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At least 55 records · Page 3
All sourcesNASA NTRSDOE OSTI
NASA NTRS2018

Laser Metrology for Ultra-Stable Space-Based Coronographs

Sensing starlight rejected from a coronagraph is essential in stabilizing the telescope pointing and wavefront drift, but performance is degraded for dim stars. Laser Metrology (MET) provides a different, complementary sensing method, one that can be used to measure changes in the alignment of the optics at high bandwidth, independent of the magnitude of the host star. Laser metrology measures changes in the separation of optical fiducial pairs, which can be separated by many meters. The principle of operations is similar to the laser metrology system used in LISA-Pathfinder to measure the in-orbit displacement between two test masses to a precision of ~10 picometers. In closed loop with actuators, MET actively maintains rigid body alignment of the front-end optics, thereby eliminating the dominant source of wavefront drift. In the case of a segmented, active primary mirror, MET provides six degrees of freedom sensing, replacing edge sensors. MET maintains wavefront control even during attitude maneuvers, such as slews between target stars, thereby avoiding the need to repeat time-consuming speckle suppression. These features can significantly improve the performance and observational efficiency of future large-aperture space telescopes equipped with internal coronagraphs. We evaluate MET trusses for various proposed monolithic and segmented space-based coronagraphs and present the performance requirements necessary to maintain contrast drift below 10^-11.

Moore, Dustin↗
NASA NTRSDate not supplied

Robotic Arm-based Antenna Metrology System for Aerospace Applications

Robotic antenna metrology presents interesting opportunities to investigate novel approaches to traditional antenna and communication system evaluation. In 2018 the National Aeronautics and Space Administration (NASA) Glenn Research Center (GRC) began exploring the use of robotic measurement for antenna and communication system metrology to address unique needs for traceability and in situ testing of a novel antenna for use in unmanned aerial systems (UAS). Since that initial development of the Portable Laser Guided Robotic Metrology (PLGRM) system many additional capabilities have been added to support a wide variety of aerospace applications. This paper provides an overview of the system itself, existing capabilities, benefits over other measurement approaches, and future work.

antennas, antenna patterns, measurements, aerospac↗
NASA NTRS2004

Search for general relativistic effects in table-top displacement metrology

As displacement metrology accuracy improves, general relativistic effects will become noticeable. Metrology gauges developed for the Space Interferometry Mission were used to search for locally anisotropic space-time, with a null result at the 10 to the negative tenth power level.

displacement metrology↗
NASA NTRS2004

Search for general relativistic effects in table-top displacement metrology

As displacement metrology accuracy improves, general relativistic effects will become noticeable. Metrology gauges developed for the Space Interferometry Mission, were used to search for locally anisotropic space-time, with a null result at the 10 to the negative 10th power level.

displacement metrology↗
NASA NTRS2006

Corner cube model for internal metrology system of Space Interferometer Mission (SIM)

A corner cube (CC) articulation model has been developed to evaluate the SIM internal metrology (IntMet) optical delay bias (with the accuracy of picometer) due to the component imperfections, such as vertex offset, reflection coating index error, dihedral error, and surface figure error at each facet. This physics-based and MATLAB-implemented geometric optics model provides useful guidance on the flight system design, integration, and characterization. The first portion of this paper covers the CC model details. Then several feature of the model, such as metrology beam footprint visualization, roofline straddling/crossing analysis, and application to drive the sub-system design and the error budget flow-down, are demonstrated in the second part.

Corner cube,↗
NASA NTRS2001

Optical metrology for testing an all-composite 2-meter diameter mirror

The Herschel Space Observatory (formerly known as FIRST) consists of a 3.5 m space telescope designed for use in the long IR and sub-milimeter wavebands. To demonstrate the viability of a carbon fiber composite telescope for this application, Composite Optics Incorporated (COI) manufactured a fast (f/1), large (2 m), lightweight (10.1 kg/m squared) demonstration mirror. A key challenge in demonstrating the performance of this novel mirror was to characterize the surface accuracy at cryogenic (70 K) temperatures. A wide variety of optical metrology techniques were investigated and a brief survey of empirical test results and limitations of the various techniques will be presented in this paper. Two complementary infrared (IR)techniques operating at a wavelength of 10.6 microns were chosen for further development: (1) IR Twyman-Green Phase Shifting Interferometry (IR PSI) and (2) IR Shack-Hartmann (IR SH) Wavefront Sensing. Innovative design modifications made to an existing IR PSI to achieve high-resolution, scannable, infrared measurements of the composite mirror are described. The modified interferometer was capable of measuring surface gradients larger than 350 microradians. The design and results of measurements made with a custom-built IR SH Wavefrong Sensor operating at 10.6 microns are also presented. A compact experimental setup permitting simultaneous operation of both the IR PSI and IR SH tools is shown. The advantages and the limitations of the two key IR metrology tools are discussed.

IR metrology phase shifting interferometry Shack-H↗
NASA NTRS2004

Wide angle astrometric demonstration on the micro-arcsecond metrology testbed for the space interferometry mission

The Space Interferometry Mission (SIM) requires fringe measurements to the level of picometers in order to produce astrometric data at the micro-arc-second level. To be more specific, it is necessary to measure both the position of the starlight central fringe and the change in the internal optical path of the interferometer to a few hundreds of picometers. The internal path is measured with a small heterodyne metrology beam, whereas the starlight fringe position is estimated with a CCD sampling a large concentric annular beam. One major challenge for SIM is to align the metrology beam with the starlight beam to keep the consistency between these two sensors at the system level while articulating the instrument optics over the field of view.

metrology↗
NASA NTRS2006

Laser Metrology Sensing and Control for Large Segmented-Mirror Telescopes

Described an optical hexapod metrology concept: a) Can work together with edge sensors; b) Can measure M1 - M2 distance and M1 global curvature. Swept-frequency laser metrology system: a) Absolute optical path length measurement (approx.1 micron); b) Relative optical path length measurement (approx.nm) Air turbulence is a concern for ground-based telescopes and needs further study.

large telescopes↗
NASA NTRS2011

Optimized Biasing of Pump Laser Diodes in a Highly Reliable Metrology Source for Long-Duration Space Missions

Optical metrology system reliability during a prolonged space mission is often limited by the reliability of pump laser diodes. We developed a metrology laser pump module architecture that meets NASA SIM Lite instrument optical power and reliability requirements by combining the outputs of multiple single-mode pump diodes in a low-loss, high port count fiber coupler. We describe Monte-Carlo simulations used to calculate the reliability of the laser pump module and introduce a combined laser farm aging parameter that serves as a load-sharing optimization metric. Employing these tools, we select pump module architecture, operating conditions, biasing approach and perform parameter sensitivity studies to investigate the robustness of the obtained solution.

808 mm diode pumps↗
NASA NTRS1981

NASA Metrology and Calibration, 1980

The proceedings of the fourth annual NASA Metrology and Calibration Workshop are presented. This workshop covered (1) review and assessment of NASA metrology and calibration activities by NASA Headquarters, (2) results of audits by the Office of Inspector General, (3) review of a proposed NASA Equipment Management System, (4) current and planned field center activities, (5) National Bureau of Standards (NBS) calibration services for NASA, (6) review of NBS's Precision Measurement and Test Equipment Project activities, (7) NASA instrument loan pool operations at two centers, (8) mobile cart calibration systems at two centers, (9) calibration intervals and decals, (10) NASA Calibration Capabilities Catalog, and (11) development of plans and objectives for FY 1981. Several papers in this proceedings are slide presentations only.

Source record↗
NASA NTRS1988

Langley Research Center Metrology Program status for fiscal year 1987

The status of the Langley Research Center's metrology program for fiscal year 1987 is presented. The NASA Metrology Information System, which was operational for the entire year, provided the majority of performance data describing work analysis, turnaround time, out-of-tolerance instrument data, and other instrument service data. Calibration system development, equipment replacing and updating, status of last year's planned objectives, and Reference Standard certification requirements are described. The status of the LaRC voltage and resistance measurement assurance program and the agency-wide resistance program are reviewed. Progress on fiscal year 1987 objectives is discussed and fiscal year 1988 objectives are stated.

Kern, Frederick A.↗
NASA NTRS1992

Front-End Processor For Metrology-Information System

Front-end processor for NASA Metrology Information System (NMIS) is real-time relational data-base computer system designed to distribute processing for NMIS mainframe system or run as stand-alone local-area-network data-base system. System used in large calibration laboratories for work control and to maintain records of calibration, repair, costs, manpower usage, traceability, and other pertinent facts about instruments supported by laboratories. Provides enhancements to existing NASA Metrology Information System and batches upload to minimize mainframe I/O at times of heavy usage.

Muse, Walter S.↗
NASA NTRS1991

Endoscopic measurement using radial metrology with digital correlation

Radial metrology combines standard optical measurement techniques with a unique panoramic annular lens (PAL) system to study material properties and deformations on the inner surfaces of the cavities found, for example, inside pipes, tubes, and boreholes. A PAL profilometer using speckle metrology is analyzed and the equations obtained from the analysis are used to calibrate the PAL profilometer when it is used to profile the inner surface of a cylindrical pipe and to measure the deformation of the pipe when it is subjected to diametral compression.

Matthys, Donald R.↗
NASA NTRS1992

Metrology of X-ray optics utilizing shearing interferometric techniques

This paper will discuss the optical testing of extreme grazing incidence mirror systems and normal incidence high-precision mirror systems during fabrication processing of the optical substrates. The optical metrology is closely coupled with an advanced material removal process which will be discussed in terms of the optical metrology. Interferometric data will be presented of the optical surfaces. Surface roughness data will be shown and discussed.

Baker, Phillip C.↗
NASA NTRS1991

NASA's Metrology and Calibration program

The success of the National Aeronautics and Space Administration's scientific and engineering projects is often based on the capability and quality of the metrology and calibration programs of its field centers and facilities. A Metrology and Calibration Working Group, having representation from each of the NASA field centers and facilities, was established to develop and implement a program to provide a centralized direction and agency wide focus. A brief history of the Group is presented. The development of the Group's operating philosophy, the long term objectives, the measurement research and development program, and review of accomplishments is discussed.

Kern, Frederick A.↗
NASA NTRS1985

Development and implementation of the NASA Metrology and Information System

The NASA Metrology Information System (NMIS) was developed as a subsystem of the NASA Equipment Management System (NEMS) to provide a standardized technique in managing the calibration programs of its field Centers and facilities. The NMIS is a computerized data-base system providing: automatic instrument calibration recall and control, historical data including calibration and repair labor and parts costs, incoming instrument performance condition; instrument data including description, manufacturer, model and serial number, and instrument user name location. NMIS automatically provides 28 standardized calibration system performance reports on a user selected schedule. An ad hoc report generation capability is also provided. A standardized form, the Metrology Control Document, was developed for use as a calibration work order and data input document. System implementation plan is presented.

German, Earl S.↗
NASA NTRS1994

Laser Metrology System For A Segmented Telescope Reflector

Report describes proposed laser metrology system in far-infrared telescope with segmented primary reflector. Telescope to be flown in outer space and used to observe celestial objects. Laser metrology system mounted on structure that supported secondary telescope reflector and measures relative positions and alignments of segments of primary reflector. System used in pointing as well as in maintaining surface figure.

Lau, Kenneth H.↗
NASA NTRS1993

NASA metrology and calibration, 1993

Th sixteenth annual workshop of NASA's Metrology and Calibration Working Group was held April 20-22, 1993. The goals of the Working Group are to provide Agencywide standardization of individual metrology programs, where appropriate; to promote cooperation and exchange of information within NASA, with other Government agencies, and with industry; to serve as the primary Agency interface with the National Institute of Standards and Technology; and to encourage formal quality control techniques such as Measurement Assurance Programs. These proceedings contain unedited reports and presentations from the workshop and are provided for information only.

Source record↗