Engineering Papers⌕ Search

SEARCH · Engineering Papers

Results for “bit error”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.

At least 37 records · Page 2
All sourcesNASA NTRSDOE OSTI
NASA NTRS1987

Bit-error-rate testing of high-power 30-GHz traveling-wave tubes for ground-terminal applications

Tests were conducted at NASA Lewis to measure the bit-error-rate performance of two 30-GHz 200-W coupled-cavity traveling-wave tubes (TWTs). The transmission effects of each TWT on a band-limited 220-Mbit/s SMSK signal were investigated. The tests relied on the use of a recently developed digital simulation and evaluation system constructed at Lewis as part of the 30/20-GHz technology development program. This paper describes the approach taken to test the 30-GHz tubes and discusses the test data. A description of the bit-error-rate measurement system and the adaptations needed to facilitate TWT testing are also presented.

Shalkhauser, Kurt A.↗
NASA NTRS1987

Automated measurement of the bit-error rate as a function of signal-to-noise ratio for microwave communications systems

The performance of microwave systems and components for digital data transmission can be characterized by a plot of the bit-error rate as a function of the signal to noise ratio (or E sub b/E sub o). Methods for the efficient automated measurement of bit-error rates and signal-to-noise ratios, developed at NASA Lewis Research Center, are described. Noise measurement considerations and time requirements for measurement accuracy, as well as computer control and data processing methods, are discussed.

Kerczewski, Robert J.↗
NASA NTRS1989

Characterization of multiple-bit errors from single-ion tracks in integrated circuits

The spread of charge induced by an ion track in an integrated circuit and its subsequent collection at sensitive nodal junctions can cause multiple-bit errors. The authors have experimentally and analytically investigated this phenomenon using a 256-kb dynamic random-access memory (DRAM). The effects of different charge-transport mechanisms are illustrated, and two classes of ion-track multiple-bit error clusters are identified. It is demonstrated that ion tracks that hit a junction can affect the lateral spread of charge, depending on the nature of the pull-up load on the junction being hit. Ion tracks that do not hit a junction allow the nearly uninhibited lateral spread of charge.

Zoutendyk, J. A.↗
NASA NTRS1981

Bit error rate performance of Image Processing Facility high density tape recorders

The Image Processing Facility at the NASA/Goddard Space Flight Center uses High Density Tape Recorders (HDTR's) to transfer high volume image data and ancillary information from one system to another. For ancillary information, it is required that very low bit error rates (BER's) accompany the transfers. The facility processes about 10 to the 11th bits of image data per day from many sensors, involving 15 independent processing systems requiring the use of HDTR's. When acquired, the 16 HDTR's offered state-of-the-art performance of 1 x 10 to the -6th BER as specified. The BER requirement was later upgraded in two steps: (1) incorporating data randomizing circuitry to yield a BER of 2 x 10 to the -7th and (2) further modifying to include a bit error correction capability to attain a BER of 2 x 10 to the -9th. The total improvement factor was 500 to 1. Attention is given here to the background, technical approach, and final results of these modifications. Also discussed are the format of the data recorded by the HDTR, the magnetic tape format, the magnetic tape dropout characteristics as experienced in the Image Processing Facility, the head life history, and the reliability of the HDTR's.

Heffner, P.↗
NASA NTRS1985

New short constraint length, rate 1/N convolutional codes which minimize the required SNR for given desired bit error rates

It is pointed out that for a convolutional coding system, the Bit Error Rate (BER) at the Viterbi decoder output is upper-bounded by the transfer function bound. A large number of rate 1/N convolutional codes have been reported. The criteria used for determining the quality of a code in code search procedures, however, may not be very suited for cases in which the required BER is in the moderate range. For this reason, it may be best to select the code with the aim to minimize the required SNR for a given disired BER. Partial code searching techniques are presented, and a table listing the code search results is provided.

Lee, P. J.↗
NASA NTRS1986

Bit error rate testing of a proof-of-concept model baseband processor

Bit-error-rate tests were performed on a proof-of-concept baseband processor. The BBP, which operates at an intermediate frequency in the C-Band, demodulates, demultiplexes, routes, remultiplexes, and remodulates digital message segments received from one ground station for retransmission to another. Test methods are discussed and test results are compared with the Contractor's test results.

Stover, J. B.↗
NASA NTRS1984

Computing in the presence of soft bit errors

It is shown that single-event-upsets (SEUs) due to cosmic rays are a significant source of single bit error in spacecraft computers. The physical mechanism of SEU, electron hole generation by means of Linear Energy Transfer (LET), it discussed with reference made to the results of a study of the environmental effects on computer systems of the Galileo spacecraft. Techniques for making software more tolerant of cosmic ray effects are considered, including: reducing the number of registers used by the software; continuity testing of variables; redundant execution of major procedures for error detection; and encoding state variables to detect single-bit changes. Attention is also given to design modifications which may reduce the cosmic ray exposure of on-board hardware. These modifications include: shielding components operating in LEO; removing low-power Schottky parts; and the use of CMOS diodes. The SEU parameters of different electronic components are listed in a table.

Rasmussen, R. D.↗
NASA NTRS1971

The effect of bandlimiting of a PCM/NRZ signal on the bit-error probability.

The explicit expressions for the intersymbol interference as a function of bandwidth-bit duration product and bit positions for PCM/NRZ systems operating in the presence of Gaussian noise and in a bandlimited channel are determined. Two types of linear bit detectors are considered, integrate and dump, and bandlimit and sample. Restriction of bandwidth results in a performance degradation. The degradation of signal-to-noise ratio is presented as a function of bandwidth-bit duration product and bit patterns. The average probability of bit errors is computed for various bandwidths. The calculations of the upper bound and lower bound on the error probability are also presented.

Tu, K.↗
NASA NTRS1991

Bit error rate performance of pi/4-DQPSK in a frequency-selective fast Rayleigh fading channel

The bit error rate (BER) performance of pi/4-differential quadrature phase shift keying (DQPSK) modems in cellular mobile communication systems is derived and analyzed. The system is modeled as a frequency-selective fast Rayleigh fading channel corrupted by additive white Gaussian noise (AWGN) and co-channel interference (CCI). The probability density function of the phase difference between two consecutive symbols of M-ary differential phase shift keying (DPSK) signals is first derived. In M-ary DPSK systems, the information is completely contained in this phase difference. For pi/4-DQPSK, the BER is derived in a closed form and calculated directly. Numerical results show that for the 24 kBd (48 kb/s) pi/4-DQPSK operated at a carrier frequency of 850 MHz and C/I less than 20 dB, the BER will be dominated by CCI if the vehicular speed is below 100 mi/h. In this derivation, frequency-selective fading is modeled by two independent Rayleigh signal paths. Only one co-channel is assumed in this derivation. The results obtained are also shown to be valid for discriminator detection of M-ary DPSK signals.

Liu, Chia-Liang↗
NASA NTRS2012

Correlation Between Analog Noise Measurements and the Expected Bit Error Rate of a Digital Signal Propagating Through Passive Components

A method of determining the bit error rate (BER) of a digital circuit from the measurement of the analog S-parameters of the circuit has been developed. The method is based on the measurement of the noise and the standard deviation of the noise in the S-parameters. Once the standard deviation and the mean of the S-parameters are known, the BER of the circuit can be calculated using the normal Gaussian function.

Warner, Joseph D.↗
NASA NTRS1990

Bit-error-rate testing of fiber optic data links for MMIC-based phased array antennas

The measured bit-error-rate (BER) performance of a fiber optic data link to be used in satellite communications systems is presented and discussed. In the testing, the link was measured for its ability to carry high burst rate, serial-minimum shift keyed (SMSK) digital data similar to those used in actual space communications systems. The fiber optic data link, as part of a dual-segment injection-locked RF fiber optic link system, offers a means to distribute these signals to the many radiating elements of a phased array antenna. Test procedures, experimental arrangements, and test results are presented.

Shalkhauser, K. A.↗
NASA NTRS1990

Bit error rate testing of fiber optic data links for MMIC-based phased array antennas

The measured bit-error-rate (BER) performance of a fiber optic data link to be used in satellite communications systems is presented and discussed. In the testing, the link was measured for its ability to carry high burst rate, serial-minimum shift keyed (SMSK) digital data similar to those used in actual space communications systems. The fiber optic data link, as part of a dual-segment injection-locked RF fiber optic link system, offers a means to distribute these signals to the many radiating elements of a phased array antenna. Test procedures, experimental arrangements, and test results are presented.

Shalkhauser, K. A.↗
NASA NTRS1978

High-speed communication detector characterization by bit error rate measurements

Performance data taken on several candidate high data rate laser communications photodetectors is presented. Measurements of bit error rate versus signal level were made in both a 1064 nm system at 400 Mbps and a 532 nm system at 500 Mbps. RCA silicon avalanche photodiodes are superior at 1064 nm, but the Rockwell hybrid 3-5 avalanche photodiode preamplifiers offer potentially superior performance. Varian dynamic crossed field photomultipliers are superior at 532 nm, however, the RCA silicon avalanche photodiode is a close contender.

Green, S. I.↗