Concentration-versus-depth profiles of hydrogen, carbon, and fluorine in lunar rock surfaces
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Padawer, G. M.↗
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Depth profiles of Mn-53 in lunar rocks and soils
Results of measurements of cosmic-ray-produced Mn-53 taken down the length of the Apollo 16 deep drill core are presented. They indicate that the lunar regolith has been unmixed, on a meter scale, for the past 5 million years at the location of this core. The data are in agreement with earlier Mn-53 measurements on the Apollo 15 drill core. Mn-53 activity profiles in 14310, 12002, and 14321 are compared to each other; all three rocks have probably been on the lunar surface long enough to saturate their solar cosmic-ray-produced Mn-53 (half-life = 3.7 m.y.) activity.
Imamura, M.↗
Depositional history of core section 74001 - Depth profiles of maturity, FeO, and metal
Samples from every 0.5-cm interval of soil in core section 74001 have been studied by ferromagnetic resonance (FMR) and magnetic techniques. The values of the FMR maturity index show that the 74001 samples are very immature (the index ranges from 0.14 to 0.29 units) and have not seen appreciable, if any, surface exposure since their deposition. In fact, the small amount of fine-grained metal in the 74001 samples is probably not acquired as a result of their exposure to the micrometeoroid flux at the lunar surface. Thus, the black-glass soil of 74001 was deposited very rapidly, probably in a single episode or several closely spaced episodes of lunar fire fountaining. The average concentration of FeO and its standard deviation for all the 74001 samples are 22.5 + or - 0.3 wt.%. Since the FeO concentration is so uniform, no large variations in the major-element chemistry of 74001 are expected, with the possible exception of the volatile elements. The concentration of coarse-grained metal, which is measured magnetically, and its standard deviation are 0.15 + or - 0.01 wt.%. The coarse-grained metal probably precipitated contemporaneously with the silicate and oxide phases in the black-glass droplets.
Morris, R. V.↗
Be-10 and Cl-36 depth profiles in an Apollo 15 drill core
The present study of galactic cosmic ray production profiles by means of tandem accelerator mass spectrometry has measured cosmic ray-produced Be-10 and Cl-36, whose half-attenuation lengths are respectively calculated to be 120 and 132 g/sq cm. The measured half-attenuation lengths for Be-10 are noted to be slightly longer than predicted by the Reedy-Arnold (1972) theoretical model. Secondary thermal neutron production from Cl-35 is invoked as an explanation for the flatter and deeper maximum seen in the Cl-36 profile.
Nishiizumi, K.↗
Al-26 depth profile in Apollo 15 drill core
Accelerator mass spectrometry is used in a study of galactic cosmic ray production profiles based on cosmic ray-produced Al-26 in the Apollo 15 long core. The results, which are in general agreement with earlier nondestructive counting data, are of significantly higher precision, yet systematically lower. The half-attenuation length for Al-26 production is presently calculated to be 122 g/sq cm, after normalizing the data to average chemical composition.
Nishiizumi, K.↗
A simple method of obtaining concentration depth-profiles from X-ray diffraction
The construction of composition profiles from X-ray intensity bands was investigated. The intensity band-to-composition profile transformation utilizes a solution which can be easily evaluated. The technique can be applied to thin films and thick speciments for which the variation of lattice parameters, linear absorption coefficient, and reflectivity with composition are known. A deconvolution scheme with corrections for the instrumental broadening and ak-alfadoublet is discussed.
Wiedemann, K. E.↗
Electron Microscopy Studies, Surface Analysis and Microbial Culturing Experiments on a Depth Profile Through Martian Meteorite Nakhla
Combined electron microscopy studies and culturing experiments have shown that Nakhla became contaminated with recent terrestrial microorganisms. Additional surface analysis detected an as yet unknown organic species which may represent a biomarker.
Toporski, J. K. W.↗
Depth profile of radiolytic fluence on Europa: implications for remote sensing and in-situ analyses
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Europa in situ remote sensing↗
Depth profiling and standardization from the back side of a sample for accurate analyses: Emphasis on quantifying low‐fluence, shallow implants in diamond‐like carbon
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Karen D. Rieck↗
Discrimination and quantification of Fe and Ni abundances in Genesis solar wind implanted collectors using X-ray standing wave fluorescence yield depth profiling with internal referencing
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Y. Choi↗
Participation in the 1996 Arlindo Cruise to the Indonesian Seas
The objective of Arlindo-Productivity is to understand the factors responsible for regional differences in the response of phytoplankton and zooplankton to the SE and NW Monsoons in Indonesia. The hypothesis is that an interplay between circulation and shoaling of the nutricline, as a response to the monsoons, regulates productivity in the Indonesian Seas. My o@jective for the cruise in 1996 was to continue our collaboration with Indonesian scientists by conducting a set of hydrographic, primary production and spectral irradiance observations in the Indonesian Seas. This grant paid for shipping, travel and incidental costs associated with participation in the cruise in December, 1996. Ship costs were borne by the Indonesian Institute of Sciences as part of the collaborative effort. A plan for Arlindo in 1996 was agreed upon in March, 1996, by Indonesian scientists together with Arnold Gordon. The plan called for a 20-day physical oceanography and mooring cruise in November, 1996, followed by a 5-day bio-optical cruise. The bio-optical cruise departed from, and returned to, Ambon, and sampled in the Banda Sea. We completed a series of chlorophyll analyses, both a sampling of surface variability and depth profiles in the Banda Sea. We also completed three MER profiles for depth profiles of spectral irradiance. These data have a useful by-product in that they can be used for vicarious calibration of the OCTS sensor aboard the ADEOS satellite. As such, the data has been transmitted to NASDA in Japan for their use.
Marra, John↗
Tribological characteristics of gold films deposited on metals by ion plating and vapor deposition
The graded interface between an ion-plated film and a substrate is discussed as well as the friction and wear properties of ion-plated gold. X-ray photoelectron spectroscopy (XPS) depth profiling and microhardness depth profiling were used to investigate the interface. The friction and wear properties of ion-plated and vapor-deposited gold films were studied both in an ultra high vacuum system to maximize adhesion and in oil to minimize adhesion. The results indicate that the solubility of gold on the substrate material controls the depth of the graded interface. Thermal diffusion and chemical diffusion mechanisms are thought to be involved in the formation of the gold-nickel interface. In iron-gold graded interfaces the gold was primarily dispersed in the iron and thus formed a physically bonded interface. The hardness of the gold film was influenced by its depth and was also related to the composition gradient between the gold and the substrate. The graded nickel-gold interface exhibited the highest hardness because of an alloy hardening effect. The effects of film thickness on adhesion and friction were established.
Miyoshi, K.↗
Tribological characteristics of gold films deposited on metals by ion plating and vapor deposition
The graded interface between an ion-plated film and a substrate is discussed as well as the friction and wear properties of ion-plated gold. X-ray photoelectron spectroscopy (XPS) depth profiling and microhardness depth profiling were used to investigate the interface. The friction and wear properties of ion-plated and vapor-deposited gold films were studied both in an ultra high vacuum system to maximize adhesion and in oil to minimize adhesion. The results indicate that the solubility of gold on the substrate material controls the depth of the graded interface. Thermal diffusion and chemical diffusion mechanisms are thought to be involved in the formation of the gold-nickel interface. In iron-gold graded interfaces the gold was primarily dispersed in the iron and thus formed a physically bonded interface. The hardness of the gold film was influenced by its depth and was also related to the composition gradient between the gold and the substrate. The graded nickel-gold interface exhibited the highest hardness because of an alloy hardening effect. The effects of film thickness on adhesion and friction were established.
Miyoshi, K.↗
Spatial U-Pb Age Distribution in Shock-Recrystallized Zircon – A Case Study from the Rochechouart Impact Structure, France
Age determination of impact structures via the zircon U–Pb system remains challenging and often ambiguous due to highly variable effects of shock metamorphism on U-Pb geochronology. It is, therefore, crucial to link the observed zircon microtextures, including their temperature and pressure conditions associated with their formation, directly to the U–Pb ages preserved. Here, we analyzed three recrystallized zircon grains and one plastically deformed zircon crystal from the medium-sized Rochechouart impact structure in the northwestern Massif Central of France. For the Rochechouart impact structure the impact age (206.92 ± 0.32 Ma [40Ar/39Ar]) as well as the 2 tectono-themal history is well established making this study site ideal to test concepts about U-Pb systematics in shocked zircon and to differentiate between shock-driven age resetting and preimpact crystallization and metamorphic overprinting. Zircon microstructures were studied using scanning electron imaging, cathodoluminescence imaging, and electron backscatter diffraction (EBSD) mapping. Further, we conducted U–Pb Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS) depth-profiling analysis, allowing us to interpret the resultant age data in discrete steps with increasing ablation time/depth. The U–Pb depth profiling data demonstrate that plastically strained grains are incompletely reset and preserve rim and interior age domains reflecting typical pre-impact (pre-Variscan and Variscan) regional tectonic ages. Our results also reveal that the granular crystals encountered contain microstructural evidence for “former reidite in granular neoblastic” (FRIGN) zircon, reflecting both high-pressure (⩾30GPa) and high temperature (⩾1200℃) conditions. This signifies that FRIGN zircon is now known from an additional, medium sized, impact structure further supporting the hypothesis that this impact induced microstructure is commonly preserved. In addition, FRIGN zircon has a high potential to preserve completely impact-reset crystal domains (~204 to 207 Ma) that can be identified by our combined analytical approach of U–Pb depth profiling and EBSD mapping, and thus are suitable for determining reliable impact ages
U-Pb depth profiling↗
Auger analysis of a fiber/matrix interface in a ceramic matrix composite
Auger electron spectroscopy (AES) depth profiling was used to characterize the fiber/matrix interface of an SiC fiber, reaction bonded Si3N4 matrix composite. Depth profiles of the as received double coated fiber revealed concentration oscillations which disappeared after annealing the fiber in the environment used to fabricate the composite. After the composite was fractured, the Auger depth profiles showed that failure occurred in neither the Beta-SiC fiber body nor in the Si3N4 matrix but, concurrently, at the fiber coating/matrix interface and within the fiber coating itself.
Honecy, Frank S.↗
Auger analysis of a fiber/matrix interface in a ceramic matrix composite
Auger electron spectroscopy (AES) depth profiling was used to characterize the fiber/matrix interface of an SiC fiber, reaction bonded Si3N4 matrix composite. Depth profiles of the as received double coated fiber revealed concentration oscillations which disappeared after annealing the fiber in the environment used to fabricate the composite. After the composite was fractured, the Auger depth profiles showed that failure occurred in neither the Beta-SiC fiber body nor in the Si3N4 matrix but, concurrently, at the fiber coating/matrix interface and within the fiber coating itself.
Honecy, Frank S.↗
X-Ray Fluorescence Solvent Detection at the Substrate-Adhesive Interface
With environmental regulations limiting the use of volatile organic compounds, low-vapor pressure solvents have replaced traditional degreasing solvents for bond substrate preparation. When used to clean and prepare porous bond substrates such as phenolic composites, low vapor pressure solvents can penetrate deep into substrate pore networks and remain there for extended periods. Trapped solvents can interact with applied adhesives either prior to or during cure, potentially compromising bond properties. Currently, methods for characterizing solvent time-depth profiles in bond substrates are limited to bulk gravimetric or sectioning techniques. While sectioning techniques such as microtome allow construction of solvent depth profiles, their depth resolution and reliability are limited by substrate type. Sectioning techniques are particularly limited near the adhesive-substrate interface where depth resolution is further limited by adhesive-substrate hardness and, in the case of a partially cured adhesive, mechanical properties differences. Additionally, sectioning techniques cannot provide information about lateral solvent diffusion. Cross-section component mapping is an alternative method for measuring solvent migration in porous substrates that eliminates the issues associated with sectioning techniques. With cross-section mapping, the solvent-wiped substrate is sectioned perpendicular rather than parallel to the wiped surface, and the sectioned surface is analyzed for the solvent or solvent components of interest using a two-dimensional mapping or imaging technique. Solvent mapping can be performed using either direct or indirect methods. With a direct method, one or more solvent components are mapped using red or Raman spectroscopy together with a moveable sample stage and/or focal plane array detector. With an indirect method, an elemental "tag" not present in the substrate is added to the solvent before the substrate is wiped. Following cross sectioning, the tag element can then be mapped by its characteristic x-ray emission using either x-ray fluorescence, or electron-beam energy-and wavelength-dispersive x-ray spectrometry. The direct mapping techniques avoid issues of different diffusion or migration rates of solvents and elemental tags, while the indirect techniques avoid spectral resolution issues in cases where solvents and substrates have adjacent or overlapping peaks. In this study, cross-section component indirect mapping is being evaluated as a method for measuring migration of d-limonene based solvents in glass-cloth phenolic composite (GCP) prior to and during subsequent bonding and epoxy adhesive cure.
Wurth, Laura↗
A study of the properties of beryllium doped silicon with particular emphasis on diffusion mechanisms: Profiles of depth dependent conductivity as determined by electrical surface probes
Very large diffusion coefficients were encountered and required the determination of impurity profiles for samples approximately 1 cm thick. Since conductivity values are readily converted into concentrations of electrically active impurities, the major problem became that of accurately determining the conductivity profiles of beryllium diffused silicon samples. Four-point probe measurements on samples having depth conductivities are interpreted in terms of conductivity profiles, based on an exact solution of the problem of exponentially depth dependent conductivity. Applications include surface conductivity determination where the form of the conductivity profile is known, and conductivity profile determination from probe measurements taken as the sample surface is progressively lapped away. The application is limited to samples having conductivity monotonically decreasing with depth from the probed surface.
Franks, R. K.↗