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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 55 records · Page 3
All sourcesNASA NTRSDOE OSTI
NASA NTRS1985

Fatigue criterion to system design, life and reliability

A generalized methodology to structural life prediction, design, and reliability based upon a fatigue criterion is advanced. The life prediction methodology is based in part on work of W. Weibull and G. Lundberg and A. Palmgren. The approach incorporates the computed life of elemental stress volumes of a complex machine element to predict system life. The results of coupon fatigue testing can be incorporated into the analysis allowing for life prediction and component or structural renewal rates with reasonable statistical certainty.

Zaretsky, E. V.↗
NASA NTRS1985

Fatigue criterion to system design, life and reliability

A generalized methodology to structural life prediction, design, and reliability based upon a fatigue criterion is advanced. The life prediction methodology is based in part on work of Weibull and Lundberg and Palmgren. The approach incorporates the computed life of elemental stress volumes of a complex machine element to predict system life. The results of coupon fatigue testing can be incorporated into the analysis allowing for life prediction and component or structural renewal rates with reasonable statistical certainty.

Zaretsky, E. V.↗
NASA NTRS1973

Modern methodology of designing target reliability into rotating mechanical components

Experimentally determined distributional cycles-to-failure versus maximum alternating nominal strength (S-N) diagrams, and distributional mean nominal strength versus maximum alternating nominal strength (Goodman) diagrams are presented. These distributional S-N and Goodman diagrams are for AISI 4340 steel, R sub c 35/40 hardness, round, cylindrical specimens 0.735 in. in diameter and 6 in. long with a circumferential groove 0.145 in. radius for a theoretical stress concentration = 1.42 and 0.034 in. radius for a stress concentration = 2.34. The specimens are subjected to reversed bending and steady torque in specially built, three complex-fatigue research machines. Based on these results, the effects on the distributional S-N and Goodman diagrams and on service life of superimposing steady torque on reversed bending are established, as well as the effect of various stress concentrations. In addition a computer program for determining the three-parameter Weibull distribution representing the cycles-to-failure data, and two methods for calculating the reliability of components subjected to cumulative fatigue loads are given.

Kececioglu, D. B.↗
NASA NTRS1990

A methodology for evaluating the reliability and risk of structures under complex service environments

The theoretical basis and numerical implementation of NESSUS (Numerical Evaluation of Stochastic Structures Under Stress; Cruse et al., 1988), a computer code for probabilistic structural analyses of aerospace components, are described, with an emphasis on the use of NESSUS for reliability and risk assessment. Topics addressed include the structure of NESSUS, the material-properties model, computational procedures, probabilistic models of fatigue-crack initiation, risk/cost evaluation, fatigue-fracture analyses, and fatigue-crack propagation. Numerical results from typical applications are presented in extensive graphs and briefly characterized; the usefulness of NESSUS predictions for establishing inspection and retirement schedules and for component certification is indicated.

Shiao, Michael C.↗
NASA NTRS1990

A methodology for evaluating the reliability and risk of structures under complex service environments

The theoretical basis and numerical implementation of NESSUS (Numerical Evaluation of Stochastic Structures Under Stress), a computer code for probabilistic structural analysis of aerospace components, are described, with an emphasis on the use of NESSUS for reliability and risk assessment. Topics addressed include the structure of probabilistic models of fatigue-crack initiation, risk/cost evaluation, fatigue-fracture analysis, and fatigue-crack initiation. Numerical results from typical applications are presented in graphs and briefly characterized. The usefulness of NESSUS predictions for establishing inspection and retirement schedules and for component certification is indicated.

Shiao, Michael C.↗
NASA NTRS2010

Scaled CMOS Technology Reliability Users Guide

The desire to assess the reliability of emerging scaled microelectronics technologies through faster reliability trials and more accurate acceleration models is the precursor for further research and experimentation in this relevant field. The effect of semiconductor scaling on microelectronics product reliability is an important aspect to the high reliability application user. From the perspective of a customer or user, who in many cases must deal with very limited, if any, manufacturer's reliability data to assess the product for a highly-reliable application, product-level testing is critical in the characterization and reliability assessment of advanced nanometer semiconductor scaling effects on microelectronics reliability. A methodology on how to accomplish this and techniques for deriving the expected product-level reliability on commercial memory products are provided.Competing mechanism theory and the multiple failure mechanism model are applied to the experimental results of scaled SDRAM products. Accelerated stress testing at multiple conditions is applied at the product level of several scaled memory products to assess the performance degradation and product reliability. Acceleration models are derived for each case. For several scaled SDRAM products, retention time degradation is studied and two distinct soft error populations are observed with each technology generation: early breakdown, characterized by randomly distributed weak bits with Weibull slope (beta)=1, and a main population breakdown with an increasing failure rate. Retention time soft error rates are calculated and a multiple failure mechanism acceleration model with parameters is derived for each technology. Defect densities are calculated and reflect a decreasing trend in the percentage of random defective bits for each successive product generation. A normalized soft error failure rate of the memory data retention time in FIT/Gb and FIT/cm2 for several scaled SDRAM generations is presented revealing a power relationship. General models describing the soft error rates across scaled product generations are presented. The analysis methodology may be applied to other scaled microelectronic products and their key parameters.

Microelectronics Reliability↗
NASA NTRS1975

High order software - A methodology for defining software

Higher order software (HOS) is a formal methodology for reliable systems specification and development. HOS is concerned only with computable functions and their relationships for any given system. Questions of methodology are considered, taking into account aspects of formulation meta-language principles, and HOS analyzers. Details of system design are discussed, giving attention to aspects of immediate self-control and indirect self-control. A description is given of the approaches used for software management.

Hamilton, M.↗
NASA NTRS1984

Reliability and maintainability assessment factors for reliable fault-tolerant systems

A long term goal of the NASA Langley Research Center is the development of a reliability assessment methodology of sufficient power to enable the credible comparison of the stochastic attributes of one ultrareliable system design against others. This methodology, developed over a 10 year period, is a combined analytic and simulative technique. An analytic component is the Computer Aided Reliability Estimation capability, third generation, or simply CARE III. A simulative component is the Gate Logic Software Simulator capability, or GLOSS. The numerous factors that potentially have a degrading effect on system reliability and the ways in which these factors that are peculiar to highly reliable fault tolerant systems are accounted for in credible reliability assessments. Also presented are the modeling difficulties that result from their inclusion and the ways in which CARE III and GLOSS mitigate the intractability of the heretofore unworkable mathematics.

Bavuso, S. J.↗
NASA NTRS1987

Reliability models for Space Station power system

This paper presents a methodology for the reliability evaluation of Space Station power system. The two options considered are the photovoltaic system and the solar dynamic system. Reliability models for both of these options are described along with the methodology for calculating the reliability indices.

Singh, C.↗
NASA NTRS2016

Pitfalls and Precautions When Using Predicted Failure Data for Quantitative Analysis of Safety Risk for Human Rated Launch Vehicles

Launch vehicle reliability analysis is largely dependent upon using predicted failure rates from data sources such as MIL-HDBK-217F. Reliability prediction methodologies based on component data do not take into account risks attributable to manufacturing, assembly, and process controls. These sources often dominate component level reliability or risk of failure probability. While consequences of failure is often understood in assessing risk, using predicted values in a risk model to estimate the probability of occurrence will likely underestimate the risk. Managers and decision makers often use the probability of occurrence in determining whether to accept the risk or require a design modification. Due to the absence of system level test and operational data inherent in aerospace applications, the actual risk threshold for acceptance may not be appropriately characterized for decision making purposes. This paper will establish a method and approach to identify the pitfalls and precautions of accepting risk based solely upon predicted failure data. This approach will provide a set of guidelines that may be useful to arrive at a more realistic quantification of risk prior to acceptance by a program.

Hatfield, Glen S.↗
NASA NTRS1992

Use of probabilistic design methods for NASA applications

This paper presents a reliability evaluation process designed to improve the reliability of advanced launch systems. The work performed includes the development of a reliability prediction methodology to be used in the design phase of the Space Transportation Main Engine (STME). This includes prediction techniques which use historical data bases as well as deterministic and probabilistic engineering models for predicting design reliability. In summary, this paper describes a probabilistic design approach for the next-generation liquid rocket engine, the STME.

Safie, Fayssal M.↗
NASA NTRS2015

Reliability and Probabilistic Risk Assessment - How They Play Together

PRA methodology is one of the probabilistic analysis methods that NASA brought from the nuclear industry to assess the risk of LOM, LOV and LOC for launch vehicles. PRA is a system scenario based risk assessment that uses a combination of fault trees, event trees, event sequence diagrams, and probability and statistical data to analyze the risk of a system, a process, or an activity. It is a process designed to answer three basic questions: What can go wrong? How likely is it? What is the severity of the degradation? Since 1986, NASA, along with industry partners, has conducted a number of PRA studies to predict the overall launch vehicles risks. Planning Research Corporation conducted the first of these studies in 1988. In 1995, Science Applications International Corporation (SAIC) conducted a comprehensive PRA study. In July 1996, NASA conducted a two-year study (October 1996 - September 1998) to develop a model that provided the overall Space Shuttle risk and estimates of risk changes due to proposed Space Shuttle upgrades. After the Columbia accident, NASA conducted a PRA on the Shuttle External Tank (ET) foam. This study was the most focused and extensive risk assessment that NASA has conducted in recent years. It used a dynamic, physics-based, integrated system analysis approach to understand the integrated system risk due to ET foam loss in flight. Most recently, a PRA for Ares I launch vehicle has been performed in support of the Constellation program. Reliability, on the other hand, addresses the loss of functions. In a broader sense, reliability engineering is a discipline that involves the application of engineering principles to the design and processing of products, both hardware and software, for meeting product reliability requirements or goals. It is a very broad design-support discipline. It has important interfaces with many other engineering disciplines. Reliability as a figure of merit (i.e. the metric) is the probability that an item will perform its intended function(s) for a specified mission profile. In general, the reliability metric can be calculated through the analyses using reliability demonstration and reliability prediction methodologies. Reliability analysis is very critical for understanding component failure mechanisms and in identifying reliability critical design and process drivers. The following sections discuss the PRA process and reliability engineering in detail and provide an application where reliability analysis and PRA were jointly used in a complementary manner to support a Space Shuttle flight risk assessment.

Safie, Fayssal M.↗
NASA NTRS2019

Inclusion of Radiation Environment Variability for Reliability Estimates for SiC Power MOSFETs

Variability of the solar energetic particle environment is investigated for single-event-burnout reliability of silicon-carbide power metal-oxide-semiconductor field effect transistors. A probabilistic assessment of failure evaluates the benefits of de-rating voltage, shielding, and mission length. The Prediction of Solar particle Yields for Characterizing Integrating Circuits code is used to calculate a cumulative density function for the fluence of the environment. The lethal ion method is then used to determine what proportion of the environment will cause single-event-burnout. The operating voltage determines the lowest linear-energy-transfer particle that will cause single-event-burnout and that should be included in the environment distribution. The shielding and mission length also determine the final environment distribution of the mission fluence. Through calculating the reliability for different operating voltages, shielding, and mission length for a specific device, it is shown that shielding thickness and operating voltage have a large effect on reliability and can be traded off during the design.

Heavy ion↗
NASA NTRS1981

Use of ceramics in point-focus solar receivers

One of the research and development efforts in the Solar Thermal Energy Systems Project at the Jet Propulsion Laboratory has been focused on application of ceramic components for advanced point-focus solar receivers. The impetus for this effort is a need for high efficiency, low cost solar receivers which operate in a temperature regime where use of metal components is impractical. The current status of the work on evaluation of ceramic components at JPL and elsewhere is outlined and areas where lack of knowledge is currently slowing application of ceramics are discussed. Future developments of ceramic processing technology and reliability assurance methodology should open up applications for the point-focus solar concentrator system in fuels and chemicals production, in thermochemical energy transport and storage, in detoxification of hazardous materials and in high temperature process heat as well as for electric power generation.

Smoak, R. H.↗
NASA NTRS1986

Experimental investigations of trace element fractionation in iron meteorites. III - Elemental partitioning in the system Fe-Ni-S-P

Measurements of solid metal/liquid metal trace element partition coefficients, which are used to interpret the crystallization history of magmatic iron meteorite groups differ greatly between different research groups, using different experimental techniques. Specifically, partition coefficients measured utilizing 'static' experiments which approach equilibrium cannot be reconciled with the results of 'dynamic' experiments which mimic fractional crystallization. We report new tests of our 'static' experimental technique and demonstrate that our methodology yields reliable equilibrium values for Ni, P and Ge partition coefficients. Partition coefficients in the Fe-Ni-S-P system are well matched by interpolation between the Fe-Ni-S and Fe-Ni-P subsystems. In contrast, the predictions of 'dynamic' experiments do not agree with our measurements and, consequently, the ability of 'dynamic' experiments to reproduce iron meteorite Ge vs. Ni fractionation trends successfully must be regarded as fortuitous.

Malvin, D. J.↗
NASA NTRS1990

Masking failures of multidimensional sensors (extended abstract)

When a computer monitors a physical process, the computer uses sensors to determine the values of the physical variables that represent the state of the process. A sensor can sometimes fail, however, and in the worst case report a value completely unrelated to the true physical value. The work described is motivated by a methodology for transforming a process control program that can not tolerate sensor failure into one that can. In this methodology, a reliable abstract sensor is created by combining information from several real sensors that measure the same physical value. To be useful, an abstract sensor must deliver reasonably accurate information at reasonable computational cost. Sensors are considered that deliver multidimensional values (e.g., location or velocity in three dimensions, or both temperature and pressure). Geometric techniques are used to derive upper bounds on abstract sensor accuracy and to develop efficient algorithms for implementing abstract sensors.

Chew, Paul↗
NASA NTRS2006

Reliability of Radioisotope Stirling Convertor Linear Alternator

Onboard radioisotope power systems being developed and planned for NASA s deep-space missions would require reliable design lifetimes of up to 14 years. Critical components and materials of Stirling convertors have been undergoing extensive testing and evaluation in support of a reliable performance for the specified life span. Of significant importance to the successful development of the Stirling convertor is the design of a lightweight and highly efficient linear alternator. Alternator performance could vary due to small deviations in the permanent magnet properties, operating temperature, and component geometries. Durability prediction and reliability of the alternator may be affected by these deviations from nominal design conditions. Therefore, it is important to evaluate the effect of these uncertainties in predicting the reliability of the linear alternator performance. This paper presents a study in which a reliability-based methodology is used to assess alternator performance. The response surface characterizing the induced open-circuit voltage performance is constructed using 3-D finite element magnetic analysis. Fast probability integration method is used to determine the probability of the desired performance and its sensitivity to the alternator design parameters.

Shah, Ashwin↗