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At least 487 records · Page 27

Product assurance technology for procuring reliable, radiation-hard, custom LSI/VLSI electronics

Advanced measurement methods using microelectronic test chips are described. These chips are intended to be used in acquiring the data needed to qualify Application Specific Integrated Circuits (ASIC's) for space use. Efforts were focused on developing the technology for obtaining custom IC's from CMOS/bulk silicon foundries. A series of test chips were developed: a parametric test strip, a fault chip, a set of reliability chips, and the CRRES (Combined Release and Radiation Effects Satellite) chip, a test circuit for monitoring space radiation effects. The technical accomplishments of the effort include: (1) development of a fault chip that contains a set of test structures used to evaluate the density of various process-induced defects; (2) development of new test structures and testing techniques for measuring gate-oxide capacitance, gate-overlap capacitance, and propagation delay; (3) development of a set of reliability chips that are used to evaluate failure mechanisms in CMOS/bulk: interconnect and contact electromigration and time-dependent dielectric breakdown; (4) development of MOSFET parameter extraction procedures for evaluating subthreshold characteristics; (5) evaluation of test chips and test strips on the second CRRES wafer run; (6) two dedicated fabrication runs for the CRRES chip flight parts; and (7) publication of two papers: one on the split-cross bridge resistor and another on asymmetrical SRAM (static random access memory) cells for single-event upset analysis.

Buehler, M. G.↗

Method for determination of neutral atomic oxygen flux

A method for measuring atomic oxygen flux to a probe surface is presented which uses two probes. One is a glass probe enclosing a small ceramic resistor heater and a thermocouple for determining the ambient local temperature. Another probe has a silver tip and a thermocouple inside it. In an atomic oxygen environment, the silver probe will quickly develop a silver oxide coating which provides for atomic oxygen recombination. The use of the two probes allows a more accurate determination of the energy input into the catalytic silver oxide probe due to recombination.

Carruth, M. R., Jr.↗

Progress in kinetic inductance thermometers for X-ray calorimeters

Conventional X-ray microcalorimeters have so far used ionimplanted resistors for thermometers. Recently, however, several new methods for sensing small temperature changes have been suggested that are nondissipative. Such devices may have intrinsically better energy resolution by eliminating the Johnson noise present in resistive devices. The use of kinetic inductance thermometers for X-ray microcalorimeters is being investigated. This technique exploits the strong temperature dependence of magnetic penetration depth of thin superconducting films. The prototype system, designed for operation at 1.5 K, uses films of aluminum and tin. Once the expected temperature sensitivity and alpha particle detection have been demonstrated, aluminum will be replaced with titanium or another material with a suitable critical temperature and the device will be operated at 0.3 K. At this temperature, the energy resolution from thermal noise should be sufficiently good to allow X-ray detection.

Rawley, G. L.↗

Reduced-Wiring Tactile Sensor

Proposed tactile sensor on robot finger puts out multiplexed analog signals transmitted to control computer on fewer wires than needed to transmit equivalent digital signals. Analog output represents data on contact area of object being gripped, on position of object, and on direction and rate of slippage if any. Consists of chains of normally open switches and resistors on surface of finger. Each resistance double preceding resistance in each chain. Constant-current sources supply power to chains.

Ohm, Timothy R.↗

Circuit For Current-vs.-Voltage Tests Of Semiconductors

Circuit designed for measurement of dc current-versus-voltage characteristics of semiconductor devices. Operates in conjunction with x-y pen plotter or digital storage oscilloscope, which records data. Includes large feedback resistors to prevent high currents damaging device under test. Principal virtues: low cost, simplicity, and compactness. Also used to evaluate diodes and transistors.

Huston, Steven W.↗

Addressable-Matrix Integrated-Circuit Test Structure

Method of quality control based on use of row- and column-addressable test structure speeds collection of data on widths of resistor lines and coverage of steps in integrated circuits. By use of straightforward mathematical model, line widths and step coverages deduced from measurements of electrical resistances in each of various combinations of lines, steps, and bridges addressable in test structure. Intended for use in evaluating processes and equipment used in manufacture of application-specific integrated circuits.

Sayah, Hoshyar R.↗

Analog synthesized fast-variable linear load

A several kilowatt power level, fast-variable linear resistor was synthesized by using analog components to control the conductance of power MOSFETs. Risetimes observed have been as short as 500 ns with respect to the control signal and 1 to 2 microseconds with respect to the power source voltage. A variant configuration of this load that dissipates a constant power set by a control signal is indicated. Replacement of the MOSFETs by static induction transistors (SITs) to increase power handling, speed and radiation hardness is discussed.

Niedra, Janis M.↗

Step voltage analysis for the catenoid lightning protection system

The main objective of the proposed overhead Catenoid Lightning Protection System (CLPS) is personnel safety. To ensure working personnel's safety in lightning situations, it is necessary that the potential difference developed across a distance equal to a person's pace (step voltage) does not exceed a separately established safe voltage in order to avoid electrocution (ventricular fibrillation) of humans. Therefore, the first stage of the analytical effort is to calculate the open circuit step voltage. An impedance model is developed for this purpose. It takes into consideration the earth's complex impedance behavior and the transient nature of the lightning phenomenon. In the low frequency limit, this impedance model is shown to reduce to results similar to those predicted by the conventional resistor model in a DC analysis.

Chai, J. C.↗

An 8-b 1.3-MHz successive-approximation A/D converter

A new successive-approximation A/D converter is described. It combines a string of equal-valued polysilicon resistors and a set of ratioed capacitors in a unique circuit configuration so that a high sampling rate is achieved. The comparator is realized by a chopper-stabilized amplifier to reduce the effect of the offset voltages of MOS amplifiers. The converter performs an 8-b monotonic conversion with a differential nonlinearity less than 1 LSB in 770 nsec. The die area is 3750 sq mil. This new conversion technique can also be utilized in a pipelined A/D converter (Temes, 1985) and enables it to achieve high speed.

Hadidi, KH.↗

Design considerations for a solar array switching unit

An analysis of the sequential switching shunt regulator unit (SSU) proposed for the space station and space platform is presented. The solar array and shunt regulator system is analyzed for ripple, output impedance, and stability. The performances of proportional gain and proportional integrator (PI) controllers are compared. A design example is provided, and an EASY5 simulation is presented for the regulation of the bus voltage by the SSU. It is shown that the bus ripple may be limited by the equivalent series resistor, in which case it cannot be reduced by increasing the capacitance or switching frequency. The proportional controller is shown to offer a faster response than the PI controller, but has a load-current-dependent steady state error. This error can be removed by the PI controller, but the bus impedance has a low-frequency pole which slows the response.

Patil, A. R.↗

Improving Current Balance In Parallel MOSFET's

Simple circuit makes currents more nearly equal. Addition of diodes and adjustable-tap resistor increases operating range over which drain currents in two unmatched power MOSFET's brought more nearly into balance.

Niedra, Janis M.↗

A study of ignition and simulation circuits for arcjet thrusters, part 1

A 1 kW electronic load was programmed to simulate the nonlinear i-v (volt-ampere) characteristics of an arcjet, both ignited and unignited. The simulator was tested and found to closely resemble an arcjet both for large transients and small perturbances up to about 40 kHz. No attempt was made to simulate the ignition process itself. The dynamic behavior of the arcjet (and the simulator) was shown to differ significantly from that of a resistor bank. Previous research led to the design and construction of a 1 kW arcjet power supply. A high voltage ignition circuit was added to this hardware, and tests on a 1 kW arcjet were performed at NASA-Lewis. All tests were successful and no ignition failures were observed. Circuit documentation and test results are included.

Stuart, Thomas A.↗

Amplitude squeezed light from a laser

Intensity squeezed light was successfully generated using semiconductor lasers with sub-Poissonian pumping. Control of the pumping statistics is crucial and is achieved by a large series resistor which regulates the pump current; its sub-Poissonian statistics are then transferred to the laser output. The sub-Poissonian pumping of other laser systems is not so simple, however, and their potential as squeezed states sources is apparently diminished. We consider a conventional laser incoherently pumped well above threshold, and allow for pump depletion of the ground state. In this regime, sub-Poissonian photon statistics and squeezed amplitude fluctuations are produced.

Hart, D. L.↗

Nickel-hydrogen LEO cycling at 20 percent - 50 percent DOD

The test setup consists of four major elements: the programmable power supplies and load banks, the data acquisition and control system control computer, and the NiH2 specimen test cells. A simplified block diagram of the test setup is shown. The test setup provides complete battery isolation should a fault occur, and fusing as necessary to protect the battery cells and other equipment. Front panel switches provide for power supply configuration and battery isolation. Front panel meters provide continuous real-time visual monitoring of the voltage and current for each pack of cells. A strip chart recorder provides a hard copy of the voltage and current profiles for each of the packs. The test operates continuously with minimal human interface, except during special tests. The two power supplies are controlled by resistance programming. A bank of resistors and relays was built which can be switched by the control computer to provide control over the charge current to the batteries. The load banks are controlled by the 3497A. The 3497A is equipped with a 0.5 volt programmable power supply which is used to voltage program the load banks. A Hewlett-Packard Vectra 9000 running an HP Basic program is used as the control computer to remotely instruct the 3497A (data acquisition and control) to scan the data channels and retrieve test data. The program then reads, calculates, and stores the data. If an anomaly occurs, the program will disconnect the cells and shut down the test to avoid damage to the cells or equipment.

Lowery, John E.↗

Simulating the arcjet thruster using a nonlinear active load

Arcjet thrusters are known to have distinctly nonlinear electrical characteristics with negative incremental resistance throughout their normal operating region. The 1-kW arcjet simulator proposed here accurately mimics these characteristics statically, and dynamically up to 40 kHz. Testing with a power-processing unit (PPU) and the simulator, a 1-kW arcjet, and a resistive load bank established that the simulator accurately predicted the transient behavior of the PPU-arcjet combination, while the resistive load bank did not. The simulator uses resistors and insulated-gate bipolar transistors to dissipate the PPU output power; a nonlinear feedback is applied to produce the desired v-i characteristics. This feedback is analyzed dynamically. The arcjet simulator allows development of a PPU to a higher level of confidence before beginning testing at an arcjet facility.

Altenburger, Gene P.↗

Analog synthesized fast-variable linear load

A several-kilowatt power level, fast-variable linear resistor has been synthesized by using analog components to control the conductance of power MOSFETs. Risetimes observed have been as short as 500 ns with respect to the control signal and 1 to 2 microsec with respect to the power source voltage. A variant configuration of this load that dissipates a constant power set by a control signal is indicated. Replacement of the MOSFETs by static induction transistors to increase power handling, speed, and radiation hardness is discussed.

Niedra, Janis M.↗

Gauge Measures Hot Erosion Of Insulation

Compact ladder networks containing thermocouples and resistors serve as gauges to measure erosion of insulating materials by hot, flowing gases. Designed for use in blast tubes during tests of rocket motors. Concept readily specialized to other applications in which insulation subject to erosion.

Gould, Reginald J.↗

An architecture for object-oriented intelligent control of power systems in space

A control system for autonomous distribution and control of electrical power during space missions is being developed. This system should free the astronauts from localizing faults and reconfiguring loads if problems with the power distribution and generation components occur. The control system uses an object-oriented simulation model of the power system and first principle knowledge to detect, identify, and isolate faults. Each power system component is represented as a separate object with knowledge of its normal behavior. The reasoning process takes place at three different levels of abstraction: the Physical Component Model (PCM) level, the Electrical Equivalent Model (EEM) level, and the Functional System Model (FSM) level, with the PCM the lowest level of abstraction and the FSM the highest. At the EEM level the power system components are reasoned about as their electrical equivalents, e.g, a resistive load is thought of as a resistor. However, at the PCM level detailed knowledge about the component's specific characteristics is taken into account. The FSM level models the system at the subsystem level, a level appropriate for reconfiguration and scheduling. The control system operates in two modes, a reactive and a proactive mode, simultaneously. In the reactive mode the control system receives measurement data from the power system and compares these values with values determined through simulation to detect the existence of a fault. The nature of the fault is then identified through a model-based reasoning process using mainly the EEM. Compound component models are constructed at the EEM level and used in the fault identification process. In the proactive mode the reasoning takes place at the PCM level. Individual components determine their future health status using a physical model and measured historical data. In case changes in the health status seem imminent the component warns the control system about its impending failure. The fault isolation process uses the FSM level for its reasoning base.

Holmquist, Sven G.↗