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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 55 records · Page 3
All sourcesNASA NTRSDOE OSTI
NASA NTRS2001

Preliminary Results of Field Emission Cathode Tests

Preliminary screening tests of field emission cathodes such as chemical vapor deposited (CVD) diamond, textured pyrolytic graphite, and textured copper were conducted at background pressures typical of electric thruster test facilities to assess cathode performance and stability. Very low power electric thrusters which provide tens to hundreds micronewtons of thrust may need field emission neutralizers that have a capability of tens to hundreds of microamperes. From current voltage characteristics, it was found that the CVD diamond and textured metals cathodes clearly satisfied the Fowler-Nordheim emission relation. The CVD diamond and a textured copper cathode had average current densities of 270 and 380 mA/sq cm, respectively, at the beginning-of-life. After a few hours of operation the cathode emission currents degraded by 40 to 75% at background pressures in the 10(exp -5) Pa to 10(exp -4) Pa range. The textured pyrolytic graphite had a modest current density at beginning-of-life of 84 mA/sq cm, but this cathode was the most stable of all. Extended testing of the most promising cathodes is warranted to determine if current degradation is a burn-in effect or whether it is a long-term degradation process. Preliminary experiments with ferroelectric emission cathodes, which are ceramics with spontaneous electric polarization, were conducted. Peak current densities of 30 to 120 mA/sq cm were obtained for pulse durations of about 500 ns in the 10(exp -4) Pa pressure range.

Sovey, James S.↗
NASA NTRS2002

Performance Evaluation of 40 cm Ion Optics for the NEXT Ion Engine

The results of performance tests with two 40 cm ion optics sets are presented and compared to those of 30 cm ion optics with similar aperture geometries. The 40 cm ion optics utilized both NSTAR and TAG (Thick-Accelerator-Grid) aperture geometries. All 40 cm ion optics tests were conducted on a NEXT (NASA's Evolutionary Xenon Thruster) laboratory model ion engine. Ion optics performance tests were conducted over a beam current range of 1.20 to 3.52 A and an engine input power range of 1.1 to 6.9 kW. Measured ion optics' performance parameters included near-field radial beam current density profiles, impingement-limited total voltages, electron backstreaming limits, screen grid ion transparencies, beam divergence angles, and start-up transients. Impingement-limited total voltages for 40 cm ion optics with the NSTAR aperture geometry were 60 to 90 V lower than those with the TAG aperture geometry. This difference was speculated to be due to an incomplete burn-in of the TAG ion optics. Electron backstreaming limits for the 40 cm ion optics with the TAG aperture geometry were 8 to 19 V higher than those with the NSTAR aperture geometry due to the thicker accelerator grid of the TAG geometry. Because the NEXT ion engine provided beam flatness parameters that were 40 to 63 percent higher than those of the NSTAR ion engine, the 40 cm ion optics outperformed the 30 cm ion optics.

Soulas, George C.↗
NASA NTRS2004

COTS Ceramic Chip Capacitors: An Evaluation of the Parts and Assurance Methodologies

This viewgraph presentation profiles an experiment to evaluate the suitability of commercial off-the-shelf (COTS) ceramic chip capacitors for NASA spaceflight applications. The experiment included: 1) Voltage Conditioning ('Burn-In'); 2) Highly Accelerated Life Test (HALT); 3) Destructive Physical Analysis (DPA); 4) Ultimate Voltage Breakdown Strength. The presentation includes results for each of the capacitors used in the experiment.

Sampson, Michael J.↗
NASA NTRS2004

Alternative Test Methods for Electronic Parts

It is common practice within NASA to test electronic parts at the manufacturing lot level to demonstrate, statistically, that parts from the lot tested will not fail in service using generic application conditions. The test methods and the generic application conditions used have been developed over the years through cooperation between NASA, DoD, and industry in order to establish a common set of standard practices. These common practices, found in MIL-STD-883, MIL-STD-750, military part specifications, EEE-INST-002, and other guidelines are preferred because they are considered to be effective and repeatable and their results are usually straightforward to interpret. These practices can sometimes be unavailable to some NASA projects due to special application conditions that must be addressed, such as schedule constraints, cost constraints, logistical constraints, or advances in the technology that make the historical standards an inappropriate choice for establishing part performance and reliability. Alternate methods have begun to emerge and to be used by NASA programs to test parts individually or as part of a system, especially when standard lot tests cannot be applied. Four alternate screening methods will be discussed in this paper: Highly accelerated life test (HALT), forward voltage drop tests for evaluating wire-bond integrity, burn-in options during or after highly accelerated stress test (HAST), and board-level qualification.

Plante, Jeannette↗
NASA NTRS1996

Hydrogen Effects on GaAs Device Reliability

It has been observed that GaAs devices mounted in hermetically sealed packages, and exposed to burn-in and lifetest temperatures as low as 125 C, exhibit performance degradation in both RF and DC characteristics after relatively short periods of test time (500 hours). This paper will provide a discussion and summary of the general understanding of the failure mechanisms associated with this.

GaAs devices degradation gate metallization struct↗
NASA NTRS2016

Processing and Characterization of Thousand-Hour 500 C Durable 4H-SiC JFET Integrated Circuits

This work reports fabrication and testing of integrated circuits (ICs) with two levels of interconnect that consistently achieve greater than 1000 hours of stable electrical operation at 500 C in air ambient. These ICs are based on 4H-SiC junction field effect transistor (JFET) technology that integrates hafnium ohmic contacts with TaSi2 interconnects and SiO2 and Si3N4 dielectric layers over approximately 1-micrometer scale vertical topology. Following initial burn-in, important circuit parameters remain stable for more than 1000 hours of 500 C operational testing. These results advance the technology foundation for realizing long-term durable 500 C ICs with increased functional capability for sensing and control combustion engine, planetary, deep-well drilling, and other harsh-environment applications.

Microelectronics↗
NASA NTRS2016

Processing and Characterization of Thousand-Hour 500 C Durable 4H-SiC JFET Integrated Circuits

This work reports fabrication and testing of integrated circuits (ICs) with two levels of interconnect that consistently achieve greater than 1000 hours of stable electrical operation at 500 C in air ambient. These ICs are based on 4H-SiC junction field effect transistor (JFET) technology that integrates hafnium ohmic contacts with TaSi2 interconnects and SiO2 and Si3N4 dielectric layers over 1-m scale vertical topology. Following initial burn-in, important circuit parameters remain stable for more than 1000 hours of 500 C operational testing. These results advance the technology foundation for realizing long-term durable 500 C ICs with increased functional capability for sensing and control combustion engine, planetary, deep-well drilling, and other harsh-environment applications.

JFET↗
NASA NTRS2017

Prolonged 500 C Operation of 100+ Transistor Silicon Carbide Integrated Circuits

This report describes more than 5000 hours of successful 500 C operation of semiconductor integrated circuits (ICs) with more than 100 transistors. Multiple packaged chips with two different 4H-SiC junction field effect transistor (JFET) technology demonstrator circuits have surpassed thousands of hours of oven-testing at 500 C. After 100 hours of 500 C burn-in, the circuits (except for 2 failures) exhibit less than 10 change in output characteristics for the remainder of 500C testing. We also describe the observation of important differences in IC materials durability when subjected to the first nine constituents of Venus-surface atmosphere at 9.4 MPa and 460C in comparison to what is observed for Earth-atmosphere oven testing at 500 C.

Silicon Carbid↗
NASA NTRS2017

Prolonged 500 C Operation of 100+ Transistor Silicon Carbide Integrated Circuits

This report describes more than 5000 hours of successful 500 C operation of semiconductor integrated circuits (ICs) with more than 100 transistors. Multiple packaged chips with two different 4H-SiC junction field effect transistor (JFET) technology demonstrator circuits have surpassed thousands of hours of oven-testing at 500 C. After 100 hours of 500 C burn-in, the circuits (except for 2 failures) exhibit less than 10% change in output characteristics for the remainder of 500 C testing. We also describe the observation of important differences in IC materials durability when subjected to the first nine constituents of Venus-surface atmosphere at 9.4 MPa and 460 C in comparison to what is observed for Earth-atmosphere oven testing at 500 C.

Spry, David J.↗
NASA NTRS2018

A Screening Method Using Pulsed-Power Combined with Infrared Imaging to Detect Pattern Defects in Bulk Metal Foil or Thin Film Resistors

Bulk metal foil and thin film resistors occasionally contain localized defects within the etched resistor pattern. Common defects of this type include in-line constrictions referred to as notches, unremoved resistor material bridges between adjacent pattern lines, and embedded non-conductive particles in the resistor material. Such defects are prone to fracture due to thermomechanical fatigue during powered operation, especially power cycling, resulting in positive resistance change and open circuit failure modes. Common screening methods of optical microscopy, short time overload power tests (e.g., 6.25x rated power for 5 seconds) and burn-in (e.g., 1.5x rated power for 100 hours) are useful, but they are not always effective at removing devices with such defects. An improved method has been developed to screen for localized resistor pattern defects. The method involves the application of brief, high power electrical pulses at a low duty cycle while inspecting the resistor with a high resolution, high speed infrared camera. The following test conditions were found to be suitable for this purpose: 6.25x rated power, 1 to 5 pulses, 50 ms pulse width and 10% duty cycle. During the power pulsing, localized constrictions in the resistor pattern are identifiable as hot spots via the infrared camera. Reject criteria can be established based on observations of hot spots. To assess its effectiveness, a total of two hundred eighty (280) surface mount foil resistors (40 each from 7 different lots) were screened using this infrared technique. The screening identified twenty-nine (29) resistors with significant hot spots in the resistor pattern. All 280 resistors were then subjected to an industry standard 10,000 hour life test at 1x rated power at 70°C with power cycled for 90 minutes on and 30 minutes off. During life testing, three resistors exhibited positive resistance change failure mode. All three failures were due to thermomechanical fatigue failure of localized bridge defects at the locations identified via infrared screening. The results of this evaluation illustrate the benefits of the pulsed-power infrared detection screening technique to identify reliability suspect foil or thin film resistors that may escape common screening methods.

screening↗
NASA NTRS2018

A Screening Method Using Pulsed-Power Combined with Infrared Imaging to Detect Pattern Defects in Bulk Metal Foil or Thin Film Resistors

Bulk metal foil and thin film resistors occasionally contain localized defects within the etched resistor pattern. Common defects of this type include in-line constrictions referred to as notches, unremoved resistor material bridges between adjacent pattern lines, and embedded non-conductive particles in the resistor material. Such defects are prone to fracture due to thermomechanical fatigue during powered operation, especially power cycling, resulting in positive resistance change and open circuit failure modes. Common screening methods of optical microscopy, short time overload power tests (e.g., 6.25x rated power for 5 seconds) and burn-in (e.g., 1.5x rated power for 100 hours) are useful, but they are not always effective at removing devices with such defects. An improved method has been developed to screen for localized resistor pattern defects. The method involves the application of brief, high power electrical pulses at a low duty cycle while inspecting the resistor with a high resolution, high speed infrared camera. The following test conditions were found to be suitable for this purpose: 6.25x rated power, 1 to 5 pulses, 50 ms pulse width and 10% duty cycle. During the power pulsing, localized constrictions in the resistor pattern are identifiable as hot spots via the infrared camera. Reject criteria can be established based on observations of hot spots. To assess its effectiveness, a total of two hundred eighty (280) surface mount foil resistors (40 each from 7 different lots) were screened using this infrared technique. The screening identified twenty-nine (29) resistors with significant hot spots in the resistor pattern. All 280 resistors were then subjected to an industry standard 10,000 hour life test at 1x rated power at 70°C with power cycled for 90 minutes on and 30 minutes off. During life testing, three resistors exhibited positive resistance change failure mode. All three failures were due to thermomechanical fatigue failure of localized bridge defects at the locations identified via infrared screening. The results of this evaluation illustrate the benefits of the pulsed-power infrared detection screening technique to identify reliability suspect foil or thin film resistors that may escape common screening methods.

screening↗
NASA NTRS2017

Results of All Polyimide, Etched Foil Heater Qualification and Failure Limit Testing

Standard FEP (Fluorinated Ethylene Propylene resin) polyimide (SFP) or Kapton film heaters—which have a long history of space flight—are output-power limited by the melting point of Teflon which is used as an adhesive and insulator between the encasing layers of Kapton. The limit is expressed as a power density or through maximum operating temperature limits. All-polyimide (AP) heaters (also known as adhesive-less heaters) do not contain FEP Teflon between the layers of Kapton so the heaters are unconstrained by the melting point of Teflon. Thus, AP heaters have a higher maximum power density and operating temperature. AP heaters have not been qualified or flown on JPL missions but could be useful in applications that require a higher power density (Watt density) than the SFP heaters can support. The purpose of this paper is to document the qualification and property testing of the AP heaters for flight purposes. JPL (Jet Propulsion Lab.) tested several varieties of all-polyimide heaters to determine their functional equivalence to the standard heater which has substantial flight heritage and to determine their maximum limits. Tests included standard in-air burn-in tests, maximum power testing, lead pull strength, process qualification verification (PQV), long duration thermal cycling, and electro-magnetic compatibility shielding properties for copper-cladded shielded heaters. The results show that the all-polyimide heater appears to be functionally equivalent to the standard heater and has a higher Watt density and maximum operating temperature limit. The tests, test articles, failure analysis of the test articles, and results are described herein. These test results indicate that the all-polyimide heater is ready for flight applications.

Cucullu, Gordon C., III↗
NASA NTRS2020

PHALANX: Expendable Projectile Sensor Networks for Planetary Exploration

Technologies enabling long-term, wide-ranging measurement in hard-to-reach areas are a critical need for planetary science inquiry. Phenomena of interest include flows or variations in volatiles, gas composition or concentration, particulate density, or even simply temperature. Improved measurement of these processes enables understanding of exotic geologies and distributions or correlating indicators of trapped water or biological activity. However, such data is often needed in unsafe areas such as caves, lava tubes, or steep ravines not easily reached by current spacecraft and planetary robots. To address this capability gap, we have developed miniaturized, expendable sensors which can be ballistically lobbed from a robotic rover or static lander - or even dropped during a flyover. These projectiles can perform sensing during flight and after anchoring to terrain features. By augmenting exploration systems with these sensors, we can extend situational awareness, perform long-duration monitoring, and reduce utilization of primary mobility resources, all of which are crucial in surface missions. We call the integrated payload that includes a cold gas launcher, smart projectiles, planning software, network discovery, and science sensing: PHALANX. In this paper, we introduce the mission architecture for PHALANX and describe an exploration concept that pairs projectile sensors with a rover “mothership.” Science use cases explored include reconnaissance using ballistic cameras, volatiles detection, and building timelapse maps of temperature and illumination conditions. Strategies to autonomously coordinate constellations of deployed sensors to self-discover and localize with peer ranging (i.e. a “local GPS”) are summarized, thus providing communications infrastructure beyond-line-of-sight (BLOS) of the rover. Capabilities were demonstrated through both simulation and physical testing with a terrestrial prototype. The approach to developing a terrestrial prototype is discussed, including design of the launching mechanism, projectile optimization, micro-electronics fabrication, and sensor selection. Results from early testing and characterization of commercial-off-the-shelf (COTS) components are reported. Nodes were subjected to successful burn-in tests over 48 hours at full logging duty cycle. Integrated field tests were conducted in the Roverscape, a half-acre planetary analog environment at NASA Ames, where we tested up to 10 sensor nodes simultaneously coordinating with an exploration rover. Ranging accuracy has been demonstrated to be within +/-10cm over 20m using commodity radios when compared to high-resolution laser scanner ground truthing. Evolution of the design, including progressive miniaturization of the electronics and iterated modifications of the enclosure housing for streamlining and optimized radio performance are described. Finally, lessons learned to date, gaps toward eventual flight mission implementation, and continuing future development plans are discussed.

Dille, Michael↗
NASA NTRSDate not supplied

Development of the GeoNEX Level 2G Products: Exploiting the Diurnal Variability of TOA Reflectance in Atmospheric Correction

This study develops a new atmospheric correction algorithm to generate the Level 2G products, in particular the gap-filled Surface Reflectance at 10-minute time steps, for the Geostationary-NASA Earth Exchange (GeoNEX) project. The algorithm is based on the MODIS MAIAC (Multi-Angle Implementation of Atmospheric Correction) framework but with significant modifications to exploit angular/temporal information from the diurnal variability of the GeoNEX L1G TOA (Top-of-Atmosphere) reflectance. The algorithm starts by evaluating the roughness/smoothness of the diurnal time series of the TOA reflectance. Because rapid changes in TOA reflectance are generally caused by passing clouds or shadows, rough segments of the time series are automatically filtered out while the smooth segments are further tested for brightness and temperature to identify clear-sky and snow-free observations. Next the algorithm runs the MAIAC RTM (Radiative Transfer Model) to retrieve the Ross-Thick-Li-Sparse (RTLS) BRDF model parameters and the daily-mean atmospheric optical depth (AOD) that allow the RTM to optimally simulate the observed diurnal variability of clear-sky TOA reflectance. Once the initial RTLS parameters are retrieved after the algorithm’s burn-in period, they are used as the prior information to predict the AOD level for the next days, while the subsequent clear-sky observations are used to make necessary adjustments to the RTLS parameters in an continuous fashion. This “prediction-analysis” cycle is then iterated to process the full time series of the L1G data, skipping only total-cloudy days or when surface snow is detected. We tested the algorithm over a list of selected AERONET sites. The retrieved results (the daily mean AOD and the RTLS parameters) reasonably agree with the ground-based measurements. Importantly, the results indicate that the diurnal cycles of surface reflectance are continuous functions of the illumination-view geometry. Thus we can use the retrieved RTLS model to accurately fill in data gaps on partial cloudy days. Also, our algorithm is totally independent from the traditional approaches based on the use of spectral band ratios between the shortwave infrared (e.g., 2.2µm) and the visible (e.g., 0.47µm and 0.64µm) bands. Our results thus demonstrate that the high-frequent diurnal geostationary observations contain unique information that helps us improve atmospheric correction of remote sensing data.

GeoNEX↗
NASA NTRS2021

A Paradigm Shift in Quality Assurance of COTS Capacitors for Space Applications

Limitations of a traditional approach to screening and qualification of COTS capacitors for space applications that is based on burn-in and life test requirements described in the relevant military specifications are analyzed. An alternative approach that is originated from analysis of highly accelerated life testing (HALT) of capacitors susceptible to wear-out failures and allows for assessments of the risks of failure during the mission is suggested. Examples include results of reliability testing of advanced BME ceramic capacitors, polymer tantalum capacitors and multianode manganese oxide tantalum capacitors.

Alexander A Teverovsky↗
NASA NTRS2022

Reliability Assurance for COTS Capacitors

Burn-in (BI) and life testing (LT) are the most important reliability related elements of quality assurance for components used in space systems. This presentation discusses the need of transition from the existing approach to BI, LT, and destructive physical analysis (DPA) of COTS capacitors that is based on military specifications to an alternative approach that is based on Physics of Failure and HALT.

reliability↗
DOE OSTI2026

General-Purpose Heat Source Radioisotope Thermoelectric Generator Flight Unit 5 Refurbished (GPHS-RTG F5R) Power Prediction

INL has evaluated and refurbished General Purpose Heat Source (GPHS) Radioisotope Thermoelectric Generator (RTG) Flight Unit 5 (GPHS-RTG F5R or F5R) that was defueled in 2005. The generator has passed all the INL internal reviews, an end item data package has been delivered to NASA and is ready fueling for a mission. NASA requested a user’s guide for F5R with enough detail for a prospective mission proposal. This report documents the development of the power prediction model used in the user’s guide. The prediction evaluated the thermoelectric “burn-in” and the graceful degradation modes of the missions and developed a thermal inventory dependent equation that predicts the power that matches Galileo, Cassini, and PNH within a three-standard deviation of ±1%. This prediction is only valid for the 30 VDC load voltage of these missions.

30 - DIRECT ENERGY CONVERSION↗
DOE OSTI2026

General-Purpose Heat Source Radioisotope Thermoelectric Generator Flight Unit 5 Refurbished (GPHS-RTG F5R) Power Prediction

INL has evaluated and refurbished General Purpose Heat Source (GPHS) Radioisotope Thermoelectric Generator (RTG) Flight Unit 5 (GPHS-RTG F5R or F5R) that was defueled in 2005. The generator has passed all the INL internal reviews, an end item data package has been delivered to NASA and is ready fueling for a mission. NASA requested a user’s guide for F5R with enough detail for a prospective mission proposal. This report documents the development of the power prediction model used in the user’s guide. The prediction evaluated the thermoelectric “burn-in” and the graceful degradation modes of the missions and developed a thermal inventory dependent equation that predicts the power that matches Galileo, Cassini, and PNH within a three-standard deviation of ±1%. This prediction is only valid for the 30 VDC load voltage of these missions.

30 - DIRECT ENERGY CONVERSION↗