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The use of weakest-precondition predicate transformers in the derivation of sequential, process-control software is discussed. Only one extension to Dijkstra's calculus for deriving ordinary sequential programs was found to be necessary: function-valued auxiliary variables. These auxiliary variables are needed for reasoning about states of a physical process that exists during program transitions.
Activities directed toward the development of methods of measurement for semiconductor materials, process control, and devices are described. Topics investigated include: measurements of transistor delay time; application of the infrared response technique to the study of radiation-damaged, lithium-drifted silicon detectors; and identification of a condition that minimizes wire flexure and reduces the failure rate of wire bonds in transistors and integrated circuits under slow thermal cycling conditions. Supplementary data concerning staff, standards committee activities, technical services, and publications are included as appendixes.
Activities directed toward the development of methods of measurement for semiconductor materials, process control, and devices are described. Accomplishments include the determination of the reasons for differences in measurements of transistor delay time, identification of an energy level model for gold-doped silicon, and the finding of evidence that it does not appear to be necessary for an ultrasonic bonding tool to grip the wire and move it across the substrate metallization to make the bond. Work is continuing on measurement of resistivity of semiconductor crystals; study of gold-doped silicon; development of the infrared response technique; evaluation of wire bonds and die attachment; measurement of thermal properties of semiconductor devices, delay time, and related carrier transport properties in junction devices, and noise properties of microwave diodes; and characterization of silicon nuclear radiation detectors.
Methods of measurement for semiconductor material, process control, and devices
Methods of measurement for semiconductor materials process control, and devices
Tuning and photovoltaic methods and identification of test conditions for measurement of semiconductor materials, process control, and devices
AFDex is a rule based system designed to provide intelligent process control, diagnosis, and error recovery for a Shuttle based cryogenic experiment, SHOOT (Superfluid Helium On-Orbit Transfer). This paper describes the AFDex system in the context of traditional associative, model-based, and qualitative systems and discusses the implications of this first expert system in space.
Researchers at the U.S. Bureau of Mines have developed adaptive process control systems in which genetic algorithms (GA's) are used to augment fuzzy logic controllers (FLC's). GA's are search algorithms that rapidly locate near-optimum solutions to a wide spectrum of problems by modeling the search procedures of natural genetics. FLC's are rule based systems that efficiently manipulate a problem environment by modeling the 'rule-of-thumb' strategy used in human decision making. Together, GA's and FLC's possess the capabilities necessary to produce powerful, efficient, and robust adaptive control systems. To perform efficiently, such control systems require a control element to manipulate the problem environment, and a learning element to adjust to the changes in the problem environment. Details of an overall adaptive control system are discussed. A specific laboratory acid-base pH system is used to demonstrate the ideas presented.
Researchers at the U.S. Bureau of Mines have developed adaptive process control systems in which genetic algorithms (GA's) are used to augment fuzzy logic controllers (FLC's). GA's are search algorithms that rapidly locate near-optimum solutions to a wide spectrum of problems by modeling the search procedures of natural genetics. FLC's are rule based systems that efficiently manipulate a problem environment by modeling the 'rule-of-thumb' strategy used in human decision-making. Together, GA's and FLC's possess the capabilities necessary to produce powerful, efficient, and robust adaptive control systems. To perform efficiently, such control systems require a control element to manipulate the problem environment, an analysis element to recognize changes in the problem environment, and a learning element to adjust to the changes in the problem environment. Details of an overall adaptive control system are discussed. A specific laboratory acid-base pH system is used to demonstrate the ideas presented.
Report details the test and inspection procedures for the mass production of high reliability integrated circuits. It covers configuration control, basic fundamentals of quality control, control charts, wafer process evaluation, general process evaluation, evaluation score system, and diffusion evaluation.
Six computers operate synchronously and are interconnected by three independent data buses. Processors control one subsystem. Some can control buses to transfer data at 1 megabit per second. Every 2.5 msec each processor examines list of things to do during next interval. This spacecraft control system could be adapted for controlling complex industrial processes.
Component assembly on printed circuitry keeps making giant strides toward denser packaging and smaller dimensions. From a single layer to multilayer, from through holes to surface mounted components and tape applied bonds, unrelenting progress results in new, difficult problems in assembling, soldering, inspecting and controlling the manufacturing process of the new electronics. Among the major problems are the variables introduced by human operators. The small dimensions and the tight assembly tolerances are now successfully met by machines which are faster and more precise than the human hand. The same is true for soldering. But visual inspection of the solder joints is now so severely limited by the ever shrinking area accessible to the human eye that the inspector's diagnosis cannot be trusted any longer. Solutions to correcting these problems are discussed.
PC software is described which provides flexible natural language process control capability with an IBM PC or compatible machine. Hardware requirements include the PC, and suitable hardware interfaces to all controlled devices. Software required includes the Microsoft Disk Operating System (MS-DOS) operating system, a PC-based FORTRAN-77 compiler, and user-written device drivers. Instructions for use of the software are given as well as a description of an application of the system.
NBS activities in developing methods of measurement for semiconductor materials, process control, and devices
This progress report describes NBS activities directed toward the development of methods of measurement for semiconductor materials, process control, and devices. Significant accomplishments during this reporting period include design of a plan to provide standard silicon wafers for four-probe resistivity measurements for the industry, publication of a summary report on the photoconductive decay method for measuring carrier lifetime, publication of a comprehensive review of the field of wire bond fabrication and testing, and successful completion of organizational activity leading to the establishment of a new group on quality and hardness assurance in ASTM Committee F-1 on Electronics. Work is continuing on measurement of resistivity of semiconductor crystals; characterization of generation-recombination-trapping centers in silicon; study of gold-doped silicon; development of the infrared response technique; evaluation of wire bonds and die attachment; and measurement of thermal properties of semiconductor devices, delay time and related carrier transport properties in junction devices, and noise properties of microwave diodes.
A knowledge based system (KBS) methodology designed to study human machine interactions and levels of autonomy in allocation of process control tasks is presented. Users are provided with operation manuals to assist them in normal and abnormal situations. Unfortunately, operation manuals usually represent only the functioning logic of the system to be controlled. The user logic is often totally different. A method is focused on which illicits user logic to refine a KBS shell called an Operator Assistant (OA). If the OA is to help the user, it is necessary to know what level of autonomy gives the optimal performance of the overall man-machine system. For example, for diagnoses that must be carried out carefully by both the user and the OA, interactions are frequent, and processing is mostly sequential. Other diagnoses can be automated, in which the case the OA must be able to explain its reasoning in an appropriate level of detail. OA structure was used to design a working KBS called HORSES (Human Orbital Refueling System Expert System). Protocol analysis of pilots interacting with this system reveals that the a-priori analytical knowledge becomes more structured with training and the situation patterns more complex and dynamic. This approach can improve the a-priori understanding of human and automatic reasoning.
Topics addressed include: stratospheric chemistry; tropospheric trace gas (sources, distributions, and trends); tropospheric chemistry (processes, controlling the ozone and hydroxyl radicals); stratosphere-troposphere exchange; dynamic processes; and radiative processes (solar and terrestrial).
Alpha and gamma radiation detectors and measuring instruments for semiconductor materials, process control, and devices