Engineering Papers⌕ Search

SEARCH · Engineering Papers

Results for “reliability modeling”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.

At least 37 records · Page 2
All sourcesNASA NTRSDOE OSTI
NASA NTRS1982

Life and reliability models for helicopter transmissions

Computer models of life and reliability are presented for planetary gear trains with a fixed ring gear, input applied to the sun gear, and output taken from the planet arm. For this transmission the input and output shafts are co-axial and the input and output torques are assumed to be coaxial with these shafts. Thrust and side loading are neglected. The reliability model is based on the Weibull distributions of the individual reliabilities of the in transmission components. The system model is also a Weibull distribution. The load versus life model for the system is a power relationship as the models for the individual components. The load-life exponent and basic dynamic capacity are developed as functions of the components capacities. The models are used to compare three and four planet, 150 kW (200 hp), 5:1 reduction transmissions with 1500 rpm input speed to illustrate their use.

Savage, M.↗
NASA NTRS1979

Trends in reliability modeling technology for fault tolerant systems

Developments in reliability modeling for large fault tolerant avionic computing systems are presented. Issues of state size and complexity, fault coverage, and practical computation are addressed. A two-fold developmental effort is described based on the structural and fault coverage modeling approaches. A technique which was successfully applied to an 865 state pure death stationary Markov model is presented. Of particular interest is a short computer program which executes very quickly to produce reliability results of a large state space model. This model also incorporates fault coverage states for processor, memory, and bus line replaceable units. A second structural reliability modeling scheme is aimed at solving nonstationary Markov models. This technique provides the tool required for studying the reliability of systems with nonconstant failure rates and includes intermittent/transient faults, electronic hardware which exhibits decreasing failure rates, and hydromechanical devices which typically have wearout failure mechanisms. Several aspects of fault coverage, including modeling and data measurement of intermittent/transient faults and latent faults, are elucidated and illustrated. The CARE II (computer-aided reliability estimation) coverage is presented and shortcomings to be eliminated are discussed.

Bavuso, S. J.↗
NASA NTRS1971

Reliability model of a monopropellant auxiliary propulsion system

A mathematical model and associated computer code has been developed which computes the reliability of a monopropellant blowdown hydrazine spacecraft auxiliary propulsion system as a function of time. The propulsion system is used to adjust or modify the spacecraft orbit over an extended period of time. The multiple orbit corrections are the multiple objectives which the auxiliary propulsion system is designed to achieve. Thus the reliability model computes the probability of successfully accomplishing each of the desired orbit corrections. To accomplish this, the reliability model interfaces with a computer code that models the performance of a blowdown (unregulated) monopropellant auxiliary propulsion system. The computer code acts as a performance model and as such gives an accurate time history of the system operating parameters. The basic timing and status information is passed on to and utilized by the reliability model which establishes the probability of successfully accomplishing the orbit corrections.

Greenberg, J. S.↗
NASA NTRS2005

Key Reliability Drivers of Liquid Propulsion Engines and A Reliability Model for Sensitivity Analysis

This paper is to address the in-flight reliability of a liquid propulsion engine system for a launch vehicle. We first establish a comprehensive list of system and sub-system reliability drivers for any liquid propulsion engine system. We then build a reliability model to parametrically analyze the impact of some reliability parameters. We present sensitivity analysis results for a selected subset of the key reliability drivers using the model. Reliability drivers identified include: number of engines for the liquid propulsion stage, single engine total reliability, engine operation duration, engine thrust size, reusability, engine de-rating or up-rating, engine-out design (including engine-out switching reliability, catastrophic fraction, preventable failure fraction, unnecessary shutdown fraction), propellant specific hazards, engine start and cutoff transient hazards, engine combustion cycles, vehicle and engine interface and interaction hazards, engine health management system, engine modification, engine ground start hold down with launch commit criteria, engine altitude start (1 in. start), Multiple altitude restart (less than 1 restart), component, subsystem and system design, manufacturing/ground operation support/pre and post flight check outs and inspection, extensiveness of the development program. We present some sensitivity analysis results for the following subset of the drivers: number of engines for the propulsion stage, single engine total reliability, engine operation duration, engine de-rating or up-rating requirements, engine-out design, catastrophic fraction, preventable failure fraction, unnecessary shutdown fraction, and engine health management system implementation (basic redlines and more advanced health management systems).

Huang, Zhao-Feng↗
NASA NTRS2014

A General Reliability Model for Ni-BaTiO3-Based Multilayer Ceramic Capacitors

The evaluation of multilayer ceramic capacitors (MLCCs) with Ni electrode and BaTiO3 dielectric material for potential space project applications requires an in-depth understanding of their reliability. A general reliability model for Ni-BaTiO3 MLCC is developed and discussed. The model consists of three parts: a statistical distribution; an acceleration function that describes how a capacitor's reliability life responds to the external stresses, and an empirical function that defines contribution of the structural and constructional characteristics of a multilayer capacitor device, such as the number of dielectric layers N, dielectric thickness d, average grain size, and capacitor chip size A. Application examples are also discussed based on the proposed reliability model for Ni-BaTiO3 MLCCs.

statistical modeling↗
NASA NTRS1979

Trends in reliability modeling technology for fault tolerant systems

Reliability modeling for fault tolerant avionic computing systems was developed. The modeling of large systems involving issues of state size and complexity, fault coverage, and practical computation was discussed. A novel technique which provides the tool for studying the reliability of systems with nonconstant failure rates is presented. The fault latency which may provide a method of obtaining vital latent fault data is measured.

Bavuso, S. J.↗
NASA NTRS1992

Analysis of whisker-toughened CMC structural components using an interactive reliability model

Realizing wider utilization of ceramic matrix composites (CMC) requires the development of advanced structural analysis technologies. This article focuses on the use of interactive reliability models to predict component probability of failure. The deterministic William-Warnke failure criterion serves as theoretical basis for the reliability model presented here. The model has been implemented into a test-bed software program. This computer program has been coupled to a general-purpose finite element program. A simple structural problem is presented to illustrate the reliability model and the computer algorithm.

Duffy, Stephen F.↗
NASA NTRS1981

Software models: A Bayesian approach to parameter estimation in the Jelenski-Moranda software reliability model

Maximum likelihood estimation procedures for the Jelinski-Moranda software reliability model often give misleading answers. A reparameterization and a Bayesian analysis eliminate some of the problems incurred by MLE methods and often give better predictions on sets of real and simulated data. Practical difficulties in estimating the initial number of errors N and the failure rate of each error phi by the method of maximum likelihood are: N, the MLE of N, is occasionally infinite (i.e., the routines for calculating N and phi do not converge). It is shown that N is finite sub i only if the regression line of the interevent times t sub i vs. i has positive slope. A serious problem is that often N approximates n, the sample size, and sometimes N = n. Thus the MLE predicts that the program is perfect even when it is far from being so. Only when almost all failures have been removed can N and phi be trusted near the end of debugging.

Littlewood, B.↗
NASA NTRS2014

A General Reliability Model for Ni-BaTiO3-Based Multilayer Ceramic Capacitors

The evaluation for potential space project applications of multilayer ceramic capacitors (MLCCs) with Ni electrode and BaTiO3 dielectric material requires an in-depth understanding of the MLCCs reliability. A general reliability model for Ni-BaTiO3 MLCCs is developed and discussed in this paper. The model consists of three parts: a statistical distribution; an acceleration function that describes how a capacitors reliability life responds to external stresses; and an empirical function that defines the contribution of the structural and constructional characteristics of a multilayer capacitor device, such as the number of dielectric layers N, dielectric thickness d, average grain size r, and capacitor chip size A. Application examples are also discussed based on the proposed reliability model for Ni-BaTiO3 MLCCs.

statistical modeling↗
NASA NTRS2014

A Reliability Model for Ni-BaTiO3-Based (BME) Ceramic Capacitors

The evaluation of multilayer ceramic capacitors (MLCCs) with base-metal electrodes (BMEs) for potential NASA space project applications requires an in-depth understanding of their reliability. The reliability of an MLCC is defined as the ability of the dielectric material to retain its insulating properties under stated environmental and operational conditions for a specified period of time t. In this presentation, a general mathematic expression of a reliability model for a BME MLCC is developed and discussed. The reliability model consists of three parts: (1) a statistical distribution that describes the individual variation of properties in a test group of samples (Weibull, log normal, normal, etc.), (2) an acceleration function that describes how a capacitors reliability responds to external stresses such as applied voltage and temperature (All units in the test group should follow the same acceleration function if they share the same failure mode, independent of individual units), and (3) the effect and contribution of the structural and constructional characteristics of a multilayer capacitor device, such as the number of dielectric layers N, dielectric thickness d, average grain size r, and capacitor chip size S. In general, a two-parameter Weibull statistical distribution model is used in the description of a BME capacitors reliability as a function of time. The acceleration function that relates a capacitors reliability to external stresses is dependent on the failure mode. Two failure modes have been identified in BME MLCCs: catastrophic and slow degradation. A catastrophic failure is characterized by a time-accelerating increase in leakage current that is mainly due to existing processing defects (voids, cracks, delamination, etc.), or the extrinsic defects. A slow degradation failure is characterized by a near-linear increase in leakage current against the stress time; this is caused by the electromigration of oxygen vacancies (intrinsic defects). The two identified failure modes follow different acceleration functions. Catastrophic failures follow the traditional power-law relationship to the applied voltage. Slow degradation failures fit well to an exponential law relationship to the applied electrical field. Finally, the impact of capacitor structure on the reliability of BME capacitors is discussed with respect to the number of dielectric layers in an MLCC unit, the number of BaTiO3 grains per dielectric layer, and the chip size of the capacitor device.

reliability↗
NASA NTRS1972

An eclectic integrated circuit reliability model

A general form of a comprehensive reliability modeling rationale was formulated for the integrated circuit. Integrated device failure models amenable to long term applications were investigated.

Fetcher, B. C.↗
NASA NTRS1989

Noninteractive macroscopic reliability model for ceramic matrix composites with orthotropic material symmetry

A macroscopic noninteractive reliability model for ceramic matrix composites is presented. The model is multiaxial and applicable to composites that can be characterized as orthotropic. Tensorial invariant theory is used to create an integrity basis with invariants that correspond to physical mechanisms related to fracture. This integrity basis is then used to construct a failure function per unit volume (or area) of material. It is assumed that the overall strength of the composite is governed by weakest link theory. This leads to a Weibull type model similar in nature to the principle of independent action (PIA) model for isotropic monolithic ceramics. An experimental program to obtain model parameters is briefly discussed. In addition, qualitative features of the model are illustrated by presenting reliability surfaces for various model parameters.

Duffy, Stephen F.↗
NASA NTRS1989

Noninteractive macroscopic reliability model for ceramic matrix composites with orthotropic material symmetry

A macroscopic noninteractive reliability model for ceramic matrix composites is presented. The model is multiaxial and applicable to composites that can be characterized as orthotropic. Tensorial invariant theory is used to create an integrity basis with invariants that correspond to physical mechanisms related to fracture. This integrity basis is then used to construct a failure function per unit volume (or area) of material. It is assumed that the overall strength of the composite is governed by weakest link theory. This leads to a Weibull type model similar in nature to the principle of independent action (PIA) model for isotropic monolithic ceramics. An experimental program to obtain model parameters is briefly discussed. In addition, qualitative features of the model are illustrated by presenting reliability surfaces for various model parameters.

Duffy, Stephen F.↗
NASA NTRS1984

An approximation formula for a class of Markov reliability models

A way of considering a small but often used class of reliability model and approximating algebraically the systems reliability is shown. The models considered are appropriate for redundant reconfigurable digital control systems that operate for a short period of time without maintenance, and for such systems the method gives a formula in terms of component fault rates, system recovery rates, and system operating time.

White, A. L.↗
NASA NTRS2014

Data Used in Quantified Reliability Models

Data is the crux to developing quantitative risk and reliability models, without the data there is no quantification. The means to find and identify reliability data or failure numbers to quantify fault tree models during conceptual and design phases is often the quagmire that precludes early decision makers consideration of potential risk drivers that will influence design. The analyst tasked with addressing a system or product reliability depends on the availability of data. But, where is does that data come from and what does it really apply to? Commercial industries, government agencies, and other international sources might have available data similar to what you are looking for. In general, internal and external technical reports and data based on similar and dissimilar equipment is often the first and only place checked. A common philosophy is "I have a number - that is good enough". But, is it? Have you ever considered the difference in reported data from various federal datasets and technical reports when compared to similar sources from national and/or international datasets? Just how well does your data compare? Understanding how the reported data was derived, and interpreting the information and details associated with the data is as important as the data itself.

DeMott, Diana↗
NASA NTRS1990

AX-5 space suit reliability model

The AX-5 is an all metal Extra-vehicular (EVA) space suit currently under consideration for use on Space Station Freedom. A reliability model was developed based on the suit's unique design and on projected joint cycle requirements. Three AX-5 space suit component joints were cycled under simulated load conditions in accordance with NASA's advanced space suit evaluation plan. This paper will describe the reliability model developed, the results of the cycle testing, and an interpretation of the model and test results in terms of projected Mean Time Between Failure for the AX-5. A discussion of the maintenance implications and life cycle for the AX-5 based on this projection is also included.

Reinhardt, AL↗