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NASA NTRS2009

Grating angle magnification enhanced angular sensor and scanner

An angular magnification effect of diffraction is exploited to provide improved sensing and scanning. This effect is most pronounced for a normal or near-normal incidence angle in combination with a grazing diffraction angle, so such configurations are preferred. Angular sensitivity can be further enhanced because the width of the diffracted beam can be substantially less than the width of the incident beam. Normal incidence configurations with two symmetric diffracted beams are preferred, since rotation and vertical displacement can be readily distinguished. Increased sensitivity to vertical displacement can be provided by incorporating an interferometer into the measurement system. Quad cell detectors can be employed to provide sensitivity to rotation about the grating surface normal. A 2-D grating can be employed to provide sensitivity to angular displacements in two different planes (e.g., pitch and yaw). Combined systems can provide sensitivity to vertical displacement and to all three angular degrees of freedom.

Sun, Ke-Xun↗

NASA NTRS1992

Normal incidence spectrophotometer using high density transmission grating technology and highly efficiency silicon photodiodes for absolute solar EUV irradiance measurements

New developments in transmission grating and photodiode technology now make it possible to realize spectrometers in the extreme ultraviolet (EUV) spectral region (wavelengths less than 1000 A) which are expected to be virtually constant in their diffraction and detector properties. Time dependent effects associated with reflection gratings are eliminated through the use of free standing transmission gratings. These gratings together with recently developed and highly stable EUV photodiodes have been utilized to construct a highly stable normal incidence spectrophotometer to monitor the variability and absolute intensity of the solar 304 A line. Owing to its low weight and compactness, such a spectrometer will be a valuable tool for providing absolute solar irradiance throughout the EUV. This novel instrument will also be useful for cross-calibrating other EUV flight instruments and will be flown on a series of Hitchhiker Shuttle Flights and on SOHO. A preliminary version of this instrument has been fabricated and characterized, and the results are described.

Ogawa, H. S.↗

NASA NTRS1995

ZnO films on /001/-cut (110)-propagating GaAs substrates for surface acoustic wave device applications

A potential application for piezoelectric films substrates is the monolithic integration of surface acoustic wave (SAW) devices with GaAs electronics. Knowledge of the SAW properties of the layered structure is critical for the optimum and accurate design of such devices. The acoustic properties of ZnO films sputtered on /001/-cut group of (110) zone axes-propagating GaAs substrates are investigated in this article, including SAW velocity, effective piezoelectric coupling constant, propagation loss, diffraction, velocity surface, and reflectivity of shorted and open metallic gratings. The measurements of these essential SAW properties for the frequency range between 180 and 360 MHz have been performed using a knife-edge laser probe for film thicknesses over the range of 1.6-4 micron and with films of different grain sizes. The high quality of dc triode sputtered films was observed as evidenced by high K(sup 2) and low attenuation. The measurements of the velocity surface, which directly affects the SAW diffraction, on the bare and metalized ZnO on SiO2 or Si3N4 on /001/-cut GaAs samples are reported using two different techniques: (1) knife-edge laser probe, (2) line-focus-beam scanning acoustic microscope. It was found that near the group of (110) zone axes propagation direction, the focusing SAW property of the bare GaAs changes into a nonfocusing one for the layered structure, but a reversed phenomenon exists near the (100) direction. Furthermore, to some extent the diffraction of the substrate can be controlled with the film thickness. The reflectivity of shorted and open gratings are also analyzed and measured. Zero reflectivity is observed for a shorted grating. There is good agreement between the measured data and theoretical values.

Hickernell, Frederick S.↗

NASA NTRS1995

ZnO Films on {001}-Cut <110>-Propagating GaAs Substrates for Surface Acoustic Wave Device Applications

A potential application for piezoelectric films on GaAs substrates is the monolithic integration of surface acoustic wave (SAW) devices with GaAs electronics. Knowledge of the SAW properties of the layered structure is critical for the optimum and accurate design of such devices. The acoustic properties of ZnO films sputtered on {001}-cut <110> -propagating GaAs substrates are investigated in this article, including SAW Velocity effective piezoelectric coupling constant, propagation loss. diffraction, velocity surface, and reflectivity of shorted and open metallic gratings. The measurements of these essential SAW properties for the frequency range between 180 and 360 MHz have been performed using a knife-edge laser probe for film thicknesses over the range of 1.6-4 micron and with films or different grain sizes. The high quality of dc triode sputtered films was observed as evidenced by high K(exp 2) and low attenuation. The measurements of the velocity surface, which directly affects the SAW diffraction, on the bare and metalized ZnO on SiO2, or Si3N4 on {001}-cut GaAs samples are reported using two different techniques: 1) knife-edge laser probe, 2) line-focus-beam scanning acoustic microscope. It was found that near the <110> propagation direction, the focusing SAW property of the bare GaAs changes into a nonfocusing one for the layered structure, but a reversed phenomenon exists near the <100> direction. Furthermore, to some extent the diffraction of the substrate can be controlled with the film thickness. The reflectivity of shorted and open gratings are also analyzed and measured. Zero reflectivity is observed for a shorted grating. There is good agreement between the measured data and theoretical values.

Kim, Yoonkee↗

NASA NTRS1983

High efficiency spectrographs for the EUV and soft X-rays

The use of grazing incidence optics and reflection grating designs is shown to be a method that improves the performance of spectrographs at wavelengths shorter than 1200 A. Emphasis is laid on spectroscopic designs for X ray and EUV astronomy, with sample designs for an objective reflection grating spectrograph (ORGS) and an echelle spectrograph for wavelengths longer than 100 A. Conical diffraction allows operations at grazing incidence in the echelle spectrograph. In ORGS, the extreme distance of X ray objects aids in collimating the source radiation, which encounters conical diffraction within the instrument, proceeds parallel to the optical axis, and arrives at the detector. A series of gratings is used to achieve the effect. A grazing echelle is employed for EUV observations, and offers a resolution of 20,000 over a 300 A bandpass.

Cash, W.↗

NASA NTRS1984

Ion beam deposited silicon carbide on glass optics and replica gratings

The results of an attempt to coat optical flats and replace echelle gratings with ion-deposited SiC are reported. Deposition was performed by bombarding a SiC target with an ion beam angled 45 deg relative to the target. Half the target was covered with stainless steel to furnish a comparison opportunity. After precleaning SiC coatings of 300-2200 A thickness were deposited. The specimens had previously been coated with either Au or Al or were left blank. Reflectance and diffraction data were taken of the finished flats and gratings. The SiC-coated flats performed as well as uncoated flats while the echelles exhibited deteriorating performance with increasing coating thickness. Further studies are indicated on the effect of coating thickness on surface roughness.

Windt, D. L.↗

DOE OSTI2025

Full complex amplitude control of second-harmonic generation via electrically tunable intersubband polaritonic metasurfaces

Nonlinear intersubband polaritonic metasurfaces based on coupling of the intersubband nonlinear optical response of quantum-engineered semiconductor heterostructures and electromagnetic modes of nanoresonators provide efficient frequency mixing with moderate pump intensities. The resonant nonlinear optical response, represented as a complex function, can be modulated via Stark tuning of intersubband transition energies under applied voltages. However, achieving full complex amplitude control (both phase and magnitude) remains challenging. In this work, we present and experimentally validate electrically tunable nonlinear intersubband polaritonic metasurfaces that achieve complete complex amplitude control for second-harmonic generation (SHG). Through a design featuring two in-plane flipped meta-atoms per unit cell, we achieve complete electrical control of both the amplitude and phase of the metasurface second-order nonlinear susceptibility, with a tuning range of 0 to 30 nm V −1 for the magnitude and 0-2π for the phase of the nonlinear optical response. Using these properties, we achieve complete on-off SHG modulation and beam diffraction tuning through electrically controlled amplitude and phase gratings.

Science & Technology - Other Topics↗

NASA NTRS1982

Moire interferometry for thermal expansion of composites

Moire interferometry by reflection is described and demonstrated for the case of a real reference grating of 1200 lines/mm. Extraneous beams can be displaced and stopped by using a wedge-shaped air gap between reference and specimen gratings. Double-order dominance, the use of diffraction sequences for reflection, the isolation of preferred sequences, and the use of two-beam interference are discussed. Experimental accuracy is enhanced significantly by using several data points to establish displacements along a line, and random errors characterized by one standard deviation can be as small as one microstrain. The method is well adapted to thermal environments, coefficients of thermal expansion of selected graphite-epoxy laminates being determined in the temperature range of 297-422 K. Very good precision was achieved for a wide range of thermal expansion coefficients, from approximately zero to 27 microstrains/K.

Bowles, D. E.↗

NASA NTRS1986

A spectrometer to measure the diffuse, astronomical extreme ultraviolet background

The present grazing incidence spectrometer for measuring the diffuse astronomical background between 80 and 650 A uses a wire grid collimator to define a 40-arcmin by 15-deg field of view. After passing through the collimator, radiation impinges on an array of plane reflection gratings. An array of mirrors then focuses the diffracted light through a thin filter onto a microchannel plate detector. The resulting system focuses to a few arcmin and produces spectra with 10 to 20 A resolution. Performance characteristics of the spectrometer are discussed.

Labov, Simon↗

NASA NTRS1993

Order-sorting filter transmittance measured with an array detector

The simultaneous measurement of the spectrally and spatially variant transmittance of a linear variable order-sorting filter in a manner that closely resembles its conditions of actual use is described. The transmittance of a prototype order-sorting filter was measured in the 400- to 880-nm wavelength region by illuminating it with the output beam of a spectrophotometer while the filter was attached to the front of a 30 x 32 pixel silicon array detector. The filter was designed to be used in the output beam of a grating spectrometer to prevent the dispersal of higher diffracted orders onto an array detector. Areas of the filter that were spatially matched to the corresponding detector pixel column had measured peak transmittances of about 90 percent that were uniform to within +/- 1.5 percent along a given column. Transmittances for incident wavelengths shorter than the desired bandpass, corresponding to the order overlap region, were measured in the 0.003 range. Line spread function measurements made with the array detector indicated no significant beam spreading caused by inserting the filter into the beam.

Heaney, James B.↗

NASA NTRS1996

Detector Arrays for an Airborne Infrared Echelle Spectrometer

The design of a long-slit echelle spectrograph covering the 16 - 210 micron range for use on the Stratospheric Observatory for Infrared Astronomy (SOFIA) is under study at NASA-Ames. This wavelength range is selected for its content of important astrophysical spectral lines accessible from an airborne platform, and availability of suitable detectors. Two dimensional arrays will be used to simultaneously provide spectral coverage in the dispersion direction and imaging in the cross-dispersion direction. Major goals are: (1) to reach sensitivities limited primarily by the background from the residual atmosphere and the telescope; (2) to provide imaging not far from the diffraction limit of the 2.5 meter (effective) aperture of the telescope; and (3) to obtain diffraction-limited spectral resolution from the large echelle grating, which means that the resolving power increases with decreasing wavelength. To meet these requirements, three detector types are forseen: a commercially available monolithic Si:Sb IBC array to cover the wavelength range from 16 to 40 microns, a Ge:Sb photoconductor array to cover the range from 40 to 125 microns, and a stressed Ge:Ga photoconductor array covering the range from 125 to 210 microns. The paper discusses details of the studies and plans for the field optics, detectors, and readouts.

Erickson, E. F.↗

NASA NTRS2000

Diffractive Optical Elements for Spectral Imaging

Diffractive optical elements fabricated on flat and non-flat substrates frequently act as dispersive elements in imaging spectrometers. We describe the design and electron-beam fabrication of blazed and computer-generated-hologram gratings for slit and tomographic imaging spectrometers.

diffractive optics gratings spectral imaging imagi↗

NASA NTRS2000

Diffractive Optical Elements for Spectral Imaging

diffractive optics gratings spectral imaging imagi↗

NASA NTRS1989

Efficiency measurements of reflection gratings in the 100-300-A band

Zero-order and first-order efficiencies of plane diffraction grazings over the 100-300-A band have been measured using the NRL beamline facility at the National Synchrotron Light Source. Measurements were taken at grating angles of 5, 10, and 15 deg, and the incident radiation was polarized primarily in the transverse magnetic mode. Four (three laminar, one blazed) of the gratings were ion etched in high quality quartz blanks, overcoated with 200 A of gold. A fifth (blazed) grating was ruled in gold. The line densities are 1000, 2000, and 3600 grooves/mm for those with laminar profiles. Both blazed gratings have a blaze angle of 8 deg and line densities of 3600 grooves/mm. Measured first-order efficiencies up to 15 percent were obtained for the laminar gratings and up to 8 percent was obtained for the ion-etched blazed grating. Much lower efficiencies (not greater than 2 percent) were measured for the ruled grating. A computer program was written to calculate grating efficiencies using a full electromagnetic model. Measured efficiencies of the ion-etched gratings agree well with predicted values, but the measured first-order efficiency of the ruled grating is much lower than predicted.

Meekins, John F.↗

NASA NTRS2016

Arcus: The X-Ray Grating Spectrometer Explorer

Arcus will be proposed to the NASA Explorer program as a free-flying satellite mission that will enable high-resolution soft X-ray spectroscopy (8-50 Angstroms) with unprecedented sensitivity-effective areas of greater than 500 sq cm and spectral resolution greater than 2500. The Arcus key science goals are (1) to determine how baryons cycle in and out of galaxies by measuring the effects of structure formation imprinted upon the hot gas that is predicted to lie in extended halos around galaxies, groups, and clusters, (2) to determine how black holes influence their surroundings by tracing the propagation of out-flowing mass, energy and momentum from the vicinity of the black hole out to large scales and (3) to understand how accretion forms and evolves stars and circumstellar disks by observing hot infalling and outflowing gas in these systems. Arcus relies upon grazing incidence silicon pore X-ray optics with the same 12m focal length (achieved using an extendable optical bench) that will be used for the ESA Athena mission. The focused X-rays from these optics will then be diffracted by high-efficiency off-plane reflection gratings that have already been demonstrated on sub-orbital rocked flights, imaging the results with flight-proven CCD detectors and electronics. The power and telemetry requirements on the spacecraft are modest. The majority of mission operations will not be complex, as most observations will be long (~100 ksec), uninterrupted, and pre-planned, although there will be limited capabilities to observe targets of opportunity, such as tidal disruption events or supernovae with a 3-5 day turnaround. After the end of prime science, we plan to allow guest observations to maximize the science return of Arcus to the community.

Instrumentation↗

DOE OSTI2022

Fabrication of low blaze angle gratings by replication and plasma etch

We suggest a new method of making ultra-low blaze angle gratings for synchrotron application. The method is based on reduction of the blaze angle of a master grating by replication followed by a plasma etch. A master blazed grating with a relatively large blaze angle is fabricated by anisotropic wet etching of a Si single crystal substrate. The surface of the master grating is replicated by a polymer material on top of a quartz substrate by nanoimprinting and then transferred into quartz by a plasma etch. Then a 2nd nanoimprint step is applied to transfer the saw-tooth surface into a resist layer on top of a Si grating substrate. The plasma etch through the patterned resist layer provides transfer of the grooves into the Si substrate and results in reduction of the blaze angle due to the difference in etch rates of the resist and Si. We investigated the impact of the replication process on the groove shape, facet surface roughness, and diffraction efficiency of the fabricated 200 lines/mm low blaze angle grating.

Park, Sooyeon↗

NASA NTRS1978

Aspheric grating for extreme ultraviolet astronomy

A family of plane curves is developed which can diffract incident parallel rays to a point focus. These curves, termed diffractoidal curves, are rotated around an axis to produce surfaces of revolution correspondingly termed diffractoids, whose imaging properties for sources at infinity are studied by ray tracing in a few examples. The paraboloid emerges as a limiting case of the diffractoid. A comparison is made between the stigmatic focusing properties of the diffractoid and the toroidal grating.

Kastner, S. O.↗

NASA NTRS2005

Fabrication of Fiber Optic Grating Apparatus and Method

An apparatus and method for forming a Bragg grating on an optical fiber using a phase mask to diffract a beam of coherent energy and a lens combined with a pair of mirrors to produce two symmetrical virtual point sources of coherent energy in the plane of the optical fiber. The two virtual light sources produce an interference pattern along the optical fiber. In a further embodiment, the period of the pattern and therefore the Bragg wavelength grating applied to the fiber is varied with the position of the optical fiber relative the lens.

Ying Wang↗