Search for orbital magnetism in the kagome superconductor CsV 3 Sb 5 using neutron diffraction
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We discuss a simple statistical analysis which yields the precision, resolution, accuracy and trueness of diffraction-based lattice strain measurements. The procedure consists of measuring the thermal expansion induced in each component of an ideal, non-reacting, two-component, crystalline powder sample in situ. One component, with a high coefficient of thermal expansion (CTE), serves as an internal thermometer. The quantities of interest are obtained by determining the smallest, statistically significant, thermal lattice strain which can be detected through diffraction analysis in the second, low CTE, component in response to controlled temperature changes. This procedure also provides a robust check of the alignment of the diffraction system and is able to reveal the presence of systematic errors. The application of this technique to a time-of-flight engineering diffractometer/strain scanner is presented.
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Raw data collected on Ce metal from within the Paris-Edinburgh press on SNAP.
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