SEARCH · Engineering Papers

Results for “triple modular redundancy”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

SourceResearch connectionFrom yearThrough year

Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.

At least 37 records · Page 2

All sources NASA NTRS DOE OSTI

DOE OSTI2024

Soft error-mitigating semiconductor design system and associated methods

A soft error-mitigating semiconductor design system and associated methods that tailor circuit design steps to mitigate corruption of data in storage elements (e.g., flip flops) due to Single Events Effects (SEEs). Required storage elements are automatically mapped to triplicated redundant nodes controlled by a voting element that enforces majority-voting logic for fault-free output (i.e., Triple Modular Redundancy (TMR)). Storage elements are also optimally positioned for placement in keeping with SEE-tolerant spacing constraints. Additionally, clock delay insertion (employing either a single global clock or clock triplication) in the TMR specification may introduce useful skew that protects against glitch propagation through the designed device. The resultant layout generated from the TMR configuration may relax constraints imposed on register transfer level (RTL) engineers to make rad-hard designs, as automation introduces TMR storage registers, memory element spacing, and clock delay/triplication with minimal designer input.

Miryala, Sandeep↗

NASA NTRS2022

Radiation Tolerance and Mitigation for Neuromorphic Processors

Neuromorphic processors are designed to execute Deep Neural Networks (DNNs) at very high speed using only a fraction of the electrical power needed to run a DNN on a traditional CPU or GPU. This unique capability makes Neuromorphic processors a prime candidate for space systems, where advanced computational tasks like image analysis, depth map reconstruction, or rover control need to be executed in a power-starved environment. In contrast to the growing number of applications of Neuromorphic processors in smart phones, the automotive and robotics domain, the space environment is unforgiving because of extreme temperatures and high levels of radiation. Any space system, operating beyond LEO requires computing hardware that is resilient against radiation effects. However, Neuromorphic processors have not yet been designed or tested for their radiation tolerance. In this report, we consider traditional methods of detection of radiation events and mitigation via redundancy and gauge their effectiveness on DNNs. In contrast to traditional flight software, however, neural networks represent a statistical algorithm, which might affect its resilience against radiation events. We will focus on the analysis of the tolerance of DNNs with respect to radiation events and discuss techniques to detect radiation hits using on-chip triple modular redundancy (TMR) on an Intel Loihi neuromorphic processor and to mitigate radiation damage. We describe an architecture for on-chip TMR for the Intel Loihi and present results of initial experiments.

Neural Networks↗

NASA NTRS1975

Modeling transient faults in TMR computer systems

In this paper we report the development of a technique for modeling transient faults in redundant computer systems. Transient faults are characterized by their arrival rate and their duration. Fault detection, transient recovery, and the effect of permanent faults are included. A fault occurrence/recovery status state diagram is drawn to illustrate the operational status of the system while undergoing faults. The state diagram is used to formulate the equations for the mission failure probability. The techniques are then applied to a triple modular redundant computer system.

Merryman, P. M.↗

NASA NTRS2001

Fundamentals of Digital Engineering: Designing for Reliability

The concept of designing for reliability will be introduced along with a brief overview of reliability, redundancy and traditional methods of fault tolerance is presented, as applied to current logic devices. The fundamentals of advanced circuit design and analysis techniques will be the primary focus. The introduction will cover the definitions of key device parameters and how analysis is used to prove circuit correctness. Basic design techniques such as synchronous vs asynchronous design, metastable state resolution time/arbiter design, and finite state machine structure/implementation will be reviewed. Advanced topics will be explored such as skew-tolerant circuit design, the use of triple-modular redundancy and circuit hazards, device transients and preventative circuit design, lock-up states in finite state machines generated by logic synthesizers, device transient characteristics, radiation mitigation techniques. worst-case analysis, the use of timing analyzer and simulators, and others. Case studies and lessons learned from spaceflight designs will be given as examples

Katz, R.↗

DOE OSTI2020

Design of a Time-to-Digital Converter ASIC and a mini-DAQ system for the Phase-2 upgrade of the ATLAS Monitored Drift Tube detector

We present the second prototype of a time-to-digital (TDC) ASIC for the upgrade of the ATLAS Monitored Drift Tube (MDT) detector for High-Luminosity LHC operations. Compared to the first prototype, triple modular redundancy has been implemented for the configuration and flow control logic. Here, the total power consumption is increased by less than 10 mW while achieving the same time resolution and channel uniformity. A mini-DAQ system has been built to verify the front-end electronics chain with the new prototype together with other ASICs and boards in triggered mode. Cosmic ray tests with a small-diameter MDT chamber indicate that the configuration and data transmission of the readout electronics perform well. It is expected that this prototype design will be used in the final production.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗

DOE OSTI2021

In-pixel automatic threshold calibration for the CMS Endcap Timing Layer readout chip

We present the implementation and verification of an in-pixel automatic threshold calibration circuit for the CMS Endcap Timing Layer (ETL) in the High-Luminosity LHC upgrade. The discriminator threshold of the ETL readout chip (ETROC) needs to be calibrated regularly to mitigate the circuit baseline change. Traditional methods need a lot of communication through a slow control system hence are time-consuming. This paper describes an in-pixel automatic scheme with improvements in operating time and usability. In this scheme, a sample-accumulation circuit is used to measure the average discriminator output. A binary successive approximation and linear combination scan are applied to find the equivalent baseline. The actual calibration procedure has been first implemented in FPGA firmware and tested with the ETROC front-end prototype chip (ETROC0). The calibration circuit has been implemented with Triple Modular Redundancy (TMR) and verified with Single Event Effects (SEEs) simulation. A complete calibration process lasts 35 ms with a 40 MHz clock. In the worst case, the dynamic and static power consumption are estimated to be 300 uW and 10.4 uW, respectively. The circuit design, implemented in a 65 CMOS technology, will be integrated into ETROC2, the next iteration of the ETROC with a 16 x16 pixel matrix.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗

DOE OSTI2022

A radiation tolerant clock generator for the CMS endcap timing layer readout chip

Here, we present the test results of a low jitter Phase Locked Loop (PLL) prototype chip for the CMS Endcap Timing Layer readout chip (ETROC). This chip is based on the improved version of a clock synthesis circuit named ljCDR from the Low Power Gigabit Transceiver (lpGBT) project. The ljCDR is tested in its PLL mode. An automatic frequency calibration (AFC) block with the Triple Modular Redundancy (TMR) register is developed for the LC-oscillator calibration. The chip was manufactured in a 65 nm CMOS process with 10 metal layers. The chip has been extensively tested, including Total Ionizing Dose (TID) testing up to 300 Mrad and Single Event Upset (SEU) testing with heavy ions possessing a Linear Energy Transfer (LET) from 1.3 to 62.5 MeV × cm 2 /mg.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗

DOE OSTI2024

First test results of the HGCAL concentrator ASICs: ECON-T and ECON-D

With over 6 million channels, the High Granularity Calorimeter for the CMS HL-LHC upgrade presents a unique data transmission challenge. The ECON ASICs provide a critical stage of on-detector data compression and selection for the trigger path (ECON-T) and data acquisition path (ECON-D) of the HGCAL. The ASICs, fabricated in 65 nm CMOS, are radiation tolerant up to 200 Mrad and require low power consumption: < 2.5 mW/sensor-channel per chip. Here, we report on the first functionality and radiation tests for the ECON-D-P1 full-functionality prototype. We present a comparison of single event effect (SEE) cross sections measured for different methods of triple modular redundancy using test results from the ECON-T-P1 full-functionality prototype.

47 OTHER INSTRUMENTATION↗

DOE OSTI2021

Reconfigurable Framework for Resilient Semantic Segmentation for Space Applications

Deep learning (DL) presents new opportunities for enabling spacecraft autonomy, onboard analysis, and intelligent applications for space missions. However, DL applications are computationally intensive and often infeasible to deploy on radiation-hardened (rad-hard) processors, which traditionally harness a fraction of the computational capability of their commercial-off-the-shelf counterparts. Commercial FPGAs and system-on-chips present numerous architectural advantages and provide the computation capabilities to enable onboard DL applications; however, these devices are highly susceptible to radiation-induced single-event effects (SEEs) that can degrade the dependability of DL applications. In this article, we propose Reconfigurable ConvNet (RECON), a reconfigurable acceleration framework for dependable, high-performance semantic segmentation for space applications. In RECON, we propose both selective and adaptive approaches to enable efficient SEE mitigation. In our selective approach, control-flow parts are selectively protected by triple-modular redundancy to minimize SEE-induced hangs, and in our adaptive approach, partial reconfiguration is used to adapt the mitigation of dataflow parts in response to a dynamic radiation environment. Combined, both approaches enable RECON to maximize system performability subject to mission availability constraints. We perform fault injection and neutron irradiation to observe the susceptibility of RECON and use dependability modeling to evaluate RECON in various orbital case studies to demonstrate a 1.5–3.0× performability improvement in both performance and energy efficiency compared to static approaches.

97 MATHEMATICS AND COMPUTING↗

NASA NTRS1967

Automatic channel switching device

Automatic channel switching device operates with all three triple modular redundant channels when there are no errors. When a failure occurs, channel and module switching isolate the failure to a specific channel. Since only one must operate correctly, reliability is increased.

Ball, M.↗

NASA NTRS1973

A reliability and comparative analysis of two standby system configurations.

Equations are derived which enable one to calculate the system reliability for parallel or triple modular redundant systems with standby spares. Software error detection is introduced into the TMR/Spares system configuration in order to utilize fully all of the units. An indication of the sensitivity of the system reliability to an increase in the number of spares, partitioning, switching, variations in the powered and unpowered failures rates, and time is presented. A comparison of the parallel and the TMR/Spares system configurations, under similar conditions, is given.

Taylor, D. S.↗

NASA NTRS1974

Unpowered to powered failure rate ratio - A key reliability parameter

It is shown that the initial assumption of the ratio of unpowered to powered failure rates can have a strong influence on the design of a modular system intended for space missions. The analysis is performed for parallel systems and for triple modular redundant systems. Parallel systems are shown to be much more sensitive to the unpowered to powered failure rate ratio than the TMR/Spares systems, however, regardless of which standby redundancy technique is considered, the dependence of the system reliability on this ratio increases as the number of standby spares increases.

Taylor, D. S.↗

NASA NTRS1974

A multiprocessor computer simulation model employing a feedback scheduler/allocator for memory space and bandwidth matching and TMR processing

A computer simulation model for a multiprocessor computer is developed that is useful for studying the problem of matching multiprocessor's memory space, memory bandwidth and numbers and speeds of processors with aggregate job set characteristics. The model assumes an input work load of a set of recurrent jobs. The model includes a feedback scheduler/allocator which attempts to improve system performance through higher memory bandwidth utilization by matching individual job requirements for space and bandwidth with space availability and estimates of bandwidth availability at the times of memory allocation. The simulation model includes provisions for specifying precedence relations among the jobs in a job set, and provisions for specifying precedence execution of TMR (Triple Modular Redundant and SIMPLEX (non redundant) jobs.

Bradley, D. B.↗

NASA NTRS1975

HOME - An application of fault-tolerant techniques and system self-testing

Hard Over Monitoring Equipment (HOME) has been designed to complement and enhance the flight safety of a flight research helicopter. HOME is an independent, highly reliable, and fail-safe special purpose computer that monitors the flight control commands issued by the flight control computer of the helicopter. In particular, HOME detects the issuance of a hazardous hard-over command for any of the four flight control axes and transfers the control of the helicopter to the flight safety pilot. The design of HOME incorporates certain reliability and fail-safe enhancement design features, such as triple modular redundancy, majority logic voting, fail-safe dual circuits, independent status monitors, in-flight self-test, and a built-in preflight exerciser. The HOME design and operation is described with special emphasis on the reliability and fail-safe aspects of the design.

Holden, D. G.↗

NASA NTRS1981

Development of a fault-tolerant microprocessor based computer system for space flight

A methodology for the design of a tightly coupled, highly reliable microprocessor based computer system is described. The concept of triple modular redundancy with sparing is used. The notion of synchronizing by using a single crystal oscillator is examined. The use of decoders to replace voters is also used. The decoders not only isolate the failed module but also allow error identification to be accomplished. Each module is to have its own RAM memory. The necessary circuitry to select a correct memory and the corresponding DMA controller was designed.

Montgomery, V. T.↗

NASA NTRS1992

Derivation and application of hard deadlines for real-time control systems

The computation-time delay in the feedback controller of a real-time control system may cause failure to update the control input during one or more sampling periods. If this delay exceeds a certain limit called a hard deadline, either the necessary conditions for system stability are violated or the system leaves the allowed state-space. In such a case a dynamic failure is said to occur to the system. A method for calculating the hard deadlines in linear time-invariant control systems by considering system stability and the allowed state-space is presented. To derive necessary conditions for (asymptotic) system stability, the state difference equation is modified based on an assumed maximum delay and the probability distribution of delays whose magnitudes are less than, or equal to, the assumed maximum delay. Moreover, the allowed state-space - which is derived from given input and state constraints - is used to calculate the hard deadline as a function of time and the system state. A one-shot delay model in which a single event causes a dynamic failure is also considered. The knowledge of hard deadline is then applied to the design of error recovery in a triple modular redundant (TMR) controller computer.

Shin, Kang G.↗

NASA NTRS2006

Evolutionary Based Techniques for Fault Tolerant Field Programmable Gate Arrays

The use of SRAM-based Field Programmable Gate Arrays (FPGAs) is becoming more and more prevalent in space applications. Commercial-grade FPGAs are potentially susceptible to permanently debilitating Single-Event Latchups (SELs). Repair methods based on Evolutionary Algorithms may be applied to FPGA circuits to enable successful fault recovery. This paper presents the experimental results of applying such methods to repair four commonly used circuits (quadrature decoder, 3-by-3-bit multiplier, 3-by-3-bit adder, 440-7 decoder) into which a number of simulated faults have been introduced. The results suggest that evolutionary repair techniques can improve the process of fault recovery when used instead of or as a supplement to Triple Modular Redundancy (TMR), which is currently the predominant method for mitigating FPGA faults.

Larchev, Gregory V.↗

NASA NTRS2006

Single Event Effects Test Results for Advanced Field Programmable Gate Arrays

Reconfigurable Field Programmable Gate Arrays (FPGAs) from Altera and Actel and an FPGA-based quick-turnApplication Specific Integrated Circuit (ASIC) from Altera were subjected to single-event testing using heavy ions. Both Altera devices (Stratix II and HardCopy II) exhibited a low latchup threshold (below an LET of 3 MeV-cm2/mg) and thus are not recommended for applications in the space radiation environment. The flash-based Actel ProASIC Plus device did not exhibit latchup to an effective LET of 75 MeV-cm2/mg at room temperature. In addition, these tests did not show flash cell charge loss (upset) or retention damage. Upset characterization of the design-level flip-flops yielded an LET threshold below 10 MeV-cm2/mg and a high LET cross section of about lxlO-6 cm2/bit for storing ones and about lxl0-7 cm2/bit for storing zeros . Thus, the ProASIC device may be suitable for critical flight applications with appropriate triple modular redundancy mitigation techniques.

Field Programmable Gate Arrays↗