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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 361 records · Page 20
All sourcesNASA NTRSDOE OSTI
NASA NTRS2019

Radiation specification and testing of heterogenous microprocessor SOCs

Modern commercial microprocessor devices include multiple processor architectures, buses, basic peripherals, and application hardware such as Graphics Processing Units (GPUs) and Digital Signal Processors (DSPs) in one device. Developing RHBD versions of similar devices risks sacrificing processing performance for system-wide radiation requirements. The heterogenous structure of modern commercial system on a chip (SOC) devices, in design and performance goals for subsystems, suggests a similar approach to specifying Radiation Hardened by Design (RHBD) requirements.

Ballast, Jon↗
NASA NTRS1985

Thermal fatigue tests of a radiative heat shield panel for a hypersonic transport

A pair of corrugation stiffened, beaded skin Rene 41 heat shield panels were exposed to 20,000 thermal cycles between room temperature and 1450 F to evaluate the thermal fatigue response of Rene 41 metallic heat shields for hypersonic cruise aircraft applications. At the conclusion of the tests, the panels retained substantial structural integrity; however, there were cracks and excessive wear in the vicinity of fastener holes and there was an 80-percent loss in ductility of the skin. Shrinkage of the panel which caused the cracks and wear must be considered in design of panels for Thermal Protection Systems (TPS) applications.

Webb, Granville L.↗
NASA NTRS1996

Testing Thermophotovoltaic Cells With Black-Body Radiation

Method of testing thermophotovoltaic (TPV) cells involves maintaining cells at various temperatures while exposing cells to black-body radiation at various intensities from black-body sources at various other temperatures. Provides for simulation and evaluation of performance under variety of operating conditions and could become standard testing method for government and industry.

Lin, James J.↗
NASA NTRS1987

One-Dimensional Simulation of Isotropic Radiation

Solar cells tested for effects of radiation in unidirectional beam. Cam groove imparts cosecant-function velocity to solar cells on rotating target plate. Cells on stationary plate above rotating one absorb steady perpendicular radiation from test source.

Anspaugh, B. E.↗
NASA NTRS1992

Development of IR radiation simulator for spacecraft thermal testing

The aim was to simulate, in a ground test, the solar radiation environment to which the Ofeq satellite would be exposed in orbit. The solar simulator usually used is very expensive, as are its operation and maintenance, therefore an infrared (IR) simulator was used; its development involved the creation of uniform IR fluxes onto the irregular geometry of a spacecraft. The tests were carried out on a thermal model of the satellite and the model was verified in a solar simulator test at a European space center. Heat flux mapping software was developed to plan the positioning of the heating elements which generated the IR fluxes and a system was built for heat flux and temperature monitoring and control. A special heat flux sensor was developed to measure the energy absorbed by the satellite surfaces; its calibration had to be independent of wavelength, so that the measurements obtained at IR wavelengths would be equivalent to the actual solar radiation effects. The results of the verification experiment are presented; their conformity with predicted values indicates that the technique developed is a suitable tool for satellite design verification.

Shimrony, Yoram↗
NASA NTRS2006

Low Temperature (30 K) TID Test Results of a Radiation Hardened 128 Channel Serial-to-Parallel Converter

This viewgraph presentation reviews the low temperature, Total Ionizing Dose (TID) tests of radiation hardened serial to parallel converter to be used on the James Webb Space Telescope. The test results show that the original HV583 level shifter - a COTS part -was not suitable for JWST because the supply currents exceeded specs after 20 krad( Si) .The HV584 - functionally similar to the HV583 -was designed using RHBD approach that reduced the leakage currents to within acceptable levels and had only a small effect on the level-shifted output voltage.

Meyer, Stephen↗
NASA NTRS1981

Solar cell development for the power extension package

The PEP is a 32 kilowatt flexible substrate, retrievable, solar array system for use on the Space Shuttle. Solar cell costs will be reduced by increasing cell area and simplifying cell and coverglass fabrication processes and specifications. The cost goal is to produce cells below $30 per watt. Two and ten ohm-cm silicon cells were investigated. In phase I of the cell development program a few thousand candidate cells will be produced and evaluated for utility and quality. In phase II a large number of cells will be fabricated to verify production readiness and cell yields and costs. This schedule is compatible with PEP initial operational capability in 1984. Approximately 140,000 large area (5.9 x 5.9 cm) cells will be required for two PEP solar arrays. The status of the cell development and testing, including a radiation damage test and side-by-side comparison of candidate cell types with pre- and post-irradiation airplane calibration of outer space short-circuit current, is reported.

Baraona, C. R.↗
NASA NTRS1992

Small Explorer Data System MIL-STD-1773 fiber optic bus

The MIL-STD-1773 Fiber Optic Data Bus as implemented in the GSFC Small Explorer Data System (SEDS) for the Small Explorer Program is described. It provides an overview of the SEDS MIL-STD-1773 bus components system design considerations, reliability figures, acceptance and qualification testing requirements, radiation requirements and tests, error handling considerations, and component heritage. The first mission using the bus will be launched in June of 1992.

Flanegan, Mark↗
NASA NTRS1919

General Discussion of Test Methods for Radiators

Report describes the methods and apparatus developed and used in the extensive experimental research into the problems involved in the dissipation of heat by means of the airplane radiator.

Dickinson, H C↗
NASA NTRS2001

Low Temperature Testing of a Radiation Hardened CMOS 8-Bit Flash Analog-to-Digital (A/D) Converter

Power processing electronic systems, data acquiring probes, and signal conditioning circuits are required to operate reliably under harsh environments in many of NASA:s missions. The environment of the space mission as well as the operational requirements of some of the electronic systems, such as infrared-based satellite or telescopic observation stations where cryogenics are involved, dictate the utilization of electronics that can operate efficiently and reliably at low temperatures. In this work, radiation-hard CMOS 8-bit flash A/D converters were characterized in terms of voltage conversion and offset in the temperature range of +25 to -190 C. Static and dynamic supply currents, ladder resistance, and gain and offset errors were also obtained in the temperature range of +125 to -190 C. The effect of thermal cycling on these properties for a total of ten cycles between +80 and - 150 C was also determined. The experimental procedure along with the data obtained are reported and discussed in this paper.

Gerber, Scott S.↗
NASA NTRS2015

Complex Parts, Complex Data: Why You Need to Understand What Radiation Single Event Testing Data Does and Doesn't Show and the Implications Thereof

Electronic parts (integrated circuits) have grown in complexity such that determining all failure modes and risks from single particle event testing is impossible. In this presentation, the authors will present why this is so and provide some realism on what this means. Its all about understanding actual risks and not making assumptions.

NASA Electronic Parts and Packaging (NEPP) Program↗
NASA NTRS2006

Guidelines for Design and Test of a Built-In Self Test (BIST) Circuit For Space Radiation Studies of High-Speed IC Technologies

Serial Bit Error Rate Testing under radiation to characterize single particle induced errors in high-speed IC technologies generally involves specialized test equipment common to the telecommunications industry. As bit rates increase, testing is complicated by the rapidly increasing cost of equipment able to test at-speed. Furthermore as rates extend into the tens of billions of bits per second test equipment ceases to be broadband, a distinct disadvantage for exploring SEE mechanisms in the target technologies. In this presentation the authors detail the testing accomplished in the CREST project and apply the knowledge gained to establish a set of guidelines suitable for designing arbitrarily high speed radiation effects tests.

Carts, M. A.↗
NASA NTRS1994

Radiation-Protected Protocols For Self-Testing Of Microcircuits

Ionizing radiation need not trigger unintended self-testing. Protocols installed in certain microcircuits permitting functional self-testing do not consider possibility of inadvertent triggering by protons or energetic heavy ions in space or satellite orbit. Recommended devices be rendered immune to so-called single event effects of energetic ions in cosmic rays, flares, or trapped-charge belts surrounding Earth and some other planets. Proposed pair of stimuli be applied to device in specified manner to start self-test. Protocol can require two or more stimuli at single node, or pair of stimuli at two nodes, or some more complicated combination.

Nichols, Donald K.↗