Microscopic system for Mars study program /feasibility study/ Final report, 30 Oct. 1961 - 31 Mar. 1962
Remote automatic microscopic system for Mars life detection
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Remote automatic microscopic system for Mars life detection
Microscope modification for time-lapse cinematography noting holding camera stand, deflecting light mirror, culture chamber, etc
Cesium ion emission patterns obtained from rear- fed porous refractory metals, using thermal emission microscope
Fast scanning IR microscope for semiconductor evaluation used for engineering design analysis, reliability improvement, failure analysis, etc
Defect structures in ion emission images of metals and stress distributions under imaging conditions studied with field ion microscope
Fast scan infrared microscope for inspecting microelectronic circuits
Scanning electron microscope for evaluating failure mechanisms in semiconductor devices, and for three-dimensional representation of biological specimens
Fast scan infrared microscope for measuring thermal and electromechanical parameters affecting reliability of microelectronic devices
Two magnetically geared microscope stages for nuclear track plates
Oxygen caused bright spots in field ion microscope patterns of tungsten, noting oxygen variation effects
Reflected light microscope for viewing unstained brain and ganglion cells
Threshold voltage for onset of image-spot blurring of field-ion microscope screen and function of tip temperature
The Camera, Hand Lens, and Microscope Probe (CHAMP) will allow examination of martian surface features and materials (terrain, rocks, soils, samples) on spatial scales ranging from kilometers to micrometers, thus enabling both microscopy and context imaging with high operational flexibility. CHAMP is designed to allow the detailed and quantitative investigation of a wide range of geologic features and processes on Mars, leading to a better quantitative understanding of the evolution of the martian surface environment through time. In particular, CHAMP will provide key data that will help understand the local region explored by Mars Surface Laboratory (MSL) as a potential habitat for life. CHAMP will also support other anticipated MSL investigations, in particular by helping identify and select the highest priority targets for sample collection and analysis by the MSL's analytical suite.
The Miniaturized Variable Pressure Scanning Electron Microscope(MVP-SEM) project, funded by the NASA Planetary Instrument Concepts for the Advancement of Solar System Observations (PICASSO) Research Opportunities in Space and Earth Science (ROSES), will build upon previous miniaturized SEM designs for lunar and International Space Station (ISS) applications and recent advancements in variable pressure SEM's to design and build a SEM to complete analyses of samples on the surface of Mars using the atmosphere as an imaging medium. By the end of the PICASSO work, a prototype of the primary proof-of-concept components (i.e., the electron gun, focusing optics and scanning system)will be assembled and preliminary testing in a Mars analog chamber at the Jet Propulsion Laboratory will be completed to partially fulfill Technology Readiness Level to 5 requirements for those components. The team plans to have Secondary Electron Imaging(SEI), Backscattered Electron (BSE) detection, and Energy Dispersive Spectroscopy (EDS) capabilities through the MVP-SEM.
The Miniaturized Variable Pressure Scanning Electron Microscope (MVP-SEM) project, funded by the NASA Planetary Instrument Concepts for the Advancement of Solar System Observations (PICASSO) Research Opportunities in Space and Earth Sciences (ROSES), will build upon previous miniaturized SEM designs and recent advancements in variable pressure SEM's to design and build a SEM to complete analyses of samples on the surface of Mars using the atmosphere as an imaging medium. This project is a collaboration between NASA Marshall Space Flight Center (MSFC), the Jet Propulsion Laboratory (JPL), electron gun and optics manufacturer Applied Physics Technologies, and small vacuum system manufacturer Creare. Dr. Ralph Harvery and environmental SEM (ESEM) inventor Dr. Gerry Danilatos serve as advisors to the team. Variable pressure SEMs allow for fine (nm-scale) resolution imaging and micron-scale chemical study of materials without sample preparation (e.g., carbon or gold coating). Charging of a sample is reduced or eliminated by the gas surrounding the sample. It is this property of ESEMs that make them ideal for locations where sample preparation is not yet feasible, such as the surface of Mars. In addition, the lack of sample preparation needed here will simplify the sample acquisition process and allow caching of the samples for future complementary payload use.
Development of a miniaturized scanning electron microscope that will utilize the martian atmosphere to dissipate charge during analysis continues. This instrument is expected to be used on a future rover or lander to answer fundamental Mars science questions. To identify the most important questions, a survey was taken at the 47th Lunar and Planetary Science Conference (LPSC). From the gathered information initial topics were identified for a SEM on the martian surface. These priorities are identified and discussed below. Additionally, a concept of operations is provided with the goal of maximizing the science obtained with the minimum amount of communication with the instrument.
A new instrument developed by LLNL scientists and engineers, the Movie Mode Dynamic Transmission Electron Microscope (MM-DTEM), captures billionth-of-a-meter-scale images with frame rates more than 100,000 times faster than those of conventional techniques. The work was done in collaboration with a Pleasanton-based company, Integrated Dynamic Electron Solutions (IDES) Inc. Using this revolutionary imaging technique, a range of fundamental and technologically important material and biological processes can be captured in action, in complete billionth-of-a-meter detail, for the first time. The primary application of MM-DTEM is the direct observation of fast processes, including microstructural changes, phase transformations and chemical reactions, that shape real-world performance of nanostructured materials and potentially biological entities. The instrument could prove especially valuable in the direct observation of macromolecular interactions, such as protein-protein binding and host-pathogen interactions. While an earlier version of the technology, Single Shot-DTEM, could capture a single snapshot of a rapid process, MM-DTEM captures a multiframe movie that reveals complex sequences of events in detail. It is the only existing technology that can capture multiple electron microscopy images in the span of a single microsecond.
The FY18 milestone for this work involved the completion of qualification testing of the Thermal Conductivity Microscope (TCM) in preparation for installation in the Irradiated Materials Characterization Laboratory (IMCL). In FY17 the TCM was entered into stage one mockup at the Materials and Fuels Complex (MFC) and initial testing was completed. This initial testing at the MFC centered on the ability operate the equipment remotely using manipulators and functional testing of the instrument. During FY18 issues noted during initial testing were addressed, a sample heater indexing system was developed, software enhancements were integrated and a sputter coater for use in the glove was procured. Additional testing was preformed to ensure instrument accuracy and reproducibility. The Phase II qualification plan, MFC-EQP-0267, completed approval on August 14, 2018.