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Spherical electrode eliminates high-voltage breakdown

Spherical electrodes surrounding electrode-dielectric junctions eliminate high-voltage breakdown. The gap between the spherical electrode and the dielectric must be of an optimum size for proper operation. Modified, this electrode should be suitable as a high-voltage feedthrough between various liquid and gaseous media.

Finke, R. C.

Nomograph for prediction of RF-breakdown voltages

Information in nomograph is derived from data obtained from RF-breakdown tests on components of uniform and nonuniform geometry. Nomograph also can be used in design work to predict breakdown margins; if operational minimum pressure is established giving minimum value on nomograph, minimum breakdown voltage consistent with allowed value can be predicted.

Hickernell, F. S.

The Significance of Breakdown Voltages for Quality Assurance of Low-Voltage BME Ceramic Capacitors

Application of thin dielectric, base metal electrode (BME) ceramic capacitors for high-reliability applications requires development of testing procedures that can assure high quality and reliability of the parts. In this work, distributions of breakdown voltages (VBR) in variety of low-voltage BME multilayer ceramic capacitors (MLCCs) have been measured and analyzed. It has been shown that analysis of the distributions can indicate the proportion of defective parts in the lot and significance of the defects. Variations of the distributions after solder dip testing allow for an assessment of the robustness of capacitors to soldering-related stresses. The drawbacks of the existing screening and qualification methods to reveal defects in high-value, low-voltage MLCCs and the importance of VBR measurements are discussed. Analysis has shown that due to a larger concentration of oxygen vacancies, defect-related degradation of the insulation resistance (IR) and failures are more likely in BME compared to the precious metal electrode (PME) capacitors.

reliability