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NASA NTRS1995

Method for reducing sidelobe impact of low order aberration in a coronagraph

The invention relates to a method for reducing a sidelobe impact of low order aberrations using a coronagraph (2) having an apodized occulting mask (10), comprising the steps of: (a) providing in the coronagraph (2) the apodized occulting disk (10) having a transmission profile which graduates from opaque to transparent along its radius and the negative of whose amplitude transmission is a Gaussian profile; (b) determining a predicted sidelobe impact of the aberrations from a particular mix of low order aberration measured in a system as described by the Zernike polynomials; (c) applying the coronagraph to a system point spread function using a given rms width for the Gaussian profile describing the apodized occulting mask (10) and determining an attenuation level of the aberration sidelobes; (d) scaling the Gaussian occulting mask (10) profile to a wider rms width if the sidelobe attenuation level is too low; and (e) repeating the steps (b) through (d) until the attenuation level is acceptable.

Ftaclas, Christ↗

NASA NTRS2010

Reflector Surface Error Compensation in Dual-Reflector Antennas

By probing the field on a small subreflector at a minimal number of points, the main reflector surface errors can be obtained and subsequently used to design a phase-correction subreflector that can compensate for main reflector errors. The compensating phase-error profile across the subreflector can be achieved either by a surface deformation or by the use of an array of elements such as patch antennas that can cause a phase shift between the incoming and outgoing fields. The second option is of primary interest here, but the methodology can be applied to either case. The patch array is most easily implemented on a planar surface. Therefore, the example of a flat subreflector and a parabolic main reflector (a Newtonian dual reflector system) is considered in this work. The subreflector is assumed to be a reflector array covered with patch elements. The phase variation on a subreflector can be detected by a small number of receiving patch elements (probes). By probing the phase change at these few selected positions on the subreflector, the phase error over the entire surface can be recovered and used to change the phase of all the patch elements covering the subreflector plane to compensate for main reflector errors. This is accomplished by using a version of sampling theorem on the circular aperture. The sampling is performed on the phase-error function on the circular aperture of the main reflector by a method developed using Zernike polynomials. This method is based upon and extended from a theory previously proposed and applied to reflector aperture integration. This sampling method provides for an exact retrieval of the coefficients of up to certain orders in the expansion of the phase function, from values on a specifically calculated set of points in radial and azimuthal directions in the polar coordinate system, on the circular reflector aperture. The corresponding points on the subreflector are then obtained and, by probing the fields at these points, a set of phase values is determined that is then transferred back to the main reflector aperture for recovering the phase function. Once this function is recovered, the corresponding phase function on the subreflector is calculated and used to compensate for main reflector surface errors. In going back and forth between sub and main reflectors, geometrical (ray) optics is employed, which even though it ignores edge diffraction and other effects, is shown to be accurate for phase recovery.

Jamnejad, Vahraz↗

NASA NTRS2016

Phase-Retrieval Uncertainty Estimation and Algorithm Comparison for the JWST-ISIM Test Campaign

Phase retrieval, the process of determining the exitpupil wavefront of an optical instrument from image-plane intensity measurements, is the baseline methodology for characterizing the wavefront for the suite of science instruments (SIs) in the Integrated Science Instrument Module (ISIM) for the James Webb Space Telescope (JWST). JWST is a large, infrared space telescope with a 6.5-meter diameter primary mirror. JWST is currently NASA's flagship mission and will be the premier space observatory of the next decade. ISIM contains four optical benches with nine unique instruments, including redundancies. ISIM was characterized at the Goddard Space Flight Center (GSFC) in Greenbelt, MD in a series of cryogenic vacuum tests using a telescope simulator. During these tests, phase-retrieval algorithms were used to characterize the instruments. The objective of this paper is to describe the Monte-Carlo simulations that were used to establish uncertainties (i.e., error bars) for the wavefronts of the various instruments in ISIM. Multiple retrieval algorithms were used in the analysis of ISIM phase-retrieval focus-sweep data, including an iterativetransform algorithm and a nonlinear optimization algorithm. These algorithms emphasize the recovery of numerous optical parameters, including low-order wavefront composition described by Zernike polynomial terms and high-order wavefront described by a point-by-point map, location of instrument best focus, focal ratio, exit-pupil amplitude, the morphology of any extended object, and optical jitter. The secondary objective of this paper is to report on the relative accuracies of these algorithms for the ISIM instrument tests, and a comparison of their computational complexity and their performance on central and graphical processing unit clusters. From a phase-retrieval perspective, the ISIM test campaign includes a variety of source illumination bandwidths, various image-plane sampling criteria above and below the Nyquist- Shannon critical sampling value, various extended object sizes, and several other impactful effects.

Design Analysis↗

NASA NTRS2018

Influence of Core and Hexapod Geometry, and Local Reinforcement on the Performance of Ultra-Lightweight ULE Mirror

The Habitable Exoplanet Observatory (HabEx) mission has unique optical performance requirements which drive the mirror design process beyond the traditional criteria. While mass and stiffness are still important, the response to inertia loading (expressed in terms of Zernike coefficients) to omni-directional excitation dominates the effort. While a Zerodur mirror is the current baseline, as mass budgets change, a ULE design is being studied as a potential alternative. This trade study looked at over 264 design variations using the Arnold Mirror Modeler and ANSYS(c) to investigate the influence of various design elements, including: substrate thickness, core cell size, hexapod geometry and local reinforcement. Design 'goodness' was evaluated based on the mirror's inertial deformation response to omni-directional input. This response was calculated via RSSing Zernike polynomial responses to (XYZ) accelerations.

Space Telescope Technology↗

DOE OSTI2025

Modal focal adaptive optics for Bessel-focus two-photon fluorescence microscopy

Adaptive optics (AO) improves the spatial resolution of microscopy by correcting optical aberrations. While its application has been well established in microscopy modalities utilizing a circular pupil, its adaptation to systems with non-circular pupils, such as Bessel-focus two-photon fluorescence microscopy (2PFM) with an annular pupil, remains relatively uncharted. Herein, we present a modal focal AO (MFAO) method for Bessel-focus 2PFM. Measuring and correcting aberration using a spatial light modulator placed in conjugation with the focal plane of the microscope objective, MFAO employs Zernike annular polynomials — a first in AO implementation — to achieve performance on par with a previous zonal AO method, but with a notably simplified optical configuration. We validated the performance of MFAO in correcting artificial and sample-induced aberrations, as well as in in vivo imaging of zebrafish larvae and mouse brains. By expanding the application of modal AO to annular pupils as well as aberration measurement and correction to a wavefront modulator at the objective focal plane, MFAO represents a notable advancement in the implementation of AO in microscopy.

47 OTHER INSTRUMENTATION↗

NASA NTRSDate not supplied

Bridging the Gap Between Finite Element Modeling and Wavefront Analysis for Streamlined Optical System Design

Traditionally, evaluating the optical performance of mirrors derived from finite element (FEA), with third-party software requires cumbersome manual effort – which impacts efficient design optimization. This paper presents a process that seamlessly integrates FEA results with wavefront analysis software, significantly simplifying performance assessment and enabling rapid design iteration. We leverage the 4D technology interferometer and "4Sight" wavefront analysis software for performance measurement and comparison with FEA predictions. Recognizing the need for efficient data exchange, we developed an application that converts FEA data into a format compatible with 4Sight. The software takes two user-defined inputs: optical surface position and deformation information, typically provided as CSV or TXT files. Within a second, it generates an output file suitable for direct import into 4Sight, enabling immediate visualization of key optical performance metrics.

Zernike Polynomial↗