Electron Bombardment of ZnTe EO Bunch Charge Detector for Signal Lifetime Studies in Radiation Environment
Electro-optic detection of bunch charge distribution utilizing the nonlinear Pockel's and Kerr effect of materials has been implemented at various facilities as a method of passive detection for beam preservation throughout characterization. Most commonly, the inorganic II-VI material ZnTe is employed due to it's strong Pockel's EO effect and relatively high temporal resolution (~90 fs). Despite early exploration of radiation damage on ZnTe in exploration of semi-conductor materials in the 1970's, full characterization of EO response over radiation lifetime has yet to be performed. The following poster presents a method for ZnTe crystal characterization studies throughout radiation exposure at various energies and dosages by analyzing the changes in index of refraction including bulk uniformity, and THz signal response changes.