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At least 469 records · Page 26

Anomalous magneto-structural behavior of MnBi explained: A path towards an improved permanent magnet

Low-temperature MnBi (hexagonal NiAs phase) exhibits anomalies in the lattice constants (a, c) and bulk elastic modulus (B) below 100 K, spin reorientation and magnetic susceptibility maximum near 90 K, and, importantly for high-temperature magnetic applications, an increasing coercivity (unique to MnBi) above 180 K. We calculate the total energy and magneto-anisotropy energy (MAE) versus (a, c) using DFT+U methods. We reproduce and explain all the above anomalies. We predict that coercivity and MAE increase due to increasing a, suggesting means to improve MnBi permanent magnets.

36 MATERIALS SCIENCE↗

Evolution of structural and magnetic properties due to nanocrystallization of mechanically milled amorphous Pr-Co-B powders

Pr{sub 2}Co{sub 14}B permanent magnet powders were prepared by mechanical milling of an arc-melted ingot. X-ray diffraction analysis revealed the presence of the 2:14:1 phase after 1 h of milling which transformed into an amorphous phase with additional milling time. Increasing the milling time also lowered the intrinsic coercivity while the saturation magnetization increased up to 105 emu/g. Differential scanning calorimetry measurements revealed a crystallization temperature of around 560 °C. Upon annealing 30 h of as-milled amorphous powders between 500 and 900 °C, we observed the precipitation of the 2:14:1 phase. The optimum post-milling annealing temperature was 600 °C with an intrinsic coercivity of 7 kOe and maximum energy product of 6 MGOe.

36 MATERIALS SCIENCE↗

Binary pseudo-random patterned structures for modulation transfer function calibration and resolution characterization of a full-field transmission soft x-ray microscope

We present a modulation transfer function (MTF) calibration method based on binary pseudo-random (BPR) one-dimensional sequences and two-dimensional arrays as an effective method for spectral characterization in the spatial frequency domain of a broad variety of metrology instrumentation, including interferometric microscopes, scatterometers, phase shifting Fizeau interferometers, scanning and transmission electron microscopes, and at this time, x-ray microscopes. The inherent power spectral density of BPR gratings and arrays, which has a deterministic white-noise-like character, allows a direct determination of the MTF with a uniform sensitivity over the entire spatial frequency range and field of view of an instrument. We demonstrate the MTF calibration and resolution characterization over the full field of a transmission soft x-ray microscope using a BPR multilayer (ML) test sample with 2.8 nm fundamental layer thickness. We show that beyond providing a direct measurement of the microscope’s MTF, tests with the BPRML sample can be used to fine tune the instrument’s focal distance. Our results confirm the universality of the method that makes it applicable to a large variety of metrology instrumentation with spatial wavelength bandwidths from a few nanometers to hundreds of millimeters.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗