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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 55 records · Page 3
All sourcesNASA NTRSDOE OSTI
NASA NTRS2000

Evaluation of Data Retention and Imprint Characteristics of FRAMs Under Environmental Stresses for NASA Applications

A major reliability issue for all advanced nonvolatile memory (NVM) technology devices including FRAMs (Ferroelectric random access memories) is the data retention characteristics over extended period of time, under environmental stresses and exposure to total ionizing dose (TID) radiation effects. For this testing, 256 Kb FRAMs in 28-pin plastic DIPS, rated for industrial grade temperature range of -40 C to +85 C, were procured. These are two-transistor, two-capacitor (2T-2C) design FRAMs. In addition to data retention characteristics, the parts were also evaluated for imprint failures, which are defined as the failure of cells to change from a "preferred" state, where it has been for a significant period of time to an opposite state (e.g., from 1 to 0, or 0 to 1). These 256 K FRAMs were subjected to scanning acoustic microscopy (C-SAM); 1,000 temperature cycles from -65 C to +150 C; high temperature aging at 150 C, 175 C, and 200 C for 1,000 hours; highly accelerated stress test (HAST) for 500 hours; 1,000 hours of operational life test at 125 C; and total ionizing dose radiation testing. As a preconditioning, 10 K read/write cycles were performed on all devices. Interim electrical measurements were performed throughout this characterization, including special imprint testing and final electrical testing. Some failures were observed during high temperature aging test at 200 C, during HAST testing, and during 1,000 hours of operational life at 125 C. The parts passed 10 Krad exposure, but began showing power supply current increases during the dose increment from 10 Krad to 30 Krad, and at 40 Krad severe data retention and parametric failures were observed. Failures from various environmental group testing are currently being analyzed.

Sharma, Ashok K.↗
NASA NTRS1982

Investigation of reliability attributes and accelerated stress factors on terrestrial solar cells

The accelerated stress test results obtained on all terrestrial solar cells since the inception of the program are summarized. Tested cells were grouped according to the method used to form the conductive metallization layer: solder dipped, vacuum deposited, screen printed, and copper plated. Although metallization systems within each group were quite similar, they differed in numerous details according to the procedures employed by each manufacturer. Test results were summarized for all cells according to both electrical degradation and catastrophic mechanical changes. These results indicated a variability within each metallization category which was dependent on the manufacturer. Only one manufacturer was represented in the copper plated category and, although these showed no signs of detrimental copper diffusion during high temperature testing, their metallization was removed easily during high humidity pressure cooker testing. Preliminary testing of encapsulated cells showed no major differences between encapsulated and unencapsulated cells when subjected to accelerated testing.

Lathrop, J. W.↗
NASA NTRS1985

Reliability and Engineering of Thin-Film Photovoltaic Modules. Research forum proceedings

A Research Forum on Reliability and Engineering of Thin Film Photovoltaic Modules, under sponsorship of the Jet Propulsion Laboratory's Flat Plate Solar Array (FSA) Project and the U.S. Department of Energy, was held in Washington, D.C., on March 20, 1985. Reliability attribute investigations of amorphous silicon cells, submodules, and modules were the subjects addressed by most of the Forum presentations. Included among the reliability research investigations reported were: Arrhenius-modeled accelerated stress tests on a Si cells, electrochemical corrosion, light induced effects and their potential effects on stability and reliability measurement methods, laser scribing considerations, and determination of degradation rates and mechanisms from both laboratory and outdoor exposure tests.

Ross, R. G., Jr.↗
NASA NTRS1984

A study of environmental characterization of conventional and advanced aluminum alloys for selection and design. Phase 1: Literature review

A review of the literature is presented with the objectives of identifying relationships between various accelerated stress corrosion testing techniques, and for determining the combination of test methods best suited to selection and design of high strength aluminum alloys. The following areas are reviewed: status of stress-corrosion test standards, the influence of mechanical and environmental factors on stress corrosion testing, correlation of accelerated test data with in-service experience, and procedures used to avoid stress corrosion problems in service. Promising areas for further work are identified.

Sprowls, D. O.↗
NASA NTRS1984

A study of environmental characterization of conventional and advanced aluminum alloys for selection and design. Phase 2: The breaking load test method

A technique is demonstrated for accelerated stress corrosion testing of high strength aluminum alloys. The method offers better precision and shorter exposure times than traditional pass fail procedures. The approach uses data from tension tests performed on replicate groups of smooth specimens after various lengths of exposure to static stress. The breaking strength measures degradation in the test specimen load carrying ability due to the environmental attack. Analysis of breaking load data by extreme value statistics enables the calculation of survival probabilities and a statistically defined threshold stress applicable to the specific test conditions. A fracture mechanics model is given which quantifies depth of attack in the stress corroded specimen by an effective flaw size calculated from the breaking stress and the material strength and fracture toughness properties. Comparisons are made with experimental results from three tempers of 7075 alloy plate tested by the breaking load method and by traditional tests of statistically loaded smooth tension bars and conventional precracked specimens.

Sprowls, D. O.↗
NASA NTRS2001

Accelerated Testing Methodology in Constant Stress-Rate Testing for Advanced Structural Ceramics: A Preloading Technique

Preloading technique was used as a means of an accelerated testing methodology in constant stress-rate ('dynamic fatigue') testing for two different brittle materials. The theory developed previously for fatigue strength as a function of preload was further verified through extensive constant stress-rate testing for glass-ceramic and CRT glass in room temperature distilled water. The preloading technique was also used in this study to identify the prevailing failure mechanisms at elevated temperatures, particularly at lower test rate in which a series of mechanisms would be associated simultaneously with material failure, resulting in significant strength increase or decrease. Two different advanced ceramics including SiC whisker-reinforced composite silicon nitride and 96 wt% alumina were used at elevated temperatures. It was found that the preloading technique can be used as an additional tool to pinpoint the dominant failure mechanism that is associated with such a phenomenon of considerable strength increase or decrease.

Choi, Sung R.↗
NASA NTRS2001

Accelerated Testing Methodology in Constant Stress-Rate Testing for Advanced Structural Ceramics: A Preloading Technique

Preloading technique was used as a means of an accelerated testing methodology in constant stress-rate (dynamic fatigue) testing for two different brittle materials. The theory developed previously for fatigue strength as a function of preload was further verified through extensive constant stress-rate testing for glass-ceramic and CRT glass in room temperature distilled water. The preloading technique was also used in this study to identify the prevailing failure mechanisms at elevated temperatures, particularly at lower test rates in which a series of mechanisms would be associated simultaneously with material failure, resulting in significant strength increase or decrease. Two different advanced ceramics including SiC whisker-reinforced composite silicon nitride and 96 wt% alumina were used at elevated temperatures. It was found that the preloading technique can be used as an additional tool to pinpoint the dominant failure mechanism that is associated with such a phenomenon of considerable strength increase or decrease.

Choi, Sung R.↗
NASA NTRS1982

Development of a photovoltaic module qualification test based on combined-environment accelerated stress data

The U.S. Coast Guard has developed a qualification test to screen photovoltaic modules for utilization on marine aids to navigation. The test is based on a combined-environment of hot and cold saltwater immersion and air pressurization. The test has demonstrated a very high acceleration factor and excellent correlation of electrical failures with modules in a concurrent real-time marine exposure.

Trenchard, S. E.↗
NASA NTRS2011

Composite Overwrapped Pressure Vessels (COPV): Flight Rationale for the Space Shuttle Program

Each Orbiter Vehicle (Space Shuttle Program) contains up to 24 Kevlar49/Epoxy Composite Overwrapped Pressure Vessels (COPV) for storage of pressurized gases. In the wake of the Columbia accident and the ensuing Return To Flight (RTF) activities, Orbiter engineers reexamined COPV flight certification. The original COPV design calculations were updated to include recently declassified Kevlar COPV test data from Lawrence Livermore National Laboratory (LLNL) and to incorporate changes in how the Space Shuttle was operated as opposed to orinigially envisioned. 2005 estimates for the probability of a catastrophic failure over the life of the program (from STS-1 through STS-107) were one-in-five. To address this unacceptable risk, the Orbiter Project Office (OPO) initiated a comprehensive investigation to understand and mitigate this risk. First, the team considered and eventually deemed unfeasible procuring and replacing all existing flight COPVs. OPO replaced the two vessels with the highest risk with existing flight spare units. Second, OPO instituted operational improvements in ground procedures to signficiantly reduce risk, without adversely affecting Shuttle capability. Third, OPO developed a comprehensive model to quantify the likelihood of occurrance. A fully-instrumented burst test (recording a lower burst pressure than expected) on a flight-certified vessel provided critical understanding of the behavior of Orbiter COPVs. A more accurate model was based on a newly-compiled comprehensive database of Kevlar data from LLNL and elsewhere. Considering hardware changes, operational improvements and reliability model refinements, the mean reliability was determined to be 0.998 for the remainder of the Shuttle Program (from 2007, for STS- 118 thru STS-135). Since limited hardware resources precluded full model validation through multiple tests, additional model confidence was sought through the first-ever Accelerated Stress Rupture Test (ASRT) of a flown flight article. A Bayesian statistical approach was developed to interpret possible test results. Since the lifetime observed in the ASRT exceeded initial estimates by one to two orders of magnitude, the Space Shuttle Program deemed there was significant conservatism in the model and accepted continued operation with existing flight hardware. Given the variability in tank-to-tank original prooftest response, a non-destructive evaluation (NDE) technique utilizing Raman Spectroscopy was developed to directly measure COPV residual stress state. Preliminary results showed that patterns of low fiber elastic strains over the outside vessel surface, together with measured permanent volume growth during proof, could be directly correlated to increased fiber stress ratios on the inside fibers adjacent to the liner, and thus reduced reliability.

Kezirian, Michael T.↗
NASA NTRS1980

Stress corrosion cracking evaluation of martensitic precipitation hardening stainless steels

The resistance of the martensitic precipitation hardening stainless steels PH13-8Mo, 15-5PH, and 17-4PH to stress corrosion cracking was investigated. Round tensile and c-ring type specimens taken from several heats of the three alloys were stressed up to 100 percent of their yield strengths and exposed to alternate immersion in salt water, to salt spray, and to a seacoast environment. The results indicate that 15-5PH is highly resistant to stress corrosion cracking in conditions H1000 and H1050 and is moderately resistant in condition H900. The stress corrosion cracking resistance of PH13-8Mo and 17-4PH stainless steels in conditions H1000 and H1050 was sensitive to mill heats and ranged from low to high among the several heats included in the tests. Based on a comparison with data from seacoast environmental tests, it is apparent that alternate immersion in 3.5 percent salt water is not a suitable medium for accelerated stress corrosion testing of these pH stainless steels.

Humphries, T. S.↗
NASA NTRS2012

Some Aspects of the Failure Mechanisms in BaTiO3-Based Multilayer Ceramic Capacitors

The objective of this presentation is to gain insight into possible failure mechanisms in BaTiO3-based ceramic capacitors that may be associated with the reliability degradation that accompanies a reduction in dielectric thickness, as reported by Intel Corporation in 2010. The volumetric efficiency (microF/cm3) of a multilayer ceramic capacitor (MLCC) has been shown to not increase limitlessly due to the grain size effect on the dielectric constant of ferroelectric ceramic BaTiO3 material. The reliability of an MLCC has been discussed with respect to its structure. The MLCCs with higher numbers of dielectric layers will pose more challenges for the reliability of dielectric material, which is the case for most base-metal-electrode (BME) capacitors. A number of MLCCs manufactured using both precious-metal-electrode (PME) and BME technology, with 25 V rating and various chip sizes and capacitances, were tested at accelerated stress levels. Most of these MLCCs had a failure behavior with two mixed failure modes: the well-known rapid dielectric wearout, and so-called 'early failures." The two failure modes can be distinguished when the testing data were presented and normalized at use-level using a 2-parameter Weibull plot. The early failures had a slope parameter of Beta >1, indicating that the early failures are not infant mortalities. Early failures are triggered due to external electrical overstress and become dominant as dielectric layer thickness decreases, accompanied by a dramatic reduction in reliability. This indicates that early failures are the main cause of the reliability degradation in MLCCs as dielectric layer thickness decreases. All of the early failures are characterized by an avalanche-like breakdown leakage current. The failures have been attributed to the extrinsic minor construction defects introduced during fabrication of the capacitors. A reliability model including dielectric thickness and extrinsic defect feature size is proposed in this presentation. The model can be used to explain the Intel-reported reliability degradation in MLCCs with respect to the reduction of dielectric thickness. It can also be used to estimate the reliability of a MLCC based on its construction and microstructure parameters such as dielectric thickness, average grain size, and number of dielectric layers. Measures for preventing early failures are also discussed in this document.

Liu, David Donhang↗
NASA NTRS1976

Voltage stress effects on microcircuit accelerated life test failure rates

The applicability of Arrhenius and Eyring reaction rate models for describing microcircuit aging characteristics as a function of junction temperature and applied voltage was evaluated. The results of a matrix of accelerated life tests with a single metal oxide semiconductor microcircuit operated at six different combinations of temperature and voltage were used to evaluate the models. A total of 450 devices from two different lots were tested at ambient temperatures between 200 C and 250 C and applied voltages between 5 Vdc and 15 Vdc. A statistical analysis of the surface related failure data resulted in bimodal failure distributions comprising two lognormal distributions; a 'freak' distribution observed early in time, and a 'main' distribution observed later in time. The Arrhenius model was shown to provide a good description of device aging as a function of temperature at a fixed voltage. The Eyring model also appeared to provide a reasonable description of main distribution device aging as a function of temperature and voltage. Circuit diagrams are shown.

Johnson, G. M.↗
NASA NTRS2010

Composite Overwrapped Pressure Vessels (COPV): Developing Flight Rationale for the Space Shuttle Program

Introducing composite vessels into the Space Shuttle Program represented a significant technical achievement. Each Orbiter vehicle contains 24 (nominally) Kevlar tanks for storage of pressurized helium (for propulsion) and nitrogen (for life support). The use of composite cylinders saved 752 pounds per Orbiter vehicle compared with all-metal tanks. The weight savings is significant considering each Shuttle flight can deliver 54,000 pounds of payload to the International Space Station. In the wake of the Columbia accident and the ensuing Return to Flight activities, the Space Shuttle Program, in 2005, re-examined COPV hardware certification. Incorporating COPV data that had been generated over the last 30 years and recognizing differences between initial Shuttle Program requirements and current operation, a new failure mode was identified, as composite stress rupture was deemed credible. The Orbiter Project undertook a comprehensive investigation to quantify and mitigate this risk. First, the engineering team considered and later deemed as unfeasible the option to replace existing all flight tanks. Second, operational improvements to flight procedures were instituted to reduce the flight risk and the danger to personnel. Third, an Orbiter reliability model was developed to quantify flight risk. Laser profilometry inspection of several flight COPVs identified deep (up to 20 mil) depressions on the tank interior. A comprehensive analysis was performed and it confirmed that these observed depressions were far less than the criterion which was established as necessary to lead to liner buckling. Existing fleet vessels were exonerated from this failure mechanism. Because full validation of the Orbiter Reliability Model was not possible given limited hardware resources, an Accelerated Stress Rupture Test of a flown flight vessel was performed to provide increased confidence. A Bayesian statistical approach was developed to evaluate possible test results with respect to the model credibility and thus flight rationale for continued operation of the Space Shuttle with existing flight hardware. A non-destructive evaluation (NDE) technique utilizing Raman Spectroscopy was developed to directly measure the overwrap residual stress state. Preliminary results provide optimistic results that patterns of fluctuation in fiber elastic strains over the outside vessel surface could be directly correlated with increased fiber stress ratios and thus reduced reliability.

Kezirian, Michael T.↗
NASA NTRS2014

Evaluation of Commercial Automotive-Grade BME Capacitors

Three Ni-BaTiO3 ceramic capacitor lots with the same specification (chip size, capacitance, and rated voltage) and the same reliability level, made by three different manufacturers, were degraded using highly accelerated life stress testing (HALST) with the same temperature and applied voltage conditions. The reliability, as characterized by mean time to failure (MTTF), differed by more than one order of magnitude among the capacitor lots. A theoretical model based on the existence of depletion layers at grain boundaries and the entrapment of oxygen vacancies has been proposed to explain the MTTF difference among these BME capacitors. It is the conclusion of this model that reliability will not be improved simply by increasing the insulation resistance of a BME capacitor. Indeed, Ni-BaTiO3 ceramic capacitors with a smaller degradation rate constant K will always give rise to a longer reliability life

capacitor↗
NASA NTRS2014

Evaluation of Commercial Automotive-Grade BME Capacitors

Three Ni-BaTiO3 ceramic capacitor lots with the same specification (chip size, capacitance, and rated voltage) and the same reliability level, made by three different manufacturers, were degraded using highly accelerated life stress testing (HALST) with the same temperature and applied voltage conditions. The reliability, as characterized by mean time to failure (MTTF), differed by more than one order of magnitude among the capacitor lots. A theoretical model based on the existence of depletion layers at grain boundaries and the entrapment of oxygen vacancies has been proposed to explain the MTTF difference among these BME capacitors. It is the conclusion of this model that reliability will not be improved simply by increasing the insulation resistance of a BME capacitor. Indeed, Ni-BaTiO3 ceramic capacitors with a smaller degradation rate constant K will always give rise to a longer reliability life.

reliability↗
NASA NTRS1985

Assessing corrosion problems in photovoltaic cells via electrochemical stress testing

A series of accelerated electrochemical experiments to study the degradation properties of polyvinylbutyral-encapsulated silicon solar cells has been carried out. The cells' electrical performance with silk screen-silver and nickel-solder contacts was evaluated. The degradation mechanism was shown to be electrochemical corrosion of the cell contacts; metallization elements migrate into the encapsulating material, which acts as an ionic conducting medium. The corrosion products form a conductive path which results in a gradual loss of the insulation characteristics of the encapsulant. The precipitation of corrosion products in the encapsulant also contributes to its discoloration which in turn leads to a reduction in its transparency and the consequent optical loss. Delamination of the encapsulating layers could be attributed to electrochemical gas evolution reactions. The usefulness of the testing technique in qualitatively establishing a reliability difference between metallizations and antireflection coating types is demonstrated.

Shalaby, H.↗