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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 505 records · Page 28

Goddard Modular SmallSat Architecture (GMSA) Adapter Board H-Bridge MOSEFT ICs Total Ionizing Dose Characterization Report

The purpose of this testing was to obtain total ionizing dose (TID) information about commercial off-the-shelf (COTS) n-channel and p-channel MOFETs that are being considered for use on the Goddard Modular SmallSat Architecture (GMSA) Adapter board in an H-Bridge circuit to drive magnetorquers. Testing took place at NASA Goddard Space Flight Center’s (GSFC) Radiation Effects Facility using the gamma source. Testing occurred from July 31st – August 1st, 2018.

total ionizing dose (TID)↗

Chandra and XMM-Newton Observations of A2256: Cold Fronts, Merger Shocks, and Constraint on the IC Emission

We present the results of deep Chandra and XMM-Newton observations of a complex merging galaxy cluster Abell 2256 (A2256) that hosts a spectacular radio relic (RR). The temperature and metallicity maps show clear evidence of a merger between the western subcluster (SC) and the primary cluster (PC). We detect five X-ray surface brightness edges. Three of them near the cluster center are cold fronts (CFs): CF1 is associated with the infalling SC; CF2 is located in the east of the PC; and CF3 is to the west of the PC core. The other two edges at cluster outskirts are shock fronts(SFs): SF1 near the RR in the NW has Mach numbers derived from the temperature and the density jumps, respectively, of MT=1.62±0.12 and Mρ=1.23±0.06; SF2 in the SE has MT=1.54±0.05 and Mρ=1.16±0.13. In the region of the RR, there is no evidence for the correlation between X-ray and radio substructures, from which we estimate an upper limit for the inverse-Compton emission, and therefore set a lower limit on the magnetic field (∼450 kpc from PC center) of B>1.0μG for a single power-law electron spectrum or B>0.4μG for a broken power-law electron spectrum. We propose a merger scenario including a PC, an SC, and a group. Our merger scenario accounts for the X-ray edges, diffuse radio features, and galaxy kinematics, as well as projection effects.

Chong Ge↗

Chandra and XMM-Newton Observations of A2256: Cold Fronts, Merger Shocks, and Constraint on the IC Emission

We present the results of deep Chandra and XMM-Newton observations of a complex merging galaxy cluster Abell 2256 (A2256) that hosts a spectacular radio relic (RR).The temperature and metallicity maps show clear evidence of a merger between the western subcluster (SC) and the primary cluster (PC). We detect five X-ray surface brightness edges. Three of them near the cluster center are cold fronts (CFs): CF1is associated with the infalling SC; CF2 is located in the east of the PC; and CF3 is to the west of the PC core. The other two edges at cluster outskirts are shock fronts(SFs): SF1 near the RR in the NW has Mach numbers derived from the temperature and the density jumps, respectively, of MT=1.62±0.12andMρ=1.23±0.06; SF2 in the SE has MT=1.54±0.05andMρ=1.16±0.13. In the region of the RR, there is no evidence for the correlation between X-ray and radio substructures, from which we estimate an upper limit for the inverse-Compton emission, and therefore set a lower limit on the magnetic field (∼450 kpc from PC center) of B>1.0μG for a single power-law electron spectrum or B>0.4μG for a broken power-law electron spectrum. We propose a merger scenario including a PC, an SC, and a group. Our merger scenario accounts for the X-ray edges, diffuse radio features, and galaxy kinematics, as well as projection effects.

Chong Ge↗

Interband Cascade (IC) Optical Frequency Combs

We demonstrate an electrically-driven frequency comb whose sub-picosecond pulses span more than 1 THz of spectral bandwidth centered near 3.6 µm. This is achieved by passively mode locking an interband cascade laser with gain and saturable absorber sections monolithically integrated on the same chip.

Meyer, Jerry R.↗

System for Long-Duration Electrical Testing of SiC IC Generation 12 Chips at 500 °C

The system described in this report is an improved testing rig designed to enhance measurement flexibility, provide a compact oven footprint, and reduce costs for parallel oven-testing silicon carbide (SiC) integrated circuit devices at 500 °C for long durations (greater than 100 h). The testing rig design was characterized in terms of the ovens’ internal and external temperatures, system noise, and the leakage properties of their substrate/inner boards, where the devices under test (DUTs) reside. The test rig employs a National Instruments (NI) Peripheral Component Interconnect eXtensions for Instrumentation (PXI) measurement system, room-temperature pin-switching/customizing boards, and high-temperature compact ovens.

Stephanie Booth↗