Sources of and Remedies for Removing Unwanted Reflections in Millimeter Wave Images of Complex SOFI-Covered Structures
In the recent years, continuous-wave (CW) near-field and lens-focused millimeter wave imaging systems have been effectively. used to demonstrate their utility for producing high-resolution images of metallic structures covered with spray on foam insulation (SOFI) such as the space shuttle external tank. These systems have produced images with a spatial resolution of approximately 2 mm at a frequency of 150 GHz, and can easily interrogate thin as well as thick SOFI (> 9") enabling detection and evaluation of flaws such as voids, disbands, delaminations and corrosion. These systems are relatively simple, inexpensive, easy-to-use, require little to no signal processing of the raw data, on-site friendly, real-time and small. However, for some specific structures a certain interference pattern may be superimposed on the produced images. Generally, this occurs when the SOFI surface is at a relatively significant angle with respect to the surface of the substrate (or other sub-structures) on which it is sprayed. Consequently, the reflection from the surface of the SOFI and that from the substrate (or sub-structure) coherently combine into an interference pattern as the SOFI surface is scanned. There are methods by which the influence of this unwanted interference can be reduced, such as the incorporation of an incidence angle and the proper use of signal polarization. This paper presents the basics of this problem and describes the use of the methods for reducing this unwanted influence through several specific examples. A discussion on how the use of a swept-frequency or pulsed method may also alleviate this problem is also presented.