) surface of the natural type-IIb diamond crystal. We have found that the low-energy peak consists of a total of four maxima. The relative energy positions of three of them could be related to the electron energy minima near the bottom of the conduction band. The fourth peak, having the lowest energy, was attributed to the breakup of the bulk exciton at the surface during the process of secondary electron emission.

Asnin, V. M.↗
NASA NTRS1977

Secondary electron emission from a dielectric film subjected to an electric field

An electric field in the range of 0.3,3.3 kV/mm is created normal to a thin film FEP teflon sample which accumulates potential of up to 8.8, 13.7 or 18.3 kV when exposed to an electron beam having energy of 10.0, 15.0 or 20.0 kV, respectively. It is found that the secondary electron emission from the charged sample varies with field. The threshold voltage, at which the secondary electron emission coefficient sigma is unity, drops down from a low field value of 13.73 kV to a high field value of 13.11 kV for a 15.0 kV beam. A computational technique was developed that generates equipotential lines or contours and field vectors above a plane where potential is known. The utilization of conformal transformations allows the extension of the technique to configurations which map into a plane.

Quoc-Nguyen, N.↗
NASA NTRS1985

Calculation of secondary-electron escape currents from inclined-spacecraft surfaces in a magnetic field

In low Earth orbit, the geomagnetic field B(vector) is strong enough that secondary electrons emitted from spacecraft surfaces have an average gyroradius much smaller than typical dimensions of large spacecraft. This implies that escape of secondaries will be strongly inhibited on surfaces which are nearly parallel to B(vector), even if a repelling electric field exists outside them. This effect is likely to make an important contribution to the current balance and hence the equilibrium potential of such surfaces, making high voltage charging of them more likely. Numerically calculated escaping secondary electron fluxes are presented for these conditions. For use in numerical spacecraft charging simulations, an analytic curve fit to these results is given which is accurate to within 3% of the emitted current.

Laframboise, J. G.↗
NASA NTRS1978

Effects of secondary electrons from heavy primary cosmic rays in a MWPC hodoscope

A multi-wire proportional counter hodoscope, efficient for both primary track recovery and reading out all wires set by secondary electrons, was flown in a balloon flight experiment covering the range of cosmic ray charge from 4 to 28 and kinetic energy T greater than 0.5 GeV/nucleon. Data on the secondary electron effects in the hodoscope is presented for primary nuclei between C and Fe and kinetic energies between 0.6 and 7.0 GeV/nucleon. The total number of affected anodes in the hodoscope is seen to increase linearly with the cosmic ray change, with a slope that depends strongly on energy over this limited primary energy range.

Derrickson, J. H.↗
NASA NTRS1998

A Review of the Suppression of Secondary Electron Emission from the Electrodes of Multistage Collectors

A review is presented of more than 20 years of research conducted at NASA Lewis Research Center on the suppression of secondary electron emission (SEE) for the enhancement of the efficiency of vacuum electron devices with multistage depressed collectors. This paper will include a description of measurement techniques, data from measurements of SEE on a variety of materials of engineering interest and methods of surface treatment for the suppression of SEE. In the course of this work the lowest secondary electron yield ever reported was achieved for ion textured graphite, and, in a parallel line of research, the highest yield was obtained for chemical vapor deposited thin diamond films.

Dayton, James A., Jr.↗
DOE OSTI2023

Identifying the secondary electron cutoff in ultraviolet photoemission spectra for work function measurements of non-ideal surfaces

Abstract Absolute values of work functions can be determined in ultraviolet photoemission spectroscopy (UPS) by measuring the minimum kinetic energy of secondary electrons generated by a known photon energy. However, some samples can produce spectra that are difficult to interpret due to additional intensity below the true secondary electron cutoff. Disordered absorbates on elemental metals add small intensity below the onset for the transition metal surfaces studied, which can be attributed to energy losses after photoelectrons are generated. In contrast, spectra from WO 3−x films can produce multiple onsets with comparable intensity which do not fit this model. False onsets (in the context of work function measurements) can be minimized by optimizing experimental detection parameters including limiting analyzer acceptance angles and pass energy. True work functions can be identified by examining the onsets as the sample bias is varied.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗