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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.
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Reduces spectral contamination by spurious X-ray. Specimen holder made of compressed carbon, securely retains standard electron microscope grid (disk) 3 mm in diameter and absorbs backscattered electrons that otherwise generate spurious X-rays. Since holder inexpensive, dedicated to single specimen when numerous samples examined.
One of the biggest problems in obtaining high accuracy in microscopic electrophoresis is the parabolic flow of liquid in the chamber due to electroosmotic backflow during application of the electric field. In chambers with glass walls the source of polarization leading to electroosmosis is the negative charge of the silicare and other ions that form the wall structure. It was found by Hjerten, who used a rotating 3.0 mm capillary tube for free zone electrophoresis, that precisely neutralizing this charge was extremely difficult, but if a neutral polymer matrix (formaldehyde fixed methylcellulose) was formed over the glass (quartz) wall the double layer was displaced and the viscosity at the shear plane increased so that electroosmotic flow could be eliminated. Experiments were designed to determine the reliability with which methylcellulose coating of the Zeiss Cytopherometer chamber reduced electroosmotic backflow and the effect of coating on the accuracy of cell electrophoretic mobility (EPN) determinations. Fixed rat erythrocytes (RBC) were used as test particles.
Utilizing eikonal phase shifts determined from a microscopic double-folding optical potential, marked improvement in the agreement between theory and experiment, for elastic carbon-carbon scattering between 200 and 300 MeV, is obtained when only those values for the nucleon-nucleon slope parameter, appropriate for diffractive scattering, are used. The appropriateness of the perturbative eikonal expansion is discussed by comparison with recent results, obtained for the same potentials, using a more exact complex Wentzell-Kramers-Brillouin (WKB) formalism.
An effort to evaluate the high temperature performance of a polyimide (PMR-15)-graphite composite which consists of several plies of woven strands of carbon fibers was undertaken. The longterm effect of high temperature on the dry material was studied by exposing polished test specimens of 473 F in a oven for nearly 400 hours. Periodically the specimens were removed and observed microscopically. Gradually surface cracks began to appear and the number of cracks increased over time. At the conclusion of the exposure the specimens were graudually ground down and observed in order to determine the depth of the cracks into the interior of the material. This procedure was repeated at an exposure temperature of 550 F.
A mercuric iodide energy dispersive X-ray spectrometer, with Peltier cooling provided for the detector and input field effect transistor, has been developed and tested in a scanning electron microscope. X-ray spectra were obtained with the 15 keV electron beam. An energy resolution of 225 eV (FWHM) for Mn-K(alpha) at 5.9 keV and 195 eV (FWHM) for the Mg-K line at 1.25 keV has been measured. Overall system noise level was 175 eV (FWHM). The detector system characterization with a carbon target demonstrated good energy sensitivity at low energies and lack of significant spectral artifacts at higher energies.
Using a recently developed technology called thermal-wave microscopy, NASA Lewis Research Center has developed a computer controlled submicron thermal-wave microscope for the purpose of investigating III-V compound semiconductor devices and materials. This paper describes the system's design and configuration and discusses the hardware and software capabilities. Knowledge of the Concurrent 3200 series computers is needed for a complete understanding of the material presented. However, concepts and procedures are of general interest.
The lack of additivity of proton and electron exposure of GaAs solar cells has been established as due to macroscopic variations in defect densities. The difference in annealing in proton and electron exposure is herein related to the microscopic variation in defect structures. Electron equivalence can be established when annealing is present only for high energy electrons.
A unique scanning tunneling microscope (STM) system has been developed for spectroscopy of the superconducting energy gap. High-resolution control of tunnel current and voltage allows for measurement of superconducting properties at tunnel resistance levels 100-1000 greater than that achieved in prior work. The previously used STM methods for superconductor spectroscopy are compared to those developed for the work reported here. Superconducting energy-gap spectra are reported for three superconductors, Pb, PbBi, and NbN, over a range of tunnel resistance. The measured spectra are compared directly to theory.
Display accessories increase resolution and flexibility of use. Toolmaker's microscope equipped with video monitor, auxiliary lighting, and high-resolution readout devices enables noncontacting measurements of tiny slots, indentations, and similar features on parts. Measures places difficult or impossible to reach by mechanical means.
The paper elucidates those microscopic plasma processes (electrostatic shocks, pitch angle scattering of the ions, and ion perpendicular heating) which help in trapping and/or thermalizing the plasma in the flux tubes. The mechanism and conditions for electrostatic shock formation are discussed. It is shown that equatorial ion heating stops interhemispheric flow by setting up a potential barrier at the equator.
Nonlinear equilibrium states of a microscopic current filamentation (electrothermal instability) in the solar atmosphere are explored. This phenomenon occurs for transition zone ion temperature plasmas provided that the electron to ion temperature ratio exceeds 1. It is shown that when the onset condition for the electrothermal instability is satisfied, the instability drives a current filamentation to a nonlinear equilibrium state that has a spatially periodic electron temperature variation with wavelength.
The low-temperature scanning tunneling microscope (STM) system described by LeDuc et al. (1987) was used to observe the phonon density of states effects in a superconductor. Using techniques based on those employed in macroscopic tunneling spectroscopy, electron tunneling current-voltage (I-V) spectra were measured for NbN and Pb, and dI/dV vs V spectra were measured using standard analog derivative techniques. I-V measurements on NbN and Pb samples under typical STM conditions showed no evidence for multiparticle tunneling effects.
Ballistic-electron-emission microscope (BEEM) employs scanning tunneling-microscopy (STM) methods for nondestructive, direct electrical investigation of buried interfaces, such as interface between semiconductor and thin metal film. In BEEM, there are at least three electrodes: emitting tip, biasing electrode, and collecting electrode, receiving current crossing interface under investigation. Signal-processing device amplifies electrode signals and converts them into form usable by computer. Produces spatial images of surface by scanning tip; in addition, provides high-resolution images of buried interface under investigation. Spectroscopic information extracted by measuring collecting-electrode current as function of one of interelectrode voltages.
A vacuum compatible scanning tunneling microscope was designed and built, capable of imaging solid surfaces with atomic resolution. The single piezoelectric tube design is compact, and makes use of sample mounting stubs standard to a commercially available surface analysis system. Image collection and display is computer controlled, allowing storage of images for further analysis. Calibration results from atomic scale images are presented.
Tensile specimens made of a metal-matrix composite (cast and extruded aluminum alloy-based matrix reinforced with Al2O3 particulate) were tested in situ in a scanning electron microscope equipped with a deformation stage, to directly monitor the crack propagation phenomenon. The in situ SEM observations revealed the presence of microcracks both ahead of and near the crack-tip region. The microcracks were primarily associated with cracks in the alumina particles. The results suggest that a region of intense deformation exists ahead of the crack and corresponds to the region of microcracking. As the crack progresses, a region of plastically deformed material and associated microcracks remains in the wake of the crack.
Mercuric iodide X-ray detectors have been undergoing tests in a prototype scanning electron microscope system being developed for unmanned space flight. The detector program addresses the issues of geometric configuration in the SEM, compact packaging that includes separate thermoelectric coolers for the detector and FET, X-ray transparent hermetic encapsulation and electrical contacts, and a clean vacuum environment.
Proposed microscope operates in "water-window" part of x-ray spectrum. Contains spherical-mirror substrates coated with multiple thin layers of material exhibiting Bragg reflection at wavelength at which water transparent. Suited for making high-resolution, high-contrast images for microbiological research.
Microscope contains Bragg-reflecting, grazing-incidence reflectors, filter wheel, and detector. Multiple nested coaxial pairs of reflectors used to form images simultaneously at multiple wavelengths. Collects and focuses radiation to produce images with moderate spectral resolution and high spatial resolution. Enables use of smaller, cheaper, better-shielded detectors. Combination of features provides new information of unprecedented value in several fields of research; probing fine structures of pulsed plasmas, investigating minute variations in structures of material specimens penetrated only by hard-x or gamma rays, or in producing maps of distributions of radioisotopes in biological specimens.