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At least 397 records · Page 22

Field effect transistors used as voltage controlled resistors

Two new methods of incorporating field effect transistors into circuit designs have resulted in linear response of this type transistor over a wide range of controlled voltage levels. This increases its usefulness as a voltage-controlled resistor.

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Boron nitride housing cools transistors

Boron nitride ceramic heat sink cools transistors in r-f transmitter and receiver circuits. Heat dissipated by the transistor is conducted by the boron nitride housing to the metal chassis on which it is mounted.

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Insulator-holder protects transistors in dense electronic assemblies

Molded insulating spacer with one or more cavities is used as an insulated holder for mounting metal-case transistors in a chassis containing densely packed electronic components. The transistors are mechanically supported on their bases and electrically isolated from each other by the holder.

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Jig protects transistors from heat while tinning leads

In tinning transistor leads, an aluminum jig is used to dip the leads into the molten tin. The jigs mass shunts excess heat given off by the molten tin before it reaches and damages the transistor body.

Pelletier, A. J.↗

Substituting transistor for diode improves rectifying means

Unusual transistor connection that substitutes for a silicon diode and allows significantly higher repetition rates without increasing power loss rectifies an alternating current. Operation speed is improved by a factor of 10 or more when a given diode is replaced by this transistor circuit.

Muller, R. M.↗

Field effect transistors improve buffer amplifier

Unity gain buffer amplifier with a Field Effect Transistor /FET/ differential input stage responds much faster than bipolar transistors when operated at low current levels. The circuit uses a dual FET in a unity gain buffer amplifier having extremely high input impedance, low bias current requirements, and wide bandwidth.

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Transistor h parameter conversion slide rule

Slide rule enables the ready conversion of transistor h parameters from one form to another and reduces calculation time by a factor of 5 to 10. The scales are selected to cover all ranges of each parameter that will normally exist for any transistor, and answers are given in the correct order of magnitude, making powers-of-ten calculations unnecessary.

Brantner, R. E.↗

Prediction of radiation damage effects in transistors

Quantative relationships between radiation dosage to transistors and resultant damage are established. Calculation of these dose levels is based on high energy particle population data and analysis of the shielding effect provided by the enclosures surrounding a given transistor.

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Transistor bonding pad configuration for uniform injection and low inductance

Modification of process for fabricating transistors, which comprises a metallization-pattern design for emitter and base areas together with a double bonding configuration for each emitter and base-bonding lead, improves uniformity of carrier injection in transistors and of reducing lead inductances at base-emitter terminals.

Jacobson, D. S.↗