When and how to use a software reliability model
Proper use of software reliability models is discussed.
Goel, A. L.↗
SEARCH · Engineering Papers
Results for “reliability modeling”
Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.
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Reliability model of a monopropellant auxiliary propulsion system
A mathematical model and associated computer code has been developed which computes the reliability of a monopropellant blowdown hydrazine spacecraft auxiliary propulsion system as a function of time. The propulsion system is used to adjust or modify the spacecraft orbit over an extended period of time. The multiple orbit corrections are the multiple objectives which the auxiliary propulsion system is designed to achieve. Thus the reliability model computes the probability of successfully accomplishing each of the desired orbit corrections. To accomplish this, the reliability model interfaces with a computer code that models the performance of a blowdown (unregulated) monopropellant auxiliary propulsion system. The computer code acts as a performance model and as such gives an accurate time history of the system operating parameters. The basic timing and status information is passed on to and utilized by the reliability model which establishes the probability of successfully accomplishing the orbit corrections.
Greenberg, J. S.↗
Key Reliability Drivers of Liquid Propulsion Engines and A Reliability Model for Sensitivity Analysis
This paper is to address the in-flight reliability of a liquid propulsion engine system for a launch vehicle. We first establish a comprehensive list of system and sub-system reliability drivers for any liquid propulsion engine system. We then build a reliability model to parametrically analyze the impact of some reliability parameters. We present sensitivity analysis results for a selected subset of the key reliability drivers using the model. Reliability drivers identified include: number of engines for the liquid propulsion stage, single engine total reliability, engine operation duration, engine thrust size, reusability, engine de-rating or up-rating, engine-out design (including engine-out switching reliability, catastrophic fraction, preventable failure fraction, unnecessary shutdown fraction), propellant specific hazards, engine start and cutoff transient hazards, engine combustion cycles, vehicle and engine interface and interaction hazards, engine health management system, engine modification, engine ground start hold down with launch commit criteria, engine altitude start (1 in. start), Multiple altitude restart (less than 1 restart), component, subsystem and system design, manufacturing/ground operation support/pre and post flight check outs and inspection, extensiveness of the development program. We present some sensitivity analysis results for the following subset of the drivers: number of engines for the propulsion stage, single engine total reliability, engine operation duration, engine de-rating or up-rating requirements, engine-out design, catastrophic fraction, preventable failure fraction, unnecessary shutdown fraction, and engine health management system implementation (basic redlines and more advanced health management systems).
Huang, Zhao-Feng↗
Software Reliability Modeling Techniques and Tools
Presents software reliability modeling techniques and tools.
Reliability measurement reliability function failu↗
A General Reliability Model for Ni-BaTiO3-Based Multilayer Ceramic Capacitors
The evaluation of multilayer ceramic capacitors (MLCCs) with Ni electrode and BaTiO3 dielectric material for potential space project applications requires an in-depth understanding of their reliability. A general reliability model for Ni-BaTiO3 MLCC is developed and discussed. The model consists of three parts: a statistical distribution; an acceleration function that describes how a capacitor's reliability life responds to the external stresses, and an empirical function that defines contribution of the structural and constructional characteristics of a multilayer capacitor device, such as the number of dielectric layers N, dielectric thickness d, average grain size, and capacitor chip size A. Application examples are also discussed based on the proposed reliability model for Ni-BaTiO3 MLCCs.
statistical modeling↗
Trends in reliability modeling technology for fault tolerant systems
Reliability modeling for fault tolerant avionic computing systems was developed. The modeling of large systems involving issues of state size and complexity, fault coverage, and practical computation was discussed. A novel technique which provides the tool for studying the reliability of systems with nonconstant failure rates is presented. The fault latency which may provide a method of obtaining vital latent fault data is measured.
Bavuso, S. J.↗
Analysis of whisker-toughened CMC structural components using an interactive reliability model
Realizing wider utilization of ceramic matrix composites (CMC) requires the development of advanced structural analysis technologies. This article focuses on the use of interactive reliability models to predict component probability of failure. The deterministic William-Warnke failure criterion serves as theoretical basis for the reliability model presented here. The model has been implemented into a test-bed software program. This computer program has been coupled to a general-purpose finite element program. A simple structural problem is presented to illustrate the reliability model and the computer algorithm.
Duffy, Stephen F.↗
Software models: A Bayesian approach to parameter estimation in the Jelenski-Moranda software reliability model
Maximum likelihood estimation procedures for the Jelinski-Moranda software reliability model often give misleading answers. A reparameterization and a Bayesian analysis eliminate some of the problems incurred by MLE methods and often give better predictions on sets of real and simulated data. Practical difficulties in estimating the initial number of errors N and the failure rate of each error phi by the method of maximum likelihood are: N, the MLE of N, is occasionally infinite (i.e., the routines for calculating N and phi do not converge). It is shown that N is finite sub i only if the regression line of the interevent times t sub i vs. i has positive slope. A serious problem is that often N approximates n, the sample size, and sometimes N = n. Thus the MLE predicts that the program is perfect even when it is far from being so. Only when almost all failures have been removed can N and phi be trusted near the end of debugging.
Littlewood, B.↗
A General Reliability Model for Ni-BaTiO3-Based Multilayer Ceramic Capacitors
The evaluation for potential space project applications of multilayer ceramic capacitors (MLCCs) with Ni electrode and BaTiO3 dielectric material requires an in-depth understanding of the MLCCs reliability. A general reliability model for Ni-BaTiO3 MLCCs is developed and discussed in this paper. The model consists of three parts: a statistical distribution; an acceleration function that describes how a capacitors reliability life responds to external stresses; and an empirical function that defines the contribution of the structural and constructional characteristics of a multilayer capacitor device, such as the number of dielectric layers N, dielectric thickness d, average grain size r, and capacitor chip size A. Application examples are also discussed based on the proposed reliability model for Ni-BaTiO3 MLCCs.
statistical modeling↗
A Reliability Model for Ni-BaTiO3-Based (BME) Ceramic Capacitors
The evaluation of multilayer ceramic capacitors (MLCCs) with base-metal electrodes (BMEs) for potential NASA space project applications requires an in-depth understanding of their reliability. The reliability of an MLCC is defined as the ability of the dielectric material to retain its insulating properties under stated environmental and operational conditions for a specified period of time t. In this presentation, a general mathematic expression of a reliability model for a BME MLCC is developed and discussed. The reliability model consists of three parts: (1) a statistical distribution that describes the individual variation of properties in a test group of samples (Weibull, log normal, normal, etc.), (2) an acceleration function that describes how a capacitors reliability responds to external stresses such as applied voltage and temperature (All units in the test group should follow the same acceleration function if they share the same failure mode, independent of individual units), and (3) the effect and contribution of the structural and constructional characteristics of a multilayer capacitor device, such as the number of dielectric layers N, dielectric thickness d, average grain size r, and capacitor chip size S. In general, a two-parameter Weibull statistical distribution model is used in the description of a BME capacitors reliability as a function of time. The acceleration function that relates a capacitors reliability to external stresses is dependent on the failure mode. Two failure modes have been identified in BME MLCCs: catastrophic and slow degradation. A catastrophic failure is characterized by a time-accelerating increase in leakage current that is mainly due to existing processing defects (voids, cracks, delamination, etc.), or the extrinsic defects. A slow degradation failure is characterized by a near-linear increase in leakage current against the stress time; this is caused by the electromigration of oxygen vacancies (intrinsic defects). The two identified failure modes follow different acceleration functions. Catastrophic failures follow the traditional power-law relationship to the applied voltage. Slow degradation failures fit well to an exponential law relationship to the applied electrical field. Finally, the impact of capacitor structure on the reliability of BME capacitors is discussed with respect to the number of dielectric layers in an MLCC unit, the number of BaTiO3 grains per dielectric layer, and the chip size of the capacitor device.
reliability↗
An eclectic integrated circuit reliability model
A general form of a comprehensive reliability modeling rationale was formulated for the integrated circuit. Integrated device failure models amenable to long term applications were investigated.
Fetcher, B. C.↗
Noninteractive macroscopic reliability model for ceramic matrix composites with orthotropic material symmetry
A macroscopic noninteractive reliability model for ceramic matrix composites is presented. The model is multiaxial and applicable to composites that can be characterized as orthotropic. Tensorial invariant theory is used to create an integrity basis with invariants that correspond to physical mechanisms related to fracture. This integrity basis is then used to construct a failure function per unit volume (or area) of material. It is assumed that the overall strength of the composite is governed by weakest link theory. This leads to a Weibull type model similar in nature to the principle of independent action (PIA) model for isotropic monolithic ceramics. An experimental program to obtain model parameters is briefly discussed. In addition, qualitative features of the model are illustrated by presenting reliability surfaces for various model parameters.
Duffy, Stephen F.↗
Noninteractive macroscopic reliability model for ceramic matrix composites with orthotropic material symmetry
A macroscopic noninteractive reliability model for ceramic matrix composites is presented. The model is multiaxial and applicable to composites that can be characterized as orthotropic. Tensorial invariant theory is used to create an integrity basis with invariants that correspond to physical mechanisms related to fracture. This integrity basis is then used to construct a failure function per unit volume (or area) of material. It is assumed that the overall strength of the composite is governed by weakest link theory. This leads to a Weibull type model similar in nature to the principle of independent action (PIA) model for isotropic monolithic ceramics. An experimental program to obtain model parameters is briefly discussed. In addition, qualitative features of the model are illustrated by presenting reliability surfaces for various model parameters.
Duffy, Stephen F.↗
An approximation formula for a class of Markov reliability models
A way of considering a small but often used class of reliability model and approximating algebraically the systems reliability is shown. The models considered are appropriate for redundant reconfigurable digital control systems that operate for a short period of time without maintenance, and for such systems the method gives a formula in terms of component fault rates, system recovery rates, and system operating time.
White, A. L.↗
Data Used in Quantified Reliability Models
Data is the crux to developing quantitative risk and reliability models, without the data there is no quantification. The means to find and identify reliability data or failure numbers to quantify fault tree models during conceptual and design phases is often the quagmire that precludes early decision makers consideration of potential risk drivers that will influence design. The analyst tasked with addressing a system or product reliability depends on the availability of data. But, where is does that data come from and what does it really apply to? Commercial industries, government agencies, and other international sources might have available data similar to what you are looking for. In general, internal and external technical reports and data based on similar and dissimilar equipment is often the first and only place checked. A common philosophy is "I have a number - that is good enough". But, is it? Have you ever considered the difference in reported data from various federal datasets and technical reports when compared to similar sources from national and/or international datasets? Just how well does your data compare? Understanding how the reported data was derived, and interpreting the information and details associated with the data is as important as the data itself.
DeMott, Diana↗
AX-5 space suit reliability model
The AX-5 is an all metal Extra-vehicular (EVA) space suit currently under consideration for use on Space Station Freedom. A reliability model was developed based on the suit's unique design and on projected joint cycle requirements. Three AX-5 space suit component joints were cycled under simulated load conditions in accordance with NASA's advanced space suit evaluation plan. This paper will describe the reliability model developed, the results of the cycle testing, and an interpretation of the model and test results in terms of projected Mean Time Between Failure for the AX-5. A discussion of the maintenance implications and life cycle for the AX-5 based on this projection is also included.
Reinhardt, AL↗
Evaluation of reliability modeling tools for advanced fault tolerant systems
The Computer Aided Reliability Estimation (CARE III) and Automated Reliability Interactice Estimation System (ARIES 82) reliability tools for application to advanced fault tolerance aerospace systems were evaluated. To determine reliability modeling requirements, the evaluation focused on the Draper Laboratories' Advanced Information Processing System (AIPS) architecture as an example architecture for fault tolerance aerospace systems. Advantages and limitations were identified for each reliability evaluation tool. The CARE III program was designed primarily for analyzing ultrareliable flight control systems. The ARIES 82 program's primary use was to support university research and teaching. Both CARE III and ARIES 82 were not suited for determining the reliability of complex nodal networks of the type used to interconnect processing sites in the AIPS architecture. It was concluded that ARIES was not suitable for modeling advanced fault tolerant systems. It was further concluded that subject to some limitations (the difficulty in modeling systems with unpowered spare modules, systems where equipment maintenance must be considered, systems where failure depends on the sequence in which faults occurred, and systems where multiple faults greater than a double near coincident faults must be considered), CARE III is best suited for evaluating the reliability of advanced tolerant systems for air transport.
Baker, Robert↗
Automatic specification of reliability models for fault-tolerant computers
The calculation of reliability measures using Markov models is required for life-critical processor-memory-switch structures that have standby redundancy or that are subject to transient or intermittent faults or repair. The task of specifying these models is tedious and prone to human error because of the large number of states and transitions required in any reasonable system. Therefore, model specification is a major analysis bottleneck, and model verification is a major validation problem. The general unfamiliarity of computer architects with Markov modeling techniques further increases the necessity of automating the model specification. Automation requires a general system description language (SDL). For practicality, this SDL should also provide a high level of abstraction and be easy to learn and use. The first attempt to define and implement an SDL with those characteristics is presented. A program named Automated Reliability Modeling (ARM) was constructed as a research vehicle. The ARM program uses a graphical interface as its SDL, and it outputs a Markov reliability model specification formulated for direct use by programs that generate and evaluate the model.
Liceaga, Carlos A.↗