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At least 469 records · Page 26
All sourcesNASA NTRSDOE OSTI
NASA NTRS2002

Body Composition of Rats on NASA Rodent Foodbar Versus Purina Lab Chow

The objective of this study is to test the nutritional adequacy of the NASA Rodent Foodbar for long term use for rats. The Foodbar was tested on two rat strains, Sprague Dawley and Fischer 344. Rats were fed either Foodbar or the control diet, Purina Chow #5012. Body composition analysis was performed on a selected number of samples (n=6 for each gender and treatment group) as part of extensive testing of the Foodbar. Water, fat, ash, and protein (and their percentages) for both treatment groups were compared. Sprague Dawley Foodbar fed rats had a lower % protein than Chow fed rats (25.8% vs. 30.0%). In addition, Sprague Dawley females fed Foodbar had higher total fat (42.1g vs. 24.6g) and % fat (16.4% vs. 10.5%), but lower % water (51.3% vs. 54.8%) than Sprague Dawley females fed Chow. Fischer 344 Foodbar fed rats had a lower % water (47.4% vs. 49,3%) and total water (93.2g vs. 99.6g). In addition, Fischer 344 Foodbar males had higher % fat (17.0% vs. 13.8%) and total fat (43.0g vs. 34.7g). The data suggests that body composition of Foodbar fed rats tends to have lower water content but a higher fat content compared to controls, but not all results are the same for different strains and even different genders within the same strains. The data obtained here, in addition to other data, helps provide a better understanding of the nutritional adequacy of the Foodbar and whether the formula may need to be modified.

Yu, Diane Sau Mun↗
NASA NTRS2024

Mark I Silicon Carbide Integrated Circuit Test Oven Assembly and Programming Guide

This report provides a parts list, with assembly and programming instructions for building firstgeneration (Mark I) compact test ovens; this oven design is customized for prolonged functional electrical testing of prototype silicon carbide (SiC) devices at temperatures up to 500 °C (932 °F). The general approach of using multiple compact ovens to perform long-term, high-temperature electronics testing efficiently is described in a conference paper (Izadnegahdar, Alain, et al.: Alternative Setup for LongDuration Low-Duty-Cycle 600 °C Ambient Testing of SiC Integrated Circuits. International Microelectronics Assembly and Packaging Society (iMAPS) HiTECH 2021 Technology Crossover Extravaganza, 2021), available at https://ntrs.nasa.gov/citations/20210011676. The new Mark I oven design described here offers several significant improvements over the compact oven described in that paper. For example, it is constructed from commercial off-the-shelf (COTS) components and requires minimal assembly. Much of the work involves drilling holes in the two aluminum project boxes, which contain the control electronics and the oven itself. The cost of components is less than $200 (USD) per oven, which makes constructing multiple ovens affordable. In addition, the two-box design separates the high-temperature heater from the electronics, which keeps the electronics cool, prolonging the lifetime of these components.

high temperature↗
DOE OSTI2020

Model 9975 O-Ring Fixture Long-Term Leak Performance (FY2020 Status Report)

Leak testing experiments to monitor the aging performance of Viton GLT and GLT-S O-rings used in the model 9975 shipping package has been ongoing since 2004 at Savannah River National Laboratory. Seventy tests using mock-up 9975 primary containment vessels (PCVs) with GLT O-rings were assembled and heated to temperatures ranging from 200 to 450 °F. In addition, fourteen tests with GLT-S O-rings were initiated in 2008 and heated to temperatures ranging from 200 to 400 °F. The conditioning temperatures are elevated compared to the calculated maximum O-ring temperature in a 9975 package in storage, 158 °F, to accelerate aging and enable observations of O-ring failures in a reasonable time frame. The fixtures are leak tested periodically and all GLT O-ring fixtures aging at 350 °F or above have failed to maintain a leak-tight seal. Eight GLT O-ring fixtures aging at 300 °F have failed after 2.8 to 5.7 years at temperature while the remaining fixtures at 300 °F were retired from testing following more than five years without failure. No failures have yet been observed in GLT O-ring fixtures aging at 200 °F for 12 to 14 years or aging at 270 °F for 8.5 years. All GLT-S O-ring fixtures aging at 300 °F or above have failed their leak test. No failures have yet been observed in GLT-S O-ring fixtures aging at 200 and 250 °F for 10 to 10.5 years. Data from the O-ring fixtures are generally consistent with results from compression stress-relaxation testing, and provide confidence in the predictive models based on those results. However, uncertainty exists in extrapolating these elevated temperature results to the lower temperatures of interest for normal storage in K-Area Complex (KAC). Oxygen consumption testing, which includes results from temperatures near KAC normal storage temperatures, is ongoing to provide further confidence and corroborate these extrapolations. The collective data from these test efforts suggest the minimum O-ring service life at KAC normal storage conditions should be at least 34 years for GLT and GLT-S O-rings. Measurement of compression set in O-rings removed from failed fixtures, compared to that from KAC surveillance O-rings, indicates margin remains for O-rings still in service. Aging and periodic leak testing will continue for the remaining PCV fixtures.

12 MANAGEMENT OF RADIOACTIVE AND NON-RADIOACTIVE W↗
DOE OSTI2022

Model 9975 O-Ring Fixture Long-Term Leak Performance (FY2022 Status Report)

Leak testing experiments to monitor the aging performance of Viton® GLT and GLT-S O-rings used in the model 9975 shipping package has been ongoing since 2004 at Savannah River National Laboratory. Seventy tests using mock-up 9975 primary containment vessels (PCVs) with GLT O-rings were assembled and heated to temperatures ranging from 200 to 450 °F. Due to material substitution, fourteen tests with GLT-S O-rings were initiated in 2008 and heated to temperatures ranging from 200 to 400 °F. The conditioning temperatures are elevated compared to the calculated maximum O-ring temperature in a 9975 package in storage, 158 °F, to accelerate aging and enable observations of O-ring failures in a reasonable time frame. The fixtures are leak tested periodically and all GLT O-ring fixtures aging at 350 °F or above have failed to maintain a leak-tight seal. Eight GLT O-ring fixtures aging at 300 °F have failed after 2.8 to 5.7 years at temperature while the remaining fixtures at 300 °F were retired from testing following more than five years without failure. There has been one GLT O-ring fixture which failed after 13.4 years aging at 200 °F. However, 20 other GLT O-rings aging at 200 °F have remained leak-tight for over 14 years and remain in test. No failures have yet been observed in GLT O-ring fixtures aging at 270 °F for 10.4 years. All GLT-S O-ring fixtures aging at 300 °F or above have failed their leak test. No failures have yet been observed in GLT-S O-ring fixtures aging at 250 °F for 12.5 years. This year, one GLT-S O-ring fixture failed after 12.4 years aging at 200 °F. Data from the O-ring fixtures are generally consistent with results from compression stress-relaxation testing, and provide confidence in the predictive models based on those results. However, uncertainty exists in extrapolating these elevated temperature results to the lower temperatures of interest for normal storage in K-Area Complex (KAC). Oxygen consumption testing, which includes results from temperatures near KAC normal storage temperatures, is ongoing to provide further confidence and corroborate these extrapolations. The collective data from these test efforts suggest the minimum O-ring service life at KAC normal storage conditions should be at least 34 years for GLT and GLT-S O-rings. Measurement of compression set in O-rings removed from failed fixtures, compared to that from KAC surveillance O-rings, indicate significant margin remains for O-rings still in service in 9975 packages in KAC. Aging and periodic leak testing will continue for the remaining 25 mock-up PCV fixtures.

36 MATERIALS SCIENCE↗
DOE OSTI2024

Model 9975 O Ring Fixture Long-Term Leak Performance (FY2024 Status Report)

Leak testing experiments to monitor the aging performance of Viton ® GLT and GLT-S O-rings used in the model 9975 shipping package have been ongoing since 2004 at Savannah River National Laboratory. Seventy tests using mock-up 9975 primary containment vessels (PCVs) with GLT O-rings were assembled and heated to temperatures ranging from 200 to 450 °F. Due to material substitution, fourteen tests with GLT-S O-rings were initiated in 2008 and heated to temperatures ranging from 200 to 400 °F. The conditioning temperatures are elevated compared to the calculated maximum O-ring temperature in a 9975 package in storage, 158 °F, to accelerate aging and enable observations of O-ring failures in a reasonable time frame. The mock-up PCV fixtures are leak tested periodically, and all GLT O-ring fixtures aging at 350 °F or above have failed to maintain a leak-tight seal. Eight GLT O-ring fixtures aging at 300 °F have failed after 2.8 to 5.7 years at temperature while the remaining fixtures at 300 °F were retired from testing following more than five years of aging without failure. Two of these retired fixtures were returned to testing and heated to 350 °F to evaluate the impact of additional heating at higher temperature for aged O-rings. Fixture #20 failed after 3 months of testing while fixture #18 remained leak tight. These O-rings demonstrated that aged and in-service O-rings can continue to be used, even at higher temperatures, after being in storage, and their leak performance are consistent with other samples at 350 °F.

42 ENGINEERING↗
NASA NTRS1986

Nickel hydrogen low Earth orbit life testing

A program to demonstrate the long term reliability of NiH2 cells in low Earth orbits (LEO) and support use in mid-altitude orbits (MAO) was initiated. Both 3.5 and 4.5 inch diameter nickel hydrogen cells are included in the test plan. Cells from all U.S. vendors are to be tested. The tests will be performed at -5 and 10 C at 40 and 60% DOD for LEO orbit and 10 C and 80% DOD for MAO orbit simulations. The goals of the testing are 20,000 cycles at 60% DOD and 30,000 cycles at 40% DOD. Cells are presently undergoing acceptance and characterization testing at Naval Weapons Systems Center, Crane.

Badcock, C. C.↗
NASA NTRS2003

Long-Term Reliability of High Speed SiGe/Si Heterojunction Bipolar Transistors

Accelerated lifetime tests were performed on double-mesa structure Si/Si0.7Ge0.3/Si npn heterojunction bipolar transistors, grown by molecular beam epitaxy, in the temperature range of 175C-275C. Both single- and multiple finger transistors were tested. The single-finger transistors (with 5x20 micron sq m emitter area) have DC current gains approximately 40-50 and f(sub T) and f(sub MAX) of up to 22 GHz and 25 GHz, respectively. The multiple finger transistors (1.4 micron finger width, 9 emitter fingers with total emitter area of 403 micron sq m) have similar DC current gain but f(sub T) of 50 GHz. It is found that a gradual degradation in these devices is caused by the recombination enhanced impurity diffusion (REID) of boron atoms from the p-type base region and the associated formation of parasitic energy barriers to electron transport from the emitter to collector layers. This REID has been quantitatively modeled and explained, to the first order of approximation, and the agreement with the measured data is good. The mean time to failure (MTTF) of the devices at room temperature is estimated from the extrapolation of the Arrhenius plots of device lifetime versus reciprocal temperature. The results of the reliability tests offer valuable feedback for SiGe heterostructure design in order to improve the long-term reliability of the devices and circuits made with them. Hot electron induced degradation of the base-emitter junction was also observed during the accelerated lifetime testing. In order to improve the HBT reliability endangered by the hot electrons, deuterium sintered techniques have been proposed. The preliminary results from this study show that a deuterium-sintered HBT is, indeed, more resistant to hot-electron induced base-emitter junction degradation. SiGe/Si based amplifier circuits were also subjected to lifetime testing and we extrapolate MTTF is approximately 1.1_10(exp 6) hours at 125iC junction temperature from the circuit lifetime data.

Ponchak, George E.↗
NASA NTRS1975

Effect of high temperature aging on bonded and weld bonded joints

Development of adhesives for applications requiring long-term service at temperatures up to 600 F is discussed. This development work utilizes polyimide (PI) and polyphenylquinoxaline (PPQ) resin technology worked out previously. The resultant adhesives are evaluated in structural joints of titanium, steel and composite adherends and in honeycomb sandwich panels. Suitable adhesives also are evaluated in weld bonded titanium alloy joints. Testing includes determination of long-term aging of stressed and unstressed specimens at temperatures from about 450 F to 600 F as well as under dynamic fatigue conditions.

Vaughan, R. W.↗
DOE OSTI2021

ACCELERATED CREEP TEST (ACT) QUALIFICATION OF CREEP RESISTANCE USING THE WCS CONSTITUTIVE MODEL AND STEPPED ISOSTRESS METHOD (SSM)

In this study, a qualification of accelerated creep-resistance of Inconel 718 is assessed using the novel Wilshire-Cano-Stewart (WCS) model and the stepped isostress method (SSM) and predictions are made to conventional creep data. Conventional creep testing (CCT) is a long-term continuous process, in fact, the ASME B&PV III requires that 10,000+ hours of experiments must be conducted to each heat for materials employed in boilers and/or pressure vessel components. This process is costly and not feasible for rapid development of new materials. As an alternative, accelerated creep testing techniques have been developed to reduce the time needed to characterize the creep resistance of materials. Most techniques are based upon the time-temperature-stress superposition principle (TTSSP) that predicts minimum-creep-strain-rate (MCSR) and stress-rupture behaviors but lack the ability to predict creep deformation and consider deformation mechanisms that occur for experiments of longer duration. The stepped isostress method (SSM) has been developed which enables the prediction of creep deformation response as well as reduce the time needed for qualification of materials. The SSM approach has been successful for polymer, polymeric composites, and recently has been introduced for metals. In this study, the WCS constitutive model, calibrated to SSM test data, qualifies the creep resistance of Inconel 718 at 750°C and predictions are compared to CCT data. The WCS model has proven to make long-term predictions for stress-rupture, minimum-creep-strain-rate (MCSR), creep deformation, and damage in metallic materials. The SSM varies stress levels after time interval adding damage to the material, which can be tracked by the WCS model. The SSM data is calibrated into the model and the WCS model generates realistic predictions of stress-rupture, MSCR, damage, and creep deformation. The calibrated material constants are used to generate predictions of stress-rupture and are post-audit validated using the National Institute of Material Science (NIMS) database. Similarly, the MCSR predictions are compared from previous studies. Finally the creep deformation predictions are compared with real data and is determined that the results are well in between the expected boundaries. Material characterization and mechanical properties can be determined at a faster rate and with a more cost-effective method. This is beneficial for multiple applications such as in additive manufacturing, composites, spacecraft, and Industrial Gas Turbines (IGT).

36 MATERIALS SCIENCE↗
NASA NTRS1975

Analysis of turbofan engine performance deterioration and proposed follow-on tests

Data and engine parts on in-service JT3D and JT8D engines were analyzed and documented relative to engine deterioration. It is concluded that the fan-compressor system of these engines contributes to the long term engine deterioration. An engine test and instrumentation plan was formulated for a proposed follow-on program. The goal of this program is to verify the above conclusion and to attempt to identify more precisely which components of the fan-compressor system are at fault.

Sallee, G. P.↗
NASA NTRS1978

Acoustic emission testing of composite vessels under sustained loading

Acoustic emission (AE) tests have been conducted on small-diameter Kevlar 49/epoxy pressure vessels subjected to long-term sustained load-to-failure tests. Single-cycle burst tests were used as a basis for determining the test pressure in the sustained-loading tests. AE data from two vessel locations were compared. The data suggest that AE from vessel wall-mounted transducers is quite different for identical vessels subjected to the same pressure loading. AE from boss-mounted transducers yielded relatively consistent values. These values were not a function of time for vessel failure. The development of an AE test procedure for predicting the residual service life or integrity of composite vessels is discussed.

Lark, R. F.↗
NASA NTRS1990

A numerical method for prediction of compressible turbulent flows with closure models

A new computer code to solve the time averaged Navier-Stokes equations is developed. Many of the state-of-the-art numerical techniques and algorithms have been tested and implemented in the program in order to achieve a better numerical accuracy and code efficiency. Various turbulence models are tested for a wide range of flows. The initial focus has been on two-equation eddy-viscosity models, which are the most advanced available in current compressible flow codes. The long term goal will be to test Reynolds-Stress models and to explore their performance in the high Mach number range. Although testing and improvement of turbulence models for supersonic and hypersonic flows is the primary objective of this research, part of the effort has been devoted to analyzing the vortex breakdown phenomena using new computer programs. Some preliminary results on the breakdown of a vortex flow in a tube are reported. Present calculations are restricted to two dimensional flow geometry.

Huang, P. G.↗
NASA NTRS2016

Evaluation of 10V Chip Polymer Tantalum Capacitors for Space Applications

Due to low ESR and safe failure mode, new technology chip polymer tantalum capacitors (CPTC) have gained popularity in the electronics design community, first in commercial applications, and now in hi-rel and space systems. The major drawbacks of these parts are high leakage currents, degradation under environmental stresses, and a relatively narrow temperature range of operating and storage conditions. Several studies have shown that a certain amount of moisture in polymer cathodes is necessary for a normal operation of the parts. This might limit applications of CPTCs in space systems and requires analysis of long-term exposure to deep vacuum conditions on their performance and reliability. High leakage currents and limited maximum operational temperature complicate accelerated testing that is necessary to assess long-term reliability and require new screening and qualification procedures for quality assurance. A better understanding of behavior of CPTCs as compared to traditional, MnO2, capacitors is necessary to develop adequate approaches for QA system for space applications. A specific of CPTCs is that different materials and processes might be used for low-voltage (10 V and less) and high-voltage (above 10 V) capacitors, so performance and degradation processes in these groups require separate analysis. In this work, that is a part of the NASA Electronic Parts and Packaging (NEPP) program, degradation of AC and DC characteristics under environmental stresses at different temperatures and voltages have been studied in nine lots of commercial and automotive grade capacitors rated to 10 V. Results of analysis of leakage currents, high temperature storage (HTS) up to 5000 hrs in vacuum and air at different temperatures, and Highly Accelerated Life Testing (HALT) in the range from 85 C to 145 C are presented. Temperature and voltage acceleration factors were calculated based on approximation of distributions of degradation rates with a general log-linear Weibull model. Mechanisms of degradation and failures, and requirements for screening and qualification testing are discussed.

Tantalum Capacitors↗
NASA NTRS1994

Astrometry with Hubble Space Telescope Fine Guidance Sensor number 3: Position-mode stability and precision

We report results from a test exploring the long- and short-term astrometric stability of Hubble Space Telescope Fine Guidance Sensor (FGS) #3. A test field was observed 40 times over 522 days to determine the precision and accuracy of FGS astrometry and to measure the character and magnitude of possible secular scale changes. We examine the astrometric data and the associated guide-star data to determine random errors. These data are also explored to find sources of systematic error. After correcting for some systematic effects we obtain a precision of 0.002 arcsec (2 mas) per observation (RSS of x and y). This is relative astrometry within a central 2.5 arcmin FGS field of view for any orientation. We find that the scale varies over time and confirm the sense of the trend with independent data. From the 40 observation sets we produce a catalog of an astrometry test field containing eight stars whose relative positions are known to an average 0.7 and 0.9 mas in x and y. One reference star has a relative parallax of 3.1 plus or minus 0.5 mas. Finally, we report that eleven observation sets acquired over 387 days produce parallaxes and relative positions with 1-mas precision.

Benedict, G. F.↗
NASA NTRS1982

The prediction of long term viscoelastic properties of fiber reinforced plastics

A method for the experimental and analytical accelerated characterization of long term viscoelastic properties is presented. The time-temperature-stress superposition principle (TTSSP) is shown to serve as the basis for determining long term compliance data from short term creep test results. Nonlinear viscoelastic theories are discussed to provide the framework for the mathematically modeling of such a process. A time dependent Tsai-Hill-Zhurkov failure theory is used to determine long term failure properties from short term data. Compliance and failure data are incorporated in an incremental lamination theory to make long term laminate predictions. Comparisons are made between theory and experiment.

Brinson, H. F.↗
DOE OSTI2020

Iodine Waste Form Corrosion: PNNL Summary Testing Report

A test method to correlate the laboratory corrosion behavior of iodine-containing waste forms (IWFs) to a conceptual long-term corrosion models is required. Several candidate methods have been evaluated previously, and each method presents unique challenges and limitations. Dynamic leach tests have emerged as the preferred candidate test method to evaluate IWFs and parameterize an eventual long-term corrosion model. This report was prepared in support of this effort to define the test suite to evaluate the corrosion of IWFs, with the goal of defining and parameterizing a conceptual long-term corrosion model. A review was presented highlighting the high degree of variability between the IWF corrosion data that is available in the literature and the need for a standardized test suite. The targeted test suite is composed of a single interval screening test, a dynamic leach test, and post-test solid characterization of the monolithic IWF samples. The data presented serves two purposes: to expand the range of IWFs evaluated with the test suite to assess method variability and to further understand the corrosion of IWFs to best inform conceptual long-term corrosion model development. A series of IWF types were included in the testing, including hot isostatically pressed Ag-mordenite, silver functionalized silica-based aerogels, iodosodalites (hot isostatic pressing, sintered, glass bonded ceramic), iodoapatite, tellurite glass and glass composite materials.

42 ENGINEERING↗
NASA NTRS1982

Measurement of speech levels in the presence of time varying background noise

Short-term speech level measurements which could be used to note changes in vocal effort in a time varying noise environment were studied. Knowing the changes in speech level would in turn allow prediction of intelligibility in the presence of aircraft flyover noise. Tests indicated that it is possible to use two second samples of speech to estimate long term root mean square speech levels. Other tests were also performed in which people read out loud during aircraft flyover noise. Results of these tests indicate that people do indeed raise their voice during flyovers at a rate of about 3-1/2 dB for each 10 dB increase in background level. This finding is in agreement with other tests of speech levels in the presence of steady state background noise.

Pearsons, K. S.↗