Enabling Optical & Electrical Characterization of Al2O3/GaN Interfaces with Transparent ITO Contacts
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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.
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Tests performed to determine accuracy and efficiency of bus separators used in microprocessors are presented. Functional, AC parametric, and DC parametric tests were performed in a Tektronix S-3260 automated test system. All the devices passed the functional tests and yielded nominal values in the parametric test.
Raw data obtained from functional tests, data retention tests, and AC and DC parametric tests are presented along with schmoo plots. Rise/fall time screening results are included.
Two 22 cell batteries designed by Martin Marietta were tested. The batteries were rated at 26.5 Amp-Hr. The battery design is characterized by the following: Gates Aerospace 42B030AB15, 11 pos/12 neg, Pellon 2536 separator, passivated pos/teflonated neg. The tests can be summarized as follows: (1) no noticeable capacity loss after storage period; and (2) batteries exhibited larger non-uniformity of cell voltages during constant current charge.
Doped polyaniline blended with poly(ethylene oxide) has been electrospun in air to give fibers with diameters in the range 3 nm 200 nm. These fibers were captured on wafers of degenerately doped Si/SiO2 by placing the wafer in the path of the fiber jet formed during the electrospinning process. Individual fibers were contacted using shadow mask evaporation and were also captured on prepatterned wafers. Fibers having diameters greater than 100 nm show a slight increase in the conductivity as compared to the bulk film, while fibers with diameters less than 30 nm had lower conductivity than the bulk. Data on Scanning Conductance Microscopy along the length of individual fibers will be presented. For fibers where the diameter was not uniform, we found that below a certain diameter ( approx.15 nm) the fiber was less conducting as compared to thicker diameter fibers. Dependence of the fiber conductivity on a gate bias is underway and these results will also be presented.
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Test results using an engineering model Advanced NEXT thruster are presented to identify different arc types utilizing ground test hardware. Three distinct arc types were observed: grid-to-grid arcs, high voltage-to-chassis arcs, and a combination of both. The frequency of high voltage-to-chassis arcs ranged from 4-30%, depending on operating conditions and hardware configuration. Higher beam currents were typically associated with more frequent high voltage-to-chassis arcs. During these arcs, the measured chassis current levels ranged from 20-70 A, however a significant portion of the output beam current returned to the beam supply via the neutralizer cathode plasma, which may be a ground test facility effect. The paper also discusses conducted susceptibility tests that can be performed at the spacecraft level to address the transients associated with arcing events.
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The dimensional reduction of solids into smaller fragments provides a route to achieve new physical properties and gain deeper insight into the extended parent structures. Here, we report the synthesis of CuTOTP-OR (TOTP n – = 2,3,6,7-tetraoxidotriphenylene), a family of copper-based macrocycles that resemble truncated fragments of the conductive 2D metal–organic framework Cu 3 (HHTP) 2 (HHTP = 2,3,6,7,10,11-hexahydroxytriphenylene). The planar metal–organic macrocycles self-assemble into ordered nanotubes with internal diameters of ~2 nm and short interlayer distances of ~3.20 Å. Strong π–π stacking interactions between macrocycles facilitate out-of-plane charge transport, and pressed pellet conductivities as high as 2(1)×10 -3 S cm -1 are observed. Peripheral alkyl functionalization enhances solution processability and enables the fabrication of thin-film field-effect transistor devices. Ambipolar charge transport is observed, suggesting similar behavior may be operative in Cu 3 (HHTP) 2 . By coupling the attractive features of metal–organic frameworks with greater processability, these macrocycles enable facile device integration and a more nuanced understanding of out-of-plane charge transport in 2D conductive metal–organic frameworks.
Fourier analysis is basis of method of characterizing electrical frequency or time response of photodetector. In method, detector stimulated by optical input signal, intensity modulated with square wave or other repetitive waveform of known frequency spectrum, and output of detector recorded. Electro-optical transfer function, which characterizes frequency response of detector, then computed as ratio between discrete Fourier transforms of output and input waveforms.
This article presents the antenna-integrated glass interposer for D-band 6G wireless applications using dieembedding technology. Here, we implement the die-embedded package on glass substrates and characterize the electrical performance in the D-band. The electrical characterization employs embedded test dies with the 50-Ω ground–signal–ground (GSG) ports and coplanar waveguides. We achieve low-loss die-to-package transitions by using staggered dielectric vias, which are compared with the transitions of wire-bonding and flip-chip assembly. This article provides detailed information on the design, modeling, fabrication, and characterization of the die-to-package interconnects. This article also demonstrates the integration of microstrip patch antenna array and embedded dies in the D-band. The results show superior electrical performance provided by the die-embedded glass interposer. The die-to-package interconnect exhibits good matching (less than —10-dB S11) and low loss (0.2-dB loss) in the D-band. The integrated 1 × 8 patch antenna array shows 11.6-dB broadside gain and good matching with the embedded die. In addition, by using a temporary carrier, the antenna-integrated glass interposer also has great potential for further heterogeneous integration and thermal management.
Understanding household peak electricity demand is critical to evaluate the technical need for electrical infrastructure upgrades. This study characterizes peak loads for existing and new equipment using metered data from a convenience sample of 11,940 U.S. dwellings from four sources, including 911 from two sources with end-use metering. After standardized data cleaning and labeling, we derived descriptive statistics for key metrics, such as maximum demand and demand factors, and developed predictive models relating 60- to 15-min demand for the National Electrical Code (NEC). Mean 15-min maximum demand was 9.7 kW (median 9.0 kW; IQR 7.0–11.5 kW, 95% CI 9.6–9.8 kW), indicating spare capacity in 98% of homes with hypothetical 100 A panels. Maximum demand increased with floor area and number of high-demand loads. Dwelling maximum demand was driven by higher-power, longer-duration heating appliances and vehicle charging, while most user-operated appliances contributed little. Demand factors are used to account for how most devices contribute less than their rated power to maximum demand. Existing load mean demand factors (28%; median 10%; IQR 0–58%; CI 28–29%) were higher than those for new loads (21%; median 7%; IQR 0–35%; CI 20–21%), because new loads changed the timing and magnitude of maximum demand. New high-demand loads had higher than average demand factors (40–60%). Whole dwelling demand factors support the NEC's 40% assumption, but they challenge its conservative 100% treatment of new HVAC. We propose a data-driven 50% demand factor for new equipment, which would align with metered data, improve affordability, and modernize electrical codes.
NASAs Hall Effect Rocket with Magnetic Shielding (HERMeS) 12.5 kW Technology Demonstration Unit-1 (TDU-1) Hall thruster has been the subject of extensive technology maturation in preparation for development into a flight ready propulsion system. Part of the technology maturation was to test the TDU-1 thruster in several ground based electrical configurations to assess the thruster robustness and suitability to successful in-space operation. The ground based electrical configuration testing has recently been demonstrated as an important step in understanding and assessing how a Hall thruster may operate differently in space compared to ground based testing, and to determine the best configuration to conduct development and qualification testing. This presentation will cover the electrical configuration testing of the TDU-1 HERMeS Hall thruster in NASA Glenn Research Centers Vacuum Facility 5. The three electrical configurations examined are the thruster body tied to facility ground, thruster floating, and finally the thruster body electrically tied to cathode common. The TDU-1 HERMeS was configured with two different exit plane boundary conditions, dielectric and conducting, to examine the influence on the electrical configuration characterization.
The NASA Hall Effect Rocket with Magnetic Shielding (HERMeS) 12.5 kW Technology Demonstration Unit-1 (TDU-1) Hall thruster has been the subject of extensive technology maturation in preparation for development into a flight ready propulsion system. Part of the technology maturation was to test the TDU-1 thruster in several ground based electrical configurations to assess the thruster robustness and suitability to successful in-space operation. The ground based electrical configuration testing has recently been demonstrated as an important step in understanding and assessing how a Hall thruster may operate differently in-space compared to ground based testing, and to determine the best configuration to conduct development and qualification testing. This paper describes the electrical configuration testing of the HERMeS TDU-1 Hall thruster in NASA Glenn Research Center's Vacuum Facility 5. The three electrical configurations examined were 1) thruster body tied to facility ground, 2) thruster floating, and 3) thruster body electrically tied to cathode common. The HERMeS TDU-1 Hall thruster was also configured with two different exit plane boundary conditions, dielectric and conducting, to examine the influence on the electrical configuration characterization.
Evaluation of the long term effects on aerospace nickel cadmium cells is described. A number of 6Ah and 12Ah capacity cells which were stored in shorted condition for 9 to 11 years at the Goddard Space Flight Center were selected for the study. Of the three tests which were initiated (initial and final destruction analyses of the test cells, electrical characterization tests, and life cycling tests) only the electrical characterization tests are completed; the other tests are scheduled to be completed by February 1987. The preliminary electrial performance data from the life cycling test and chemical composition data from the destructive testing indicate no anomalous behavior.
One of the objectives of the PASP experiment is the verification of cost-effective ground simulations of high-voltage solar array/space-environment interactions by comparing the results with flight data. These ground tests consist of electrical characterization, thermal cycling, and plasma chamber simulations. The results of the latter tests are reported. Five array modules which are representative of the flight arrays were tested. The module types are planar silicon, planar gallium arsenide, planar silicon passivated with an integrally deposited cover glass, mini-Cassegrainian concentrator, and SLATS concentrator. The modules were biased to -1000 V in varying plasma densities from 4 x 103 to 2 x 105 e-/cu cm. Each array was tested in both dark and illuminated conditions with a load resistance. In addition to monitoring arcing during the plasma tests, the arrays were visually inspected and electrically characterized before and after exposure in the chamber. The electrical results are tabulated and briefly discussed.
The automated data acquisition system developed in the Space Science Laboratory at Marshall Space Flight Center for measuring electrical properties of high temperature superconductors is described. The acquisition system, consisting of a computer and computer-controlled hardware, allows large numbers of voltage, current, temperature, and magnetic measurements to be performed on bulk and thin film samples. Typical results are shown characterizing transition temperature (T sub c), critical current density (J sub c), and magnetic properties of bulk high T(sub c) materials as a function of temperature.