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At least 397 records · Page 22

Technology, design, simulation, and evaluation for SEP-hardened circuits

This paper describes the technology, design, simulation, and evaluation for improvement of the Single Event Phenomena (SEP) hardness of gate-array and SRAM cells. Through the use of design and processing techniques, it is possible to achieve an SEP error rate less than 1.0 x 10(exp -10) errors/bit-day for a 9O percent worst-case geosynchronous orbit environment.

Adams, J. R.↗

Radiation hardened microprocessor for small payloads

The RH-3000 program is developing a rad-hard space qualified 32-bit MIPS R-3000 RISC processor under the Naval Research Lab sponsorship. In addition, under IR&D Harris is developing RHC-3000 for embedded control applications where low cost and radiation tolerance are primary concerns. The development program leverages heavily from commercial development of the MIPS R-3000. The commercial R-3000 has a large installed user base and several foundry partners are currently producing a wide variety of R-3000 derivative products. One of the MIPS derivative products, the LR33000 from LSI Logic, was used as the basis for the design of the RH-3000 chipset. The RH-3000 chipset consists of three core chips and two support chips. The core chips include the CPU, which is the R-3000 integer unit and the FPA/MD chip pair, which performs the R-3010 floating point functions. The two support whips contain all the support functions required for fault tolerance support, real-time support, memory management, timers, and other functions. The Harris development effort had first passed silicon success in June, 1992 with the first rad-hard 32-bit RH-3000 CPU chip. The CPU device is 30 kgates, has a 508 mil by 503 mil die size and is fabricated at Harris Semiconductor on the rad-hard CMOS Silicon on Sapphire (SOS) process. The CPU device successfully passed tesing against 600,000 test vectors derived directly on the LSI/MIPS test suite and has been operational as a single board computer running C code for the past year. In addition, the RH-3000 program has developed the methodology for converting commercially developed designs utilizing logic synthesis techniques based on a combination of VHDK and schematic data bases.

Shah, Ravi↗

Mechanical behavior of precipitation hardenable steels exposed to highly corrosive environment

Unexpected occurrences of failures, due to stress corrosion cracking (SCC) of structural components, indicate a need for improved characterization of materials and more advanced analytical procedures for reliably predicting structures performance. Accordingly, the purpose of this study was to determine the stress corrosion susceptibility of 15 - 5 PH steel over a wide range of applied strain rates in a highly corrosive environment. The selected environment for this investigation was a 3.5 percent NaCl aqueous solution. The material selected for the study was 15 - 5 PH steel in the H 900 condition. The Slow Strain Rate technique was used to test the metallic specimens.

Rosa, Ferdinand↗

Magnetic properties and magnetic hardening mechansim of Pt-Co-B alloys

The intrinsic coercivity is found to be maximized in the Pt42Co45B13 ternary alloy which is undercooled and rapidly solidified (quenched using a 70 m/s wheel speed after undercooling), and then annealed (800 C for 2400 min). The same alloy, processed at slower cooling rates and annealed in the same way, has a much larger scale microstructure and a much lower resulting magnetic coercivity. The microstructure which would optimize the coercitvity of this coercivity of this ternary alloy is a completely ordered L1(sub zero) Pt-Co matrix with a submicron magnetic single-domion Co-boride precipitate. The L1(sub zero) phase is highly anistropic magnetically while the Co-boride precipate is somewhat less so. Annealing treatments designed to produced single-domain Co-boride precipitates enhance the coercivity. This suggests that the refined microstructures is responsible for the high coercivities found in the rapidly solidified and annealed alloy. The magnetic domain wall thickness for a Co-boride precipitate is determined from both experimental observation and theoretical calculation in order to evaluate its influence on the coercivity of the alloy. The effects of the pinning of domain walls and the barrier to the nucleation of reverse domains on the coercivity are discussed. Both microstrucutral analysis and theoretical calculation indicate that the high coercivities in the Pt42Co45B13 alloy are due to the difficult nucleation of reverse magnetic domains.

Qiu, Ning↗

Low Temperature Testing of a Radiation Hardened CMOS 8-Bit Flash Analog-to-Digital (A/D) Converter

Power processing electronic systems, data acquiring probes, and signal conditioning circuits are required to operate reliably under harsh environments in many of NASA:s missions. The environment of the space mission as well as the operational requirements of some of the electronic systems, such as infrared-based satellite or telescopic observation stations where cryogenics are involved, dictate the utilization of electronics that can operate efficiently and reliably at low temperatures. In this work, radiation-hard CMOS 8-bit flash A/D converters were characterized in terms of voltage conversion and offset in the temperature range of +25 to -190 C. Static and dynamic supply currents, ladder resistance, and gain and offset errors were also obtained in the temperature range of +125 to -190 C. The effect of thermal cycling on these properties for a total of ten cycles between +80 and - 150 C was also determined. The experimental procedure along with the data obtained are reported and discussed in this paper.

Gerber, Scott S.↗

Heavy Ion Transient Characterization of a Photobit Hardened-by-Design Active Pixel Sensor Array

This paper presents heavy ion data on the single event transient (SET) response of a Photobit active pixel sensor (APS) four quadrant test chip with different radiation tolerant designs in a standard 0.35 micron CMOS process. The physical design techniques of enclosed geometry and P-channel guard rings are used to design the four N-type active photodiode pixels as described in a previous paper. Argon transient measurements on the 256 x 256 chip array as a function of incident angle show a significant variation in the amount of charge collected as well as the charge spreading dependent on the pixel type. The results are correlated with processing and design information provided by Photobit. In addition, there is a large degree of statistical variability between individual ion strikes. No latch-up is observed up to an LET of 106 MeV/mg/sq cm.

Marshall, Paul W.↗

Hardening Doppler Global Velocimetry Systems for Large Wind Tunnel Applications

The development of Doppler Global Velocimetry from a laboratory curiosity to a wind tunnel instrumentation system is discussed. This development includes system advancements from a single velocity component to simultaneous three components, and from a steady state to instantaneous measurement. Improvements to system control and stability are discussed along with solutions to real world problems encountered in the wind tunnel. This on-going development program follows the cyclic evolution of understanding the physics of the technology, development of solutions, laboratory and wind tunnel testing, and reevaluation of the physics based on the test results.

Meyers, James F.↗

Recent Results on SEU Hardening of SiGe HBT Logic Circuits

A viewgraph presentation on SEU tolerant SiGe HBT technology is shown. The topics include: 1) Introduction; 2) TID and SEU in SiGe Technology; 3) RHBD Techniques; 4) Experiment; 5) Heavy-Ion Data and Analysis; and 6) Summary.

Krithivasan, Ramkumar↗

Low dose failures of hardened DC-DC power converters

Box-level total dose testing of the FOG (Fiber Optic Gyro) by IXSEA at ESA's GammabeamFacility were abruptly terminated at 8krad (Si) due to catastrophic failure (complete shutdown). This was unexpected because all components within the gyro were supposedly radiation tolerant. Further testing showed that the components responsible for the failure were two DC-DC converters, manufactured by Interpoint, that stopped regulating shortly before shutdown. This paper summarizes diagnostic test results for the converters to determine the underlying cause of the unexpected failure at low levels of radiation.

Interpoint Rad-hard DC-DC power converter TC4426 M↗

SEE and TID extension testing of the Xilinx XQR18V04 4Mbit radiation hardened configuration PROM

The XQR18V04 was evaluated for single event upset rates using proton and heavy ions. The PROM was demonstrated to be immune to latch-up, as well as to static upset in the flash memory cells, to an LET > 125 MeV/mg/cmz (effective). The PROM was also tested in a dynamic mode, which revealed three distinct error modes: Read Bit Errors, Address Errors, and a Single Event Functional Interrupt (SEW which affected the data output drivers. Saturation cross-sections, and onset thresholds, for these errorinodes were measured at the heavy ion facility at Texas A&M University, and the proton facility at UC Davis. Additional testing was performed at UC Davis and the Cobalt 60 source at McClellan Air Force Base to examine the effect to TID life as a function of power biasing. The PROM demonstrated a 100% improvement in total TID life with an 84% percent decrease in device usage.

FPGA Virtex II SEU↗

Method for beam hardening correction in quantitative computed X-ray tomography

Each voxel is assumed to contain exactly two distinct materials, with the volume fraction of each material being iteratively calculated. According to the method, the spectrum of the X-ray beam must be known, and the attenuation spectra of the materials in the object must be known, and be monotonically decreasing with increasing X-ray photon energy. Then, a volume fraction is estimated for the voxel, and the spectrum is iteratively calculated.

Yan, Chye Hwang↗

Exploration Technology Developments Program's Radiation Hardened Electronics for Space Environments (RHESE) Project Overview

Primary Objective: 1) A computational tool to accurately predict electronics performance in the presence of space radiation in support of spacecraft design: a) Total dose; b) Single Event Effects; and c) Mean Time Between Failure. (Developed as successor to CR ME96.) Secondary Objectives: 2) To provide a detailed description of the natural radiation environment in support of radiation health and instrument design: a) In deep space; b) Inside the magnetosphere; and c) Behind shielding.

Keys, Andrew S.↗

Radiation-hardened fast acquisition/weak signal tracking system and method

A global positioning system (GPS) receiver and method of acquiring and tracking GPS signals comprises an antenna adapted to receive GPS signals; an analog radio frequency device operatively connected to the antenna and adapted to convert the GPS signals from an analog format to a digital format; a plurality of GPS signal tracking correlators operatively connected to the analog RF device; a GPS signal acquisition component operatively connected to the analog RF device and the plurality of GPS signal tracking correlators, wherein the GPS signal acquisition component is adapted to calculate a maximum vector on a databit correlation grid; and a microprocessor operatively connected to the plurality of GPS signal tracking correlators and the GPS signal acquisition component, wherein the microprocessor is adapted to compare the maximum vector with a predetermined correlation threshold to allow the GPS signal to be fully acquired and tracked.

Winternitz, Luke↗

Radiation-Hardened Solid-State Drive

A method is provided for a radiationhardened (rad-hard) solid-state drive for space mission memory applications by combining rad-hard and commercial off-the-shelf (COTS) non-volatile memories (NVMs) into a hybrid architecture. The architecture is controlled by a rad-hard ASIC (application specific integrated circuit) or a FPGA (field programmable gate array). Specific error handling and data management protocols are developed for use in a rad-hard environment. The rad-hard memories are smaller in overall memory density, but are used to control and manage radiation-induced errors in the main, and much larger density, non-rad-hard COTS memory devices. Small amounts of rad-hard memory are used as error buffers and temporary caches for radiation-induced errors in the large COTS memories. The rad-hard ASIC/FPGA implements a variety of error-handling protocols to manage these radiation-induced errors. The large COTS memory is triplicated for protection, and CRC-based counters are calculated for sub-areas in each COTS NVM array. These counters are stored in the rad-hard non-volatile memory. Through monitoring, rewriting, regeneration, triplication, and long-term storage, radiation-induced errors in the large NV memory are managed. The rad-hard ASIC/FPGA also interfaces with the external computer buses.

Sheldon, Douglas J.↗

Precipitation Hardenable High Temperature Shape Memory Alloy

A composition of the invention is a high temperature shape memory alloy having high work output, and is made from (Ni+Pt+Y),Ti(100-x) wherein x is present in a total amount of 49-55 atomic % Pt is present in a total amount of 10-30 atomic %, Y is one or more of Au, Pd. and Cu and is present in a total amount of 0 to 10 atomic %. The alloy has a matrix phase wherein the total concentration of Ni, Pt, and the one or more of Pd. Au, and Cu is greater than 50 atomic %.

Noebe, Ronald Dean↗

Process-Hardened, Multi-Analyte Sensor for Characterizing Rocket Plume Constituents

A multi-analyte sensor was developed that enables simultaneous detection of rocket engine combustion-product molecules in a launch-vehicle ground test stand. The sensor was developed using a pin-printing method by incorporating multiple sensor elements on a single chip. It demonstrated accurate and sensitive detection of analytes such as carbon dioxide, carbon monoxide, kerosene, isopropanol, and ethylene from a single measurement. The use of pin-printing technology enables high-volume fabrication of the sensor chip, which will ultimately eliminate the need for individual sensor calibration since many identical sensors are made in one batch. Tests were performed using a single-sensor chip attached to a fiber-optic bundle. The use of a fiber bundle allows placement of the opto-electronic readout device at a place remote from the test stand. The sensors are rugged for operation in harsh environments.

Goswami, Kisholoy↗

CMOS-Compatible SOI MESFETS for Radiation-Hardened DC-to-DC Converters

A radiation-tolerant transistor switch has been developed that can operate between 196 and +150 C for DC-to-DC power conversion applications. A prototype buck regulator component was demonstrated to be performing well after a total ionizing dose of 300 krad(Si). The prototype buck converters showed good efficiencies at ultra-high switching speeds in the range of 1 to 10 MHz. Such high switching frequency will enable smaller, lighter buck converters to be developed as part of the next project. Switching regulators are widely used in commercial applications including portable consumer electronics.

Thornton, Trevor↗