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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 37 records · Page 2
All sourcesNASA NTRSDOE OSTI
NASA NTRS2005

Estimation of Cyclic Error Due to Scattering in the Internal OPD Metrology of the Space Interferometry Mission

A common-path laser heterodyne interferometer capable of measuring the internal optical path difference (OPD) with accuracy of the order of 10 pm was demonstrated at JPL. To achieve this accuracy, the relative power received by the detector that is contributed by the scattering of light at the optical surfaces should be less than -97 dB. A method has been developed to estimate the cyclic error caused by the scattering of the optical surfaces. The result of the analysis is presented.

scattering↗
NASA NTRS2005

Estimation of cyclic error due to scattering in the internal OPD metrology of the Space Interferometry Mission

A common-path laser heterodyne interferometer capable of measuring the internal OPD with accuracy of the order of 10 picometers was demonstrated at JPL. To achieve this accuracy, the relative power received by the detector that is contributed by the scattering of light at the optical surfaces should be less than -97 dB. A method has been developed to estimate the cyclic error caused by the scattering of the optical surfaces. The result of the analysis is presented.

Zhao, Feng↗
NASA NTRS2002

Optical metrology for Starlight Separated Spacecraft Stellar Interferometry Mission

We describe a high-precision inter-spacecraft metrology system designed for NASA 's StarLight mission, a space-based separated-spacecraft stellar interferometer. It consists of dual-target linear metrology, based on a heterodyne interferometer with carrier phase modulation, and angular metrology designed to sense the pointing of the laser beam and provides bearing information. The dual-target operation enables one metrology beam to sense displacement of two targets independently. We present the current design, breadboard implementation of the Metrology Subsystem in a stellar interferometer testbed and the present state of development of flight qualifiable subsystem components.

metrology stellar interferometry formation flying↗
NASA NTRS2004

Wide angle astrometric demonstration on the micro-arcsecond metrology testbed for the space interferometry mission

The Space Interferometry Mission (SIM) requires fringe measurements to the level of picometers in order to produce astrometric data at the micro-arc-second level. To be more specific, it is necessary to measure both the position of the starlight central fringe and the change in the internal optical path of the interferometer to a few hundreds of picometers. The internal path is measured with a small heterodyne metrology beam, whereas the starlight fringe position is estimated with a CCD sampling a large concentric annular beam. One major challenge for SIM is to align the metrology beam with the starlight beam to keep the consistency between these two sensors at the system level while articulating the instrument optics over the field of view.

metrology↗