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Experimental performance of a microwave cavity plasma disk ion source
The detailed description and performance characteristics of a microwave ion source are presented. This ion source utilizes an internally tuned, single-mode (or selective multimode) cylindrical cavity applicator to focus and match microwave energy into a disk-shaped discharge zone. The combination of mode focus control and variable, internal cavity matching allows the efficient operation and beam extraction over a wide range of pressures, powers and gaseous inputs. Experimental measurements of ion beam current versus accelerating voltage and input microwave power in xenon and oxygen gas are presented. Ion source specific energy and mass utilization versus experimental variables are also determined. The experimental performance demonstrates the ability of this ion source to extract an ion beam with a well matched, stable, and continuous operation over a wide range of input gases, low pressures, and over input gas flow rates in excess of 100 to a few sccm. Double Langmuir probe measurements in xenon gas indicate high degrees of ionization, and electron and ion concentrations in excess of 100 critical densities in the microwave discharge zone. This ion source has many potential uses such as spacecraft electric propulsion, material ion beam processing, and neutral beam ion sources.
H - Ion Source RF Plasma Testing with 13 MHz and 27 MHz at the Spallation Neutron Source (SNS)
The baseline RF-driven H⁻ ion source configuration at the Spallation Neutron Source (SNS) facility uses a continuous wave (CW) 600 W 13 MHz RF system to ignite and maintain a low-density plasma inside the ion source vacuum chamber. After the continuous low-density 13 MHz plasma has been established, a pulsed (typical 1 ms pulse width and 60 Hz pulse repetition rate) 80 kW 2 MHz RF system is used to increase the plasma density to produce the pulsed H⁻ ion beam. Incremental upgrades and improvements to the SNS ion source systems have resulted in the ability to reliably operate an H⁻ ion source for SNS neutron production run cycles that can last up to four months. Conditions inside the SNS H⁻ ion source evolve throughout a four-month run cycle due to changes in impurity levels, sputtering, and erosion. As the internal ion source conditions change during the run cycle, there can also be changes in plasma stability and the 13 MHz RF power level required to ignite the plasma. This paper presents the preliminary results of testing performed on the SNS Ion Source Test Stand (ISTS) system where we looked at plasma ignition and plasma stability using 27 MHz RF in place of the baseline 13 MHz RF system.
Characteristics of a microwave plasma disk ion source
This letter describes an ion source using a cylindrical microwave cavity operating in a hybrid mode associated with the TE(211) empty cavity mode. The design principles and associated electrical systems are also discussed. Extracted beam current versus accelerating voltage, and specific energy versus extracted beam current are displayed over the range of flow rates 20-80 sccm and absorbed powers 80-150 W. The results show the feasibility of this concept. The ion source has many potential uses such as space propulsion, material processing, and neutral beam ion sources.
Negative deuterium-ion source
Negative ions are formed by collisions with surfaces having low work function.
Industrial ion source technology
A 30 cm electron bombardment ion source was designed and fabricated for micromachining and sputtering applications. This source has a multipole magnetic field that employs permanent magnets between permeable pole pieces. An average ion current density of 1 ma/sq cm with 500 eV argon ions was selected as a design operating condition. The ion beam at this operating condition was uniform and well collimated, with an average variation of plus or minus 5 percent over the center 20 cm of the beam at distances up to 30 cm from the ion source. A variety of sputtering applications were undertaken with a small 10 cm ion source to better understand the ion source requirements in these applications. The results of these experimental studies are also included.
Modeling of tungsten filament in gas discharge in H - ion source
Sources of negative ions such as H - are essential elements of proton accelerators and tokamaks. They have limited lifetime. The replacement of an ion source is a costly process causing delays in the operation of the entire machine. The hot tungsten filament is the key element that limits the lifetime of the H - ion source at the Los Alamos Neutron Science Center (LANSCE) facility. An accurate model, which describes the filament physics and provides a reliable estimate on its lifetime, may significantly improve the operation of the facility. In this report we describe such a model, including a comprehensive list of relevant physical processes from first principles. The model can be used to describe different regimes of operation using diagnostics data as input parameters. It has been benchmarked against the data collected during the production cycle at LANSCE and shows good agreement with experimental data.
Preparation of a 73 As source sample for application in an offline ion source
For the generation of beams with the offline ion source at the Facility for Rare Isotope Beams (FRIB), suitable source samples are required. Arsenic-73 is a frequently requested user beam due to its significance in nuclear structure studies and astrophysics. In this work, we outline the process of preparing a 73 As source sample, containing (5.76 ± 0.37)∗10 14 atoms of 73 As, which was successfully used to generate a 73 As beam for a multi-day user experiment. Silver arsenate was chosen as the chemical form, due to its favorable volatility within the designated operating temperature range. We refined the precipitation method using stable arsenic prior to its application with the 73 As sample, resulting in precipitation yields of (99.4 ± 4.5)%.
A 30-cm diameter argon ion source
A 30 cm diameter argon ion source was evaluated. Ion source beam currents up to 4a were extracted with ion energies ranging from 0.2 to 1.5 KeV. An ion optics scaling relation was developed for predicting ion beam extraction capability as a function of total extraction voltage, gas type, and screen grid open area. Ignition and emission characteristics of several hollow cathode geometries were assessed for purposes of defining discharge chamber and neutralizer cathodes. Also presented are ion beam profile characteristics which exhibit broad beam capability well suited for ion beam sputtering applications.
A 30-cm diameter argon ion source
A 30-cm diameter argon ion source was evaluated. Ion source beam currents up to 4A were extracted with ion energies ranging from 0.2 to 1.5 KeV. An ion optics scaling relation was developed for predicting ion beam extraction capability as a function of total extraction voltage, gas type and screen grid open area. Ignition and emission characteristics of several hollow cathode geometries were assessed for purposes of defining discharge chamber and neutralizer cathodes. Also presented are ion beam profile characteristics which exhibit broad beam capability well suited for ion beam sputtering applications.
Single-beam ion source enhanced growth of transparent conductive thin films
A single-beam ion source was developed and used in combination with magnetron sputtering to modulate the film microstructure. The ion source emits a single beam of ions that interact with the deposited film and simultaneously enhances the magnetron discharge. The magnetron voltage can be adjusted over a wide range, from approximately 240 to 130 V, as the voltage of the ion source varies from 0 to 150 V, while the magnetron current increases accordingly. The low-voltage high-current magnetron discharge enables a 'soft sputtering mode', which is beneficial for thin-film growth. Indium tin oxide (ITO) thin films were deposited at room temperature using a combined single-beam ion source and magnetron sputtering. Furthermore, the ion beam resulted in the formation of polycrystalline ITO thin films with significantly reduced resistivity and surface roughness. Single-beam ion-source-enhanced magnetron sputtering has many potential applications in which low-temperature growth of thin films is required, such as coatings for organic solar cells.
Demonstration of closed shell breeding of cesium ions with an electron beam ion source
An electron beam ion source serves as a charge breeder for the Californium Rare Isotope Breeder Upgrade (CARIBU) at the Argonne Tandem Linac Accelerator System (ATLAS). The source accepts radioactive beams of 1+ or 2+ ions and raises their charge state for post-acceleration by ATLAS. The efficiency of this process impacts the length of each experiment and, hence, the type and number of experiments that can be run in each program cycle. Recent efforts to improve the charge breeding efficiency for the 80 < A < 160 species typical of CARIBU have focused on utilizing the closed shell breeding technique. Here, with this technique, the electron beam energy is manipulated to take advantage of the large gap in ionization energies at shell closures and selectively populate a single charge state. Charge breeding studies with stable cesium ions have demonstrated an absolute efficiency of 72% for Cs 27+ and a total efficiency of 93%. The Cs 27+ efficiency result represents a factor of 3 improvement over the previous best charge breeding result of 23% for Cs 27+ .
Upgrading the LANSCE accelerator with a SNS RF-driven H− ion source
The LANSCE accelerator is currently powered by a filament-driven, biased converter-type H− ion source that operates at 10%, the highest plasma duty factor for this type of source, using only ∼2.2 SCCM of H2. The ion source needs to be replaced every 4 weeks, which takes up to 4 days. The measured negative beam current of 12–16 mA falls below the desired 24 mA acceptance of the LANCSE accelerator. The SNS (Spallation Neutron Source) RF-driven, H− ion source injects ∼50 mA of H− beam into the SNS accelerator at 60 Hz with a 6% duty factor and an availability of >99.5% but requires ∼30 SCCM of H2. Up to 7 A h of H− have been produced during the 14-weeks-long source service cycles, which is unprecedented for small emittance, high-current, pulsed H− ion sources. The emittance of the SNS source is slightly smaller than the emittance of the LANSCE source. The SNS source also features unrivaled low Cs consumption and can be installed and started up in <12 h. LANSCE and SNS are working toward the use of SNS H− ion sources on the LANSCE accelerator because they could (a) fill the LANSCE accelerator to its capacity, (b) decrease the source replacement time by a factor of up to 7, and (c) increase source lifetime by a factor of about 4. This paper discusses some of the challenges that emerge when trying to match a different H− source into an existing injector with significantly different characteristics and operating regimes.
Electric Field Analysis in a Cold-Ion Source Using Stark Spectroscopy of Rydberg Atoms
Here, we analyze electric fields in ion sources generated by quasicontinuous photoionization of cold Rb atoms trapped in the focal spot of a near-concentric, in-vacuum cavity for 1064-nm laser light. Ion streams are extracted with an external electric field, F. Stark effects of Rb 57F and of nearby high-angular-momentum Rydberg levels, which exhibit large, linear Stark shifts, are employed to study the net electric-field probability distribution within the ion-source region over an extraction-field range of 0 < F < 0.35 V/cm. For F = 0, we also investigate ion-field-induced Stark spectra of the 60P 1/2 state, which exhibits a (lesser) quadratic electric-field response that affords a simplified electric-field analysis. Experimental Rydberg spectra are compared with theoretical Stark spectra, which are weighted with net electric-field distributions obtained from classical ion-trajectory simulations that include Coulomb interactions. Experiments and models are in good agreement. At small F and high ion-source rates, the field approximately follows a Holtsmark distribution, and the ion streams are degraded by the Coulomb microfields. With increasing F and at lower ion-source rates, the fields become narrowly distributed around F, resulting in directional ion streams that are less degraded by microfields. Our results are of interest for monitoring cold-ion sources for focused-ion-beam applications, where Coulomb interactions are of concern, and for studies of electric fields in cold plasmas.
Miniature cyclotron resonance ion source using small permanent magnet
An ion source using the cyclotron resonance principle is described. A miniaturized ion source device is used in an air gap of a small permanent magnet with a substantially uniform field in the air gap of about 0.5 inch. The device and permanent magnet are placed in an enclosure which is maintained at a high vacuum (typically 10 to the minus 7th power) into which a sample gas can be introduced. The ion beam end of the device is placed very close to an aperture through which an ion beam can exit into the apparatus for an experiment.
Ion sources for electric propulsion
Ion systems, which accelerate ions of Cs, Hg, or colloid particles by electrostatic fields, are furthest advanced and ready for application. Four kinds of ion sources have been developed: The contact ionization source for Cs as propellants, the electron bombardment source for Cs or Hg, the RF ionization source for Hg, and the hollow needle spray nozzle for colloidal glycerol particles. In each case, the ion beam must be neutralized by injection of electrons shortly behind the exit orifice to avoid adverse space charge effects.
Effect of solenoidal magnetic field on charge-state purity in laser ion source
A solenoidal magnetic field has been used to enhance the ion flux of a laser ion source. However, the dependence of the increase in ion current on the charge-state has not been clarified. In this study, to control the purity of the charge-state in the laser ion source, we investigated the effect of a solenoidal magnetic field on the charge-state distribution of ions in laser ion sources with a solenoid. The results indicate that the flux of ions with a heavier and/or lower charge-state can be increased using higher magnetic flux densities, and that each charged ion has an optimal solenoidal magnetic flux density that maximizes its flux. These results imply that it is possible to increase the purity of the desired charge-state ions by selecting a suitable solenoidal magnetic flux density.
Measurement of the energy distribution of electrons escaping confinement from an electron cyclotron resonance ion source
Production of high charge state ions in electron cyclotron resonance ion sources (ECRISs) is dependent on the electron energy distribution (EED) within the source plasma. In order to better understand the EED, a measurement of electrons escaping axially from an ECRIS device has been performed at the National Superconducting Cyclotron Laboratory. Electrons were measured escaping from the Superconducting Source for Ions, driven at 18 GHz. Dependencies of the observed EED on the confining magnetic field strength and injected microwave power are reported. This paper focuses on large peaks of electrons in the 400–1200 keV energy range. Measurements of the axial bremsstrahlung spectrum have been simultaneously carried out to provide a direct comparison between both techniques. A comparison between the energy associated with the peak of the electron distribution and the spectral temperature of the bremsstrahlung distribution is shown.