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At least 55 records · Page 3

Electrical research on solar cells and photovoltaic materials

The flat-plate solar cell array program which increases the service lifetime of the photovoltaic modules used for terrestrial energy applications is discussed. The current-voltage response characteristics of the solar cells encapsulated in the modules degrade with service time and this degradation places a limitation on the useful lifetime of the modules. The most desirable flat-plate array system involves solar cells consisting of highly polarizable materials with similar electrochemical potentials where the cells are encapsulated in polymers in which ionic concentrations and mobilities are negligibly small. Another possible mechanism limiting the service lifetime of the photovoltaic modules is the gradual loss of the electrical insulation characteristics of the polymer pottant due to water absorption or due to polymer degradation from light or heat effects. The mechanical properties of various polymer pottant materials and of electrochemical corrosion mechanisms in solar cell material are as follows: (1) electrical and ionic resistivity; (2) water absorption kinetics and water solubility limits; and (3) corrosion characterization of various metallization systems used in solar cell construction.

Orehotsky, J.↗

Exploring Si Heterojunction Solar Cell Degradation: Bulk and Interface Processes Analyzed by Simulations and Experiments in Order to Develop Mitigation Strategies

The Si technology with the highest conversion efficiency is a-Si/c-Si heterojunction (HJ) PV. Its market penetration, however, is slowed by reports that fielded HJ modules degraded at twice the rate of regular c-Si modules. Our very recent work confirmed this degradation and attributed it to enhanced recombination at the a-Si/c-Si interface, caused by the slow, order-of-magnitude increase of the defect density. We propose to comprehensively explore degradation mechanisms in Si HJ cells by combining simulations and experiments. Theoretically, we will: (1) simulate structure of a-Si and a-Si/c-Si interfaces, identify defects; (2) determine statistics of energy barriers that control defect formation; (3) compute growth of defect density from the barrier distribution, and the resulting degradation of Voc. Experimentally, we will: (1) create a series of HJ-cell-representative stacks with varying layer thicknesses and deposition conditions by using PECVD tools; (2) use temperature and injection-dependent lifetime spectroscopy to determine effective lifetimes; (3) deconvolve the data to separate bulk and interface effects, and the effects of charge density and interface defects to analyze long time degradation. The goal is to identify material and device degradation mechanisms, to develop mitigation strategies for improved stability, such as the introduction of capping layers and hydrogen diffusion control.

14 SOLAR ENERGY↗

MODIS Aqua Optical Throughput Degradation Impact on Relative Spectral Response and Calibration on Ocean Color Products

Since Moderate Resolution Imaging Spectroradiometer Aqua's launch in 2002, the radiometric system gains of the reflective solar bands have been degrading, indicating changes in the systems optical throughput. To estimate the optical throughput degradation, the electronic gain changes were estimated and removed from the measured system gain. The derived optical throughput degradation shows a rate that is much faster in the shorter wavelengths than the longer wavelengths. The wavelength-dependent optical throughput degradation modulated the relative spectral response (RSR) of the bands. In addition, the optical degradation is also scan angle-dependent due to large changes in response versus the scan angle over time. We estimated the modulated RSR as a function of time and scan angles and its impacts on sensor radiometric calibration for the ocean science. Our results show that the calibration bias could be up to 1.8 % for band 8 (412 nm) due to its larger out-of-band response. For the other ocean bands, the calibration biases are much smaller with magnitudes at least one order smaller.

Lee, Shihyan↗

Interconnect: Cooperative Research and Development Final Report, CRADA Number CRD-13-00507 (Project 4)

This CRADA modification involves analyses on a variety of CdTe-PV related materials, test structures, solar cells, and modules produced at FSLR and/or NLR and adds analysis related to module degradation and reliability. Materials will be provided by FSLR, NLR, and/or by interleaving FSLR and NLR layers and processes. Module reliability activities will include technical risk assessment, materials characterization, module and test structure characterization, modeling, accelerated test development, and outdoor testing.

14 SOLAR ENERGY↗

Photovoltaic design optimization for terrestrial applications

As part of the Jet Propulsion Laboratory's Low-Cost Solar Array Project, a comprehensive program of module cost-optimization has been carried out. The objective of these studies has been to define means of reducing the cost and improving the utility and reliability of photovoltaic modules for the broad spectrum of terrestrial applications. This paper describes one of the methods being used for module optimization, including the derivation of specific equations which allow the optimization of various module design features. The method is based on minimizing the life-cycle cost of energy for the complete system. Comparison of the life-cycle energy cost with the marginal cost of energy each year allows the logical plant lifetime to be determined. The equations derived allow the explicit inclusion of design parameters such as tracking, site variability, and module degradation with time. An example problem involving the selection of an optimum module glass substrate is presented.

Ross, R. G., Jr.↗

Detection and Localization of Damaged Photovoltaic Cells and Modules Using Spread Spectrum Time Domain Reflectometry

The operating efficiency of photovoltaic (PV) plants can be improved if damaged or degraded modules can be detected and identified. Currently, string-level power electronics can detect problems with modules or cabling but not locate them, which would facilitate addressing these issues. Here, we investigate the ability of spread spectrum time domain reflectometry (SSTDR) to both detect and locate/identify damaged cells and modules within a series-connected PV string. We tested the ability of SSTDR to detect and locate single-cell mini-modules and full-sized PV modules, which were intentionally damaged by impacts with a hammer (breaking the glass and damaging the silicon below) or by cutting through some or all busbars. Damage to the glass and silicon of cells was detected and located within a small string of minimodules. Busbar damage was detectable only if an open was created by cutting through all intercell busbars. Furthermore, physical impact damage to the glass and silicon of a full-sized PV module could be detected, but further development of signal processing is needed to achieve localization of such damaged modules within a string.

14 SOLAR ENERGY↗

Performance of a class of parallel spread-spectrum code acquisition schemes in the presence of data modulation

An acquisition procedure for data-modulated direct-sequence spread-spectrum systems is investigated. The correlation time is partitioned into subintervals, and the integration results in these subintervals are noncoherently combined for detection. The tradeoff between noncoherent combining loss and data modulation degradation guides the optimum choice of the number of subintervals. Two forms of data modulation are considered, namely, the alternate-data and random-data cases. The parallel acquisition schemes discussed allow multiple code-phase offsets to be examined at each test. The circular state diagram approach is used to analyze the performances of these schemes. The theory presented is valid for a class of such parallel schemes.

Cheng, Unjeng↗

Field Aging of Photovoltaic Module Packaging Materials: DuraMAT Field Module Library

To understand and develop models for silicon photovoltaic module degradation, accelerated testing is often used, however, outdoor field testing is necessary for validation. Outdoor field testing publications are often limited by the lack of a pristine, control module to compare the fielded module to. In this work, commercially available modules were purchased from seven different manufacturers for outdoor fielding then destructive characterization to investigate packaging material degradation on

14 SOLAR ENERGY↗

Energy Yield Loss Due to LETID

This presentation presents an open-source LETID model part of the PVDegradationTools, which can calculate solar modules degradation due to Light and Elevated Temperature (LETID).

degradation↗

Hot-spot heating susceptibility due to reverse bias operating conditions

Because of field experience (indicating that cell and module degradation could occur as a result of hot spot heating), a laboratory test was developed at JPL to determine hot spot susceptibility of modules. The initial hot spot testing work at JPL formed a foundation for the test development. Test parameters are selected as follows. For high shunt resistance cells, the applied back bias test current is set equal to the test cell current at maximum power. For low shunt resistance cells, the test current is set equal to the cell short circuit current. The shadow level is selected to conform to that which would lead to maximum back bias voltage under the appropriate test current level. The test voltage is determined by the bypass diode frequency. The test conditions are meant to simulate the thermal boundary conditions for 100 mW/sq cm, 40C ambient environment. The test lasts 100 hours. A key assumption made during the development of the test is that no current imbalance results from the connecting of multiparallel cell strings. Therefore, the test as originally developed was applicable for single string case only.

Gonzalez, C. C.↗

System-level performance and degradation of 21 GWDC of utility-scale PV plants in the United States

We assess the performance of a fleet of 411 utility-scale (i.e., >5 MWAC and ground-mounted) photovoltaic (PV) projects totaling 21.1 GWDC (16.3 GWAC) of capacity, which achieved commercial operations in the United States from 2007 to 2016. This fleet of projects contributed more than 50% of all solar electricity generated in the United States in 2017. Using detailed information on individual project characteristics, in conjunction with modeled irradiance data, we assess the extent to which actual first-year performance has lived up to both modeled and stated expectations. We then analyze system-level performance degradation in subsequent years by employing a “fixed effects” regression model to statistically isolate the impact of age on system performance. We find that this fleet of utility-scale PV projects has generally lived up to ex ante expectations for first-year performance but that subsequent system-level degradation—found to be −1.3%/year (±0.2%)—has, on average, been worse than both ex ante expectations (commonly −0.5%/year) and results from past studies (ranging from −0.8%/year to −1.0%/year). We emphasize that −1.3%/year is a system-level estimate that captures more than just module degradation (e.g., including soiling, balance of plant degradation, and downtime for maintenance and/or other events). A side analysis of a variety of project characteristics suggests that system-level degradation rates tend to be of lower magnitude among newer projects and larger projects and at sites with lower long-term average temperatures.

14 SOLAR ENERGY↗

Comparing Outdoor to Indoor Performance for Bifacial Modules Affected by Polarization-Type Potential-Induced Degradation

Bifacial photovoltaic (PV) modules have the advantage of using light reflected off of the ground to contribute to power production. Predicting the energy gain is challenging and requires complex models to do so accurately. Often, module degradation over time is neglected in models for the sake of simplicity or is underestimated. Comparing outdoor and indoor current–voltage (I–V) performance for bifacial modules is more challenging than for monofacial modules, as there are additional variables to consider such as rear albedo non-uniformity, cell mismatch, and their effects on temperature. This challenge is compounded when heterogeneous degradation modes occur, such as polarization-type potential-induced degradation (PID-p). To examine the effects of PID-p on I–V predictions using an empirical data-driven approach, 16 bifacial PERC modules are installed outdoors on racks with different albedo conditions. A subset is exposed to high-voltage biases of −1500 V or +1500 V. Outdoor data are traced at irradiance ranges of 150–250 W/m 2 , 500–600 W/m 2 , and 900–1000 W/m 2 . These curves are corrected using control module temperature, wire resistivity, and module resistance measured indoors. We examine several methods to transform indoor I–V curves to accurately, and more simply than existing methods, approximate outdoor performance for bifacial modules without and with varying levels of PID-p degradation. This way, bifacial performance modeling can be more accessible and informed by fielded, degraded modules. Distributions of percent errors between indoor and outdoor performance parameters and Mean Absolute Percent Errors (MAPEs) are used to assess method quality. Results including low-irradiance data (150–250 W/m 2 ) are discussed but are filtered for quantifying method quality as these data introduce substantial errors. The method with the most optimal tradeoff between low MAPE and analysis simplicity involves measuring the front side of a module indoors at an irradiance equal to plane-of-array irradiance plus the product of module bifaciality and albedo irradiance. This method gives MAPE values of 1–6.5% for non-degraded and 1.6–5.9% for PID-p degraded module performance.

14 SOLAR ENERGY↗

Local Resistance Measurement for Degradation of c-Si Heterojunction with Intrinsic Thin Layer (HIT) Solar Modules

Silicon heterojunction with intrinsic thin layer (or HIT) modules typically degrade at a rate of less than 1% annually in solar fields with dominant degradation in open-circuit voltage and some degradation in series resistance. However, detailed mechanisms can differ from module to module. Here, we study increases in local series resistance that occur over long-term field deployment, indicated by cell areas where the photoluminescence intensity does not degrade but the electroluminescence degrades significantly. To directly measure the local series resistance, we have cored out the local electroluminescence-degraded area, and we measured the sheet resistance by 4-point-probe and local nm-scale resistance using scanning spreading resistance microscopy (SSRM). The results by 4-point-probe show scattered sheet resistance that can be caused, for example, by nonuniform current paths through the transparent conductive oxide layer, the a-Si:H emitter, or the near-junction c-Si inversion layer. In contrast, the SSRM results indicate a relatively uniform and non-degraded resistivity on smaller nanometer spatial scales. SSRM is an atomic force microscopy-based two-terminal resistance mapping technique that measures the local resistance in nm-volume beneath the probe. The consistent resistances measured on the control and degraded samples can exclude the degradation of transparent conductive oxide resistance.

41 EE - Solar Energy Technologies Office (EE-4S)↗

Photovoltaic module antireflection coating degradation survey using color microscopy and spectral reflectance

Abstract Commercial antireflective coatings (ARCs) on photovoltaic (PV) module glass can improve module power by 2.5%–3.0%, but their long‐term field performance requires additional study. In this paper, we investigate ARC performance on fielded modules using two nondestructive techniques: reflectance spectroscopy and RGB microscopy, finding a large variation in coating durability and performance. For new coatings, the fleet average nominal power enhancement is 2.8%. This power enhancement is observed to degrade at approximately −0.05%/year absolute over the first 8 years of fielding in arrays that are not regularly cleaned. Interferometry and imaging results imply that coating loss for these modules is due to slow chemical thinning of the initial 125 nm thick coating by 1.4 to 5.0 nm/year. Due to the physics of interference coatings, the performance loss is projected to accelerate as the coating is further thinned, resulting in a coating lifetime (time to 80% of initial performance) of 7.5 to 25 years. At the higher 5.0 nm/year coating loss rates, we estimate that −0.14%/year power degradation of the module can be attributed solely to ARC degradation over the first 20 years. Extreme coating loss is observed on some modules where after 8 years fielding, the coating can be completely removed with a single wet wipe with a lens tissue. A case study is also presented comparing ARC and noncoated modules installed at a single site in 2013. We find that the ARC modules have a 2.6% higher soiling power loss than the noncoated modules; this exceeds the ARC power enhancement of 2.4% and leads to the surprising conclusion that the ARC lowers production for modules in this location due to increased soiling. These results demonstrate that RGB microscopy is a powerful, field‐capable, and quantitative characterization technique for assessing degradation of PV module ARCs.

Karin, Todd↗

Ultrasonic Characterization of Ethylene Vinyl Acetate (EVA) Crosslinking for Quality Assurance and Lamination Process Control (US-Xlink)

Module makers strive to cut lamination processing times to enhance production throughput and reduce costs. If overdone, this might lead to poor EVA quality due to incomplete EVA crosslinking and a large concentration of potentially harmful reactants. Those deficiencies are frequently missed during production quality testing as initially their impact on power output is small. Additionally, the crosslinking agent is frequently inhomogeneously dispersed across the EVA foils such that local destructive characterization procedures such as differential scanning calorimetry (DSC), Soxhlet extraction, swelling methods, or mechanical tests provide only a limited amount of information. However, these defects and inhomogeneities can become considerably more important during field operation, dramatically reducing long-term power yield, and increasing LCOE. Examples of typical long-term module degradation modes relating to poor lamination process conditions include cell breakage, corrosion of the metallization, delamination, and local quality deficiencies. To provide reliable material characterization in a manufacturing setting, we devised a non-destructive technology that uses ultrasound to evaluate the quality of interface adhesion and the degree of crosslinking. As a calibration reference, DSC measurements were employed. Although the potential of ultrasonic approaches for this purpose has already been noted, those previous methods were generally limited to local qualitative measurements. Furthermore, variations in EVA thickness and temperature had a substantial impact on them. The solution we propose solves these limitations by employing ultrasonic absorption rather than relying solely on sound velocity data.

14 SOLAR ENERGY↗

Carbon Footprint Analysis of Floating PV Systems

This report, conducted by the Dutch research organization TNO, presents the first detailed life cycle inventory (LCI) analysis of operational floating photovoltaic (FPV) systems. The study, focusing on two operational systems in Western Europe, reveals that FPV systems on small inland water bodies can be a valuable complement to ground-mounted PV systems in terms of greenhouse gas emissions reduction. If PV module degradation is limited, these systems' carbon footprint is 3-4 times lower than the EU grid mix target for 2030. The report compares two FPV systems with different floater compositions (HDPE and steel/HDPE) to hypothetical ground-mounted systems, using comprehensive background data. The findings highlight the necessity for long-term monitoring and thorough environmental assessments. Josco Kester, a scientist at TNO, underscores the potential environmental benefits of these systems, which could enhance the adoption of renewable energy technologies.

14 SOLAR ENERGY↗

Reliability and Power Degradation Rates of PERC Modules Using Differentiated Packaging Strategies and Characterization Tools

The reliability, durability and lifetime performance of passivated emitter, rear cell (PERC) modules used in real-world PV power plants is a critical challenge underlying the rapid adoption and bankability of these PERC cells, whose high efficiency help reduce the levelized cost of electricity (LCOE). We propose a degradation-science study of PERC module degradation pathways, benchmarking them relative to known degradation mechanisms and pathways of the incumbent aluminum back surface field (Al-BSF) modules exposed to real-world and accelerated exposure conditions.

14 SOLAR ENERGY↗

Defect Kinetics and Control for Module Reliability

Potential induced degradation is currently one of the most important module degradation mechanisms. It has been suggested that stacking faults decorated with sodium from the module glass are responsible for this effect and authors have also shown the reversibility of this effect upon reverse biasing of the module. The importance of sodium in the failure mechanism is clear, however, little is known regarding the factors that control its diffusion into the wafer, making it nearly impossible to predict the performance of a given module and engineer it to be better. Sodium migration from module glass into silicon cells and the resulting module degradation is a clear example of how defect kinetics can determine overall module performance and long-term reliability. To the detriment of the industry and its bankability, no quantitative models yet exist to predict defect-assisted module degradation, limiting the progress in improving reliability. In particular, the understanding of defect behavior under high electric fields, under stresses imparted by encapsulation or temperature, and under real operating conditions over long periods of time is a crucial gap in the current state-of-the-art. In this work we developed a Defect-Device-Degradation model to predict defect behavior and its impact on device performance over the module operational lifetime using experimentally-determined defect parameterizations. The validated model will provide a platform for manufacturing process optimization across input materials and architectures to avoid deleterious defects upstream and enable enhanced module robustness.

36 MATERIALS SCIENCE↗