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All sourcesNASA NTRSDOE OSTI
NASA NTRS1994

HiRel: Hybrid Automated Reliability Predictor (HARP) integrated reliability tool system, (version 7.0). Volume 3: HARP Graphics Oriented (GO) input user's guide

The Hybrid Automated Reliability Predictor (HARP) integrated Reliability (HiRel) tool system for reliability/availability prediction offers a toolbox of integrated reliability/availability programs that can be used to customize the user's application in a workstation or nonworkstation environment. HiRel consists of interactive graphical input/output programs and four reliability/availability modeling engines that provide analytical and simulative solutions to a wide host of highly reliable fault-tolerant system architectures and is also applicable to electronic systems in general. The tool system was designed at the outset to be compatible with most computing platforms and operating systems, and some programs have been beta tested within the aerospace community for over 8 years. This document is a user's guide for the HiRel graphical preprocessor Graphics Oriented (GO) program. GO is a graphical user interface for the HARP engine that enables the drawing of reliability/availability models on a monitor. A mouse is used to select fault tree gates or Markov graphical symbols from a menu for drawing.

Bavuso, Salvatore J.↗
NASA NTRS1994

HiRel: Hybrid Automated Reliability Predictor (HARP) integrated reliability tool system, (version 7.0). Volume 1: HARP introduction and user's guide

The Hybrid Automated Reliability Predictor (HARP) integrated Reliability (HiRel) tool system for reliability/availability prediction offers a toolbox of integrated reliability/availability programs that can be used to customize the user's application in a workstation or nonworkstation environment. HiRel consists of interactive graphical input/output programs and four reliability/availability modeling engines that provide analytical and simulative solutions to a wide host of reliable fault-tolerant system architectures and is also applicable to electronic systems in general. The tool system was designed to be compatible with most computing platforms and operating systems, and some programs have been beta tested, within the aerospace community for over 8 years. Volume 1 provides an introduction to the HARP program. Comprehensive information on HARP mathematical models can be found in the references.

Bavuso, Salvatore J.↗
NASA NTRS1994

HiRel: Hybrid Automated Reliability Predictor (HARP) integrated reliability tool system, (version 7.0). Volume 2: HARP tutorial

The Hybrid Automated Reliability Predictor (HARP) integrated Reliability (HiRel) tool system for reliability/availability prediction offers a toolbox of integrated reliability/availability programs that can be used to customize the user's application in a workstation or nonworkstation environment. The Hybrid Automated Reliability Predictor (HARP) tutorial provides insight into HARP modeling techniques and the interactive textual prompting input language via a step-by-step explanation and demonstration of HARP's fault occurrence/repair model and the fault/error handling models. Example applications are worked in their entirety and the HARP tabular output data are presented for each. Simple models are presented at first with each succeeding example demonstrating greater modeling power and complexity. This document is not intended to present the theoretical and mathematical basis for HARP.

Rothmann, Elizabeth↗
NASA NTRS1994

HiRel: Hybrid Automated Reliability Predictor (HARP) integrated reliability tool system, (version 7.0). Volume 4: HARP Output (HARPO) graphics display user's guide

The Hybrid Automated Reliability Predictor (HARP) integrated Reliability (HiRel) tool system for reliability/availability prediction offers a toolbox of integrated reliability/availability programs that can be used to customize the user's application in a workstation or nonworkstation environment. HiRel consists of interactive graphical input/output programs and four reliability/availability modeling engines that provide analytical and simulative solutions to a wide host of highly reliable fault-tolerant system architectures and is also applicable to electronic systems in general. The tool system was designed at the outset to be compatible with most computing platforms and operating systems and some programs have been beta tested within the aerospace community for over 8 years. This document is a user's guide for the HiRel graphical postprocessor program HARPO (HARP Output). HARPO reads ASCII files generated by HARP. It provides an interactive plotting capability that can be used to display alternate model data for trade-off analyses. File data can also be imported to other commercial software programs.

Sproles, Darrell W.↗
NASA NTRS1971

Reliability computation from reliability block diagrams

A method and a computer program are presented to calculate probability of system success from an arbitrary reliability block diagram. The class of reliability block diagrams that can be handled include any active/standby combination of redundancy, and the computations include the effects of dormancy and switching in any standby redundancy. The mechanics of the program are based on an extension of the probability tree method of computing system probabilities.

Chelson, P. O.↗
NASA NTRS1972

Techniques for control of long-term reliability of complex integrated circuits. I - Reliability assurance by test vehicle qualification.

Development of an alternate approach to the conventional methods of reliability assurance for large-scale integrated circuits. The product treated is a large-scale T squared L array designed for space applications. The concept used is that of qualification of product by evaluation of the basic processing used in fabricating the product, providing an insight into its potential reliability. Test vehicles are described which enable evaluation of device characteristics, surface condition, and various parameters of the two-level metallization system used. Evaluation of these test vehicles is performed on a lot qualification basis, with the lot consisting of one wafer. Assembled test vehicles are evaluated by high temperature stress at 300 C for short time durations. Stressing at these temperatures provides a rapid method of evaluation and permits a go/no go decision to be made on the wafer lot in a timely fashion.

Van Vonno, N. W.↗
NASA NTRS1972

Automation of reliability evaluation procedures through CARE - The computer-aided reliability estimation program.

Description of an on-line interactive computer program called CARE (Computer-Aided Reliability Estimation) which can model self-repair and fault-tolerant organizations and perform certain other functions. Essentially CARE consists of a repository of mathematical equations defining the various basic redundancy schemes. These equations, under program control, are then interrelated to generate the desired mathematical model to fit the architecture of the system under evaluation. The mathematical model is then supplied with ground instances of its variables and is then evaluated to generate values for the reliability-theoretic functions applied to the model.

Mathur, F. P.↗
NASA NTRS1975

Reliability computation from reliability block diagrams

Computer program computes system reliability for very general class of reliability block diagrams. Four factors are considered in calculating probability of system success: active block redundancy, standby block redundancy, partial redundancy, and presence of equivalent blocks in the diagram.

Chelson, P. O.↗
NASA NTRS1992

Reliability prediction for a class of highly reliable digital systems

Three theorems which show that the reliability of a popular class of systems can be computed using small and simple models are presented. This class consists of systems that are assemblages of subsystems where each subsystem is a majority-voting threeplex plus spares or majority-voting fourplex plus spares. The theorems are error bounds for model reduction and simplification. The error bounds are given in terms of readily available system parameters. The three theorems have been applied to a system that has been used as an example that generates extremely large reliability models; the system considered is one version of AIPS (Advanced Information Processing System) for IAPSA (Integrated Airframe Propulsion System Architecture).

White, Allan L.↗
NASA NTRS2017

Field Programmable Gate Array Reliability Analysis Guidelines for Launch Vehicle Reliability Block Diagrams

Field Programmable Gate Arrays (FPGAs) integrated circuits (IC) are one of the key electronic components in today's sophisticated launch and space vehicle complex avionic systems, largely due to their superb reprogrammable and reconfigurable capabilities combined with relatively low non-recurring engineering costs (NRE) and short design cycle. Consequently, FPGAs are prevalent ICs in communication protocols and control signal commands. This paper will identify reliability concerns and high level guidelines to estimate FPGA total failure rates in a launch vehicle application. The paper will discuss hardware, hardware description language, and radiation induced failures. The hardware contribution of the approach accounts for physical failures of the IC. The hardware description language portion will discuss the high level FPGA programming languages and software/code reliability growth. The radiation portion will discuss FPGA susceptibility to space environment radiation.

Al Hassan, Mohammad↗
NASA NTRS1980

Software reliability: Application of a reliability model to requirements error analysis

The application of a software reliability model having a well defined correspondence of computer program properties to requirements error analysis is described. Requirements error categories which can be related to program structural elements are identified and their effect on program execution considered. The model is applied to a hypothetical B-5 requirement specification for a program module.

Logan, J.↗