Low level commutation using mos fet transistors
Metal oxide silicon field effect transistors /MOS FET/ as switching elements for low level commutator
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Metal oxide silicon field effect transistors /MOS FET/ as switching elements for low level commutator
Causes of instability, high threshold voltage, and gamma radiation sensitivity of metal-oxide silicon transistors
Simultaneous fabrication of enhancement mode metal oxide semiconductor transistors in epitaxial material
Instability, high threshold voltage and gamma radiation sensitivity of metal-oxide-silicon transistors
Cobalt 60 gamma radiation effects on Metal Oxide Semiconductors /MOS/ with p-type and n-type silicon substrates
Surface state density variations on metal oxide semiconductor capacitors due to gamma radiation
Metal-oxide-silicon capacitor and radiochemical analyses of anion in sodium contamination failure mode
Magnetic memory circuitry using metal oxide semiconductor field effect transistors interfaced with plated wire memory
Nonlinear model of field effect transistor for computer aided transient analysis of complementary metal oxide semiconductor-field effect transistor NAND gate
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Metal oxide semiconductor field effect transistor circuit development and laminated electronic packaging for computer storage devices
Positive ion current emission by tungsten and molybdenum studied for influence of impurities on MOSFET transistors
Physical sputtering deposition of molybdenum disulfide films as solid lubricant on rotating and sliding components, discussing lubrication properties in vacuum
MOSFET drivers for low current memory fabricated in 64 unit monolithic strips, discussing driver performance data
Oxide impurity effects causing potential shifts in Si covered by thick oxide layer studied with metal-oxide-Si electrical measurement and radiochemical analysis
Physical sputtering deposition of molybdenum disulfide films as solid lubricant on rotating and sliding components, discussing lubrication properties in vacuum
Metal oxide semiconductor integrated circuits, showing failure rates and degradation causes
Several cycles of photoetching, dopant deposition, and drive-in produce selectively-doped regions and semiconductor junctions within a single chip.