High resolution cone beam X-ray computed tomography of 3D-microstructures of cast Al-alloys
X-ray computed tomography (XCT) has become a very important method for non-destructive 3D-characterisation of materials. XCT systems with cone beam geometry, micro- or nano-focus tubes and matrix detectors are increasingly used in research and non-destructive testing. Spatial resolutions down to 1 {mu}m can be reached with such XCT-systems for heterogeneities in metals with high absorption contrast. High resolution cone beam XCT is applied to five different Al-alloys: AlMg5Si7, AlCu4Mg1, AlZn6Mg2Cu2, AlZn8Mg2Cu2 and AlSi12Ni1. Up to four different types of inhomogeneities are segmented in one alloy using voxel sizes between (0.4 {mu}m){sup 3} and (2.3 {mu}m){sup 3}. Target metallography and elemental analysis by energy dispersive X-ray analysis are used to identify the inhomogeneities. The possibilities and restrictions of XCT applied to Al-alloys are discussed. AlMg5Si7 XCT-data with a voxel size of (0.4 {mu}m){sup 3} show inhomogeneities with brighter grey-values than the Al-matrix identified as elongated Fe-aluminides, and those with lower grey-values identified as pores and Mg{sub 2}Si-particles with a 'Chinese script-like' structure. Higher-absorbing interdendritic Al-Al{sub 2}Cu-eutectic regions appear brighter than the Al-dendrites in the CT-data of AlCu4Mg1 with (1.1 {mu}m){sup 3}/voxel, whereas pores > 4 {mu}m appear darker than the Al-matrix. The size and the 3D-structure of the {alpha}-Al dendrite arms with a diameter of 50-100 {mu}m are determined in samples from chill cast billets of AlCu4Mg1 and AlZn6Mg2Cu2 alloys. The irregular interdendritic regions containing eutectic segregations with Cu- and Zn-rich phases are > 5 {mu}m wide. Equally absorbing primary equi-axed Al{sub 3}(Sc, Zr) particles > 5 {mu}m are distinguished in the centres of the dendrites by the level of sphericity values. The distribution of Ni- and Fe-aluminides in a squeeze cast AlSi12Ni1-alloy is imaged with (0.4 {mu}m){sup 3}/voxel, but the Si-phase cannot be segmented.