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Report describes experiments that used reflection high-energy-electron diffraction (RHEED) to investigate behavior of GaAs surfaces during and after growth by molecular-beam epitaxy (MBE). Experimental results show dynamic RHEED measurements useful both as probes of surface and growth kinetics and as methods for determining and reproducing surface and growth conditions.
Formal asymptotic expansions with differently scaled variables are matched to obtain a uniform approximation to the similarity solution of the shock-wedge diffraction problem.
A study of monomers and dimers of the four alkali chlorides NaCl, KCl, RbCl, and CsCl in the vapor phase using the counting method of high energy electron diffraction is reported. Nozzle temperatures from 850-960 K were required to achieve the necessary vapor pressures of approximately 0.01 torr. Using harmonic calculations for the monomer and dimer 1 values, a consistent set of structures for all four molecules was obained. The corrected monomer distances reproduce the microwave values very well. The experiment yields information on the amount of dimer present in the vapor, and these results are compared with thermodynamic values.
Effects of diffraction on the performance of electronic heterodyne readout of moire fringes are investigated. The sensitivity, accuracy, and resolution of the system are calculated, and it is shown that these features are significantly improved compared with the conventional intensity moire readout technique. The sensitivity of the system can be tripled without changing the distance between gratings. The system was evaluated experimentally by measuring the refractive-index derivatives of a weak phase object consisting of a large KD(asterisk)P crystal. Effects of nonlinear fringe modulation were studied both theoretically and experimentally. It is shown that in this case the electronic phase is not linearly related to the fringe shift, and calibration of the system is necessary.
Multilayer W-C diffraction gratings with nominal d spacings of 35 A have been fabricated by magnetron sputter deposition. The peak and integrated reflectivities of these films have been measured with Al K-alpha X-rays and compared to theoretical values. The rms surface roughness has been evaluated. The influence of several sputtering-system process parameters on the reflectivities has been investigated.
The beta-SiC(100) surface has been studied by low energy electron diffraction, Auger electron spectroscopy, high resolution electron energy loss spectra (HREELS), and core level excitation EELS. Two new Si-terminated phases have been discovered, one with (3 x 2) symmetry, and the other with (2 x 1) symmetry. Models are presented to describe these phases. New results, for the C-rich surface, are presented and discussed. In addition, core level excitation EELS results are given and compared with theory.
The performance of ten laser diffraction particle sizing instruments (Malvern models 2200 and 2600) has been evaluated using a synthetic particle size reference standard in a round-robin test at nine independent laboratories. A calibration reticle consisting of a two-dimensional array of opaque, circular particle images photoetched in chrome thin film deposited on a glass substrate was used as the reference. Mean diameters (e.g., D32) for the reticle measured by the ten unmodified instruments varied by 27 percent. In contrast, data from six instruments with individually calibrated photodetector correction factors demonstrated much better agreement and were within 2.6 percent of the actual reticle properties.
An IR imaging system that achieves diffraction-limited spatial resolution (about 0.8 arcsec) at 10 microns on 3-meter ground-based telescopes. The system uses a linear array of sensitive HgCdTe photodiodes, scanned in the direction perpendicular to the array axis, to form two-dimensional images. Scans are completed rapidly enough to freeze atmospheric fluctuations. Individual detectors are small compared to the diameter of the Airy disk, and images are oversampled heavily in the scan direction. This method has a number of advantages for studying small fields with very high spatial resolution, and has been applied successfully to the problem of directly imaging faint circumstellar dust shells.
Stable, narrow far field produced. Array of lasers fabricated on single chip. Individual laser waveguides isolated from each other except in end portions, where diffraction coupling takes place. Radiation pattern far from laser array has single, sharp central lobe when all lasers operate in phase with each other. Shape of lobe does not vary appreciably with array current. Applications include recording, printing, and range finding.
In electron diffraction patterns of nickel-rich beta-NiAl alloys, many anomalies are observed. One of these is the appearance of diffuse intensity maxima between the reflexions of the B2 structure. This is explained by the short-range ordering of the excess nickel atoms on the simple cubic sublattice occupied only by aluminum atoms in the stoichiometric, perfectly ordered NiAl alloy. After annealing Ni 37.5 atomic percent Al and Ni 37.75 atomic percent Al for 1 week at 300 and 400 C, the diffuse intensity maxima transformed into sharp superstructure reflexions. These reflexions are explained by the formation of the four possible variants of an ordered hexagonal superstructure corresponding to the Ni2Al composition. This structure is closely related to the Ni2Al3 structure (same space group) formed by the ordering of vacancies on the nickel sublattice in aluminum-rich beta-NiAl alloys.
Information of special interest to crystal growers and device physicists now available from monochromatic synchrotron diffraction imaging (topography) is reviewed. Illustrations are taken from a variety of electro-optic crystals. Aspects of the detailed understanding of crystal growth processes obtainable from carefully selected samples are described. Finally, new experimental opportunities now available for exploitation are indicated.
Structural information of special interest to crystal growers and device physicists is now available from high resolution monochromatic synchrotron diffraction imaging (topography). In the review, the importance of superior resolution in momentum transfer and in space is described, and illustrations are taken from a variety of crystals: gallium arsenide, cadmium telluride, mercuric iodide, bismuth silicon oxide, and lithium niobate. The identification and understanding of local variations in crystal growth processes are shown. Finally, new experimental opportunities now available for exploitation are indicated.
Synchrotron radiation sources are now available throughout the world. The use of hard X-ray radiation from these sources for materials science is described with emphasis on diffraction imaging for material characterization. With the availability of synchrotron radiation, real-time in situ measurements of dynamic microstructural phenomena have been started. This is a new area where traditional application of X-rays has been superseded. Examples are chosen from limited areas and are by no means exhaustive. The new emerging information will, no doubt, have great impact on materials science and engineering.
The backscatter cross-sections of dihedral corner reflectors in the azimuthal plane are presently determined by both physical optics (PO) and the physical theory of diffraction (PTD), yielding results for the vertical and horizontal polarizations. In the first analysis method used, geometrical optics is used in place of PO at initial reflections in order to maintain the planar character of the reflected wave and reduce the complexity of the analysis. In the second method, PO is used at almost every reflection in order to maximize the accuracy of the PTD solution at the expense of a rapid increase in complexity. Induced surface current densities and resulting cross section patterns are illustrated for the two methods.
The crystal structure and equation of state of solid hydrogen have been determined directly to 26.5 gigapascals at room temperature by new synchrotron X-ray diffraction techniques. Solid hydrogen remains in the hexagonal close packed structure under these pressure-temperature conditions and exhibits increasing structural anisotropy with pressure. The pressure-volume curve determined from the X-ray data represents the most accurate experimental measurement of the equation of state to date in this pressure range. The results remove the discrepancy between earlier indirect determinations and provide a new experimental constraint on the molecular-to-atomic transition predicted at higher pressures.
It is shown that the X-ray diffraction patterns from the Hendricks-Teller model for layered systems and the icosahedral glass models for the icosahedral phases show large fluctuations between nearby scattering wave vectors and from sample to sample, that are quite analogous to laser speckle. The statistics of these fluctuations are studied analytically for the first model and via computer simulations for the second. The observability of these effects is discussed briefly.
The propagation of sound over uneven terrain and irregular topography is considered. Laboratory scale experiments were conducted on a 4.88 x 2.44 m plywood bench top with a cylindrical ridge whose radius of curvature is about 2.5 m. Experimental results include the insertion loss on the diffracting surface, and in the penumbra region, at several distances from the apex of the ridge.
A high-resolution alignment technique which utilizes the partial polarization property of fine period transmission gratings has been developed. It is especially useful when the grating period is sufficiently small so that there are no visible diffracted orders. This technique uses a photoelastic modulator (PEM) to produce an intensity signal that is proportional to the sine of twice the angle between the grating lines and the PEM crystal axis. The experimentally demonstrated resolution of this technique on 200-nm period gold transmission gratings is better than 1 arc sec. This technique was developed to align X-ray transmission gratings for spectroscopy and interferometry applications.