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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 37 records · Page 2
All sourcesNASA NTRSDOE OSTI
NASA NTRS1976

X-radiation from clusters of galaxies: Spectral evidence for a hot evolved gas

OSO-8 observations of the X-ray flux in the range 2-60 keV from the Virgo, Perseus, and Coma Clusters provide strong evidence for the thermal origin of the radiation, including iron line emission. The data are adequately described by emission from an isothermal plasma with an iron abundance in near agreement with cosmic levels. A power law description is generally less acceptable and is ruled out in the case of Perseus. Implications on the origin of the cluster gas are discussed.

Serlemitsos, P. J.↗
NASA NTRS1977

X-radiation from clusters of galaxies - Spectral evidence for a hot evolved gas

OSO-8 observations of the X-ray flux in the range between 2 and 60 keV from the Virgo, Perseus, and Coma clusters provide strong evidence for the thermal origin of the radiation, including iron-line emission. The data are adequately described by emission from an isothermal plasma with an iron abundance in near agreement with cosmic levels. A power-law description is generally less acceptable and is ruled out in the case of Perseus. Implications of the origin of the cluster gas are discussed.

Serlemitsos, P. J.↗
NASA NTRS2002

X-Radiation from the Millisecond Pulsar J0437-4715

We report on spectral and timing observations of the nearest millisecond pulsar, 50437-471 5, with the Chandra X-Ray Observatory. The pulsar spectrum, detected up to 7 keV, cannot be described by a simple one-component model. We suggest that it consists of two components: a nonthermal power-law spectrum generated in the pulsar magnetosphere, with a photon index gamma approx. = 2, and a thermal spectrum emitted by heated polar caps, with a temperature decreasing outward from 2 to 0.5 MK. The lack of spectral features in the thermal component suggests that the neutron star surface is covered by a hydrogen (or helium) atmosphere. The timing analysis shows one X-ray pulse per period, with a pulsed fraction of about 40% and the peak at the same pulse phase as the radio peak. No synchrotron pulsar-wind nebula is seen in X-rays.

Zavlin, V. E.↗
NASA NTRS1972

Neuropathological evaluation of monkeys exposed to body-alone X-radiation.

Investigation of the problem of whether morphological changes occurring in the central nervous system (CNS) following whole-body irradiation are attributable in part to abscopal factors. The 12 monkeys irradiated and the 6 that served as controls were chosen from a pool of 25 young monkeys. Over the postirradiation survival period of 14 days the hematocrit and hemoglobin values varied only slightly from the baseline values and from the values in the 6 control animals. White cell fractions were reduced in quantity but tended to recover relatively soon after irradiation. The design of this experiment was regarded as adequate to allow a conclusion whether pathological changes in the CNS of the irradiated animals differed from or exceeded those observed in the control animals. That such occurred on both counts in 3 of the 12 irradiated animals was evident. It appears that all the lesions must have been abscopally induced.

Haymaker, W.↗
NASA NTRS1991

High resolution synchrotron X-radiation diffraction imaging of crystals grown in microgravity and closely related terrestrial crystals

Irregularities in three crystals grown in space and in four terrestrial crystals grown under otherwise comparable conditions have been observed in high resolution diffraction imaging. The images provide important new clues to the nature and origins of irregularities in each crystal. For two of the materials, mercuric iodide and lead tin telluride, more than one phase (an array of non-diffracting inclusions) was observed in terrestrial samples; but the formation of these multiple phases appears to have been suppressed in directly comparable crystals grown in microgravity. The terrestrial seed crystal of triglycine sulfate displayed an unexpected layered structure, which propagated during directly comparable space growth. Terrestrial Bridgman regrowth of gallium arsenide revealed a mesoscopic structure substantially different from that of the original Czochralski material. A directly comparable crystal is to be grown shortly in space.

Steiner, Bruce↗
NASA NTRS1989

Interstellar dust as generator of x ray radiation

The x ray generation due to arising of hot dense plasma balls at high-velocity (greater than or equal to 70 km/s) collisions of dust grains in the interstellar medium is considered. Analytical expressions for efficiency of conversions of colliding dust particle kinetic energy into x ray radiation are presented. The observed intensity distribution of the diffuse component of soft cosmic x rays (0.1 to 1 keV) may be partly caused by collisions between the dusty components of high velocity clouds and of the disk of the Galaxy.

Ibadov, Subhon↗
NASA NTRS1978

On the nature of the sources of hard pulse X-ray radiation

Besides the identified sources of cosmic pulse X-ray radiation with globular clusters NGC 6624, NGC 1851 and MXB 1730-335 several new identifications were made. The source in Norma was probably identified with globular cluster NGC 5927, the source in Aquila with globular cluster NGC 6838 (M71), and the source in Puppis with globular cluster NGC 2298. Gamma pulses discovered by the Vela satellites and X-ray pulses thoroughly measured by the SAS-3, Ariel-5, and ANS satellites are thought to be the same phenomenon. The sources of such a radiation must be some kind of peculiarity at the central part of globular clusters; it is most probably a massive black hole. The sources of hard pulse radiation which cannot be identified with globular clusters are considered to be a new kind of galactic object, invisible globular clusters, which are naked nuclei of globular clusters.

Shklovskiy, I. S.↗
NASA NTRS1985

X-ray emission from cataclysmic variables with accretion disks. I - Hard X-rays. II - EUV/soft X-ray radiation

Theoretical models explaining the hard-X-ray, soft-X-ray, and EUV emission of accretion-disk cataclysmic variables in terms of the disk boundary layer (DBL) are developed on the basis of a survey of the published observational data. The data are compared with model predictions in graphs for systems with high or low (greater than or less than 10-Pg/s) accretion rates. Good agreement is obtained both at low accretion rates, where an optically thin rarefied hot (Te = 10 to the 8th K) DBL radiates most of its energy as hard X-rays, and at high accretion rates, where an optically thick 100,000-K DBL radiates most of its energy in the EUV and as soft X-rays. Detailed analysis of the old nova V603 Aql suggests that previous models predicting more detections of soft-X-ray/EUV emissions from thick-DBL objects (Ferland et al., 1982) used inappropriate dwarf masses, interstellar column densities, or classical-nova space densities.

Patterson, J.↗
NASA NTRS2016

Terrestrial Sources of X-Ray Radiation and Their Effects on NASA Flight Hardware

X-rays are an energetic and penetrating form of ionizing electromagnetic radiation, which can degrade NASA flight hardware. The main concern posed by such radiation is degradation of active electronic devices and, in some cases, diodes. Non-electronic components are only damaged at doses that far exceed the point where any electronic device would be destroyed. For the purposes of this document, flight hardware can be taken to mean an entire instrument, the flight electronics within the instrument or the individual microelectronic devices in the flight electronics. This document will discuss and describe the ways in which NASA flight hardware might be exposed to x-rays, what is and isn't a concern, and how to tell the difference. First, we must understand what components in flight hardware may be vulnerable to degradation or failure as a result of being exposed to ionizing radiation, such as x-rays. As stated above, bulk materials (structural metals, plastics, etc.) are generally only affected by ionizing radiation at very high dose levels. Likewise, passive electronic components (e.g. resistors, capacitors, most diodes) are strongly resistant to exposure to x-rays, except at very high doses. The main concerns arise when active components, that is, components like discrete transistors and microelectronic devices, are exposed to ionizing radiation. Active components are designed to respond to minute changes in currents and voltages in the circuit. As such, it is not surprising that exposure to ionizing radiation, which creates ionized and therefore electrically active particles, may degrade the way the hardware performs. For the most part, the mechanism for this degradation is trapping of the charges generated by ionizing radiation by defects in dielectric materials in the hardware. As such, the degree of damage is a function of both the quantity of ionizing radiation exposure and the physical characteristics of the hardware itself. The metric that describes the level of exposure to ionizing radiation is total ionizing dose (TID). The unit of TID is the rad, which is defined as 100 ergs absorbed per gram of material. Dose can be expressed in other units, for example grays (gy), where 1 gy = 100 rads. The actual fluence of radiation needed to deliver a rad depends on the absorbing material, so units of dose are usually stated in reference to the material of interest. That is, for microelectronic devices, the unit of dose is generally rad (Si) or rad (SiO2). However, the definition of absorbed dose in this fashion has the advantage that the type of radiation causing the ionization can be normalized so that a realistic and adequate comparison can be made. The sensitivity of microelectronic parts to TID varies over many orders of magnitude. (Note: Doses to humans are typically expressed in rems-or roentgen-equivalent-man-which measures tissue damage, and depends on the type of radiation, as well as the dose in rads.) Thus far, the "softest" parts tested at NASA showed damage at 500 rads (Si), while parts that are radiation-hardened by design can remain functional to doses on the order of 107 rads (Si). This broad range of sensitivity highlights one of the most important considerations when considering the effects of radiation on electronic parts: In order to determine whether a radiation exposure is a concern for a particular part, one must understand the technologies used in the part and their vulnerabilities to TID damage. A NASA radiation expert should be consulted to obtain such information.

X-ray↗