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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 55 records · Page 3
All sourcesNASA NTRSDOE OSTI
NASA NTRS1972

Evaluation of errors in prior mean and variance in the estimation of integrated circuit failure rates using Bayesian methods

The critical point of any Bayesian analysis concerns the choice and quantification of the prior information. The effects of prior data on a Bayesian analysis are studied. Comparisons of the maximum likelihood estimator, the Bayesian estimator, and the known failure rate are presented. The results of the many simulated trails are then analyzed to show the region of criticality for prior information being supplied to the Bayesian estimator. In particular, effects of prior mean and variance are determined as a function of the amount of test data available.

Fletcher, B. C.↗
NASA NTRS1971

A system reliability analysis for stand-by spares with non-zero unpowered failure rates

Equations which define the reliability of n-fold parallel systems with stand-by spares, and triply redundant, majority-voting systems with stand-by spares have been derived. The stand-by spares have been assumed to have a non-zero failure rate while in the stand-by mode. A Monte Carlo system simulation has been generated and the results compared to the theoretical reliability predictions. A comparison of these two stand-by configurations is also presented for three through six total units.

Taylor, D. S.↗
NASA NTRS1979

Correlation study between vibrational environmental and failure rates of civil helicopter components

An investigation of two selected helicopter types, namely, the Models 206A/B and 212, is reported. An analysis of the available vibration and reliability data for these two helicopter types resulted in the selection of ten components located in five different areas of the helicopter and consisting primarily of instruments, electrical components, and other noncritical flight hardware. The potential for advanced technology in suppressing vibration in helicopters was assessed. The are still several unknowns concerning both the vibration environment and the reliability of helicopter noncritical flight components. Vibration data for the selected components were either insufficient or inappropriate. The maintenance data examined for the selected components were inappropriate due to variations in failure mode identification, inconsistent reporting, or inaccurate informaton.

Alaniz, O.↗
NASA NTRS1976

Voltage stress effects on microcircuit accelerated life test failure rates

The applicability of Arrhenius and Eyring reaction rate models for describing microcircuit aging characteristics as a function of junction temperature and applied voltage was evaluated. The results of a matrix of accelerated life tests with a single metal oxide semiconductor microcircuit operated at six different combinations of temperature and voltage were used to evaluate the models. A total of 450 devices from two different lots were tested at ambient temperatures between 200 C and 250 C and applied voltages between 5 Vdc and 15 Vdc. A statistical analysis of the surface related failure data resulted in bimodal failure distributions comprising two lognormal distributions; a 'freak' distribution observed early in time, and a 'main' distribution observed later in time. The Arrhenius model was shown to provide a good description of device aging as a function of temperature at a fixed voltage. The Eyring model also appeared to provide a reasonable description of main distribution device aging as a function of temperature and voltage. Circuit diagrams are shown.

Johnson, G. M.↗
NASA NTRSDate not supplied

The System Complexity Metric (SCM) Explains Systems Design and is Correlated with Cost and Failure Rate

The human short term memory span and working capacity is limited to three to five items, especially if they are organized complex “chunks” of information. The impression of complexity occurs when a system is simply difficult to understand, where there is no apparent pattern to predict its behavior. Hierarchical systems design can reduce perceived complexity and increase the amount of information that can be managed. The SCM was developed to measure complexity and help compare proposed overall system architectures before detailed design information is available. The SCM is defined as the sum of the number of major nodes, N, in the system block diagram plus the number of one-way interactions, I, between the nodes. SCM = N + I. SCM’s are easily determined by direct inspection of high-level block diagrams of life support systems. Axiomatic design develops a hierarchy of subsystem requirements and designs together in a top-down, back-and-forth process. A coupling matrix is used to control the relationships between the subsystem functions and design concepts. Axiomatic design can improve system design by decoupling requirements and designs. Axiomatic design was applied to the planning of a closed life support system, similar to that used on the International Space Station. A materially open as opposed to a closed system design was created by removing the interconnections required to close the system. The open system had the same number of designed subsystems as the closed system, but it had many fewer interconnections and its SCM was lower by about half. The costs were estimated and the MTBF (Mean Time Before Failure) tabulated for open and closed space life support systems. The estimated costs were linearly proportional to SCM for the wide variations of SCM in life support, but small differences may not be significant. The flight and preflight MTBF’s both declined exponentially with increasing MTBF, faster than MTBF-2, even though the preflight estimated MTBF’s were about ten times higher than the flight MTBF’s.

System Complexity Metric (SCM)↗
NASA NTRS1972

Development of KSC program for investigating and generating field failure rates. Volume 1: Summary and overview

A summary of the KSC program for investigating the reliability aspects of the ground support activities is presented. An analysis of unsatisfactory condition reports (RC), and the generation of reliability assessment of components based on the URC are discussed along with the design considerations for attaining reliable real time hardware/software configurations.

Bean, E. E.↗
NASA NTRS2017

Lognormal Uncertainty Estimation for Failure Rates

"Uncertainty analysis itself is uncertain, therefore, you cannot evaluate it exactly," Source Uncertain. Quantitative results for aerospace engineering problems are influenced by many sources of uncertainty. Uncertainty analysis aims to make a technical contribution to decision-making through the quantification of uncertainties in the relevant variables as well as through the propagation of these uncertainties up to the result. Uncertainty can be thought of as a measure of the 'goodness' of a result and is typically represented as statistical dispersion. This presentation will explain common measures of centrality and dispersion; and-with examples-will provide guidelines for how they may be estimated to ensure effective technical contributions to decision-making.

Britton, Paul T.↗
NASA NTRS1980

JANTX1N5554 switching diode

Micro Semiconductor and Semtech diodes were tested. In group 1 tests Micro Semiconductor and Semtech lot testing was stopped because of excess failure rate. Failure analysis was performed on group 1 and 3 because of apparent failure mode.

Source record↗
NASA NTRS1986

Reliability Research for Photovoltaic Modules

Report describes research approach used to improve reliability of photovoltaic modules. Aimed at raising useful module lifetime to 20 to 30 years. Development of cost-effective solutions to module-lifetime problem requires compromises between degradation rates, failure rates, and lifetimes, on one hand, and costs of initial manufacture, maintenance, and lost energy, on other hand. Life-cycle costing integrates disparate economic terms, allowing cost effectiveness to be quantified, allowing comparison of different design alternatives.

Ross, Ronald J., Jr.↗
NASA NTRSDate not supplied

Analysis and Optimization of Test Plans for Advanced Exploration Systems Reliability and Supportability

Future crewed exploration missions beyond Low Earth Orbit (LEO) will operate farther from Earth and be logistically isolated for longer than any previous human spaceflight mission. Under these conditions, supportability and reliability willbestronger drivers of mission mass and risk than they have been in the past. Items with high failure rates, or uncertain failure rates, can result in high spares mass requirements and/or high risk on deep space missions. Testing is a critical element of system development which provides the opportunity to identify and resolve design issues, defects, or other failure modes before they cause problems during a mission. Reliability growth programs can reduce failure rates by identifying and remove failure modes via design changes, and long-duration life testing can provide valuable data to reduce failure rate estimate uncertainty and verify (to some level of confidence) that components are as reliable as expected. Testing activities take time and resources, however, and must be incorporated into program plans in order to be fully effective. This paper presents an integrated reliability test plan analysis and optimization methodology, which has been used to inform Advanced Exploration Systems (AES) Life Support Systems (LSS) ground test planning for future missions. The methodology determines the optimal number of test units to purchase and allocation of test time –split between reliability growth and uncertainty reduction testing –across a given set of items in order to minimize spares mass for a given mission under constraints on total test cost and schedule. Model outputs also include expected spares mass after testing and the expected number of modifications or refurbishments during testing, both of which can inform program planning. Discussion of the model, conclusions, and future work are also presented.

Testing↗