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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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377 records · Page 21
All sourcesNASA NTRSDOE OSTI
NASA NTRS1993

Characterization of Si (sub X)Ge (sub 1-x)/Si Heterostructures for Device Applications Using Spectroscopic Ellipsometry

Spectroscopic ellipsometry (SE) characterization of several complex Si (sub X)Ge (sub 1-x)/Si heterostructures prepared for device fabrication, including structures for heterojunction bipolar transistors (HBT), p-type and n-type heterostructure modulation doped field effect transistors, has been performed. We have shown that SE can simultaneously determine all active layer thicknesses, Si (sub X)Ge (sub 1-x) compositions, and the oxide overlayer thickness, with only a general knowledge of the structure topology needed a priori. The characterization of HBT material included the SE analysis of a Si (sub X)Ge (sub 1-x) layer deeply buried (600 nanometers) under the silicon emitter and cap layers. In the SE analysis of n-type heterostructures, we examined for the first time a silicon layer under tensile strain. We found that an excellent fit can be obtained using optical constants of unstrained silicon to represent the strained silicon conduction layer. We also used SE to measure lateral sample homogeneity, providing quantitative identification of the inhomogeneous layer. Surface overlayers resulting from prior sample processing were also detected and measured quantitatively. These results should allow SE to be used extensively as a non-destructive means of characterizing Si (sub X)Ge (sub 1-x)/Si heterostructures prior to device fabrication and testing.

Sieg, R. M.↗
NASA NTRS2016

Filled Nd(sub z) Fe(sub x) Co(sub 4-x) Sb(sub 12-y) Ge(sub y) Skutterudites: Processing and Thermoelectric Properties

Skutterudites have proven to be a useful thermoelectric system as a result of their enhanced figure of merit (ZT1), cheap material cost, favorable mechanical properties, and good thermal stability. The majority of skutterudite interest in recent years has been focused on binary skutterudites like CoSb3. Binary skutterudites are often double and triple filled, with a range of elements from the lanthanide series, in order to reduce the lattice component of thermal conductivity. Ternary and quaternary skutterudites, such as Co4Ge6Se6 or Ni4Sb8Sn4, provide additional paths to tune the electronic structure. The thermal conductivity can further be improved in these complex skutterudites by the introduction of fillers. The Nd (sub z) Fe (sub x) Co (sub 4-x) Sb (sub 12-y)Ge (sub y) system has been investigated as a p-type thermoelectric material, and is stable up to 600 degrees Centigrade. The influence of Fe and Ge content, along with filler Nd, was investigated on thermoelectric transport properties. In addition to the chemical influence on properties, some processing details of the system will also be addressed.

Electical Conductivity↗
NASA NTRS2016

Filled Nd(z)Fe(x)Co(4-x)Sb(12-y)Ge(y) Skutterudites: Processing and Thermoelectric Properties

Skutterudites have proven to be a useful thermoelectric system as a result of their enhanced figure of merit (ZT1), cheap material cost, favorable mechanical properties, and good thermal stability. The majority of skutterudite interest in recent years has been focused on binary skutterudites like CoSb3. Binary skutterudites are often double and triple filled, with a range of elements from the lanthanide series, in order to reduce the lattice component of thermal conductivity. Ternary and quaternary skutterudites, such as Co4Ge6Se6 or Ni4Sb8Sn4, provide additional paths to tune the electronic structure. The thermal conductivity can further be improved in these complex skutterudites by the introduction of fillers. The Nd(z)Fe(x)Co(4-x)Sb(12-y)Ge(y) system has been investigated as a p-type thermoelectric material, and is stable up to 600 C. The influence of Fe and Ge content, along with filler Nd, was investigated on thermoelectric transport properties. In addition to the chemical influence on properties, some processing details of the system will also be addressed.

Thermoelectric↗
NASA NTRS2017

Recent Radiation Test Results for Trench Power MOSFETs

Single-event effect (SEE) radiation test results are presented for various trench-gate power MOSFETs. The heavy-ion response of the first (and only) radiation-hardened trench-gate power MOSFET is evaluated: the manufacturer SEE response curve is verified and importantly, no localized dosing effects are measured, distinguishing it from other, non-hardened trench-gate power MOSFETs. Evaluations are made of n-type commercial and both n- and p-type automotive grade trench-gate device using ions comparable to of those on the low linear energy transfer (LET) side of the iron knee of the galactic cosmic ray spectrum, to explore suitability of these parts for missions with higher risk tolerance and shorter duration, such as CubeSats. Part-to-part variability of SEE threshold suggests testing with larger sample sizes and applying more aggressive derating to avoid on-orbit failures. The n-type devices yielded expected localized dosing effects including when irradiated in an unbiased (0-V) configuration, adding to the challenge of inserting these parts into space flight missions.

Schottky Diodes↗
NASA NTRS2017

Unipolar Barrier Dual-Band Infrared Detectors

Dual-band barrier infrared detectors having structures configured to reduce spectral crosstalk between spectral bands and/or enhance quantum efficiency, and methods of their manufacture are provided. In particular, dual-band device structures are provided for constructing high-performance barrier infrared detectors having reduced crosstalk and/or enhance quantum efficiency using novel multi-segmented absorber regions. The novel absorber regions may comprise both p-type and n-type absorber sections. Utilizing such multi-segmented absorbers it is possible to construct any suitable barrier infrared detector having reduced crosstalk, including npBPN, nBPN, pBPN, npBN, npBP, pBN and nBP structures. The pBPN and pBN detector structures have high quantum efficiency and suppresses dark current, but has a smaller etch depth than conventional detectors and does not require a thick bottom contact layer.

Ting, David Z.↗
NASA NTRS2019

Simultaneous Ohmic Contact to Silicon Carbide

A simultaneous ohmic contact to silicon carbide includes a mixture of platinum, titanium, and silicon compounds deposited on a silicon carbide substrate. The silicon carbide substrate includes an n-type surface and a p-type surface.

Okojie, Robert S.↗
NASA NTRS2019

Sublimation Protection Coatings for Thermoelectric Materials for Space Power Applications

The compounds such as Yb14MnSb11 are relatively new p-type thermoelectric materials, respectively. NASA's interest in these material are to replace the state-of-the-art Si-Ge legs of the current radioisotope thermoelectric generators (RTGs). Ideally, the hot end of this leg would operate at 1000 degrees C in the vacuum of space. These materials, however, suffer from a high sublimation rate at elevated temperatures and would require a coating in order to survive the required RTG lifetime of 14 years. The purpose of present work is to develop sublimation protection coatings for Yb14MnSb11 at temperatures up to 1000 degrees C. Coatings for Yb14MnSb11 present many challenges. The coating must not significantly react or interdiffuse with the substrate thereby degrading the substrate or consuming the coating, must remain intact and not crack or spall during thermal cycling prior to launch, and must be a good insulator both electrically and thermally so as not to provide a short circuit for either electron flow or heat through the coating rather than through the leg. Based on these requirements, several oxides have been selected as possible coating candidates. This paper discusses the development of slurry processes to deposit these oxides coatings on thermoelectric materials.

Sublimation↗
NASA NTRS2019

The Random Transiter – EPIC 249706694/HD 139139

We have identified a star, EPIC 249706694 (HD 139139), that was observed during K2 Campaign 15 with the Kepler extended mission that appears to exhibit 28 transit-like events over the course of the 87-day observation. The unusual aspect of these dips, all but two of which have depths of 200 ± 80 ppm, is that they exhibit no periodicity, and their arrival times could just as well have been produced by a random number generator. We show that no more than four of the events can be part of a periodic sequence. We have done a number of data quality tests to ascertain that these dips are of astrophysical origin, and while we cannot be absolutely certain that this is so, they have all the hallmarks of astrophysical variability on one of two possible host stars (a likely bound pair) in the photometric aperture. We explore a number of ideas for the origin of these dips, including actual planet transits due to multiple or dust emitting planets, anomalously large TTVs, S- and P-type transits in binary systems, a collection of dust-emitting asteroids, ‘dipper-star’ activity, and short-lived starspots. All transit scenarios that we have been able to conjure up appear to fail, while the intrinsic stellar variability hypothesis would be novel and untested.

S. Rappaport↗
NASA NTRS2020

Microwave Power Detection With Voltage-Gated Graphene

Commercially available, chemical vapor deposition grown, graphene has been used to realizevoltage-gate tunable, microwave power detectors. Corbino disc structures with chrome/gold contacts havebeen fabricated on top of graphene deposited on P-type silicon substrates with silicon dioxide gate oxides.Devices of varying sizes were used to detect a 433.92 MHz signal. These test structures exhibited a peak power detection sensitivity of 3.25 mV/mW at 292 K and 5.43 mV/mW at 80 K. The improved graphene detectors exceed the sensitivity of previously reported graphene detectors, 0.86 mV/mW, as well as previously explored carbon nanotube bolometers, 0.36 mV/mW

Michael R. Gasper↗
NASA NTRS2022

InAs/InAsSb Type-II Stained Layer Superlattice Infrared Detectors and Focal Plane Arrays

We explore long wavelength InAs/InAsSb superlattice complementary barrier infrared detectors that contain p-type absorber layers for quantum efficiency enhancement. We also discuss type-II superlattice infrared detector technology for NASA Earth Science applications, including LWIR FPAs for land imaging, and MWIR FPAs for CubeSat hyperspectral imaging.

Pagano, Thomas S.↗
NASA NTRS2022

Progress in InAs/InAsSb Superlattice Barrier Infrared Detectors

The InAs/InAsSb (Gallium-free) type-II strained-layer superlattice (T2SLS) has emerged in recent years as a viable infrared detector material. In particular, mid-wavelength InAs/InAsSb T2SLS focal plane array (FPA) based on the nBn detector architecture exhibits good operating characteristics at 160 K, demonstrating a considerably operating temperature advantage over InSb FPAs. In the long and very long cutoff wavelengths, InAs/InAsSb T2SLS detectors with n-type absorbers are limited in their attainable quantum efficiency (QE) due to shorter hole diffusion lengths and relatively modest absorption coefficients. We have explored long and very long wavelength InAs/InAsSb T2SLS complementary barrier infrared detectors (CBIRDs) that contain p-type absorber layers in order to take advantage of the longer electron diffusion length for QE enhancement. We also discuss recent development of the InAs/InAsSb T2SLS infrared detectors at the Jet Propulsion Laboratory for NASA Earth Science applications, including long-wavelength infrared FPAs for land imaging, and mid-wavelength infrared FPAs for CubeSat hyperspectral imaging.

Pagano, Thomas S.↗
NASA NTRS1997

Skutterudites: An Update

Explore the source record for details and available documents.

skutterudite crystal structure ZT values p-type co↗
NASA NTRS1998

Some Properties of Re(sub 2)Te(sub 5) based Materials

One of the new approaches for developing thermoelectric materials with superior figures of merit is to look at materials which can be referred to as 'rattling' semiconductors.

coefficient values thermal conductivity electrical↗