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At least 469 records · Page 26

Elucidating the microscopic origin of electrochemical corrosion and electrical conductivity by lattice response to severe plastic deformation in Al-Mn-Si alloy

Highlights: • Al-Mn-Si specimens were underwent severe plastic deformation by CGP and cold-rolling and their combined routes. • Microscopical observations depicted particles' fragmentation and non-preferential distribution under heavy straining. • XRD analysis revealed dislocations annihilation and lattice swelling (d-spacing increase) due to dynamic recrystallization. • Polarization outputs disclosed direct correlation of corrosion behavior with dislocations density. • Four-point probe test proved that electrical conductivity was a function of lattice d-spacing. - Abstract: Al-Mn-Si specimens were underwent SPD by CGP, cold-rolling and their combined paths. Acquired OM and SEM micrographs revealed that random distribution of intermetallic precipitates beside their fragmentation under heavy imposed strains deteriorated particles’ influence on the electrochemical corrosion and inhibited pitting. Analysis of XRD patterns pointed out that post-rolling of CGPed sheets resulted in dynamic annihilation of dislocations and accordingly crystal lattice swelling (d-spacing increase) due to dynamic recrystallization. From polarization results, crystallites’ refinement along with density increment of sub-grain boundaries within structure as a consequence of SPD beside dislocation density enhancement accelerated corrosion. Outputs of four-point probe electrical conductivity examination indicated that apart from the employed processing, lattice compaction and atomic layers approach would limit the electrons’ mobility space and hence reduce the conductivity of material. In this regard, combined effects of CGP and rolling as employed dual-straining route on Al-Mn-Si alloy enhanced the electrical conductivity by d-spacing growth.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗

The roles of interfaces and other microstructural features in Cu/Nb nanolayers as revealed by in situ beam bending experiments inside an scanning electron microscope (SEM)

Interfaces and their interactions with other microstructural features, such as grain boundaries or twin structures, have been widely viewed as parameters for designing metallic nanolayers. These interfaces could play a role in hindering cracks from propagating across the nanolayers while in operation. To date, many studies have focused on the roles of interfaces in affecting the plasticity mechanisms and thus the deformability of nanolayers. However, no studies have investigated on the subsequent mechanisms of fracture leading to the final failure. In this study, in situ microfracture bending tests inside a scanning electron microscope (SEM) were performed on the notched clamped beams of Cu/Nb nanolayers with a similar layer thickness using two different fabrication processes: physical vapor deposition (PVD) and accumulative roll bonding (ARB). Due to the columnar grains of the Cu/Nb PVD beams, a sudden catastrophic linear elastic, brittle fracture phenomenon was observed; in the Cu/Nb ARB beams, fracture events of notch widening phase and crack initiation and fracture along the shear instability were observed. Detailed examinations showed the presence of competing mechanisms between the multilayered interface, columnar grain boundary, and experimental factors of beam geometry and the position of the tip. With this newfound knowledge, new types of metallic nanolayers can be designed with enhanced strength and fracture resistant properties.

36 MATERIALS SCIENCE↗

Microscopic analysis of copper current collectors and mechanisms of fragmentation under compressive forces

Extensive fragmentation of copper current collectors was observed after spherical indentation on prismatic and large-format pouch Li-ion cells by 3D X-ray computed tomography (XCT). Microscopic analysis including scanning electron microscopy (SEM), scanning transmission electron microscopy (STEM) and x-ray photoelectron microscopy (XPS) was carried out on copper current collectors from used commercial cells and pristine anodes. The copper-graphite cross-section images showed rough interface areas affected by reactions and diffusion in the used cell. Electron probe micro-analyzer (EPMA) element mapping showed the interface area was rich in oxygen and phosphorus. A detectable amount of phosphorus was also uniformly distributed inside the current collector. The same oxygen and phosphorus distributions were confirmed by STEM/EDS analysis. XPS depth profiles on multiple elements revealed the interface area of the aged anode was rich in Li, F, P, O and C and diffused at least 50 nm into the copper. In comparison, the pristine anode showed a very smooth C/Cu interface. No other elements were detected. For commercial cells, the reactions in the interface area and diffusion of multiple elements into the lattice and grain boundaries were responsible for the embrittlement of the copper current collectors. Finally, permanent cell capacity loss was observed in electrochemical performance of the indented cells.

36 MATERIALS SCIENCE↗

Microscopic vertical orientation of nano-interspaced graphene architectures in deposit films as electrodes for enhanced supercapacitor performance

This paper reported a novel two-step process to fabricate high-performance supercapacitor films that contain microscale domains of nano-interspaced, re-stacked graphene sheets oriented perpendicular to the surface of current collector substrate, i.e., carbon fiber paper. In the two-step process, we first used ligand molecules to modify the surface of graphene oxide (GO) sheets and manipulate the interspacing between the re-stacked GO sheets. The ligand-modified GOs, i.e., m-GOs, were then reduced to obtain more conductive graphene (m-rGO), where X-ray diffraction measurement results indicated well-controlled interlayer spacing between the restacked m-rGO sheets up to 1 nm. The typical lateral dimension of the restacked m-rGO sheets were ~40 µm. Then, electrical field was introduced during m-rGO slurry deposition process to induce the vertical orientation of the m-rGO sheets/stacks in the film deposit. The direct current electrical field induced the orientation of the domains of m-rGO stacks along the direction perpendicular to the surface of deposit film, i.e., direction of electric field. Also, the applied electric field increased the interlayer spacing further, which should enhance the diffusion and accessibility of electrolyte ions. As compared with the traditionally deposited “control” films, the field-processed film deposits that contain oriented structure of graphene sheets/stacks have shown up to ~1.6 times higher values in capacitance (430 F/g at 0.5 A/g) and ~67% reduction in equivalent series resistance. Finally, the approach of using electric field to tailor the microscopic architecture of graphene-based deposit films is effective to fabricate film electrodes for high performance supercapacitors.

36 MATERIALS SCIENCE↗

Enhancement of effective linear RF surface resistance of superconducting surfaces by microscopic topography

Minimization of Radio-Frequency (RF) dissipation on superconducting surfaces is of interest for many applications. A prominent one is the use of Superconducting RF (SRF) cavities for charged particle acceleration. In addition to our previous investigation which characterized the occurrence of high-field non-linear losses by microscopic surface topography, the topic of increased linear losses as a function of surface topographic character merits consideration. Surfaces with isotropic homogeneous surface topography may be well characterized by power spectral density (PSD) derived from systematic height measurements. PSD characterizations of representative niobium cavity surface treatments have been developed: Electro-Polishing (EP), Nano-Mechanical Polishing (NMP) and Centrifugal Barrel Polishing (CBP) A perturbation model based on PSD statistical analysis is used to calculate additional RF loss on these surfaces when superconducting. The model assesses the penetration depth effects for a superconductor. We thus estimate the RF power dissipation ratio between these rough surfaces and an ideal smooth surface.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗

Polarization control at the microscopic and electronic structure observatory

The new Microscopic and Electronic Structure Observatory (MAESTRO) at the Advanced Light Source (ALS) in Berkeley provides X-rays of variable polarization, produced by an elliptically polarized undulator (EPU), for angle resolved photoemission (ARPES) and photoemission electron microscopy (PEEM) experiments. The interpretation of photoemission data, in particular of dichroism effects in ARPES, requires the precise knowledge of the exact polarization state. Numerical simulations show that the first harmonics of the EPU at MAESTRO provides soft X-rays of almost 100% on axis polarization. However, the higher harmonics as well as the downstream optical elements of the beamline, have a considerable impact on the polarization of the light delivered to the experimental end-station. Finally, employing a simple reflective polarimeter, the polarization is characterized for variable EPU and beamline settings and the overall degree of polarization in the MAESTRO end-stations is estimated to be on the order of 83%.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗

Electron Microscopic Evaluation and Fission Product Identification of Irradiated TRISO Coated Particles from the AGR-1 Experiment: A Preliminary Review

Post-irradiation examination of coated particle fuel from the AGR-1 experiment is in progress at Idaho National Laboratory and Oak Ridge National Laboratory. In this paper a brief summary of results from characterization of microstructures in the coating layers of selected irradiated fuel particles with burnup of 11.3% and 19.3% FIMA will be given. The main objectives of the characterization were to study irradiation effects, fuel kernel porosity, layer debonding, layer degradation or corrosion, fission-product precipitation, grain sizes, and transport of fission products from the kernels across the TRISO layers. Characterization techniques such as scanning electron microscopy, transmission electron microscopy, energy dispersive spectroscopy, and wavelength dispersive spectroscopy were used. A new approach to microscopic quantification of fission-product precipitates is also briefly demonstrated. Microstructural characterization focused on fission-product precipitates in the SiC-IPyC interface, the SiC layer and the fuel-buffer interlayer. The results provide significant new insights into mechanisms of fission-product transport. Although Pd-rich precipitates were identified at the SiC-IPyC interlayer, no significant SiC-layer thinning was observed for the particles investigated. Characterization of these precipitates highlighted the difficulty of measuring low concentrations of Ag in precipitates with significantly higher concentrations of Pd and U. Different approaches to resolving this problem are discussed. An initial hypothesis is provided to explain fission-product precipitate compositions and locations. No SiC phase transformations were observed and no debonding of the SiC-IPyC interlayer as a result of irradiation was observed for the samples investigated. Lessons learned from the post-irradiation examination are described and future actions are recommended.

11 NUCLEAR FUEL CYCLE AND FUEL MATERIALS↗

The microscopic model of BiFeO 3

Many years and great effort have been spent constructing the microscopic model for the room temperature multiferroic BiFeO 3 . However, earlier models implicitly assumed that the cycloidal wavevector q was confined to one of the three-fold symmetric axes in the hexagonal plane normal to the electric polarization. Because recent measurements indicate that q can be rotated by a magnetic field, it is essential to properly treat the anisotropy that confines q at low fields. Here, we propose that the anisotropy energy $–K_3S^6$ sin$^6θ$ cos $6ϕ$ confines the wavevectors q to the three-fold axis $ϕ=0$ and $±2π/3$ within the hexagonal plane with $θ=π/2$.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗

Microscopic Self-consistent Study of Neon Halos with Resonant Contributions

Recent reaction measurements have been interpreted as evidence of a halo structure in the exotic neutron-rich isotopes 29,31Ne. While theoretical studies of 31Ne generally agree on its halo nature, they differ significantly in their predictions of its properties and underlying cause (e.g., that 31Ne lies in an "island of inversion'"). We have made a systematic theoretical analysis of possible Neon halo signatures -- the first using a fully microscopic, relativistic mean field approach that properly treats positive energy orbitals (such as the valence neutron in 31Ne) self-consistently with bound levels, and that includes the pairing effect that keeps the nucleus loosely bound with negative Fermi energy. Our model is the analytical continuation of the coupling constant (ACCC) method based on a relativistic mean field (RMF) theory with Bardeen-Cooper-Schrieffer (BCS) pairing approximation. We calculate neutron- and matter-radii, one-neutron separation energies, p- and f-orbital energies and occupation probabilities, and neutron densities for single-particle resonant orbitals in 27-31Ne. We analyze these results for evidence of neutron halo formation in 29,31Ne. Our model predicts a p-orbit 1n halo structure for 31Ne, based on a radius increase from 30Ne that is 7 - 8 times larger than the increase from 29Ne to 30Ne, as well as a decrease in the neutron separation energy by a factor of ~ 10 compared to that of 27-30Ne. In contrast to other studies, our inclusion of resonances yields an inverted ordering of p and f orbitals for small deformations. Furthermore, we find no evidence of an s-orbit 1n halo in 29Ne as recently claimed in the literature.

exotic nuclei↗

Enhanced phase contrast transfer using ptychography combined with a pre-specimen phase plate in a scanning transmission electron microscope

We report the ability to image light elements in both crystalline and noncrystalline materials at near atomic resolution with an enhanced contrast is highly advantageous to understand the structure and properties of a wide range of beam sensitive materials including biological specimens and molecular hetero-structures. This requires the imaging system to have an efficient phase contrast transfer at both low and high spatial frequencies. Here, we introduce a new phase contrast imaging method in a scanning transmission electron microscope (STEM) using a pre-specimen phase plate in the probe forming aperture, combined with a fast pixelated detector to record diffraction patterns at every probe position, and phase reconstruction using ptychography. The phase plate significantly enhances the contrast transfer of low spatial frequency information, and ptychography maximizes the extraction of the phase information at all spatial frequencies. In addition, the STEM probe with the presence of the phase plate retains its atomic resolution, allowing simultaneous incoherent Z-contrast imaging to be obtained along with the ptychographic phase image. An experimental image of Au nanoparticles on a carbon support shows high contrast for both materials. Multislice image simulations of a DNA molecule shows the capability of imaging soft matter at low dose conditions, which implies potential applications of low dose imaging of a wide range of beam sensitive materials.

36 MATERIALS SCIENCE↗

Tunable electron beam pulser for picoseconds stroboscopic microscopy in transmission electron microscopes

For two decades, time-resolved transmission electron microscopes (TEM) have relied on pulsed-laser photoemission to generate electron bunches to explore sub-microsecond to sub-picosecond dynamics. Despite the vast successes of photoemission time-resolved TEMs, laser-based systems are inherently complex, thus tend not to be turn-key. In this paper, we report on the successful retrofit of a commercial 200 keV TEM, without an external laser, capable of producing continuously tunable pulsed electron beams with repetition rates from 0.1 GHz up to 12 GHz and a tunable bunch length from tens of nanoseconds down to 10 ps. This innovation enables temporal access into previously inaccessible regimes: i.e., high repetition rate stroboscopic experiments. Combination of a pair of RF-driven traveling wave stripline elements, quadrupole magnets, and a variable beam aperture enables operation of the instrument in (1) continuous waveform (CW) mode as though the instrument was never modified (i.e. convention TEM operation mode, where the electrons from the emission cathode randomly arrive at the sample without resolvable time information), (2) stroboscopic (pump-probe) mode, and (3) pulsed beam mode for dose rate sensitive materials. In order to analyze the effect of a pulsed beam on image quality, we examined Au nanoparticles using bright field, high-resolution TEM imaging and selected area diffraction in both continuous and pulsed-beam mode. Furthermore, in comparison of conventional TEMs, the add-on beam pulser enables the observation of ultrafast dynamic behavior in materials that are reversible under synchronized excitation.

36 MATERIALS SCIENCE↗

X-ray Energy-Dispersive Spectrometry During In Situ Liquid Cell Studies Using an Analytical Electron Microscope

The use of analytical spectroscopies during scanning/transmission electron microscope (S/TEM) investigations of micro- and nano-scale structures has become a routine technique in the arsenal of tools available to today's materials researchers. Essential to implementation and successful application of spectroscopy to characterization is the integration of numerous technologies, which include electron optics, specimen holders, and associated detectors. While this combination has been achieved in many instrument configurations, the integration of X-ray energy-dispersive spectroscopy and in situ liquid environmental cells in the S/TEM has to date been elusive. In this work we present the successful incorporation/modifications to a system that achieves this functionality for analytical electron microscopy.

Zaluzec, Nestor J.↗

Microwave Frequency Comb from a Semiconductor in a Scanning Tunneling Microscope

Abstract Quasi-periodic excitation of the tunneling junction in a scanning tunneling microscope, by a mode-locked ultrafast laser, superimposes a regular sequence of 15 fs pulses on the DC tunneling current. In the frequency domain, this is a frequency comb with harmonics at integer multiples of the laser pulse repetition frequency. With a gold sample the 200th harmonic at 14.85 GHz has a signal-to-noise ratio of 25 dB, and the power at each harmonic varies inversely with the square of the frequency. Now we report the first measurements with a semiconductor where the laser photon energy must be less than the bandgap energy of the semiconductor; the microwave frequency comb must be measured within 200 μ m of the tunneling junction; and the microwave power is 25 dB below that with a metal sample and falls off more rapidly at the higher harmonics. Our results suggest that the measured attenuation of the microwave harmonics is sensitive to the semiconductor spreading resistance within 1 nm of the tunneling junction. This approach may enable sub-nanometer carrier profiling of semiconductors without requiring the diamond nanoprobes in scanning spreading resistance microscopy.

Material Science↗

Visualizing and Quantifying the Cationic Mobility at {100} Surfaces of Ceria: Application to CO 2 Adsorption/Desorption Phenomena in the Environmental Transmission Electron Microscope

Environmental transmission electron microscopy in a dedicated instrument allows ultimate spatial resolution with chemical analysis capabilities similar to high resolution transmission electron microscopes (HRTEMs), while retaining partial pressures up to 20 mbar around the specimen. Finally, such instruments provide an optimized approach to study the early stages of catalytic reactions, which can start from very low partial pressure, at the atomic-scale.

36 MATERIALS SCIENCE↗

Quantitative Assessment and Measurement of X-ray Detector Performance and Solid Angle in the Analytical Electron Microscope

A wide range of X-ray detectors and geometries are available today on transmission/scanning transmission analytical electron microscopes. While there have been numerous reports of their individual performance, no single experimentally reproducible metric has been proposed as a basis of comparison between the systems. In this paper, we detail modeling, experimental procedures, measurements, and specimens which can be used to provide a manufacturer-independent assessment of the performance of an analytical system. Using these protocols, the geometrical collection efficiency, system peaks, and minimum detection limits can be independently assessed and can be used to determine the best conditions to conduct modern hyperspectral and/or spectrally resolved tomographic analyses for an individual instrument. Here, a simple analytical formula and specimen is presented which after suitable system calibrations can be used to experimentally determine the X-ray detector solid angle.

47 OTHER INSTRUMENTATION↗

Isotope-Resolved Electron Energy Loss Spectroscopy in a Monochromated Scanning Transmission Electron Microscope

The development and implementation of high-stability monochromators in state-of-the-art aberration-corrected scanning transmission electron microscopes has enabled materials characterization with an energy resolution as good as 3 meV. This allows the vibrational modes, which would otherwise be obscured by the energy spread of the electron beam, to be probed with very high precision in molecular materials. Since the vibrational energies depend on the weight of the atomic nuclei, vibrational spectroscopy can distinguish isotopes whose only difference lies in their neutron content. This opens up isotopic analysis and mapping in transmission electron microscopy as two important new research areas. In this paper, we review the monochromated electron energy loss spectroscopy (EELS) instrumentation, discuss optimal methods for probing beam-sensitive materials without destroying them, and review key nanoscale isotope-resolved results.

47 OTHER INSTRUMENTATION↗

First-Principles Simulation of Beam-Induced Processes Underlying Atomic Manipulation in Electron Microscopes

The development of experimental methods and apparatuses capable of promoting atomically precise material manipulations holds great promise for realizing the ultimate limit of feature miniaturization in materials and devices. The ability to modify materials atom by atom is anticipated to usher in new technologies in areas as diverse as separation science, medicine, and quantum information science. Historically, scanning probe-based techniques have been the most prominent approaches in this space. However, these methods are best suited for the manipulation of surface-exposed regions of materials, as the strong perturbations required for bond scission are delivered most effectively to atoms in the near-proximity to the scanning probe. In contrast, convergent electron beams with energies tuned slightly below the threshold for inducing irreversible knock-on damage have recently been employed (within scanning transmission electron microscopy) to promote atomic-scale bond rearrangements in various beam-stable solids. Currently, however, the efficiency and selectivity of beam-induced atomic manipulation processes with focused electron beams are such that long irradiation times are required to induce a desired atomic rearrangement. With a better understanding of the underlying physics dictating the outcome of a given irradiation event, methods can be devised to improve the efficiency of these techniques so that their promise can be fully realized through widespread adoption.To this end, this Account details our recent efforts to develop and apply tractable first-principles simulation approaches for studying the response of materials to electric beam-like external electric potentials applied in real space. We briefly review the concepts and capabilities in the area of atomically precise materials manipulation and review the early demonstrations of accomplishments in this area, focusing on studies using scanned convergent electron beam probes in particular. We expound upon the depth of the challenge and identify critical shortcomings of theoretical methods that have previously been employed in the simulation of beam-induced processes. We then describe the computational methods that we have generalized from the concepts and tools most commonly applied to the study of molecular photochemistry and how our adaptations of these methods can be employed to capture the relevant dynamical phenomena for beam-induced processes ranging from the initial electron scattering to the ensuing multistate reactions. Here, we contextualize these methods within the current state of the art in this area, which has historically focused primarily on the simulation of inelastic image formation in the electron microscope for the purpose of interpreting the results of quantitative electron microscopy experiments. We demonstrate that the spatial distribution of state-specific excitation rates due to the presence of an external (probe) electric charge is inhomogeneous, such that irradiation at particular locations in materials can favor specific electronic transitions (and disallow others). In addition to the potential for excited-state reaction pathways to be accessed through the initial inelastic scattering of the tightly focused electron beam from the targeted atoms, we also identify favorable conditions for the electronically nonadiabatic evolution of the highly vibrationally excited system to open complex multistate reaction pathways. Implications of the early results for understanding the mechanisms and potential routes to improved efficiency and selectivity in beam-induced reactions are discussed. We conclude with a summary of the current state of theory and modeling capabilities in this area and provide our perspective on future directions for theoretical and experimental developments that we view as crucial to advancing the use of convergent electron beams in mode-specific, atomically precise platforms for direct-write materials modifications.

36 MATERIALS SCIENCE↗

Optical Microscopic Techniques for Synthetic Polymer Characterization

In this paper, we discuss how state-of-the-art optical microscopic techniques enhance our understanding of the morphological and dynamic properties of synthetic polymers. Microscopic/nanoscopic properties obtained using these techniques can be linked to the macroscopic rheological, mechanical, optical, electrical and/or chemical properties of synthetic polymers that are widely used in scientific research and/or in daily life. Lastly, detailed knowledge of nanoscale polymer properties is thus anticipated to facilitate designing novel polymers for various applications, including surface coating, chemical separations, chemical sensing, bioimaging, and organic electronic devices.

36 MATERIALS SCIENCE↗