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At least 55 records · Page 3

Heavy Ion Microbeam- and Broadbeam-Induced Transients in SiGe HBTs

SiGe HBT heavy ion-induced current transients are measured using Sandia National Laboratories microbeam and high- and low-energy broadbeam sources at the Grand Accelerateur National d'Ions Lourds and the University of Jyvaskyla. The data were captured using a custom broadband IC package and real-time digital phosphor oscilloscopes with at least 16 GHz of analog bandwidth. These data provide detailed insight into the effects of ion strike location, range, and LET.

Pellish, Jonathan A.

Heavy Ion Microbeam- and Broadbeam-Induced Current Transients in SiGe HBTs

IBM 5AM SiGe HBT is device-under-test. High-speed measurement setup. Low-impedance current transient measurements. SNL, JYFL, GANIL. Microbeam to broadbeam position inference. Improvement to state-of-the-art. Microbeam (SNL) transients reveal position dependent heavy ion response, Unique response for different device regions Unique response for different bias schemes. Similarities to TPA pulsed-laser data. Broadbeam transients (JYFL and GANIL) provide realistic heavy ion response. Feedback using microbeam data. Overcome issues of LET and ion range with microbeam. **Angled Ar-40 data in full paper. Data sets yield first-order results, suitable for TCAD calibration feedback.

Pellish, Jonathan A.

Ka-Band SiGe Receiver Front-End MMIC for Transponder Applications

A fully integrated, front-end Ka-band monolithic microwave integrated circuit (MMIC) was developed that houses an LNA (low noise amplifier) stage, a down-conversion stage, and output buffer amplifiers. The MMIC design employs a two-step quadrature down-conversion architecture, illustrated in the figure, which results in improved quality of the down-converted IF quadrature signals. This is due to the improved sensitivity of this architecture to amplitude and phase mismatches in the quadrature down-conversion process. Current sharing results in reduced power consumption, while 3D-coupled inductors reduce the chip area. Improved noise figure is expected over previous SiGe-based, frontend designs

Venkatesan, Jaikrishna

High Temperature Stable Nanocrystalline SiGe Thermoelectric Material

A method of forming a nanocomposite thermoelectric material having microstructural stability at temperatures greater than 1000 C. The method includes creating nanocrystalline powder by cryomilling. The method is particularly useful in forming SiGe alloy powder.

Yang, Sherwin

Radiation Performance of Commercial SiGe HBT BiCMOS-High Speed Operational Amplifiers

We present results on heavy-ion and proton irradiations for commercial SiGe BiCMOS operational amplifiers: LTC6400-20 from Linear Technology and THS4304 from Texas Instruments. We found that the devices are susceptible to heavy-ion-induced SETs. The SET cross-sections increase with increasing operating frequency. The LTC6400 exhibits a LET(sub th) < 7.4 MeV·sq cm/mg for frequencies ranging from 10 to 1000 MHz. The THS4304 exhibits a LET(sub th) < 4.4 MeV·sq cm/mg at 200 MHz; the LET(sub th) decreases with increasing frequency. The significance of the SETs also increases with frequency. The SETs at 1000 MHz can erase several signal cycles. We al.so found that the LTC6400 is relatively robust against 198 and 54 MeV protons. We did not observe angular sensitivity from the proton irradiations.

Chen, Dakai

A model to predict the degradation of a SiGe thermopile.

Discussion of the various phenomena which affect the available output power of a typical radioisotope thermoelectric generator (RTG), including estimates of the magnitude of these effects. Power degradation, as well as the corresponding changes in operating temperature, are calculated by means of a computer code which systematically accounts for the time- and temperature-dependent variables. A model for predicting available output power of an RTG is developed which includes changes in performance due to fuel decay, alteration of bulk thermoelectric properties, changes in electrode contacts, geometry changes due to material sublimation, and degradation of the thermal insulation.

Stapfer, G.

Improved GaP doped SiGe thermoelectric material

Work at TECO has independently confirmed the early results obtained at JPL that high-temperature heat-treatment of SiGe/GaP alloys can significantly increase the figure of merit Z of these alloys. Several possible reasons for this improvement are given. Experiments are in progress to test these various hypothesis.

Vandersande, Jan W.

Characterization of High Ge Content SiGe Heterostructures and Graded Alloy Layers Using Spectroscopic Ellipsometry

Si(x)Ge(1-x)heterostructures on Si substrates have been widely studied due to the maturity of Si technology. However, work on Si(x)Ge)1-x) heterostructures on Ge substrates has not received much attention. A Si(x)Ge(1-x) layer on a Si substrate is under compressive strain while Si(x)Ge(1-x) on Ge is under tensile strain; thus the critical points will behave differently. In order to accurately characterize high Ge content Si(x)Ge(1-x) layers the energy shift algorithm used to calculate alloy compositions, has been modified. These results have been used along with variable angle spectroscopic ellipsometry (VASE) measurements to characterize Si(x)Ge(1-x)/Ge superlattices grown on Ge substrates. The results agree closely with high resolution x-ray diffraction measurements made on the same samples. The modified energy shift algorithm also allows the VASE analysis to be upgraded in order to characterize linearly graded layers. In this work VASE has been used to characterize graded Si(x)Ge(1-x) layers in terms of the total thickness, and the start and end alloy composition. Results are presented for a 1 micrometer Si(x)Ge(1-x) layer linearly graded in the range 0.5 less than or equal to x less than or equal to 1.0.

Heyd, A. R.

The Development of Si and SiGe Technologies for Microwave and Millimeter-Wave Integrated Circuits

Historically, microwave technology was developed by military and space agencies from around the world to satisfy their unique radar, communication, and science applications. Throughout this development phase, the sole goal was to improve the performance of the microwave circuits and components comprising the systems. For example, power amplifiers with output powers of several watts over broad bandwidths, low noise amplifiers with noise figures as low as 3 dB at 94 GHz, stable oscillators with low noise characteristics and high output power, and electronically steerable antennas were required. In addition, the reliability of the systems had to be increased because of the high monetary and human cost if a failure occurred. To achieve these goals, industry, academia and the government agencies supporting them chose to develop technologies with the greatest possibility of surpassing the state of the art performance. Thus, Si, which was already widely used for digital circuits but had material characteristics that were perceived to limit its high frequency performance, was bypassed for a progression of devices starting with GaAs Metal Semiconductor Field Effect Transistors (MESFETs) and ending with InP Pseudomorphic High Electron Mobility Transistors (PHEMTs). For each new material or device structure, the electron mobility increased, and therefore, the high frequency characteristics of the device were improved. In addition, ultra small geometry lithographic processes were developed to reduce the gate length to 0.1 pm which further increases the cutoff frequency. The resulting devices had excellent performance through the millimeter-wave spectrum.

Ponchak, George E.

Low-Power Radio-Frequency SiGe Analog-to-Digital Converter

A low-power, radio-frequency analog-to-digital converter (RF-ADC) for soil moisture remote sensing was designed and fabricated. The RF-ADC is the fundamental component used in a direct-sampling digital radiometer, which is proposed to minimize the power dissipation and system complexity for synthetic thinned array radiometer. The circuit was implemented using 0.8 micron 35-GHz silicon germanium BiCMOS technology. The total power dissipation was 222 mW.

Thompson, Willie L, II

A Study of the Measurement of Seebeck Coefficient of SiGe

In 1821 German Physicist Thomas J. Seebeck discovered that heat could be converted into electricity when a temperature difference was applied across two points on a material. Theoretically, the generated voltage has a directly proportional relationship with the temperature difference. This relationship is the Seebeck coefficient that scientists always referred to when determining the efficiency of a thermoelectricity convention. In our experiments, however, hysteresis loops appeared when we plotted voltage against temperature difference, and the measured Seebeck appeared differently when the measurements were run under vacuum, air, and helium gas. Measurements were done by using a low-frequency AC measuring method. By simulating the experimental setup into a; thermal circuit, we found that the loop and inconsistency in measuring Seebeck coefficient could be explained by studying the behaviors of a RC circuit in a thermal sense. Under vacuum, the gap of the hysteresis loop can be largely eliminated if the time period of the temperature difference increased up to 4800s. The trend of the variations in measuring Seebeck coefficients in different environments can also be predicted by using different thermal circuit models.

Heung, King Yi

Rhombohedral Super Hetero Epitaxy of Cubic SiGe on Trigonal c-plane Sapphire

New rhombohedral super-hetero-epitaxy technology was developed at NASA. This epitaxy technology enables the growth of unprecedented cubic-trigonal hybrid single crystal structures with lattice match on sapphire (Al2O3) substrates, hence with little strain and very few defects at the interface.

Choi, Sang H.