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NASA NTRSDate not supplied

Towards Qualification and Certification of Laser Powder Bed Fusion Ti-6Al-4V with In-Situ Process Monitoring and Automated Defect Detection

Qualification and certification of laser powder bed fusion (LPBF) parts are two challenges that must be answered to ensure suitability for critical applications. In-situ monitoring using high frame rate thermal and conventional optical imaging sensors is applied to the LPBF build process. Currently, the large volume of data from such sensors becomes untenable for manual inspection in production environments. This presentation serves to address this in-situ monitoring deficiency in two ways. First, a framework for managing data streams from LPBF process monitoring sensors is described. Second, two candidate image analysis techniques are presented: one is a set of heuristics that are easily interpretable, and the other is an uninterpretable convolutional neural network. These strategies are compared in terms of performance, computational expense, and speed. These methodologies represent platforms for connecting processing conditions to process modeling efforts aligned with the qualification and certification mission for LPBF Ti-6Al-4V components.

Qualification↗

NASA NTRSDate not supplied

In Situ Monitoring for Defect Detection and Certification of AM

Explore the source record for details and available documents.

in situ monitoring↗

NASA NTRS1994

An experiment to assess the cost-benefits of code inspections in large scale software development

This experiment (currently in progress) is designed to measure costs and benefits of different code inspection methods. It is being performed with a real development team writing software for a commercial product. The dependent variables for each code unit's inspection are the elapsed time and the number of defects detected. We manipulate the method of inspection by randomly assigning reviewers, varying the number of reviewers and the number of teams, and, when using more than one team, randomly assigning author repair and non-repair of detected defects between code inspections. After collecting and analyzing the first 17 percent of the data, we have discovered several interesting facts about reviewers, about the defects recorded during reviewer preparation and during the inspection collection meeting, and about the repairs that are eventually made. (1) Only 17 percent of the defects that reviewers record in their preparations are true defects that are later repaired. (2) Defects recorded at the inspection meetings fall into three categories: 18 percent false positives requiring no author repair, 57 percent soft maintenance where the author makes changes only for readability or code standard enforcement, and 25 percent true defects requiring repair. (3) The median elapsed calendar time for code inspections is 10 working days - 8 working days before the collection meeting and 2 after. (4) In the collection meetings, 31 percent of the defects discovered by reviewers during preparation are suppressed. (5) Finally, 33 percent of the true defects recorded are discovered at the collection meetings and not during any reviewer's preparation. The results to date suggest that inspections with two sessions (two different teams) of two reviewers per session (2sX2p) are the most effective. These two-session inspections may be performed with author repair or with no author repair between the two sessions. We are finding that the two-session, two-person with repair (2sX2pR) inspections are the most expensive, taking 15 working days of calendar time from the time the code is ready for review until author repair is complete, whereas two-session, two-person with no repair (2sX2pN) inspections take only 10 working days, but find about 10 percent fewer defects.

Porter, A.↗

NASA NTRS2015

Detection of CFRP Composite Manufacturing Defects Using a Guided Wave Approach

NASA Langley Research Center is investigating a guided-wave based defect detection technique for as-fabricated carbon fiber reinforced polymer (CFRP) composites. This technique will be extended to perform in-process cure monitoring, defect detection and size determination, and ultimately a closed-loop process control to maximize composite part quality and consistency. The overall objective of this work is to determine the capability and limitations of the proposed defect detection technique, as well as the number and types of sensors needed to identify the size, type, and location of the predominant types of manufacturing defects associated with laminate layup and cure. This includes, porosity, gaps, overlaps, through-the-thickness fiber waviness, and in-plane fiber waviness. The present study focuses on detection of the porosity formed from variations in the matrix curing process, and on local overlaps intentionally introduced during layup of the prepreg. By terminating the cycle prematurely, three 24-ply unidirectional composite panels were manufactured such that each subsequent panel had a higher final degree of cure, and lower level of porosity. It was demonstrated that the group velocity, normal to the fiber direction, of a guided wave mode increased by 5.52 percent from the first panel to the second panel and 1.26 percent from the second panel to the third panel. Therefore, group velocity was utilized as a metric for degree of cure and porosity measurements. A fully non-contact guided wave hybrid system composed of an air-coupled transducer and a laser Doppler vibrometer (LDV) was used for the detection and size determination of an overlap By transforming the plate response from the time-space domain to the frequency-wavenumber domain, the total wavefield was then separated into the incident and backscatter waves. The overlap region was accurately imaged by using a zero-lag cross-correlation (ZLCC) imaging condition, implying the incident and backscattered waves are in phase over the overlap boundaries.

Hudson, Tyler B.↗

NASA NTRS1998

Nonlinear ultrasonic scanning to detect material defects

A method and system are provided to detect defects in a material. Waves of known frequency(ies) are mixed at an interaction zone in the material. As a result, at least one of a difference wave and a sum wave are generated in the interaction zone. The difference wave occurs at a difference frequency and the sum wave occurs at a sum frequency. The amplitude of at least one nonlinear signal based on the sum and/or difference waves is then measured. The nonlinear signal is defined as the amplitude of one of the difference wave and sum wave relative to the product of the amplitude of the surface waves. The amplitude of the nonlinear signal is an indication of defects (e.g., dislocation dipole density) in the interaction zone.

Yost, William T.↗

NASA NTRS2002

Scanning Ultrasonic Spectroscopy System Developed for the Inspection of Composite Flywheels

Composite flywheels are being considered as replacements for chemical batteries aboard the International Space Station. A flywheel stores energy in a spinning mass that can turn a generator to meet power demands. Because of the high rotational speeds of the spinning mass, extensive testing of the flywheel system must be performed prior to flight certification. With this goal in mind, a new scanning system has been developed at the NASA Glenn Research Center for the nondestructive inspection of composite flywheels and flywheel subcomponents. The system uses ultrasonic waves to excite a material and examines the response to detect and locate flaws and material variations. The ultrasonic spectroscopy system uses a transducer to send swept-frequency ultrasonic waves into a test material and then receives the returning signal with a second transducer. The received signal is then analyzed in the frequency domain using a fast Fourier transform. A second fast Fourier transform is performed to examine the spacing of the peaks in the frequency domain. The spacing of the peaks is related to the standing wave resonances that are present in the material because of the constructive and destructive interferences of the waves in the full material thickness as well as in individual layers within the material. Material variations and flaws are then identified by changes in the amplitudes and positions of the peaks in both the frequency and resonance spacing domains. This work, conducted under a grant through the Cleveland State University, extends the capabilities of an existing point-by-point ultrasonic spectroscopy system, thus allowing full-field automated inspection. Results of an ultrasonic spectroscopy scan of a plastic cylinder with intentionally seeded flaws. The result of an ultrasonic spectroscopy scan of a plastic cylinder used as a proof-of-concept specimen is shown. The cylinder contains a number of flat bottomed holes of various sizes and shapes. The scanning system was able to successfully detect all the defects in the material. Ultrasonic spectroscopy results for a second specimen are shown along with a conventional ultrasonic C-scan. The second specimen is a section of a flywheel subcomponent that has a series of drilled holes and notches. This specimen is employed as a defect detection standard to evaluate the various nondestructive evaluation methods under consideration. Scanning results demonstrate the ability of the system to detect flaws on the order of 10 mils in the radial direction and 5 mils in the circumferential direction. Work conducted to date has shown that scanning ultrasonic spectroscopy is a viable tool for the inspection of composite flywheel systems. Ongoing development work is focused on refining the system and scanning parameters for improved resolution and defect detection.

Martin, Richard E.↗

NASA NTRSDate not supplied

Spoof Plasmon Polaritons for NDE Applications an Experimental Demonstration

NASA is exploring the use of microwave spoof plasmon polaritons to detect defects in metallic structures. This work investigates the detection of simulated defects in the form of aluminum wires as small as 1.6 mm diameter and 2mm long that are placed in a grooved aluminum test article. The inclusions simulate manufacturing defects, and the sum of the delta impedance is shown to increase with increasing volume of added metal. A threshold value of 50Ω has been proposed for defect detection. In addition to detecting defects, the technique also estimates the volume of the defect.

Microwave↗

NASA NTRSDate not supplied

Spoof Plasmon Sensing for NDE Application

NASA is exploring the use of microwave spoof plasmon polaritons to detect defects in metallic structures. This work investigates the detection of simulated defects in the form of aluminum wires as small as 1.6 mm diameter and 2 mm long that are placed in a grooved aluminum test article. The inclusions simulate manufacturing defects, and the sum of the delta impedance is shown to increase with increasing volume of added metal. Based on the results, a threshold value of 50Ω has been proposed for defect detection. In addition to detecting defects, the technique also estimates the volume of the defect.

Microwave↗

NASA NTRS2022

Assurance Equations: A Cost and Criticality Model for Optimizing Quality Assurance Surveillance

The cost of quality vs cost of failure correction has been a long-running topic of discussion within the Aerospace community. It leads directly to concepts of “risk tolerance”, and risk-based decision-making. It would be valuable if there was a way to compute the optimal investment in customer-executed quality assurance activities using defect significance with respect to performance objectives, the activities’ defect detection effectiveness, and the cost-penalty for late discovery of impactful defects. This optimization is particularly of interest to projects whose budget constraints significantly limit their risk management options.The cost to fix defects (i.e., failure correction) escalates as the project matures. There have been studies attempting to determine the relative cost of fixing defects discovered during various phases of a project life cycle with important implications, all of which suggest growth factors are large. The commonly referred to 1:10:100 rule represents a cost multiplier for repair/rework across the Design to Fab to Test hardware development phases. Cost premiums for QA activities also accumulate when they are treated as mandatory (due to schedule drag) or are performed later than their assigned phase.This paper describes the modeling of development phase -dependencies in the conduct of typical customer-executed quality assurance activities. Our initial modeling encompasses:• Distinct phases of the production lifecycle• Multiple kinds of Defects, each with some a-priori likelihood of being present• Each defect’s impact on performance Objectives for a type of hardware• The cost and efficacy of assurance techniques at detecting such Defects• The costs of fixing those Defects detected in a given phase of the production lifecycleThe model captures assurance activities’ abilities to Detect defects. Upon detection it is assumed that the Defect is immediately fixed. Defects that “escape” detection by some activity may thereafter be detected by a later activity, but by then the cost of fixing the Defect may have escalated. Defects are related to the performance Objectives they would detract from, were those Defects to remain present in the operating system.We have constructed and are exploring, a model that relates the importance of hardware system elements to mission objectives, the impact of types of Defects on those hardware types, the cost of customer-executed assurance activities (i.e., supplier controls) and their effectiveness towards reducing an impactful quality escape, and the cost of Defect correction across production phase. We describe the approach taken to select the key model aspects, why they are relevant to our NASA mission, and our efforts to populate it with relevant and contemporary data. We use a notional example to illustrate model design and function.

Plante, Jeannette↗

NASA NTRS1994

Probability of detection of defects in coatings with electronic shearography

The goal of this research was to utilize statistical methods to evaluate the probability of detection (POD) of defects in coatings using electronic shearography. The coating system utilized in the POD studies was to be the paint system currently utilized on the external casings of the NASA Space Transportation System (STS) Revised Solid Rocket Motor (RSRM) boosters. The population of samples was to be large enough to determine the minimum defect size for 90 percent probability of detection of 95 percent confidence POD on these coatings. Also, the best methods to excite coatings on aerospace components to induce deformations for measurement by electronic shearography were to be determined.

Maddux, Gary A.↗

NASA NTRS1995

Probability of detection of defects in coatings with electronic shearography

The goal of this research was to utilize statistical methods to evaluate the probability of detection (POD) of defects in coatings using electronic shearography. The coating system utilized in the POD studies was to be the paint system currently utilized on the external casings of the NASA space transportation system reusable solid rocket motor boosters. The population of samples was to be large enough to determine the minimum defect size for 90-percent POD of 95-percent confidence POD on these coatings. Also, the best methods to excite coatings on aerospace components to induce deformations for measurement by electronic shearography were to be determined.

Russell, S. S.↗

NASA NTRS2009

Connecting Research and Practice: An Experience Report on Research Infusion with SAVE

NASA systems need to be highly dependable to avoid catastrophic mission failures. This calls for rigorous engineering processes including meticulous validation and verification. However, NASA systems are often highly distributed and overwhelmingly complex, making the software portion of these systems challenging to understand, maintain, change, reuse, and test. NASA's systems are long-lived and the software maintenance process typically constitutes 60-80% of the total cost of the entire lifecycle. Thus, in addition to the technical challenges of ensuring high life-time quality of NASA's systems, the post-development phase also presents a significant financial burden. Some of NASA's software-related challenges could potentially be addressed by some of the many powerful technologies that are being developed in software research laboratories. Many of these research technologies seek to facilitate maintenance and evolution by for example architecting, designing and modeling for quality, flexibility, and reuse. Other technologies attempt to detect and remove defects and other quality issues by various forms of automated defect detection, architecture analysis, and various forms of sophisticated simulation and testing. However promising, most such research technologies nevertheless do not make the transition from the research lab to the software lab. One reason the transition from research to practice seldom occurs is that research infusion and technology transfer is difficult. For example, factors related to the technology are sometimes overshadowed by other types of factors such as reluctance to change and therefore prohibits the technology from sticking. Successful infusion might also take very long time. One famous study showed that the discrepancy between the conception of the idea and its practical use was 18 years plus or minus three. Nevertheless, infusing new technology is possible. We have found that it takes special circumstances for such research infusion to succeed: 1) there must be evidence that the technology works in the practitioner's particular domain, 2) there must be a potential for great improvements and enhanced competitive edge for the practitioner, 3) the practitioner has to have strong individual curiosity and continuous interest in trying out new technologies, 4) the practitioner has to have support on multiple levels (i.e. from the researchers, from management, from sponsors etc), and 5) to remain infused, the new technology has to be integrated into the practitioner's processes so that it becomes a natural part of the daily work. NASA IV&V's Research Infusion initiative sponsored by NASA's Office of Safety & Mission Assurance (OSMA) through the Software Assurance Research Program (SARP), strives to overcome some of the problems related to research infusion.

Lindvall, Mikael↗

NASA NTRS2009

Measurement Variability of Vertical Scanning Interferometry Tool Used for Orbiter Window Defect Assessment

The ability to sufficiently measure orbiter window defects to allow for window recertification has been an ongoing challenge for the orbiter vehicle program. The recent Columbia accident has forced even tighter constraints on the criteria that must be met in order to recertify windows for flight. As a result, new techniques are being investigated to improve the reliability, accuracy and resolution of the defect detection process. The methodology devised in this work, which is based on the utilization of a vertical scanning interferometric (VSI) tool, shows great promise for meeting the ever increasing requirements for defect detection. This methodology has the potential of a 10-100 fold greater resolution of the true defect depth than can be obtained from the currently employed micrometer based methodology. An added benefit is that it also produces a digital elevation map of the defect, thereby providing information about the defect morphology which can be utilized to ascertain the type of debris that induced the damage. However, in order to successfully implement such a tool, a greater understanding of the resolution capability and measurement repeatability must be obtained. This work focused on assessing the variability of the VSI-based measurement methodology and revealed that the VSI measurement tool was more repeatable and more precise than the current micrometer based approach, even in situations where operator variation could affect the measurement. The analysis also showed that the VSI technique was relatively insensitive to the hardware and software settings employed, making the technique extremely robust and desirable

Padula, Santo, II↗

NASA NTRS2018

A Screening Method Using Pulsed-Power Combined with Infrared Imaging to Detect Pattern Defects in Bulk Metal Foil or Thin Film Resistors

Bulk metal foil and thin film resistors occasionally contain localized defects within the etched resistor pattern. Common defects of this type include in-line constrictions referred to as notches, unremoved resistor material bridges between adjacent pattern lines, and embedded non-conductive particles in the resistor material. Such defects are prone to fracture due to thermomechanical fatigue during powered operation, especially power cycling, resulting in positive resistance change and open circuit failure modes. Common screening methods of optical microscopy, short time overload power tests (e.g., 6.25x rated power for 5 seconds) and burn-in (e.g., 1.5x rated power for 100 hours) are useful, but they are not always effective at removing devices with such defects. An improved method has been developed to screen for localized resistor pattern defects. The method involves the application of brief, high power electrical pulses at a low duty cycle while inspecting the resistor with a high resolution, high speed infrared camera. The following test conditions were found to be suitable for this purpose: 6.25x rated power, 1 to 5 pulses, 50 ms pulse width and 10% duty cycle. During the power pulsing, localized constrictions in the resistor pattern are identifiable as hot spots via the infrared camera. Reject criteria can be established based on observations of hot spots. To assess its effectiveness, a total of two hundred eighty (280) surface mount foil resistors (40 each from 7 different lots) were screened using this infrared technique. The screening identified twenty-nine (29) resistors with significant hot spots in the resistor pattern. All 280 resistors were then subjected to an industry standard 10,000 hour life test at 1x rated power at 70°C with power cycled for 90 minutes on and 30 minutes off. During life testing, three resistors exhibited positive resistance change failure mode. All three failures were due to thermomechanical fatigue failure of localized bridge defects at the locations identified via infrared screening. The results of this evaluation illustrate the benefits of the pulsed-power infrared detection screening technique to identify reliability suspect foil or thin film resistors that may escape common screening methods.

screening↗

NASA NTRS2018

A Screening Method Using Pulsed-Power Combined with Infrared Imaging to Detect Pattern Defects in Bulk Metal Foil or Thin Film Resistors

screening↗

NASA NTRS2002

Finding Feasible Abstract Counter-Examples

A strength of model checking is its ability to automate the detection of subtle system errors and produce traces that exhibit those errors. Given the high computational cost of model checking most researchers advocate the use of aggressive property-preserving abstractions. Unfortunately, the more aggressively a system is abstracted the more infeasible behavior it will have. Thus, while abstraction enables efficient model checking it also threatens the usefulness of model checking as a defect detection tool, since it may be difficult to determine whether a counter-example is feasible and hence worth developer time to analyze. We have explored several strategies for addressing this problem by extending an explicit-state model checker, Java PathFinder (JPF), to search for and analyze counter-examples in the presence of abstractions. We demonstrate that these techniques effectively preserve the defect detection ability of model checking in the presence of aggressive abstraction by applying them to check properties of several abstracted multi-threaded Java programs. These new capabilities are not specific to JPF and can be easily adapted to other model checking frameworks; we describe how this was done for the Bandera toolset.

Pasareanu, Corina S.↗

NASA NTRS1980

Detecting insulation defects in metal/plastic films

Simple apparatus checks insulation between plastic and metal surfaces. Film can be inspected more accurately; apparatus can spot minute electrical contaminants between plastic and metal films. Steel roller connected to high-range ohmmeter is guided over entire plastic area of test sample. Roller weighs 2 lb. (0.9 kg), which effectively translates into 250-psi (1.76X10 to 6th power -N/sq m) contact pressure at plastic surface sufficient to locate microscopic defects.

Buggle, R. N.↗

NASA NTRS2002

Scanning Electron Microscope Mapping System Developed for Detecting Surface Defects in Fatigue Specimens

An automated two-degree-of-freedom specimen positioning stage has been developed at the NASA Glenn Research Center to map and monitor defects in fatigue specimens. This system expedites the examination of the entire gauge section of fatigue specimens so that defects can be found using scanning electron microscopy (SEM). Translation and rotation stages are driven by microprocessor-based controllers that are, in turn, interfaced to a computer running custom-designed software. This system is currently being used to find and record the location of ceramic inclusions in powder metallurgy materials. The mapped inclusions are periodically examined during interrupted fatigue experiments. The number of cycles to initiate cracks from these inclusions and the rate of growth of initiated cracks can then be quantified. This information is necessary to quantify the effect of this type of defect on the durability of powder metallurgy materials. This system was developed with support of the Ultra Safe program.

Bonacuse, Peter J.↗