New method for level-lifetime measurements with thick scintillators
Level lifetimes provide key insight into the structure of atomic nuclei and serve as stringent tests of theoretical descriptions. Though several methods for determining level lifetimes exist for both reaction measurements and decay studies, here the focus is on techniques involving the direct measurement of time differences between population and subsequent depopulation of excited states. The techniques presented herein are broadly applicable across multiple timing ranges, but the approach is specifically described for the βγ timing method. A multi-step, amplitude-dependent time walk correction was employed to address the data analysis complications that arise from using thick scintillators for electron detection. Further, additional corrections for the depth of the interaction must also be performed when the parent isotope has been implanted into the detector. Techniques are presented for performing these time walk and depth of interaction corrections. Subsequently, a new Monte Carlo method utilizing measured detector responses obtained from the data, coupled with chi-square minimization, is presented for extracting excited state lifetimes ≳ 100 picoseconds. The framework of this Monte Carlo method is developed for the decay of a state in 68 Zn with a known 1.6 ps half life, which is considered prompt given the detection sensitivity of the technique, and then benchmarked using two other excited states in neutron-rich Ni isotopes with 120(34) ps and 1.05(3) ns half lives. Using this new method which takes into account the thick scintillator used, these same half lives were measured to be 135(10) ps and 1.04(24) ns, respectively. The overall good agreement demonstrates the validity of the technique.